JP3820972B2 - Ｐｅｔ装置 - Google Patents

Ｐｅｔ装置 Download PDF

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Publication number
JP3820972B2
JP3820972B2 JP2001368062A JP2001368062A JP3820972B2 JP 3820972 B2 JP3820972 B2 JP 3820972B2 JP 2001368062 A JP2001368062 A JP 2001368062A JP 2001368062 A JP2001368062 A JP 2001368062A JP 3820972 B2 JP3820972 B2 JP 3820972B2
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JP
Japan
Prior art keywords
radiation detector
ray
radiation
rays
semiconductor radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001368062A
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English (en)
Japanese (ja)
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JP2003167058A (ja
JP2003167058A5 (enrdf_load_stackoverflow
Inventor
進一 小嶋
隆司 岡崎
雄一郎 上野
菊男 梅垣
健介 雨宮
一浩 竹内
博司 北口
一磨 横井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2001368062A priority Critical patent/JP3820972B2/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to EP02022577A priority patent/EP1316818A3/en
Priority to US10/270,151 priority patent/US7297958B2/en
Priority to KR1020020075891A priority patent/KR20030045619A/ko
Publication of JP2003167058A publication Critical patent/JP2003167058A/ja
Priority to US10/815,662 priority patent/US7026622B2/en
Priority to US11/050,689 priority patent/US20050127302A1/en
Publication of JP2003167058A5 publication Critical patent/JP2003167058A5/ja
Priority to US11/375,598 priority patent/US20060214110A1/en
Application granted granted Critical
Publication of JP3820972B2 publication Critical patent/JP3820972B2/ja
Priority to US11/907,115 priority patent/US7627082B2/en
Priority to US12/331,299 priority patent/US7634048B2/en
Priority to US12/614,933 priority patent/US7986763B2/en
Priority to US13/165,367 priority patent/US8116427B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/612—Specific applications or type of materials biological material

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  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Nuclear Medicine (AREA)
JP2001368062A 2001-12-03 2001-12-03 Ｐｅｔ装置 Expired - Fee Related JP3820972B2 (ja)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP2001368062A JP3820972B2 (ja) 2001-12-03 2001-12-03 Ｐｅｔ装置
EP02022577A EP1316818A3 (en) 2001-12-03 2002-10-08 Radiological imaging apparatus
US10/270,151 US7297958B2 (en) 2001-12-03 2002-10-15 Radiological imaging apparatus
KR1020020075891A KR20030045619A (ko) 2001-12-03 2002-12-02 방사선 검사장치
US10/815,662 US7026622B2 (en) 2001-12-03 2004-04-02 Radiological imaging apparatus
US11/050,689 US20050127302A1 (en) 2001-12-03 2005-02-07 Radiological imaging apparatus
US11/375,598 US20060214110A1 (en) 2001-12-03 2006-03-15 Radiological imaging apparatus
US11/907,115 US7627082B2 (en) 2001-12-03 2007-10-09 Radiological imaging apparatus
US12/331,299 US7634048B2 (en) 2001-12-03 2008-12-09 Radiological imaging apparatus
US12/614,933 US7986763B2 (en) 2001-12-03 2009-11-09 Radiological imaging apparatus
US13/165,367 US8116427B2 (en) 2001-12-03 2011-06-21 Radiological imaging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001368062A JP3820972B2 (ja) 2001-12-03 2001-12-03 Ｐｅｔ装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2005156550A Division JP4321492B2 (ja) 2005-05-30 2005-05-30 放射線検査装置

Publications (3)

Publication Number Publication Date
JP2003167058A JP2003167058A (ja) 2003-06-13
JP2003167058A5 JP2003167058A5 (enrdf_load_stackoverflow) 2005-08-18
JP3820972B2 true JP3820972B2 (ja) 2006-09-13

Family

ID=19177708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001368062A Expired - Fee Related JP3820972B2 (ja) 2001-12-03 2001-12-03 Ｐｅｔ装置

Country Status (1)

Country Link
JP (1) JP3820972B2 (enrdf_load_stackoverflow)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4082324B2 (ja) * 2003-09-30 2008-04-30 株式会社日立製作所 陽電子放出型ｃｔ装置
JP3863873B2 (ja) 2003-09-30 2006-12-27 株式会社日立製作所 放射線検査装置
JP3863872B2 (ja) 2003-09-30 2006-12-27 株式会社日立製作所 陽電子放出型断層撮影装置
JP2005106692A (ja) 2003-09-30 2005-04-21 Hitachi Ltd 半導体放射線検出器及び放射線撮像装置
JP4303603B2 (ja) 2004-01-13 2009-07-29 株式会社日立製作所 核医学診断装置、及びその検出器ユニット
JP3828896B2 (ja) 2004-03-11 2006-10-04 株式会社日立製作所 陽電子放出型断層撮影装置
JP3792708B1 (ja) 2005-02-22 2006-07-05 株式会社日立製作所 核医学診断装置及び陽電子放出断層撮影装置
KR100715803B1 (ko) 2005-04-15 2007-05-10 재단법인서울대학교산학협력재단 3개 이상의 결정층이 형성된 섬광검출기 및 이를 이용한양전자 방출 단층촬영장치
JP3858044B1 (ja) 2005-09-09 2006-12-13 株式会社日立製作所 放射線検出モジュール、プリント基板および陽電子放出型断層撮影装置
JP2007178364A (ja) * 2005-12-28 2007-07-12 Hitachi Ltd 核医学診断装置
JP5148066B2 (ja) * 2006-02-08 2013-02-20 株式会社東芝 核医学装置
JP4834427B2 (ja) * 2006-03-06 2011-12-14 株式会社日立製作所 放射線検出モジュール、プリント基板および核医学診断装置
DE102006015451A1 (de) * 2006-03-31 2007-10-11 Siemens Ag Verfahren und Vorrichtung zur automatischen Differenzierung von Knochen oder anderen kalziumhaltigen Materialien und Kontrastmittel in Weichteilgewebe
RU2445647C2 (ru) * 2006-11-17 2012-03-20 Конинклейке Филипс Электроникс Н.В. Детектор излучения с несколькими электродами на чувствительном слое
JP4976874B2 (ja) * 2007-02-02 2012-07-18 株式会社日立製作所 核医学診断装置
JP5574148B2 (ja) * 2008-12-01 2014-08-20 独立行政法人放射線医学総合研究所 γ線を放出する陽電子崩壊核種の放射能絶対測定方法、放射線検出器集合体の検出効率決定方法、及び、放射線測定装置の校正方法
JP6301076B2 (ja) * 2013-07-11 2018-03-28 キヤノンメディカルシステムズ株式会社 核医学診断装置および画像処理プログラム
US10468383B2 (en) 2015-01-16 2019-11-05 Makoto Shizukuishi Semiconductor device and manufacturing method thereof
EP3374803B1 (en) * 2015-11-12 2020-04-01 Prismatic Sensors AB High-resolution computed tomography using edge-on detectors with temporally offset depth-segments
CN115631232B (zh) * 2022-11-02 2023-07-25 佛山读图科技有限公司 一种确定双探头探测器径向位置方法

Also Published As

Publication number Publication date
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