JP3957304B2 - Apd光受信器の温度補償装置 - Google Patents
Apd光受信器の温度補償装置 Download PDFInfo
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- JP3957304B2 JP3957304B2 JP2004000626A JP2004000626A JP3957304B2 JP 3957304 B2 JP3957304 B2 JP 3957304B2 JP 2004000626 A JP2004000626 A JP 2004000626A JP 2004000626 A JP2004000626 A JP 2004000626A JP 3957304 B2 JP3957304 B2 JP 3957304B2
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- temperature
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- 230000003287 optical effect Effects 0.000 title claims description 22
- 230000008859 change Effects 0.000 claims description 38
- 238000012544 monitoring process Methods 0.000 claims description 4
- 238000012790 confirmation Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 8
- 230000035945 sensitivity Effects 0.000 description 8
- 230000003321 amplification Effects 0.000 description 7
- 238000003199 nucleic acid amplification method Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000000098 azimuthal photoelectron diffraction Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000006903 response to temperature Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/60—Receivers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/02016—Circuit arrangements of general character for the devices
- H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02027—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier for devices working in avalanche mode
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/25—Arrangements specific to fibre transmission
- H04B10/2507—Arrangements specific to fibre transmission for the reduction or elimination of distortion or dispersion
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
- H02M3/156—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
Description
51 温度感知部
52 抵抗制御部
53 温度−抵抗貯蔵部
54 温度−電圧貯蔵部
55 初期値貯蔵部
56 抵抗値設定部
401 抵抗部
402 制御部
Claims (5)
- APDと、該APDの温度変化を感知するためのサーミスタと、前記APDのバイアス用の出力電圧を生成する電圧生成部と、を備えたAPD光受信器の温度補償装置において、
前記サーミスタと接続されて該サーミスタから第1抵抗値を受信し、この第1抵抗値を利用して前記APDの温度データを決定し、このAPDの温度データに応じた出力電圧データを決定し、この出力電圧データに応じた前記出力電圧を生成するための第2抵抗値データを決定するように制御するための制御手段と、
前記第2抵抗値データに従う第2抵抗値を前記電圧生成部の入力端に提供する抵抗手段と、を備え、
前記制御手段は、
APD光受信器の基準電圧値、第1抵抗値に応じたAPDの温度データ、前記APDの温度データに応じた出力電圧データ、及び前記出力電圧−第2抵抗値間の関係データを含む初期値を貯蔵する第1段階と、
前記APDとサーミスタの間の温度係数が変化したか否かを確認して、変化したときは“Steinhart & hart”式に応じた新たな関係データを貯蔵する第2段階と、
前記サーミスタから前記第1抵抗値を受信して前記APDの温度変化を監視する第3段階と、
前記第3段階の監視結果、前記APDの温度変化が感知されると、前記第1抵抗値に応じた前記APDの温度データ、該APDの温度データに応じた前記出力電圧データ、及び前記出力電圧−第2抵抗値間の関係データを通じて第2抵抗値データを決定する第4段階と、
前記第2抵抗値データを抵抗手段に伝達して該抵抗手段に第2抵抗値を設定する第5段階と、を実行することを特徴とする温度補償装置。 - 制御手段は、
サーミスタと接続されて該サーミスタから第1抵抗値を受信する温度感知手段と、
前記第1抵抗値に応じたAPDの温度データを貯蔵する温度−抵抗貯蔵手段と、
前記APDの温度データに応じた出力電圧データを貯蔵する温度−電圧貯蔵手段と、
基準電圧値及び前記出力電圧−第2抵抗値間の関係データを含む初期値を貯蔵するための初期値貯蔵手段と、
前記温度感知手段から前記第1抵抗値を受信して前記温度−抵抗貯蔵手段に伝達し、該温度−抵抗貯蔵手段から前記第1抵抗値に応じた前記APDの温度データを受信して前記温度−電圧貯蔵手段に伝達し、該温度−電圧貯蔵手段から前記APDの温度データに応じた前記出力電圧データを受信して前記初期値貯蔵手段に伝達し、該初期値貯蔵手段から前記出力電圧に応じた第2抵抗値データを受信するように制御する抵抗制御手段と、
前記抵抗制御手段から前記第2抵抗値データを受信して抵抗手段に伝達する抵抗値設定手段と、を備える請求項1記載の温度補償装置。 - 抵抗手段は、1〜10kΩの範囲で2チャネル256ステップの抵抗値を出力可能なデジタルポテンショメータである請求項1記載の温度補償装置。
- 第2抵抗値データは、“出力電圧/基準電圧”の値にする請求項1〜3のいずれか1項記載の温度補償装置。
- 第2段階の温度係数変化有無は、APDの交換を感知することにより確認する請求項1記載の温度補償装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030000143A KR100566197B1 (ko) | 2003-01-02 | 2003-01-02 | Apd 광수신기의 온도 보상 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2004215274A JP2004215274A (ja) | 2004-07-29 |
JP3957304B2 true JP3957304B2 (ja) | 2007-08-15 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2004000626A Expired - Fee Related JP3957304B2 (ja) | 2003-01-02 | 2004-01-05 | Apd光受信器の温度補償装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7060970B2 (ja) |
JP (1) | JP3957304B2 (ja) |
KR (1) | KR100566197B1 (ja) |
CN (1) | CN1276598C (ja) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7433606B2 (en) * | 2004-06-28 | 2008-10-07 | Jds Uniphase Corporation | Photodiode bias controller for optical receiver |
JP2006041628A (ja) * | 2004-07-22 | 2006-02-09 | Sumitomo Electric Ind Ltd | 光受信回路 |
US7183540B2 (en) * | 2005-03-17 | 2007-02-27 | Fiberxon Inc. | Apparatus for measuring photo diodes' temperature dependence |
US7608815B2 (en) * | 2005-06-30 | 2009-10-27 | Streetlight Intelligence, Inc. | Photo detector with compensated output and method involving same |
CN100432642C (zh) * | 2005-11-23 | 2008-11-12 | 中国科学院物理研究所 | 高集成度纯数控单光子探测器 |
JP5215320B2 (ja) * | 2007-01-08 | 2013-06-19 | アライド テレシス インコーポレーテッド | Apdレシーバの動作点を自動的に調整し設定する方法及びシステム |
KR100854774B1 (ko) * | 2007-01-10 | 2008-08-27 | (주)유니알에프테크 | 포토 다이오드의 온도 보상 회로 및 그 방법 |
US9035773B2 (en) * | 2008-03-27 | 2015-05-19 | Advanced Electronic Tracking | Environment monitoring and recording tag with remote sensing capability |
WO2010073136A2 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | High dynamic range light sensor |
CN101533286A (zh) * | 2009-03-31 | 2009-09-16 | 上海华魏光纤传感技术有限公司 | Apd反偏电压控制系统及方法 |
CN101593786B (zh) * | 2009-06-23 | 2013-04-10 | 上海华魏光纤传感技术有限公司 | 用于雪崩光电二极管的温度补偿电路 |
CN101977023B (zh) * | 2010-09-02 | 2012-07-04 | 索尔思光电(成都)有限公司 | 一种雪崩二极管的调试和补偿方法 |
US9001530B2 (en) * | 2012-06-29 | 2015-04-07 | Finisar Corporation | Integrated circuit with voltage conversion |
KR101334369B1 (ko) * | 2013-03-15 | 2013-11-29 | (주)에이알텍 | 광신호 세기에 따른 역바이어스 전압 가변의 apd 광 수신기 |
KR101448393B1 (ko) * | 2013-06-27 | 2014-10-08 | 단국대학교 천안캠퍼스 산학협력단 | 의료용 레이저 수신단의 apd 이득 안정화 방법 |
US9541656B2 (en) * | 2013-12-20 | 2017-01-10 | General Electric Company | System and method for compensating temperature gain variation in radiation detectors |
CN105759890A (zh) * | 2014-12-16 | 2016-07-13 | 中兴通讯股份有限公司 | 一种雪崩光电二极管偏置电压温度补偿装置及方法 |
US9923642B2 (en) * | 2015-02-23 | 2018-03-20 | Mitsubishi Electric Corporation | Light receiving device |
CN105406912B (zh) * | 2015-12-23 | 2018-12-14 | 上海市共进通信技术有限公司 | 具有apd的光线路终端的rssi上报补偿电路结构 |
US10564299B2 (en) | 2016-05-03 | 2020-02-18 | General Electric Company | Temperature compensation for silicon photomultiplier based detector |
US11262439B2 (en) * | 2016-07-25 | 2022-03-01 | Lg Innotek Co., Ltd. | Light-receiving device and lidar |
CN106020321A (zh) * | 2016-07-31 | 2016-10-12 | 桂林理工大学 | 一种apd阵列芯片偏置电压全自动温度补偿方法 |
CN106094963A (zh) * | 2016-07-31 | 2016-11-09 | 桂林理工大学 | Apd阵列芯片偏置电压全自动温度补偿系统 |
DE102016221863B4 (de) * | 2016-11-08 | 2020-02-27 | Dialog Semiconductor (Uk) Limited | Schaltleistungsversorgung |
KR101740340B1 (ko) | 2016-12-19 | 2017-05-29 | 한림대학교 산학협력단 | 온도 측정 장치 및 그 측정 방법 |
CN108362393A (zh) * | 2017-12-21 | 2018-08-03 | 北京航天控制仪器研究所 | 一种低噪声apd光电转换装置 |
JP7455520B2 (ja) | 2018-12-12 | 2024-03-26 | 浜松ホトニクス株式会社 | 光検出装置 |
WO2020121852A1 (ja) | 2018-12-12 | 2020-06-18 | 浜松ホトニクス株式会社 | 光検出装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JP3839574B2 (ja) * | 1998-01-12 | 2006-11-01 | 株式会社沖コムテック | アバランシェフォトダイオード用バイアス電圧制御回路およびその調整方法 |
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2003
- 2003-01-02 KR KR1020030000143A patent/KR100566197B1/ko not_active IP Right Cessation
- 2003-10-17 US US10/688,496 patent/US7060970B2/en not_active Expired - Fee Related
- 2003-11-14 CN CNB2003101149956A patent/CN1276598C/zh not_active Expired - Fee Related
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2004
- 2004-01-05 JP JP2004000626A patent/JP3957304B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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US20040129863A1 (en) | 2004-07-08 |
KR100566197B1 (ko) | 2006-03-29 |
CN1276598C (zh) | 2006-09-20 |
KR20040062334A (ko) | 2004-07-07 |
CN1516362A (zh) | 2004-07-28 |
JP2004215274A (ja) | 2004-07-29 |
US7060970B2 (en) | 2006-06-13 |
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