JP3884996B2 - 投影光学系における保持装置、該保持装置による光学調整方法、該保持装置を有する露光装置、露光方法、デバイス製造方法 - Google Patents

投影光学系における保持装置、該保持装置による光学調整方法、該保持装置を有する露光装置、露光方法、デバイス製造方法 Download PDF

Info

Publication number
JP3884996B2
JP3884996B2 JP2002174904A JP2002174904A JP3884996B2 JP 3884996 B2 JP3884996 B2 JP 3884996B2 JP 2002174904 A JP2002174904 A JP 2002174904A JP 2002174904 A JP2002174904 A JP 2002174904A JP 3884996 B2 JP3884996 B2 JP 3884996B2
Authority
JP
Japan
Prior art keywords
holding member
optical system
respect
holding
holding device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002174904A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004020868A (ja
JP2004020868A5 (enExample
Inventor
正彦 小川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2002174904A priority Critical patent/JP3884996B2/ja
Priority to US10/461,843 priority patent/US7016126B2/en
Publication of JP2004020868A publication Critical patent/JP2004020868A/ja
Publication of JP2004020868A5 publication Critical patent/JP2004020868A5/ja
Application granted granted Critical
Publication of JP3884996B2 publication Critical patent/JP3884996B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70825Mounting of individual elements, e.g. mounts, holders or supports
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/021Mountings, adjusting means, or light-tight connections, for optical elements for lenses for more than one lens
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/023Mountings, adjusting means, or light-tight connections, for optical elements for lenses permitting adjustment

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Lenses (AREA)
  • Lens Barrels (AREA)
JP2002174904A 2002-06-14 2002-06-14 投影光学系における保持装置、該保持装置による光学調整方法、該保持装置を有する露光装置、露光方法、デバイス製造方法 Expired - Fee Related JP3884996B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002174904A JP3884996B2 (ja) 2002-06-14 2002-06-14 投影光学系における保持装置、該保持装置による光学調整方法、該保持装置を有する露光装置、露光方法、デバイス製造方法
US10/461,843 US7016126B2 (en) 2002-06-14 2003-06-13 Optical element holding system in projection optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002174904A JP3884996B2 (ja) 2002-06-14 2002-06-14 投影光学系における保持装置、該保持装置による光学調整方法、該保持装置を有する露光装置、露光方法、デバイス製造方法

Publications (3)

Publication Number Publication Date
JP2004020868A JP2004020868A (ja) 2004-01-22
JP2004020868A5 JP2004020868A5 (enExample) 2005-06-16
JP3884996B2 true JP3884996B2 (ja) 2007-02-21

Family

ID=31173751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002174904A Expired - Fee Related JP3884996B2 (ja) 2002-06-14 2002-06-14 投影光学系における保持装置、該保持装置による光学調整方法、該保持装置を有する露光装置、露光方法、デバイス製造方法

Country Status (2)

Country Link
US (1) US7016126B2 (enExample)
JP (1) JP3884996B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7726811B2 (en) * 2006-02-14 2010-06-01 Lai Shui T Subjective wavefront refraction using continuously adjustable wave plates of Zernike function
SG185313A1 (en) * 2007-10-16 2012-11-29 Nikon Corp Illumination optical system, exposure apparatus, and device manufacturing method
CN106094155B (zh) * 2016-07-20 2018-10-30 瑞声科技(新加坡)有限公司 成像镜头

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1027743A (ja) * 1996-07-11 1998-01-27 Canon Inc 投影露光装置、デバイス製造方法及び収差補正光学系
JPH1054932A (ja) * 1996-08-08 1998-02-24 Nikon Corp 投影光学装置及びそれを装着した投影露光装置
US6179208B1 (en) * 1997-01-31 2001-01-30 Metanetics Corporation Portable data collection device with variable focusing module for optic assembly
JPH11121322A (ja) * 1997-10-09 1999-04-30 Nikon Corp 投影露光装置及び方法
US6924937B2 (en) * 1998-11-16 2005-08-02 Canon Kabushiki Kaisha Aberration correcting optical system

Also Published As

Publication number Publication date
US7016126B2 (en) 2006-03-21
US20040257680A1 (en) 2004-12-23
JP2004020868A (ja) 2004-01-22

Similar Documents

Publication Publication Date Title
US7154684B2 (en) Optical element holding apparatus
US6559925B2 (en) Projection exposure apparatus and method
US6172373B1 (en) Stage apparatus with improved positioning capability
CN100517569C (zh) 光学特性测量装置及方法、曝光装置及方法及组件制造方法
JPH1054932A (ja) 投影光学装置及びそれを装着した投影露光装置
JP2013528454A (ja) 傾斜された位相格子構造
TW200905157A (en) Measuring method, exposure method, and device fabricating method
TWI417508B (zh) 面位置檢測裝置、曝光裝置以及元件製造方法
JP4692862B2 (ja) 検査装置、該検査装置を備えた露光装置、およびマイクロデバイスの製造方法
JP4134566B2 (ja) 光学要素の位置決め方法及び装置、投影光学系、並びに露光装置
KR20150143661A (ko) 광학 조립체에서의 스택킹 소자 왜곡을 최소화하는 방법
US20080204904A1 (en) Optical element holding apparatus
KR100916250B1 (ko) 광학요소 유지장치
JP3884996B2 (ja) 投影光学系における保持装置、該保持装置による光学調整方法、該保持装置を有する露光装置、露光方法、デバイス製造方法
US6947122B2 (en) Scanning exposure apparatus and method
US7589911B2 (en) Technique for positioning optical system element
US20090244505A1 (en) Positioning unit of optical element, optical system, exposure apparatus, adjustment method of optical system
JP3666606B2 (ja) 投影露光装置
KR20090129348A (ko) 변형기구, 노광장치 및 디바이스 제조방법
JP4798489B2 (ja) 光学特性計測方法及び装置、並びに露光装置
JP4174262B2 (ja) 光学要素の支持構造、光学系、光学系の調整方法、露光装置、露光方法、半導体デバイス製造方法
JP2011164295A (ja) 光学装置、光学素子交換装置、及び露光装置
TW200935041A (en) Measurement apparatus, exposure apparatus, and device manufacturing method
JP4373858B2 (ja) ディクリネーション角の測定方法
JP2000195778A (ja) 露光装置及びテレセントリシティ―ムラ補正部材の製造方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040922

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040922

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20051221

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20060526

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060725

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20060821

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060919

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20061026

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20061114

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20061120

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101124

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101124

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111124

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121124

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131124

Year of fee payment: 7

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: R3D03

LAPS Cancellation because of no payment of annual fees