JP4044983B2 - 電気装置のｅｍｃ試験装置 - Google Patents

電気装置のｅｍｃ試験装置 Download PDF

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Publication number
JP4044983B2
JP4044983B2 JP34888196A JP34888196A JP4044983B2 JP 4044983 B2 JP4044983 B2 JP 4044983B2 JP 34888196 A JP34888196 A JP 34888196A JP 34888196 A JP34888196 A JP 34888196A JP 4044983 B2 JP4044983 B2 JP 4044983B2
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JP
Japan
Prior art keywords
chamber
conductor
impedance
chamber wall
wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP34888196A
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English (en)
Japanese (ja)
Other versions
JPH09196994A5 (OSRAM
JPH09196994A (ja
Inventor
ダンツアイゼン クラウス
ゴエペル クラウス−デイーテル
シユミツト ヴエルネル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Publication of JPH09196994A publication Critical patent/JPH09196994A/ja
Publication of JPH09196994A5 publication Critical patent/JPH09196994A5/ja
Application granted granted Critical
Publication of JP4044983B2 publication Critical patent/JP4044983B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Trip Switchboards (AREA)
  • Tests Of Electronic Circuits (AREA)
JP34888196A 1995-12-29 1996-12-26 電気装置のｅｍｃ試験装置 Expired - Lifetime JP4044983B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19549134A DE19549134B4 (de) 1995-12-29 1995-12-29 Vorrichtung zur EMV-Prüfung von elektrischen Geräten
DE19549134.3 1995-12-29

Publications (3)

Publication Number Publication Date
JPH09196994A JPH09196994A (ja) 1997-07-31
JPH09196994A5 JPH09196994A5 (OSRAM) 2004-08-12
JP4044983B2 true JP4044983B2 (ja) 2008-02-06

Family

ID=7781639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34888196A Expired - Lifetime JP4044983B2 (ja) 1995-12-29 1996-12-26 電気装置のｅｍｃ試験装置

Country Status (4)

Country Link
US (1) US5942903A (OSRAM)
EP (1) EP0782003B1 (OSRAM)
JP (1) JP4044983B2 (OSRAM)
DE (2) DE19549134B4 (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6597184B1 (en) * 1998-08-24 2003-07-22 British Telecommunications Method and apparatus for electromagnetic emissions testing

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2446195A (en) * 1945-03-14 1948-08-03 Us Sec War Tester for electrical shieldings
DE3130487A1 (de) * 1981-07-23 1983-02-10 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Reflexionsarme, geschirmte, metallische simulationskammer fuer elektromagnetische strahlung
DE3731165A1 (de) * 1987-09-17 1989-03-30 Licentia Gmbh Geschirmte zelle zur erzeugung von elektromagnetischen wellen des transversal-elektrischen typs
DE3842196C2 (de) * 1987-09-17 1994-05-05 Deutsche Aerospace Geschirmte Zelle zur Erzeugung von elektromagnetischen Wellen des transversal-elektrischen Typs
DE3931449A1 (de) * 1988-10-22 1990-03-08 Telefunken Systemtechnik Trichterfoermiger wellenleiter mit laufzeitausgleich
DE3925247C2 (de) * 1989-07-29 1994-03-03 Deutsche Aerospace Anordnung zur Erzeugung und zum Empfang definierter Feldstärken
DK0517992T3 (da) * 1991-06-11 1994-05-09 Sispe S R L Et apparat til måling af elektromagnetisk interferens
CA2047999C (en) * 1991-07-30 2000-10-31 Gary A. Gibson Broadband electromagnetic field simulator
US5285164A (en) * 1992-07-30 1994-02-08 Northern Telecom Limited Electromagnetic radiation measurement apparatus
DE4300778A1 (de) * 1993-01-14 1994-07-21 Puls Plasmatechnik Gmbh TEM-Zelle
US5436603A (en) * 1993-09-27 1995-07-25 Fischer Custom Communications, Inc. Transverse electromagnetic cell
DE19549246C1 (de) * 1995-12-21 1997-04-10 Hansen Euro Emc Service Gmbh Verfahren und Vorrichtung zur Erzeugung und zum Empfang elektromagnetischer Wellen zu Prüfzwecken

Also Published As

Publication number Publication date
US5942903A (en) 1999-08-24
DE19549134A1 (de) 1997-07-03
EP0782003B1 (de) 2005-04-20
EP0782003A2 (de) 1997-07-02
DE19549134B4 (de) 2005-04-07
JPH09196994A (ja) 1997-07-31
DE59611220D1 (de) 2005-05-25
EP0782003A3 (de) 1998-04-01

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