JP3839658B2 - Ｘ線検査装置 - Google Patents
Ｘ線検査装置 Download PDFInfo
- Publication number
- JP3839658B2 JP3839658B2 JP2000343175A JP2000343175A JP3839658B2 JP 3839658 B2 JP3839658 B2 JP 3839658B2 JP 2000343175 A JP2000343175 A JP 2000343175A JP 2000343175 A JP2000343175 A JP 2000343175A JP 3839658 B2 JP3839658 B2 JP 3839658B2
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- JP
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- Prior art keywords
- article
- ray
- inspection apparatus
- ray inspection
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 238000007689 inspection Methods 0.000 title claims description 92
- 238000012545 processing Methods 0.000 claims description 56
- 230000007246 mechanism Effects 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 10
- 230000007723 transport mechanism Effects 0.000 claims description 6
- 238000011109 contamination Methods 0.000 claims description 4
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 18
- 238000012360 testing method Methods 0.000 description 16
- 230000002950 deficient Effects 0.000 description 10
- 230000007547 defect Effects 0.000 description 9
- 238000009826 distribution Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 230000032258 transport Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 235000013305 food Nutrition 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 238000003702 image correction Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001502 supplementing effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Images
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- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000343175A JP3839658B2 (ja) | 2000-11-10 | 2000-11-10 | Ｘ線検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000343175A JP3839658B2 (ja) | 2000-11-10 | 2000-11-10 | Ｘ線検査装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002148212A JP2002148212A (ja) | 2002-05-22 |
| JP2002148212A5 JP2002148212A5 (enExample) | 2006-06-29 |
| JP3839658B2 true JP3839658B2 (ja) | 2006-11-01 |
Family
ID=18817582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000343175A Expired - Fee Related JP3839658B2 (ja) | 2000-11-10 | 2000-11-10 | Ｘ線検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3839658B2 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1906480B (zh) | 2004-06-24 | 2012-08-08 | 株式会社石田 | X射线检查装置和x射线检查装置的图像处理顺序的生成方法 |
| JP4519789B2 (ja) * | 2006-03-01 | 2010-08-04 | アンリツ産機システム株式会社 | Ｘ線検査装置 |
| JP4444240B2 (ja) * | 2006-06-15 | 2010-03-31 | アンリツ産機システム株式会社 | Ｘ線異物検出装置 |
| JP5156546B2 (ja) * | 2008-08-28 | 2013-03-06 | 株式会社イシダ | Ｘ線検査装置 |
| KR101321378B1 (ko) * | 2013-04-10 | 2013-10-23 | (주)자비스 | 컨베이어를 이용한 모바일 기기 엑스레이검사 방법 |
| JP6757970B2 (ja) * | 2016-09-20 | 2020-09-23 | 株式会社イシダ | 光検査装置及び光検査方法 |
| JP6655570B2 (ja) * | 2017-03-07 | 2020-02-26 | アンリツインフィビス株式会社 | 物品検査装置およびその検査対象品種切替方法 |
| JP7499097B2 (ja) * | 2019-12-20 | 2024-06-13 | 株式会社エー・アンド・デイ | Ｘ線検査方法および装置 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1998011456A1 (fr) * | 1996-09-12 | 1998-03-19 | Anritsu Corporation | Appareil pour detecter la presence d'un corps etranger avec une grande selectivite et une grande sensibilite par traitement d'image |
| JP2000135268A (ja) * | 1998-08-26 | 2000-05-16 | Yuyama Seisakusho:Kk | 錠剤検査装置 |
| JP3339431B2 (ja) * | 1998-11-11 | 2002-10-28 | 株式会社日立製作所 | 制御対象モデル構築方法および制御対象応答範囲表示方法、ならびにそのシステム |
-
2000
- 2000-11-10 JP JP2000343175A patent/JP3839658B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2002148212A (ja) | 2002-05-22 |
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