JP4046612B2 - レーザー誘起蛍光量子分析装置と組み合わせた蛍光ｘ線分析装置 - Google Patents

レーザー誘起蛍光量子分析装置と組み合わせた蛍光ｘ線分析装置 Download PDF

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JP4046612B2
JP4046612B2 JP2002588166A JP2002588166A JP4046612B2 JP 4046612 B2 JP4046612 B2 JP 4046612B2 JP 2002588166 A JP2002588166 A JP 2002588166A JP 2002588166 A JP2002588166 A JP 2002588166A JP 4046612 B2 JP4046612 B2 JP 4046612B2
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JP2004528567A (ja
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グロジンス、リー
グロジンズ、ハル
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ニトン・コーポレーション
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2002588166A 2001-05-04 2002-05-03 レーザー誘起蛍光量子分析装置と組み合わせた蛍光ｘ線分析装置 Expired - Lifetime JP4046612B2 (ja)

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US28904201P 2001-05-04 2001-05-04
PCT/US2002/013942 WO2002090955A1 (en) 2001-05-04 2002-05-03 X-ray fluorescence combined with laser induced photon spectroscopy

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JP2004528567A JP2004528567A (ja) 2004-09-16
JP2004528567A5 JP2004528567A5 (https=) 2007-05-10
JP4046612B2 true JP4046612B2 (ja) 2008-02-13

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US (1) US6801595B2 (https=)
EP (1) EP1386145B8 (https=)
JP (1) JP4046612B2 (https=)
WO (1) WO2002090955A1 (https=)

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EP1386145B1 (en) 2012-06-27
US6801595B2 (en) 2004-10-05
JP2004528567A (ja) 2004-09-16
EP1386145B8 (en) 2012-08-29
WO2002090955A1 (en) 2002-11-14
EP1386145A1 (en) 2004-02-04
US20020168045A1 (en) 2002-11-14

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