JP3454876B2 - Laminated conductor and method of manufacturing the same - Google Patents

Laminated conductor and method of manufacturing the same

Info

Publication number
JP3454876B2
JP3454876B2 JP23731893A JP23731893A JP3454876B2 JP 3454876 B2 JP3454876 B2 JP 3454876B2 JP 23731893 A JP23731893 A JP 23731893A JP 23731893 A JP23731893 A JP 23731893A JP 3454876 B2 JP3454876 B2 JP 3454876B2
Authority
JP
Japan
Prior art keywords
conductor
layer
alloy
tape
laminated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP23731893A
Other languages
Japanese (ja)
Other versions
JPH0765630A (en
Inventor
光一 手島
充裕 富田
新一 中村
道彦 稲葉
正明 森田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP23731893A priority Critical patent/JP3454876B2/en
Publication of JPH0765630A publication Critical patent/JPH0765630A/en
Application granted granted Critical
Publication of JP3454876B2 publication Critical patent/JP3454876B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
  • Laminated Bodies (AREA)
  • Wire Bonding (AREA)
  • Non-Insulated Conductors (AREA)
  • Manufacturing Of Electric Cables (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、たとえばフレキシブル
なプリント配線基板の形成用、あるいは TAB(Tape Aut
omated Bonding) 用に適する積層導体に係り、特に絶縁
フィルムなどとの接合を容易に成し得、かつ微細な導体
パターンの形成に適するテープ型の積層導体およびその
製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is applicable to, for example, formation of a flexible printed wiring board or TAB (Tape Aut
The present invention relates to a laminated conductor suitable for omated bonding, and more particularly to a tape-type laminated conductor that can be easily bonded to an insulating film and the like and is suitable for forming a fine conductor pattern, and a method for manufacturing the same.

【0002】[0002]

【従来の技術】たとえば、電子回路の構成において、屈
曲可動(可撓性)を要求される配線部の構成に、いわゆ
るフレキシブルプリント配線基板が一般に使用されてい
る。また、たとえばパーソナルコンピュータ、ワードプ
ロセッサ、あるいはテレビジョンにおいて、表示機能を
果たす液晶表示装置の駆動回路部品、または電子手帳や
関数電卓の回路構成などの広い分野で、半導体素子のテ
ープキャリヤパッケージが、ASIC用多ピンパッケージと
して使用されつつある。そして、前記テープキャリヤパ
ッケージないし TAB型の半導体素子(装置)は、所要の
リードパターンを所定の間隔で形成して成るいわゆるキ
ャリヤテープを連続的に搬送させながら、順次所定の半
導体素子をボンディング(装着)することによって、量
産的に製造もしくは構成し得るという利点と相俟って、
多くの関心が寄せられるとともに、その実用化も推進さ
れている。
2. Description of the Related Art For example, in a structure of an electronic circuit, a so-called flexible printed wiring board is generally used for a structure of a wiring portion which is required to be bendable (flexible). Also, for example, in a personal computer, a word processor, or a television, in a wide field such as a drive circuit component of a liquid crystal display device that performs a display function or a circuit structure of an electronic notebook or a scientific calculator, a tape carrier package of a semiconductor element is used for an ASIC. It is being used as a multi-pin package. The tape carrier package or the TAB type semiconductor device (device) is formed by bonding (mounting) predetermined semiconductor devices in sequence while continuously carrying a so-called carrier tape formed by forming required lead patterns at predetermined intervals. ), Combined with the advantage that it can be mass-produced or constructed,
A lot of interest has been received and its practical application is being promoted.

【0003】ところで、前記フレキシブルプリント配線
基板、もしくはキャリヤテープは、たとえばポリイミド
樹脂フィルムなど、半田ディップ後の強度劣化が少な
く、かつ柔軟性を有する絶縁性フイルム(絶縁性基体)
面に、銅箔などの導電体フィルムを張り合わせ一体化し
て成る積層導体を素材として形成されている。すなわ
ち、前記構成の銅箔張りテープ(積層導体)の銅箔を、
たとえば選択的にホトエッチングして、所要の配線パタ
ーン群など形成することにより、またはインナリードお
よびアウトリードから成るリードパターンを互いに離隔
して形成することによって製造している。
By the way, the flexible printed wiring board or the carrier tape is an insulating film (insulating substrate), such as a polyimide resin film, which has little strength deterioration after solder dipping and is flexible.
The surface is formed of a laminated conductor formed by laminating a conductor film such as a copper foil and integrating the conductor film. That is, the copper foil of the copper foil-clad tape (laminated conductor) having the above configuration is
For example, it is manufactured by selectively photoetching to form a required wiring pattern group or the like, or by forming lead patterns including inner leads and out leads apart from each other.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記構
成の銅箔を張り合わせ一体化して成る銅箔張りテープ
(積層導体)の場合は、実用上次のような問題がある。
すなわち、前記張り合わせられている銅箔は、機械的強
度や絶縁性フイルムとの接着強度が劣り、また結晶粒も
比較的大きいので、ミクロンオーダーのエッチングに対
して異方性を伴うため、ファインパターン化(微細パタ
ーン化)が困難であるという問題がある。さらに詳述す
ると、配線パターン化、もしくはリードパターン化に当
たって、銅箔のエッチング性が劣るので、狭ピッチに幅
の狭い配線パターンやリードパターンを互いに絶縁・離
隔して形成するいわゆる配線パターンやリードパターン
の微細化が非常に困難である。つまり、配線パターンの
高密度化、もしくはテープキャリヤパッケージのコンパ
クト化ないし多ピン型大容量化などに、十分に対応し得
ないことになる。
However, in the case of a copper foil-clad tape (laminated conductor) formed by laminating and integrating the copper foils having the above structure, there are practical problems as follows.
That is, the laminated copper foil is inferior in mechanical strength and adhesive strength to the insulating film, and since the crystal grains are relatively large, anisotropy is associated with etching on a micron order, so that a fine pattern is obtained. However, there is a problem that it is difficult to make the pattern (fine patterning). More specifically, since the copper foil is inferior in etching property when forming a wiring pattern or a lead pattern, a so-called wiring pattern or lead pattern in which a narrow wiring pattern or a lead pattern having a narrow pitch is formed so as to be insulated and separated from each other. Is very difficult to miniaturize. That is, it is not possible to sufficiently cope with the high density of the wiring pattern, the compact size of the tape carrier package, the large capacity of the multi-pin type, and the like.

【0005】この配線パターンやリードパターンの微細
化に対しては、銅箔の厚さを薄くする手段もあるが、形
成したリードパターンの強度ないし硬度が低下するた
め、折れ曲がり時に変形もしくは切断を起こし易くなっ
て、導通の信頼性が損なわれるという問題がある。特
に、前記リードパターンの硬度不足などは、リードパタ
ーンの型崩れなど生じ易く、自動実装の場合、電気的な
接続の信頼性で問題を起こす恐れが多分ある。
For the miniaturization of the wiring pattern and the lead pattern, there is a means of reducing the thickness of the copper foil, but since the strength or hardness of the formed lead pattern is lowered, the lead pattern is deformed or cut at the time of bending. There is a problem that it becomes easier and the reliability of conduction is impaired. In particular, when the hardness of the lead pattern is insufficient, the lead pattern is likely to lose its shape, and in the case of automatic mounting, there is a possibility of causing a problem in reliability of electrical connection.

【0006】さらに、前記絶縁性フイルム面に対する接
着強度の低さは、エッチングによる配線パターン化やリ
ードパターン化の作業の困難さを招来するとともに、パ
ターンが微細化した場合など、容易に剥離するなどして
所要の機能を果たし得ないという問題がある。そして、
この接着性の問題は、たとえばキャリヤテープに所要の
半導体素子を搭載・ボンディングした後、樹脂モールド
した場合など、気密ないし液密な封じ性を呈し得ないと
いう不都合も招来する。
Further, the low adhesive strength to the insulating film surface causes a difficulty in forming wiring patterns and lead patterns by etching, and easily peels off when the pattern is miniaturized. Then, there is a problem that the required function cannot be performed. And
This problem of adhesiveness also brings about a disadvantage that the airtight or liquid-tight sealing property cannot be exhibited, for example, when a required semiconductor element is mounted and bonded on a carrier tape and then resin-molded.

【0007】本発明は上記事情に対処してなされたもの
で、絶縁性フィルムとの接合など容易に成し得るととも
に、良好な機械的強度や接合性を有し信頼性の高いファ
インパターンを高精度に、かつ再現性よく形成すること
が可能な積層導体およびその製造方法の提供を目的とす
る。
The present invention has been made in consideration of the above circumstances, and can easily form a bond with an insulating film and has a fine pattern with high reliability having good mechanical strength and bondability. An object of the present invention is to provide a laminated conductor that can be formed with high precision and reproducibility, and a method for manufacturing the same.

【0008】[0008]

【課題を解決するための手段】本発明に係る積層導体
は、絶縁性テープ本体と、前記絶縁性テープ本体の少な
くとも一方の主面に一体的に接合されたCr,Zr,Ti
ら選ばれる添加元素を重量比で0.01〜1.5%、および不
可避的な不純物を含有するCu合金から成る導電体層とを
具備し、前記添加元素はCrおよびZrを必須成分とし、
記導電体層は絶縁性テープ本体の接合面側が少なくとも
Cr,Zr成分リッチなCu合金層を成し、かつ酸化層を有
していることを特徴とする。
A laminated conductor according to the present invention comprises an insulative tape body and a Cr, Zr, Ti body integrally bonded to at least one main surface of the insulative tape body .
0.01 to 1.5% by weight of an additive element selected from , and a conductor layer comprising a Cu alloy containing unavoidable impurities, the additive element Cr and Zr as an essential component, the conductor layer Is at least on the bonding surface side of the insulating tape body.
Cr, Zr component forms a rich Cu alloy layer, and characterized in that it has an oxidation layer.

【0009】また、本発明に係る積層導体の製造方法
は、Cr,Zr,Tiから選ばれる添加元素(ただしCrおよび
Zrを必須成分とする)を重量比で0.01〜1.5%、および
不可避的な不純物を含有するCu合金から成る導電体フィ
ルムを硝酸水溶液で表面処理して、表面領域少なくと
Cr,Zr成分リッチなCu合金層化し、かつ酸化層を生
成させる工程と、前記導電体フィルムの前記硝酸水溶液
で表面処理した一方の処理面を前記絶縁性テープ本体
主面に接合一体化する工程とを具備することを特徴とす
る。
In addition, the method for producing a laminated conductor according to the present invention, the additive element selected from Cr, Zr, Ti (provided that Cr and Zr
0.01 to 1.5% and is referred to as essential components) Zr weight ratio, and a conductive film made of Cu alloy containing unavoidable impurities to a surface treatment with a nitric acid aqueous solution, the less surface area
A step also the Cr, Zr components are rich Cu alloy stratification, and to produce the oxide layer, the nitric acid aqueous solution of the conductor film
Characterized in that the in the surface-treated one treated surface and a step of integrally bonded to <br/> main surface of the insulating tape body.

【0010】本発明において、添加元素(Cr,Ti,Zrの
少なくとも1種)の組成比が重量比で0.01%未満では硬
度が不足し、また前記上限値を超えると熱間圧延性を低
下させるとともに、所要の導電性を呈しないので、前記
の範囲内で選択される必要がある。その他、圧延加工性
や導電性を改善するため、たとえば 0.005〜0.5wt %程
度のSi,Geなどを添加することも可能である。また、絶
縁体に対する密着性など考慮した場合、所要の密着強度
(耐剥離性) 1.0kg/cm以上を得るため、前記積層導体
の導電体フィルム表面を、硝酸水溶液で処理して、極表
面のCu成分の一部を除去し、添加元素(Cr,Zr,Tiの1種
以上)リッチ層化させる一方、前記添加元素を含む酸化
銅系膜(層)を予め生成させて(形成して)おく必要が
ある。ここで、前記酸化物の形成により、絶縁性基体
(絶縁性フイルム)、たとえばポリイミド樹脂テープに
対する良好な接着性に寄与し、工業的にも製造が容易
で、かつ信頼性の高い積層導体を構成・保持することが
できる。
In the present invention, if the composition ratio of the additional element (at least one of Cr, Ti and Zr) is less than 0.01% by weight, the hardness is insufficient, and if it exceeds the upper limit, the hot rolling property is deteriorated. In addition, since it does not exhibit the required conductivity, it must be selected within the above range. In addition, in order to improve rolling workability and conductivity, it is possible to add, for example, 0.005 to 0.5 wt% of Si or Ge. In addition, in consideration of the adhesion to the insulator, in order to obtain the required adhesion strength (peeling resistance) of 1.0 kg / cm or more, the conductor film surface of the laminated conductor is treated with a nitric acid aqueous solution, Part of the Cu component is removed to make an additive element (one or more of Cr, Zr, and Ti) rich layer, while a copper oxide-based film (layer) containing the additive element is generated (formed) in advance. I need to put it. Here, the formation of the oxide contributes to good adhesiveness to an insulating substrate (insulating film), for example, a polyimide resin tape, and constitutes a laminated conductor which is industrially easy to manufacture and has high reliability.・ Can be held.

【0011】なお、上記本発明は次のような知見に基づ
いて成されたものである。すなわち、Cr,Ti,Zrの少な
くとも1種を重量比で0.01〜1.5 %、および不可避的な
不純物を含有するCu合金フィルム(膜)を、硝酸水溶
液,塩酸水溶液もしくは硫酸水溶液で処理した後、水洗
・清浄化した表面についてそれぞれ AES(オージェ電
子)スペクトルを求めたところ、図1〜図3に示すよう
な結果が得られた。ここで、図1は硝酸水溶液で処理し
た場合で、Cu,Zr,Cr, Oの各ピークが判然と認めら
れ、Zr,Cr成分がリッチ化しかつ酸化層を生成している
のに対して、塩酸水溶液で処理した場合の図2、および
硫酸水溶液で処理した場合の図3においては、Zrおよび
Crのピークが認められず、Zr,Cr成分リッチなCu合金層
化していないことが確認された。そして、本発明は、前
記導電体層のZr,Cr,Ti成分がリッチ化し、かつ酸化層
化したことにより絶縁性テープ本体面に対して、容易に
良好な接合・一体性などを呈することに着目して達成さ
れたものである。
The present invention was made based on the following findings. That is, a Cu alloy film (membrane) containing 0.01 to 1.5% by weight of at least one of Cr, Ti, and Zr and unavoidable impurities is treated with an aqueous nitric acid solution, an aqueous hydrochloric acid solution, or an aqueous sulfuric acid solution, and then washed with water.・ When the AES (Auger electron) spectrum was obtained for each of the cleaned surfaces, the results shown in FIGS. 1 to 3 were obtained. Here, FIG. 1 shows the case of treatment with a nitric acid aqueous solution, where Cu, Zr, Cr, and O peaks are clearly observed, and the Zr and Cr components are enriched and an oxide layer is formed. In FIG. 2 when treated with an aqueous solution of hydrochloric acid and in FIG. 3 when treated with an aqueous solution of sulfuric acid, Zr and
No Cr peak was observed, confirming that a Cu alloy layer rich in Zr and Cr components was not formed. Then, the present invention provides the conductive tape layer with rich Zr, Cr, and Ti components and by forming an oxide layer, thereby easily exhibiting good bonding and integrity with respect to the surface of the insulating tape body. It was achieved by paying attention.

【0012】[0012]

【作用】本発明に係る積層導体においては、導電体層を
形成するCr,Zr,Tiの少なくともいずれか1種の所定量の
元素、残部がCuおよび不可避的な不純物、さらに要すれ
ば他の添加成分を所要量含有して成るCu合金が、適度の
硬度およびエッチング性を有し、また絶縁性テープ本対
面に対し良好な密着性を呈する。つまり、前記導電体層
は、すぐれた機械的な強度および導電性を有するととも
に、支持基体としての絶縁性テープ本対とも強固に、か
つ密着一体化している一方、微細なエッチングも可能な
ため、信頼性の高いフレキシブルなプリント配線基板や
キャリヤテープパッケージの構成も容易に成し得る。特
に、Si,Geの少なくとも1種を添加すると、さらに耐剥
離強度の向上を図り得る。
In the laminated conductor according to the present invention, a predetermined amount of at least one element of Cr, Zr and Ti forming the conductor layer, the balance being Cu and unavoidable impurities, and if necessary other elements A Cu alloy containing the required amount of additional components has appropriate hardness and etching properties, and exhibits good adhesion to the facing surface of the insulating tape. That is, the conductor layer has excellent mechanical strength and conductivity, and is firmly and closely integrated with the pair of insulating tapes as a supporting substrate, while fine etching is also possible. A highly reliable and flexible printed wiring board or carrier tape package can be easily constructed. In particular, when at least one of Si and Ge is added, the peel strength can be further improved.

【0013】[0013]

【実施例】以下図面を参照して本発明の実施例を説明す
る。
Embodiments of the present invention will be described below with reference to the drawings.

【0014】実施例1〜5、参考例1〜7、参考例A〜
図4は本発明に係る積層導体の構成例を断面的に示した
もので、1は絶縁性テープ本体、たとえば厚さ75μm程
度で、かつ所要の開口部が設けられたポリイミド樹脂フ
ィルム、2は前記ポリイミド樹脂フィルム1の主面に接
着剤層3を介して一体的に支持された導電体層、すなわ
ち、重量比で0.01〜1.5%の範囲で選ばれたCr,Zr,Ti
の少なくともいずれか1種の元素、残部がCuおよび不可
避的な不純物から成る厚さ35μm程度のCu系金属箔(金
属層)である。
Examples 1-5, Reference Examples 1-7, Reference Example A-
F FIG. 4 is a cross-sectional view showing a structural example of the laminated conductor according to the present invention, in which 1 is an insulating tape body, for example, a polyimide resin film having a thickness of about 75 μm and provided with a required opening, 2 Is a conductor layer integrally supported on the main surface of the polyimide resin film 1 via an adhesive layer 3, that is, Cr, Zr, Ti selected in a range of 0.01 to 1.5% by weight.
Is a Cu-based metal foil (metal layer) having a thickness of about 35 μm, which is composed of at least one element of the above and the balance Cu and unavoidable impurities.

【0015】そして、このような積層導体は、次のごと
くして製造し得る。
Then, such a laminated conductor can be manufactured as follows.

【0016】先ず、純度99.9wt%のCu、純度99.9wt%の
Cr、純度99.9wt%のZrおよび純度99.9wt%のTi、その他
Si,Ge元素などなどを、表−1に示すような組成比(wt
%)に選択し、高周波溶解して18種のCu合金インゴット
を作成した。ここでCu合金成分の残分はCUである。その
後、これらのCu合金インゴットを鍛造してから、 900℃
で 1時間加熱、熱間圧延を施して 2mm厚の金属板をそれ
ぞれ作成した。この金属板について、表面の酸化物を除
去してから、冷間圧延により 1mm厚の金属板とし、 850
℃で熱処理を行った後、さらに冷間圧延を施して 100mm
幅、35μm 厚の金属箔とした。これらの金属箔につい
て、その硬さ(Hv)をそれぞれ測定した結果を表−1に
併せて示した。なお、表−1に表示した各評価は、硬
さ:ビッカースHv、導電率:I.A.C.S.% でそれぞれ行っ
た。また評価に当たっては、硬さ 100以上,導電率50以
上を目安とした。
First, Cu of 99.9 wt% purity and 99.9 wt% purity of
Cr, Zr with purity 99.9wt%, Ti with purity 99.9wt%, etc.
The composition ratio (wt.
%) And high-frequency melting to produce 18 kinds of Cu alloy ingots. Here, the balance of the Cu alloy component is CU. Then, after forging these Cu alloy ingots, 900 ℃
After heating for 1 hour and hot rolling, a 2 mm thick metal plate was prepared. After removing the oxide on the surface of this metal plate, it was cold-rolled to a metal plate with a thickness of 1 mm.
After heat treatment at ℃, cold rolling is further applied to 100 mm
The width of the metal foil was 35 μm. The results of measuring the hardness (Hv) of each of these metal foils are also shown in Table 1. In addition, each evaluation shown in Table-1 was performed by hardness: Vickers Hv and conductivity: IACS%, respectively. In the evaluation, hardness of 100 or more and conductivity of 50 or more were used as a guide.

【0017】[0017]

【表1】 [Table 1]

【0018】次に、前記各金属箔について、 0.1〜5Nの
硝酸処理を施して、表面部のCu成分を除去して、Cr,T
i,Zr成分リッチで、かつ表面が酸化された凹凸面を形
成した。図5〜図7は、前記金属箔の表面状態を示す走
査型電子顕微鏡写真であり、図5は硝酸処理後の状態
を、図6表面処理を施す前の状態を、さらに図7は参考
例として塩酸処理を施した後の状態をそれぞれ示す。
Next, each of the metal foils was treated with 0.1 to 5 N of nitric acid to remove the Cu component on the surface to remove Cr and T.
An uneven surface was formed that was rich in i and Zr components and had its surface oxidized. 5 to 7 are scanning electron micrographs showing the surface state of the metal foil, FIG. 5 shows a state after nitric acid treatment, FIG. 6 shows a state before surface treatment, and FIG. 7 shows a reference example. Shows the state after the treatment with hydrochloric acid.

【0019】前記エッチング処理した各金属箔を絶縁性
テープ、たとえばポリイミド樹脂フイルム面に、それぞ
れ接着剤層(たとえばエポキシ樹脂系の接着剤)を介し
て張り合わせ積層導体を作成した。なお、この積層導体
の作成において、接着剤層を介さずに、絶縁性テープの
可塑性など利用して直接接合・一体化してもよいし、ま
たポリイミド樹脂系接着剤を用いて張り合わせてもよ
い。
Each of the etched metal foils was laminated on an insulating tape, for example, a polyimide resin film surface via an adhesive layer (for example, an epoxy resin adhesive) to form a laminated conductor. In the production of this laminated conductor, the insulating tape may be directly joined / integrated by utilizing the plasticity of the insulating tape without interposing an adhesive layer, or may be laminated by using a polyimide resin adhesive.

【0020】上記でそれぞれ得た積層導体について、張
り合わせた金属箔とポリイミド樹脂フイルムとの引き剥
がし強度(ピール強度)をそれぞれ測定した結果を、前
記金属箔の酸化処理、エッチング処理条件、表面状態な
どとともに、前記表に併せて示す。
With respect to the laminated conductors obtained above, the peeling strength (peeling strength) between the laminated metal foil and the polyimide resin film was measured, and the results were measured. In addition, the above table is also shown.

【0021】なお、これら積層導体におけるCu系導体層
(Cu合金箔)の電気抵抗をそれぞれ測定したところ、い
ずれも幅60μm 程度の微細パターン化したときでも、要
求される導電性を有しており、前記良好な耐剥離性など
と相俟って、フレキシブルなプリント配線基板や TABパ
ッケージの製造に好適するものであった。
The electric resistances of the Cu-based conductor layers (Cu alloy foils) in these laminated conductors were measured, and all had the required conductivity even when formed into a fine pattern with a width of about 60 μm. Combined with the good peel resistance, it was suitable for the production of flexible printed wiring boards and TAB packages.

【0022】実施例 先ず、主面にたとえばエポキシ樹脂系の接着剤を塗布し
て、所要の接着剤層を形成・具備させた厚さ75μm程度
のポリイミド樹脂フィルムを用意し、次いで、このポリ
イミド樹脂フィルムを所定の幅、たとえば35mm幅の長尺
テープにカッティングし、この長尺テープに所要のパン
チング処理を施して、半導体素子装着部およびアウタリ
ードのカッティング領域を開口(一部の切除)した。そ
の後、重量比で0.01〜1.5%の範囲で選ばれたCr,Zr,T
iの少なくともいずれか1種の元素、残部がCuおよび不可
避的な不純物から成るたとえば厚さ35μm程度のCu合金
箔を張り合わせ一体化することによって、目的とするTA
B用テープを得た。
Example 6 First, a polyimide resin film having a thickness of about 75 μm is prepared by applying an epoxy resin adhesive to the main surface to form and equip a required adhesive layer. The resin film was cut into a long tape having a predetermined width, for example, a width of 35 mm, and the long tape was subjected to a required punching treatment to open (cut off a part of) the semiconductor element mounting portion and the cutting region of the outer lead. After that, Cr, Zr, T selected in the range of 0.01 to 1.5% by weight
The target TA is obtained by laminating and integrating a Cu alloy foil having a thickness of, for example, about 35 μm, which is composed of at least one element of i and the balance Cu and unavoidable impurities.
The tape for B was obtained.

【0023】次に、上記のように構成された TAB用テー
プをキャリヤテープ化して、各種特性を評価した結果に
ついて説明する。先ず、前記Cu合金箔の組成をいろいろ
に変えた構成の TAB用テープを11種類を用意し、それら
TAB用テープの合金箔(導電性層)の硬さおよび導電率
の評価を行った。一方それら TAB用テープの合金箔につ
いて、それぞれホトエッチング処理を施し、合金箔をピ
ッチ30μm で所要のリードパターンを形成してから、そ
のリードパターン化面上に、AuやSnの薄いめっき層を被
着形成してキャリヤテープを得、前記合金箔(導電性
層)の硬さおよび導電率の評価を加味し、 TAB用テープ
としての総合評価を行った。この一連の評価結果を、前
記表−1に合わせて示す。
Next, the results of evaluating various characteristics of the TAB tape having the above-described structure as a carrier tape will be described. First, we prepared 11 types of TAB tapes with different composition of the Cu alloy foil.
The hardness and conductivity of the alloy foil (conductive layer) of the TAB tape were evaluated. On the other hand, each of the alloy foils of these TAB tapes is subjected to photo-etching treatment to form a required lead pattern with a pitch of 30 μm, and then a thin plated layer of Au or Sn is coated on the lead patterned surface. The adhesive tape was formed to obtain a carrier tape, and the hardness and conductivity of the alloy foil (conductive layer) were taken into consideration, and a comprehensive evaluation as a TAB tape was performed. The results of this series of evaluations are also shown in Table 1 above.

【0024】上記評価結果からも分かるように、本発明
に係る積層導体は、たとえば TAB用テープとした場合、
キャリヤテープとして要求される各特性、つまり高い剥
離強度が保たれ、かつ微細なリードパターン化した場合
でも折れ曲がりなどの変形を起こさない高強度・高導電
性など兼備しているといえる。
As can be seen from the above evaluation results, when the laminated conductor according to the present invention is used, for example, as a TAB tape,
It can be said that each of the properties required for the carrier tape is maintained, that is, high peel strength is maintained, and high strength and high conductivity that do not cause deformation such as bending even when a fine lead pattern is formed.

【0025】上記では、絶縁性テープ本体として厚さ75
μm のポリイミド樹脂フィルムを例示したが、その厚さ
は前記例示に限定されるものでなく、また素材もたとえ
ばポリエステル系樹脂、ポリエーテルエーテルケトン樹
脂、ポリエーテルイミド樹脂、ポリフェニレン樹脂、ポ
リアクリレート樹脂、ポリアミドイミド樹脂、ポリアミ
ド系樹脂、もしくは酸化物、ガラスなど、ポリイミド樹
脂以外のものであってもよい。さらに、導電体層を成す
重量比で0.01〜1.5 %の範囲で選ばれたCr,Zr,Tiの少な
くともいずれか1種の元素、残部がCuおよび不可避的な
不純物から成る合金箔の厚さも、前記例示に限定されな
いことは勿論である。
In the above, the thickness of the insulating tape body is 75
The μm polyimide resin film is shown as an example, but the thickness is not limited to the above example, and the material is also polyester resin, polyether ether ketone resin, polyetherimide resin, polyphenylene resin, polyacrylate resin, Other than polyimide resin, such as polyamide-imide resin, polyamide-based resin, oxide, and glass, may be used. Furthermore, the thickness of the alloy foil which comprises at least one element of Cr, Zr, and Ti selected in the range of 0.01 to 1.5% by weight ratio forming the conductor layer, the balance being Cu and unavoidable impurities, Of course, it is not limited to the above examples.

【0026】[0026]

【発明の効果】上記説明したように、本発明に係る積層
導体によれば、重量比で0.01〜1.5 %の範囲で選ばれた
Cr,Zr,Tiの少なくともいずれか1種の元素、残部がCuお
よび不可避的な不純物から成るCu合金層が導電体層を成
し、良好な機械的な特性および導電性を備えている一
方、絶縁性テープ本体との接合面部は接着性良好なCr,Z
r,Ti成分などがリッチな酸化物層を備えているので、す
ぐれた耐剥離性ないし接着性を呈し、微細にパターンニ
ングされた形においても、剥離・破損など全面的に回避
される。一方、前記導電体層を成すCu合金層は、硬度も
高く微細にパターン化しても変形などおこし難いので、
信頼性の高いフレキシブルなプリント配線基板やキャリ
ヤテープパッケージの構成に適するものといえる。
As described above, according to the laminated conductor of the present invention, the weight ratio is selected in the range of 0.01 to 1.5%.
A Cu alloy layer composed of at least one element of Cr, Zr, and Ti, the balance of which is Cu and unavoidable impurities constitutes a conductor layer and has good mechanical properties and conductivity, The bonding surface of the insulating tape body is made of Cr, Z with good adhesion.
Since it has an oxide layer rich in r, Ti components and the like, it exhibits excellent peeling resistance or adhesiveness, and even in a finely patterned form, peeling and damage are completely avoided. On the other hand, the Cu alloy layer forming the conductor layer has a high hardness and does not easily deform even when finely patterned,
It can be said to be suitable for the construction of highly reliable and flexible printed wiring boards and carrier tape packages.

【図面の簡単な説明】[Brief description of drawings]

【図1】硝酸水溶液で処理したCu系合金導体フィルム
(箔・膜)の表面組成状態を示すAESスペクトル図。
FIG. 1 is an AES spectrum diagram showing the surface composition state of a Cu-based alloy conductor film (foil / membrane) treated with an aqueous nitric acid solution.

【図2】塩酸水溶液で処理したCu系合金導体フィルム
(箔・膜)の表面組成状態を示すAESスペクトル図。
FIG. 2 is an AES spectrum diagram showing the surface composition state of a Cu-based alloy conductor film (foil / membrane) treated with a hydrochloric acid aqueous solution.

【図3】硫酸水溶液で処理したCu系合金導体フィルム
(箔・膜)の表面組成状態を示すAESスペクトル図。
FIG. 3 is an AES spectrum diagram showing the surface composition state of a Cu-based alloy conductor film (foil / membrane) treated with a sulfuric acid aqueous solution.

【図4】本発明に係る積層導体の構成例を示す断面図。FIG. 4 is a cross-sectional view showing a configuration example of a laminated conductor according to the present invention.

【図5】硝酸水溶液で処理したCu系合金導体フィルム
(箔・膜)の表面組織状態を示す走査型電子顕微鏡写
真。
FIG. 5 is a scanning electron micrograph showing the surface texture of a Cu-based alloy conductor film (foil / membrane) treated with an aqueous nitric acid solution.

【図6】硝酸水溶液で処理前のCu系合金導体フィルム
(箔・膜)の表面組織状態を示す走査型電子顕微鏡写
真。
FIG. 6 is a scanning electron micrograph showing the surface texture of a Cu-based alloy conductor film (foil / membrane) before being treated with an aqueous nitric acid solution.

【図7】塩酸水溶液で処理したCu系合金導体フィルム
(箔・膜)の表面組織状態を示す走査型電子顕微鏡写
真。
FIG. 7 is a scanning electron micrograph showing the surface texture of a Cu-based alloy conductor film (foil / membrane) treated with a hydrochloric acid aqueous solution.

【符号の説明】[Explanation of symbols]

1…絶縁性テープ本体 2…導電体層 3…接着剤
1 ... Insulating tape body 2 ... Conductor layer 3 ... Adhesive layer

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI H01L 21/60 311 H01L 21/60 311W H05K 1/09 H05K 1/09 A (72)発明者 稲葉 道彦 神奈川県川崎市幸区小向東芝町1番地 株式会社 東 芝 研究開発センター内 (72)発明者 森田 正明 神奈川県川崎市幸区小向東芝町1番地 株式会社 東 芝 研究開発センター内 (56)参考文献 特開 平5−82589(JP,A) 特開 平5−190608(JP,A) 特開 昭60−94727(JP,A) 特開 昭62−40385(JP,A) 手島光一、桜井寿春、待鳥晴香、山根 茂美,「高強度,高熱伝導リードフレー ム材料 CCZ」,東芝レビュー,38巻 10号(1983),929〜932頁 (58)調査した分野(Int.Cl.7,DB名) H01B 5/14 C22C 9/00 H01B 13/00 503 H01L 21/60 311 H05K 1/09 ─────────────────────────────────────────────────── ───Continued from the front page (51) Int.Cl. 7 Identification FI H01L 21/60 311 H01L 21/60 311W H05K 1/09 H05K 1/09 A (72) Inventor Michihiko Inaba Kawasaki City, Kanagawa Prefecture Komukai Toshiba Town No. 1 Toshiba Research & Development Center (72) Inventor Masaaki Morita No. 1 Komukai Toshiba Town No. 1, Komukai Toshiba Town, Kawasaki City, Kanagawa Prefecture (56) Reference JP 5 -82589 (JP, A) JP 5-190608 (JP, A) JP 60-94727 (JP, A) JP 62-40385 (JP, A) Koichi Teshima, Toshiharu Sakurai, Haruka Machitori, Shigemi Yamane, “High-strength, high-thermal-conductivity lead frame material CCZ”, Toshiba Review, Volume 38, No. 10 (1983), pp.929-932 (58) Fields investigated (Int.Cl. 7 , DB name) H01B 5 / 14 C22 C 9/00 H01B 13/00 503 H01L 21/60 311 H05K 1/09

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 絶縁性テープ本体と、前記絶縁性テープ
本体の少なくとも一方の主面に一体的に接合されたC
r,Zr,Tiから選ばれる添加元素を重量比で0.01〜1.5
%、および不可避的な不純物を含有するCu合金から成る
導電体層とを具備し、前記添加元素はCrおよびZrを必須成分とし、 前記導電体
層は絶縁性テープ本体の接合面側が少なくともCr,Zr
リッチなCu合金層を成し、かつ酸化層を有している
ことを特徴とする積層導体。
1. An insulating tape body , and C integrally bonded to at least one main surface of the insulating tape body ,
Additive element selected from r, Zr, and Ti in weight ratio of 0.01 to 1.5
%, And a conductor layer made of a Cu alloy containing unavoidable impurities, the additive element contains Cr and Zr as essential components, and the conductor layer has at least Cr on the bonding surface side of the insulating tape body. laminated conductor Zr component is characterized by having a form rich Cu alloy layer, and oxide layer.
【請求項2】 Cr,Zr,Tiから選ばれる添加元素(ただ
しCrおよびZrを必須成分とする)を重量比で0.01〜1.5
%、および不可避的な不純物を含有するCu合金から成る
導電体フィルムを硝酸水溶液で表面処理して、表面領域
少なくともCr,Zr成分リッチのCu合金化し、かつ酸
化層を生成させる工程と、 前記導電体フィルムの前記硝酸水溶液で表面処理した一
方の処理面を前記絶縁性テープ本体の主面に接合一体化
する工程とを具備することを特徴とする積層導体の製造
方法。
2. An additive element selected from Cr, Zr and Ti (only
Cr and Zr as essential components) in a weight ratio of 0.01 to 1.5
%, And the steps conductor film made of Cu alloy containing unavoidable impurities to a surface treatment with a nitric acid aqueous solution, at least Cr surface area, Zr components are Cu alloy rich, and to produce an oxide layer, one surface-treated with the nitric acid aqueous solution of the conductor film
Method for producing a laminated conductor, wherein the square of the treated surface by comprising a step of integrally bonding the main surface of the insulating tape body.
JP23731893A 1993-08-30 1993-08-30 Laminated conductor and method of manufacturing the same Expired - Fee Related JP3454876B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4381574B2 (en) * 2000-08-17 2009-12-09 日鉱金属株式会社 Copper alloy foil for laminates
JP4539939B2 (en) * 2000-10-30 2010-09-08 日鉱金属株式会社 Copper alloy foil for high frequency circuits
JP2002226928A (en) * 2001-01-30 2002-08-14 Nippon Mining & Metals Co Ltd Copper alloy foil for laminated board
WO2006025347A1 (en) 2004-08-31 2006-03-09 National University Corporation Tohoku University Copper alloy and liquid-crystal display
US7940361B2 (en) 2004-08-31 2011-05-10 Advanced Interconnect Materials, Llc Copper alloy and liquid-crystal display device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
手島光一、桜井寿春、待鳥晴香、山根茂美,「高強度,高熱伝導リードフレーム材料 CCZ」,東芝レビュー,38巻10号(1983),929〜932頁

Also Published As

Publication number Publication date
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