JP4079404B2 - Ｆｔｉｒ法による多成分ガス分析方法 - Google Patents

Ｆｔｉｒ法による多成分ガス分析方法 Download PDF

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Publication number
JP4079404B2
JP4079404B2 JP15849399A JP15849399A JP4079404B2 JP 4079404 B2 JP4079404 B2 JP 4079404B2 JP 15849399 A JP15849399 A JP 15849399A JP 15849399 A JP15849399 A JP 15849399A JP 4079404 B2 JP4079404 B2 JP 4079404B2
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concentration
gas
ftir
component
correction
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JP15849399A
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Japanese (ja)
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JP2000346801A (ja
JP2000346801A5 (enExample
Inventor
香 井上
正之 足立
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Horiba Ltd
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Horiba Ltd
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Priority to JP15849399A priority Critical patent/JP4079404B2/ja
Priority to US09/578,998 priority patent/US6894297B1/en
Priority to DE2000127074 priority patent/DE10027074B4/de
Publication of JP2000346801A publication Critical patent/JP2000346801A/ja
Publication of JP2000346801A5 publication Critical patent/JP2000346801A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G01N2021/3545—Disposition for compensating effect of interfering gases
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP15849399A 1999-06-04 1999-06-04 Ｆｔｉｒ法による多成分ガス分析方法 Expired - Lifetime JP4079404B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP15849399A JP4079404B2 (ja) 1999-06-04 1999-06-04 Ｆｔｉｒ法による多成分ガス分析方法
US09/578,998 US6894297B1 (en) 1999-06-04 2000-05-25 Multi-component gas analyzing method using FTIR
DE2000127074 DE10027074B4 (de) 1999-06-04 2000-05-31 Verfahren zur Analyse von Gasgemischen mit mehreren Komponenten unter Verwendung von FTIR-Spektroskopie

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15849399A JP4079404B2 (ja) 1999-06-04 1999-06-04 Ｆｔｉｒ法による多成分ガス分析方法

Publications (3)

Publication Number Publication Date
JP2000346801A JP2000346801A (ja) 2000-12-15
JP2000346801A5 JP2000346801A5 (enExample) 2005-03-17
JP4079404B2 true JP4079404B2 (ja) 2008-04-23

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JP15849399A Expired - Lifetime JP4079404B2 (ja) 1999-06-04 1999-06-04 Ｆｔｉｒ法による多成分ガス分析方法

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US (1) US6894297B1 (enExample)
JP (1) JP4079404B2 (enExample)
DE (1) DE10027074B4 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10304455B4 (de) * 2003-02-04 2005-04-14 Siemens Ag Verfahren zur Analyse eines Gasgemisches
US9194744B2 (en) 2008-05-16 2015-11-24 University Of Washington Transmission quantification of open path FTIR spectra with temperature compensation
JP5424636B2 (ja) * 2008-12-25 2014-02-26 トヨタ自動車株式会社 Ｆｔｉｒ法を用いたガス分析装置及びこれに用いるプログラム
JP5316143B2 (ja) * 2009-03-23 2013-10-16 トヨタ自動車株式会社 排気ガス分析装置
JP2013113664A (ja) 2011-11-28 2013-06-10 Yokogawa Electric Corp レーザガス分析装置
JP5809961B2 (ja) 2011-12-22 2015-11-11 株式会社堀場製作所 試料ガス分析装置及び試料ガス分析装置用プログラム
CN102680425B (zh) * 2012-03-21 2014-08-06 西安交通大学 多组分气体傅立叶变换光谱分析的多分析模型信息融合方法
JP6128150B2 (ja) * 2015-03-12 2017-05-17 横河電機株式会社 レーザガス分析装置
JP6269576B2 (ja) 2015-05-25 2018-01-31 横河電機株式会社 多成分ガス分析システム及び方法
JP6951167B2 (ja) * 2016-11-29 2021-10-20 株式会社堀場製作所 ガス分析装置及びガス分析方法
EP3654016B1 (en) * 2017-07-14 2022-11-16 Horiba, Ltd. Gas analysis device, program for gas analysis device, and gas analysis method
US11448588B2 (en) 2017-08-07 2022-09-20 Horiba, Ltd. Analyzer, analysis method, analyzer program, and analysis learning device
JP7335727B2 (ja) 2019-06-07 2023-08-30 株式会社堀場製作所 排ガス分析装置、排ガス分析方法、排ガス分析用プログラム及び機械学習装置
WO2021005900A1 (ja) * 2019-07-05 2021-01-14 株式会社堀場製作所 試料ガス分析装置、試料ガス分析方法及び試料ガス分析用プログラム
CN111007033B (zh) * 2019-12-09 2022-08-30 温州大学 基于光谱与功率谱特征融合的痕量乙炔气体浓度检测方法
US20240418638A1 (en) 2021-12-28 2024-12-19 Horiba, Ltd. Machine learning device, exhaust gas analysis device, machine learning method, exhaust gas analysis method, machine learning program, and exhaust gas analysis program
CN115639168B (zh) * 2022-12-21 2023-04-07 杭州泽天春来科技有限公司 气体分析仪的气体检测方法、系统及介质
CN116183541B (zh) * 2023-04-24 2023-06-23 南方电网科学研究院有限责任公司 一种基于ftir技术的气体测量方法及装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2649667B2 (ja) * 1990-06-28 1997-09-03 株式会社堀場製作所 分光分析における多成分分析方法
JP2926277B2 (ja) * 1991-02-16 1999-07-28 株式会社堀場製作所 Ｆｔｉｒを用いた多成分定量分析方法
DE4203587C2 (de) * 1991-02-15 1997-04-17 Horiba Ltd Quantitatives spektralanalytisches Verfahren
JP2926278B2 (ja) * 1991-02-21 1999-07-28 株式会社堀場製作所 分光分析における多成分分析方法
DE4203588C2 (de) 1991-02-16 1996-11-14 Horiba Ltd Quantitatives spektralanalytisches Verfahren
US5138163A (en) 1991-09-09 1992-08-11 Ford Motor Company Direct sampling of engine emissions for instantaneous analysis
JP2741376B2 (ja) * 1992-04-18 1998-04-15 株式会社堀場製作所 分光分析における多成分分析方法
DE4317867A1 (de) 1993-05-28 1994-12-01 Pierburg Gmbh Vorrichtung und Verfahren zur Messung von Brennkraftmaschinen-Abgaskomponenten
GB2320155B (en) * 1996-12-03 2000-11-01 Chelsea Instr Ltd Method and apparatus for the imaging of gases
AUPO425896A0 (en) * 1996-12-18 1997-01-23 University Of Wollongong, The Method and apparatus for measuring gas concentrations and isotope ratios in gases
JP3374077B2 (ja) * 1998-05-12 2003-02-04 株式会社堀場製作所 排気ガスのサンプリング装置
US6422056B1 (en) * 1999-02-05 2002-07-23 Horiba, Ltd. Method for correcting the effect of a effect of a coexistent gas in a gas analysis and a gas analyzing apparatus using same

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Publication number Publication date
JP2000346801A (ja) 2000-12-15
DE10027074B4 (de) 2005-11-24
US6894297B1 (en) 2005-05-17
DE10027074A1 (de) 2001-04-05

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