JP4126150B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP4126150B2
JP4126150B2 JP2000247937A JP2000247937A JP4126150B2 JP 4126150 B2 JP4126150 B2 JP 4126150B2 JP 2000247937 A JP2000247937 A JP 2000247937A JP 2000247937 A JP2000247937 A JP 2000247937A JP 4126150 B2 JP4126150 B2 JP 4126150B2
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JP
Japan
Prior art keywords
tip
needle electrode
needle
sample
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2000247937A
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English (en)
Japanese (ja)
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JP2002056801A5 (https=
JP2002056801A (ja
Inventor
益義 山田
雄一郎 橋本
実 坂入
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Hitachi Ltd
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Hitachi Ltd
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Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2000247937A priority Critical patent/JP4126150B2/ja
Priority to EP10009000A priority patent/EP2296167B1/en
Priority to DE60044892T priority patent/DE60044892D1/de
Priority to EP00120100A priority patent/EP1093151B1/en
Priority to IL13854000A priority patent/IL138540A0/xx
Priority to US09/663,796 priority patent/US6686592B1/en
Publication of JP2002056801A publication Critical patent/JP2002056801A/ja
Priority to US10/651,997 priority patent/US6838664B2/en
Publication of JP2002056801A5 publication Critical patent/JP2002056801A5/ja
Application granted granted Critical
Publication of JP4126150B2 publication Critical patent/JP4126150B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2000247937A 1999-09-20 2000-08-10 質量分析装置 Expired - Lifetime JP4126150B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2000247937A JP4126150B2 (ja) 2000-08-10 2000-08-10 質量分析装置
DE60044892T DE60044892D1 (de) 1999-09-20 2000-09-15 Ionenquelle, Massenspektrometer, Massenspektrometrie und Überwachungssystem
EP00120100A EP1093151B1 (en) 1999-09-20 2000-09-15 Ion source, mass spectrometer, mass spectrometry, and monitoring system
EP10009000A EP2296167B1 (en) 1999-09-20 2000-09-15 Ion source, mass spectrometer, detector and monitoring system
IL13854000A IL138540A0 (en) 1999-09-20 2000-09-18 Mass spectrometer, mass spectrometry, and monitoring system
US09/663,796 US6686592B1 (en) 1999-09-20 2000-09-18 Mass spectrometer, mass spectrometry, and monitoring system
US10/651,997 US6838664B2 (en) 1999-09-20 2003-09-02 Mass spectrometer, mass spectrometry, and monitoring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000247937A JP4126150B2 (ja) 2000-08-10 2000-08-10 質量分析装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2008017012A Division JP4678032B2 (ja) 2008-01-29 2008-01-29 イオン源およびそれを用いた質量分析計

Publications (3)

Publication Number Publication Date
JP2002056801A JP2002056801A (ja) 2002-02-22
JP2002056801A5 JP2002056801A5 (https=) 2005-06-30
JP4126150B2 true JP4126150B2 (ja) 2008-07-30

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ID=18737934

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000247937A Expired - Lifetime JP4126150B2 (ja) 1999-09-20 2000-08-10 質量分析装置

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JP (1) JP4126150B2 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008159593A (ja) * 2008-01-29 2008-07-10 Hitachi Ltd イオン源およびそれを用いた質量分析計
JP2011044438A (ja) * 2010-11-19 2011-03-03 Hitachi Ltd イオン源

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012024570A2 (en) 2010-08-19 2012-02-23 Leco Corporation Mass spectrometer with soft ionizing glow discharge and conditioner
CN108760721A (zh) * 2018-09-18 2018-11-06 四川大学 基于中空电极尖端放电的原子发射光谱分析检测装置
KR102917636B1 (ko) * 2020-02-25 2026-01-23 바이오크로마토 인코퍼레이티드 이온화 장치, 질량 분석 시스템 및 이온화 방법
CN113793796B (zh) * 2020-05-29 2022-11-11 同方威视技术股份有限公司 电晕放电型电离源组件和离子迁移谱仪
WO2023042348A1 (ja) * 2021-09-16 2023-03-23 株式会社島津製作所 質量分析装置の電圧設定方法及び質量分析装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008159593A (ja) * 2008-01-29 2008-07-10 Hitachi Ltd イオン源およびそれを用いた質量分析計
JP2011044438A (ja) * 2010-11-19 2011-03-03 Hitachi Ltd イオン源

Also Published As

Publication number Publication date
JP2002056801A (ja) 2002-02-22

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