JP3856511B2 - ポジトロンct装置用ガントリ - Google Patents
ポジトロンct装置用ガントリ Download PDFInfo
- Publication number
- JP3856511B2 JP3856511B2 JP33309496A JP33309496A JP3856511B2 JP 3856511 B2 JP3856511 B2 JP 3856511B2 JP 33309496 A JP33309496 A JP 33309496A JP 33309496 A JP33309496 A JP 33309496A JP 3856511 B2 JP3856511 B2 JP 3856511B2
- Authority
- JP
- Japan
- Prior art keywords
- gantry
- air
- detector
- detector unit
- electronic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001816 cooling Methods 0.000 claims description 84
- 230000005855 radiation Effects 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 13
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 230000035945 sensitivity Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 230000020169 heat generation Effects 0.000 description 3
- 210000004556 brain Anatomy 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229940121896 radiopharmaceutical Drugs 0.000 description 2
- 239000012217 radiopharmaceutical Substances 0.000 description 2
- 230000002799 radiopharmaceutical effect Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium dioxide Chemical compound O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000002503 metabolic effect Effects 0.000 description 1
- 230000004060 metabolic process Effects 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
Images
Landscapes
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Nuclear Medicine (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33309496A JP3856511B2 (ja) | 1996-11-29 | 1996-11-29 | ポジトロンct装置用ガントリ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33309496A JP3856511B2 (ja) | 1996-11-29 | 1996-11-29 | ポジトロンct装置用ガントリ |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH10160847A JPH10160847A (ja) | 1998-06-19 |
| JPH10160847A5 JPH10160847A5 (enExample) | 2004-11-18 |
| JP3856511B2 true JP3856511B2 (ja) | 2006-12-13 |
Family
ID=18262217
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP33309496A Expired - Fee Related JP3856511B2 (ja) | 1996-11-29 | 1996-11-29 | ポジトロンct装置用ガントリ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3856511B2 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7065173B2 (en) * | 2003-12-02 | 2006-06-20 | General Electric Company | Method and apparatus for thermal management of CT electronics |
| JP4365762B2 (ja) | 2004-09-30 | 2009-11-18 | 株式会社日立製作所 | 核医学診断装置および核医学診断装置の冷却方法 |
| DE102004055752B4 (de) * | 2004-11-18 | 2007-12-13 | Siemens Ag | Computertomograph |
| JP4764050B2 (ja) * | 2005-03-31 | 2011-08-31 | 株式会社日立製作所 | 核医学診断装置および核医学診断装置の冷却方法 |
| JP3942188B2 (ja) | 2005-09-30 | 2007-07-11 | 株式会社日立製作所 | 核医学診断装置、陽電子放出型断層撮影装置及び検出器ユニット |
| JP2007101234A (ja) * | 2005-09-30 | 2007-04-19 | Hitachi Ltd | 核医学診断装置および核医学診断装置の冷却方法 |
| JP2007101556A (ja) * | 2006-12-04 | 2007-04-19 | Hitachi Ltd | 核医学診断装置、陽電子放出型断層撮影装置及び検出器ユニット |
| CN101877999B (zh) * | 2007-11-30 | 2012-11-21 | 皇家飞利浦电子股份有限公司 | 扫描架冷却 |
| JP5972554B2 (ja) * | 2011-11-15 | 2016-08-17 | 東芝メディカルシステムズ株式会社 | 核医学診断装置 |
| JP6312980B2 (ja) * | 2012-10-03 | 2018-04-18 | キヤノンメディカルシステムズ株式会社 | X線ct装置 |
| KR101722689B1 (ko) * | 2015-02-12 | 2017-04-03 | 삼성전자주식회사 | 냉각 ct 시스템 |
| KR101686636B1 (ko) * | 2015-02-12 | 2016-12-14 | 삼성전자주식회사 | 냉각 ct 시스템 |
| JP6498719B2 (ja) * | 2017-04-28 | 2019-04-10 | キヤノンメディカルシステムズ株式会社 | X線ct装置 |
| CN115551412B (zh) * | 2020-05-19 | 2025-09-09 | 美国西门子医疗系统股份有限公司 | 空气冷却式pet扫描仪龙门架 |
-
1996
- 1996-11-29 JP JP33309496A patent/JP3856511B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH10160847A (ja) | 1998-06-19 |
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