JP4083802B2 - デジタルベースの高速ｘ線スペクトロメータについての方法 - Google Patents

デジタルベースの高速ｘ線スペクトロメータについての方法 Download PDF

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JP4083802B2
JP4083802B2 JP50940597A JP50940597A JP4083802B2 JP 4083802 B2 JP4083802 B2 JP 4083802B2 JP 50940597 A JP50940597 A JP 50940597A JP 50940597 A JP50940597 A JP 50940597A JP 4083802 B2 JP4083802 B2 JP 4083802B2
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dsp
signal
value
adc
digital
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JPH11510900A (ja
JPH11510900A5 (enExample
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ゾウ，カール
ハバード，ブラッドレイ
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ワーバートン，ウィリアム，ケイ．
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Priority claimed from US08/730,916 external-priority patent/US5873054A/en
Priority claimed from US08/695,063 external-priority patent/US5684850A/en
Priority claimed from US08/695,062 external-priority patent/US5774522A/en
Priority claimed from US08/702,327 external-priority patent/US5870051A/en
Application filed by ワーバートン，ウィリアム，ケイ． filed Critical ワーバートン，ウィリアム，ケイ．
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Publication of JPH11510900A5 publication Critical patent/JPH11510900A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G01T1/171—Compensation of dead-time counting losses

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP50940597A 1995-08-14 1996-08-09 デジタルベースの高速ｘ線スペクトロメータについての方法 Expired - Lifetime JP4083802B2 (ja)

Applications Claiming Priority (11)

Application Number Priority Date Filing Date Title
US226695P 1995-08-14 1995-08-14
US08/730,916 US5873054A (en) 1995-08-14 1996-08-02 Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer
US08/695,063 US5684850A (en) 1995-08-14 1996-08-02 Method and apparatus for digitally based high speed x-ray spectrometer
US08/730,916 1996-08-02
US08/702,327 1996-08-02
US08/695,063 1996-08-02
US08/695,062 US5774522A (en) 1995-08-14 1996-08-02 Method and apparatus for digitally based high speed x-ray spectrometer for direct coupled use with continuous discharge preamplifiers
US08/695,062 1996-08-02
US08/702,327 US5870051A (en) 1995-08-14 1996-08-02 Method and apparatus for analog signal conditioner for high speed, digital x-ray spectrometer
US60/002,266 1996-08-02
PCT/US1996/013082 WO1997007591A1 (en) 1995-08-14 1996-08-09 Method and apparatus for digitally based high speed x-ray spectrometer

Related Child Applications (1)

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JP2007062409A Division JP2007163516A (ja) 1995-08-14 2007-03-12 デジタルベースの高速ｘ線スペクトロメータについての方法と装置

Publications (3)

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JPH11510900A JPH11510900A (ja) 1999-09-21
JPH11510900A5 JPH11510900A5 (enExample) 2004-09-09
JP4083802B2 true JP4083802B2 (ja) 2008-04-30

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JP50940597A Expired - Lifetime JP4083802B2 (ja) 1995-08-14 1996-08-09 デジタルベースの高速ｘ線スペクトロメータについての方法
JP2007062409A Pending JP2007163516A (ja) 1995-08-14 2007-03-12 デジタルベースの高速ｘ線スペクトロメータについての方法と装置

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JP2007062409A Pending JP2007163516A (ja) 1995-08-14 2007-03-12 デジタルベースの高速ｘ線スペクトロメータについての方法と装置

Country Status (4)

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EP (1) EP0880821B1 (enExample)
JP (2) JP4083802B2 (enExample)
DE (1) DE69631165T2 (enExample)
WO (1) WO1997007591A1 (enExample)

Cited By (2)

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JP4880077B1 (ja) * 2011-02-16 2012-02-22 株式会社リガク Ｘ線検出信号処理装置および方法
US8374814B2 (en) 2011-02-16 2013-02-12 Rigaku Corporation X-ray detection signal processing apparatus and method therefor

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JP3304801B2 (ja) * 1997-02-05 2002-07-22 日本電子株式会社 Ａｄ変換回路
US6587814B1 (en) * 1999-08-27 2003-07-01 William K. Warburton Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources
US6609075B1 (en) * 2001-06-04 2003-08-19 William K. Warburton Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems
US6732059B2 (en) * 2001-08-23 2004-05-04 William K. Warburton Ultra-low background gas-filled alpha counter
JP3980451B2 (ja) * 2002-08-30 2007-09-26 株式会社東芝 波形弁別装置
CN100498377C (zh) * 2004-01-13 2009-06-10 皇家飞利浦电子股份有限公司 模拟到数字转换的移位误差校正
US7966155B2 (en) * 2004-06-04 2011-06-21 William K. Warburton Method and apparatus for improving detection limits in x-ray and nuclear spectroscopy systems
JP5022902B2 (ja) 2004-09-16 2012-09-12 サザン イノヴェーション インターナショナル プロプライアトリー リミテッド 検出器出力データ内の個別信号分離装置および方法
JP5337047B2 (ja) 2006-12-13 2013-11-06 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線光子を計数する装置、撮像デバイス及び方法
RU2472179C2 (ru) * 2007-06-19 2013-01-10 Конинклейке Филипс Электроникс Н.В. Цифровая обработка импульсов в схемах счета мультиспектральных фотонов
EP2260295A4 (en) 2008-03-31 2015-12-23 Southern Innovation Internat Pty Ltd RADIATION IMAGING METHOD WITH SINGLE SIGNAL RESOLUTION
US8954300B2 (en) 2008-03-31 2015-02-10 Southern Innovation International Pty Ltd. Screening method and apparatus
CN101983342A (zh) 2008-03-31 2011-03-02 南方创新国际股份有限公司 用于钻孔测井的方法和装置
JP5581333B2 (ja) 2008-12-18 2014-08-27 サザン イノヴェーション インターナショナル プロプライアトリー リミテッド 数学的変換を使用することによってパイルアップされたパルスを分離する方法および装置
US8330123B2 (en) * 2010-01-28 2012-12-11 I.S.S. (Usa), Inc. System and method for digital parallel frequency fluorometry
US8446308B2 (en) * 2011-04-21 2013-05-21 Kabushiki Kaisha Toshiba Apparatus for detection of a leading edge of a photo sensor output signal
EP2530490B1 (en) * 2011-06-03 2019-02-27 Toshiba Medical Systems Corporation Device for radiation detection, radiation detection system and radiation detection method
CN102353972B (zh) * 2011-07-01 2013-04-10 成都理工大学 多种模式的数字化多道谱仪
JP5823208B2 (ja) * 2011-08-19 2015-11-25 株式会社東芝 Ｘ線コンピュータ断層撮影装置
JP5392437B2 (ja) * 2011-11-15 2014-01-22 富士電機株式会社 パルス処理装置および放射線分析装置
FR2984041B1 (fr) * 2011-12-13 2014-01-10 Commissariat Energie Atomique Numerisation asynchrone de signaux transitoires issus de detecteurs de rayonnement
JP6159144B2 (ja) * 2013-05-10 2017-07-05 株式会社堀場製作所 パルス波高検出装置、放射線検出装置、放射線分析装置、及びパルス波高検出方法
JP6381973B2 (ja) * 2014-06-03 2018-08-29 株式会社日立製作所 高計数率用パルス型放射線検出器
JP6545221B2 (ja) * 2017-05-15 2019-07-17 アンリツ株式会社 スペクトラムアナライザ及び信号分析方法
US11417509B2 (en) 2017-07-21 2022-08-16 Atonarp Inc. Current detection device and spectrometer using ihe same
US10224192B2 (en) * 2017-07-21 2019-03-05 Atonarp Inc. High-speed low-noise ion current detection circuit and mass spectrometer using the same
US11646190B2 (en) 2017-07-21 2023-05-09 Atonarp Inc. Current detection device and spectrometer using the same
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
CN114063139B (zh) * 2021-11-23 2025-02-18 中国科学院电工研究所 一种数字多道脉冲幅度分析装置
CN114660650A (zh) * 2022-03-14 2022-06-24 中国科学院微电子研究所 一种成形时间自适应的数字脉冲滤波方法、装置及电子设备
CN118519183B (zh) * 2024-07-22 2024-10-22 陕西正泽生物技术有限公司 一种用于医用回旋加速器的辐射监测方法及系统
CN119960007A (zh) * 2024-12-24 2025-05-09 中国辐射防护研究院 一种自适应核脉冲信号极零参数调整方法及系统

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NL7110516A (enExample) * 1971-07-30 1973-02-01
US4658216A (en) * 1983-07-14 1987-04-14 The United States Of America As Represented By The Department Of Energy High resolution, high rate X-ray spectrometer
HU210832B (en) * 1986-05-07 1995-08-28 Mta Atommag Kutato Intezete Method for processing signals and adaptive implementation of said method for nuclear spectrometers
US5067090A (en) * 1989-05-01 1991-11-19 Schlumberger Technology Corporation Nuclear spectroscopy method and apparatus for digital pulse height analysis
US5304808A (en) * 1993-02-08 1994-04-19 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for data sampling
US5349193A (en) * 1993-05-20 1994-09-20 Princeton Gamma Tech, Inc. Highly sensitive nuclear spectrometer apparatus and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4880077B1 (ja) * 2011-02-16 2012-02-22 株式会社リガク Ｘ線検出信号処理装置および方法
WO2012111195A1 (ja) * 2011-02-16 2012-08-23 株式会社リガク Ｘ線検出信号処理装置および方法
US8374814B2 (en) 2011-02-16 2013-02-12 Rigaku Corporation X-ray detection signal processing apparatus and method therefor

Also Published As

Publication number Publication date
EP0880821A1 (en) 1998-12-02
WO1997007591A1 (en) 1997-02-27
JPH11510900A (ja) 1999-09-21
DE69631165D1 (de) 2004-01-29
EP0880821B1 (en) 2003-12-17
JP2007163516A (ja) 2007-06-28
EP0880821A4 (en) 2000-03-01
DE69631165T2 (de) 2004-09-02

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