JP4067875B2 - アクティブマトリクス型発光装置の修理方法及び作製方法 - Google Patents

アクティブマトリクス型発光装置の修理方法及び作製方法 Download PDF

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Publication number
JP4067875B2
JP4067875B2 JP2002157008A JP2002157008A JP4067875B2 JP 4067875 B2 JP4067875 B2 JP 4067875B2 JP 2002157008 A JP2002157008 A JP 2002157008A JP 2002157008 A JP2002157008 A JP 2002157008A JP 4067875 B2 JP4067875 B2 JP 4067875B2
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Prior art keywords
thin film
film transistor
light emitting
reverse bias
pixel electrode
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Expired - Fee Related
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JP2002157008A
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Japanese (ja)
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JP2003051384A5 (https=
JP2003051384A (ja
Inventor
舜平 山崎
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2002157008A priority Critical patent/JP4067875B2/ja
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Publication of JP2003051384A5 publication Critical patent/JP2003051384A5/ja
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits
    • H05B45/58—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits involving end of life detection of LEDs

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Electroluminescent Light Sources (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Control Of El Displays (AREA)
JP2002157008A 2001-06-01 2002-05-30 アクティブマトリクス型発光装置の修理方法及び作製方法 Expired - Fee Related JP4067875B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002157008A JP4067875B2 (ja) 2001-06-01 2002-05-30 アクティブマトリクス型発光装置の修理方法及び作製方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001-167512 2001-06-01
JP2001167512 2001-06-01
JP2002157008A JP4067875B2 (ja) 2001-06-01 2002-05-30 アクティブマトリクス型発光装置の修理方法及び作製方法

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JP2003051384A JP2003051384A (ja) 2003-02-21
JP2003051384A5 JP2003051384A5 (https=) 2005-08-11
JP4067875B2 true JP4067875B2 (ja) 2008-03-26

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JP2002157008A Expired - Fee Related JP4067875B2 (ja) 2001-06-01 2002-05-30 アクティブマトリクス型発光装置の修理方法及び作製方法

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10706755B2 (en) 2018-08-07 2020-07-07 Samsung Display Co., Ltd. Organic light emitting diode display and repairing method thereof

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000031880A (ja) * 1998-07-16 2000-01-28 Kokusai Electric Co Ltd 無線中継装置
US7221095B2 (en) * 2003-06-16 2007-05-22 Semiconductor Energy Laboratory Co., Ltd. Light emitting device and method for fabricating light emitting device
JP2005140827A (ja) * 2003-11-04 2005-06-02 Tohoku Pioneer Corp 発光表示パネルの駆動装置
JP4495952B2 (ja) * 2003-11-25 2010-07-07 東北パイオニア株式会社 有機ｅｌ表示装置及びその駆動方法
JP5227491B2 (ja) * 2003-12-18 2013-07-03 株式会社半導体エネルギー研究所 表示装置
EP1544842B1 (en) 2003-12-18 2018-08-22 Semiconductor Energy Laboratory Co., Ltd. Display device and manufacturing method thereof
JP4860143B2 (ja) * 2003-12-19 2012-01-25 株式会社半導体エネルギー研究所 表示装置
JP4565844B2 (ja) * 2004-01-06 2010-10-20 東北パイオニア株式会社 アクティブマトリクス型発光表示パネルの駆動装置
JP2005242323A (ja) * 2004-01-26 2005-09-08 Semiconductor Energy Lab Co Ltd 表示装置及びその駆動方法
JP4882091B2 (ja) * 2004-04-23 2012-02-22 日本精機株式会社 有機ｅｌパネルの製造方法
JP4850436B2 (ja) * 2004-05-21 2012-01-11 株式会社半導体エネルギー研究所 表示装置及びそれを用いた電子機器
TWI467541B (zh) * 2004-09-16 2015-01-01 半導體能源研究所股份有限公司 顯示裝置和其驅動方法
TWI429327B (zh) 2005-06-30 2014-03-01 Semiconductor Energy Lab 半導體裝置、顯示裝置、及電子設備
JP2007035793A (ja) * 2005-07-25 2007-02-08 Optrex Corp 有機ｌｅｄ素子
JP5250960B2 (ja) * 2006-01-24 2013-07-31 セイコーエプソン株式会社 発光装置および電子機器
JP5316659B2 (ja) * 2006-01-24 2013-10-16 セイコーエプソン株式会社 発光装置および電子機器
JP4626649B2 (ja) * 2007-12-21 2011-02-09 ソニー株式会社 有機発光装置の製造方法
JP5904551B2 (ja) * 2009-05-12 2016-04-13 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 有機発光ダイオード素子の状況を解析するための、及び有機発光ダイオード素子に回復電圧を供給するためのドライバ
US8841928B2 (en) 2009-05-28 2014-09-23 Konica Minolta Holdings, Inc. Organic EL panel inspection method, organic EL panel inspection device, and organic EL panel
JP5494115B2 (ja) 2010-03-29 2014-05-14 ソニー株式会社 表示装置及び電子機器
JP5578136B2 (ja) * 2011-05-24 2014-08-27 株式会社デンソー 有機ｅｌ素子の製造方法
WO2013186961A1 (ja) 2012-06-14 2013-12-19 パナソニック株式会社 欠陥検出方法、有機ｅｌ素子のリペア方法、および有機ｅｌ表示パネル
DE102014112171B4 (de) 2014-08-26 2018-01-25 Osram Oled Gmbh Verfahren zum Erkennen eines Kurzschlusses in einem ersten Leuchtdiodenelement und optoelektronische Baugruppe
JP2016042195A (ja) * 2015-11-12 2016-03-31 株式会社半導体エネルギー研究所 表示装置
JP7048246B2 (ja) * 2017-10-05 2022-04-05 メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング 発光システム
WO2019093492A1 (ja) * 2017-11-09 2019-05-16 コニカミノルタ株式会社 発光部材、発光システム及び発光部材の製造方法
JP6604374B2 (ja) 2017-12-26 2019-11-13 セイコーエプソン株式会社 電気光学装置及び電子機器
WO2024148565A1 (zh) * 2023-01-12 2024-07-18 京东方科技集团股份有限公司 像素电路、驱动控制方法、显示基板和显示装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10706755B2 (en) 2018-08-07 2020-07-07 Samsung Display Co., Ltd. Organic light emitting diode display and repairing method thereof

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