JP3389302B2 - Control function inspection device - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention uses an apparatus to be inspected as a device for controlling the operation of each section mainly by a microcomputer, and a procedure for inspecting each control function of the inspected apparatus mainly as a microcomputer. The present invention relates to a control function inspection device in which inspection is performed by an inspection device that controls and processes.

[0002]

2. Description of the Related Art As this type of device, a control function inspection device 500 as shown in FIG. 3 is well known. In the control function inspecting apparatus 500 of FIG. 3, the inspected apparatus 100 is configured such that the operation of each section is performed by the control section 10 which mainly controls the microcomputer 11 to perform control processing.
Reference numeral 00 is configured so that the control unit 20 for controlling the control function of the microcomputer 21 mainly performs the procedure for inspecting each control function of the device under inspection 100.

The device under inspection 100 and the inspection device 200 are
The inspection communication connection line 301 and the detection communication connection line 302 are connected to each other, and the inspection communication connection line 301 is connected to the control unit 20.
It is a communication line between the inspection command signal 20a given from the control unit 10 to the control unit 10 and the inspection response signal 10a given from the control unit 10 to the control unit 20. A signal line for controlling the operation, for example, a line connected to a bus line.

Further, the detection communication line 302 is provided for each detection portion 12A and each operation portion 1 arranged in the device 100 to be inspected.
It is a communication line that gives each detection signal 12a based on the detection output obtained by detecting the state of 2B from the control unit 20 to the control unit 10. The detailed configuration of the device is as shown in FIG.

The control unit 10 includes a microcomputer 11
The processing memory 1 is mainly composed of
3 shows a control processing procedure for issuing a control command for each original operation of the inspected device 100, and each inspection operation for the inspected device 100 based on the control command from the inspection device 200. Control processing procedure for performing the device under test 1
00 is a read-only storage circuit, that is, a ROM, in which processing data such as reference data necessary for control processing of each operation of 00 is fixedly stored in advance.

The working memory 14 is a write / read-free storage circuit, that is, a RAM for temporarily storing data necessary for the progress of the control processing, that is, a RAM, and if necessary, a backup battery for storage storage. It is provided so that the stored contents can be held for a required time.

The display 15 is a microcomputer 11.
The display state corresponding to the progress state in the control process, that is, the step of the control flow is displayed. For example, a group of light-emitting display elements for displaying a plurality of digits, that is, an LED character display element group or a liquid crystal character display , That is, an LCD display.

The signal line 16 is used to transfer signals between the processing memory 13, the working memory 14, the display unit 15 and the microcomputer 11, and to the control connection terminal 17 from the microcomputer 11. Each control signal 17a is supplied to each control portion arranged in the device under test 100.
A signal line for supplying the inspection command signal 20a from the microcomputer 21 on the side of the inspection device 200 and an inspection connection terminal 18 for exchanging the inspection response signal 10a from the microcomputer 11 and the microcomputer 11. A line formed by one common signal line, that is, a bus line, for connecting a signal line connecting the two and a signal line for giving an input signal from the operation key group 19 provided in the control unit 10 to the microcomputer 11. is there.

The detection terminals 121, 122, 123 are
Each detection portion 121A, which is arranged in the device under inspection 100,
122A and 123A, for example, respective detection unit signals 121a and 121a detected by a portion that detects a temperature state, a motion state, and the like.
It is a terminal portion for obtaining 122a and 123a.

The operation detecting terminals 124 and 125 are respectively driving portions 124A and 12 arranged in the device 100 to be inspected.
5A, for example, a terminal for obtaining a signal that detects a driving operation state of an electric motor / actuator, for example, an operation unit signal 124a / 125a that detects an ON-OFF state of each drive relay or switch or the presence or absence of each drive current It is a part.

The inspection connection terminal 120 is connected to each detection signal 1
21a, 122a, 123a and respective operation unit signals 124a,
125a is a terminal portion for giving each detection signal 12a to the microcomputer 21 on the side of the inspection device 200 described later.

The detection portions 121A and 122A and the drive portions 123A and 124A are connected to the device 100 to be inspected.
With the above configuration, an arbitrary number of components are provided respectively.

Each of the inspection communication connection line 301 and the detection communication connection line 302 is a required number of individual electric wires or a cable obtained by bundling these together, and a signal conductor that needs to be shielded has a shield conductor coating. Is applied.

The control unit 20 includes a microcomputer 21.
The processing memory 2 is mainly composed of
Reference numeral 3 denotes a control processing procedure for issuing a control command to inspect the operation of each unit of the device under inspection 100, and each detection unit signal 121a.1 obtained in each operating state of the device under inspection 100.
This is a read-only memory circuit, that is, a ROM, in which processing data such as reference data for determining normality / abnormality of the signals 22a / 123a and the operation unit signals 124a / 125a is fixedly stored in advance.

The work memory 24 is a write / read-free storage circuit, that is, a RAM for temporarily storing data necessary for the progress of the control process, that is, a RAM, and if necessary, a backup battery for holding the storage. It is provided so that the stored contents can be held for a required time.

The signal line 26 is a signal line for exchanging signals between the processing memory 23, the working memory 24, the display 25 and the microcomputer 21, and the inspection command signal 20a from the microcomputer 21 and the inspection device. The signal line connecting the inspection response signal 20a from the microcomputer 11 on the 200 side to the inspection connection terminal 28 and the microcomputer 21 and the input signal from the operation key group 29 provided in the control unit 20 are provided. A line in which a signal line for giving to the microcomputer 21 and a signal line for giving each detection signal 12a to the microcomputer 21 via the inspection connection terminal 22 and the input port 27 are formed by one common signal line. , That is,
It is a bus line.

Then, based on the processing flow stored in the processing memory 23 of the control unit 20, the microcomputer 2
By giving the inspection command signal 20a from 1 to the microcomputer 11 of the control unit 10, the processing flow stored in the processing memory 11 causes each operation of each unit of the device 100 to be inspected sequentially for the required inspection item. The signal obtained corresponding to the state is used as the inspection corresponding signal 10a.
Alternatively, it is given to the microcomputer 21 of the control unit 20 as a response of the inspection result by each detection signal 12a or a combination of these two signals, and the quality of the inspection result is judged by each reference data stored in the processing memory 21. The inspection control processing is configured.

Among the detection signals 12a, the analog value signal is converted into a digital value signal by the A / D conversion circuit provided in the input port 27,
It is provided to the microcomputer 21.

When the processing flow of this control processing is generally viewed, it has a structure as shown in the flow charts of FIGS. In the process flow of FIGS. 5 to 7, the [inspected device side] process flow in the left column is based on the process flow stored in the process memory 13 of the control unit 10 in the inspected device 100, and the [inspected device] in the right column Apparatus side] The processing flow is the processing memory 2 of the control unit 20 in the inspection apparatus 200.
This is a flow based on the processing flow stored in 3.

The flow shown by the dotted line from the right column to the left column corresponds to the control command by the inspection signal 21a, and the flow shown by the dotted line from the left column to the right column is the inspection corresponding signal 10a or each It corresponds to the response of the inspection result by the detection signal 12a or a combination of these two signals.

The processing flows of FIGS. 5 to 7 will be specifically described below. For the convenience of the drawings, the processing flow is such that the end of the processing flow of FIG. 5 continues to the beginning of FIG. 6 and the end of FIG. 6 continues to the beginning of FIG.

Prior to the start of the inspection, with respect to each of the detection portions 121A, 122A, 123A of the device under inspection 100,
The operating state is set so that a predetermined detection output can be obtained, and an operating power switch (not shown) provided in the device under test 100 and the inspection device 200 is operated to bring both devices into an operating state for inspection. Operation key group 29 of the control unit 10
A signal for operating the operation key for starting the inspection process is given to the microcomputer 21 to enter the inspection start operation state.

[Explanation of Processing Flow] ◆ In step SP1, an inspection command signal 20a for inspecting the first item set as an inspection item, that is, "No. 1 inspection item" is given to the control unit 10. Then, the process proceeds to the next step SP2. Here, the “No. 1 inspection item” is, for example, an inspection for turning on all display devices such as the display device 15 arranged in the control unit 10.

At step SP2, the control unit 10 fetches the contents of the inspection command signal 20a, and at the next step SP2.
Move to 3.

In step SP3, the inspection command signal 20
It is determined whether or not there is a command for "No. 1 inspection item" in the content of a. If there is a command for "No. 1 inspection item", the process proceeds to the next step SP4, and if not, the process returns to step SP2.

In step SP4, the operation corresponding to "No. 1 inspection item" is performed, and the process proceeds to the next step SP5. Here, the inspector silently confirms whether or not all the display devices such as the display device 15 are in a predetermined display state.

In step SP5, the operation data corresponding to "No. 1 inspection item" is changed to "No. 1 inspection data".
The inspection response signal 10a is output to the control unit 20 and the process proceeds to the next step SP6. Here, when the display is in a predetermined display state, the inspector operates a predetermined key of the operation keys 19 and sets the input data as “first inspection data”.

At step SP6, the control unit 20 fetches the contents of the inspection response signal 10a, and at the next step SP6.
Move to 7.

◆ In step SP7, the inspection response signal 10
It is determined whether or not “a. No. 1 inspection data” is included in “a” and whether or not the content of the “No. 1 inspection data” is predetermined data. If there is “No. 1 inspection data” and the data is predetermined data, the process proceeds to the next step SP8, and if not, step SP6.
Return to. Whether or not the data is the predetermined data is determined by reading and comparing predetermined data corresponding to the “No. 1 inspection data” stored in the processing memory 23 in advance.

In step SP8, the inspection command signal 20a for inspecting the second inspection item, that is, "No. 2 inspection item" is given to the control unit 10, and the process proceeds to the next step SP9. Here, "No. 2 inspection items"
Is, for example, the operation detection terminal 12 arranged in the control unit 10.
This is an inspection of the operating state for No. 4.

At step SP9, the control unit 10 fetches the contents of the inspection command signal 20a, and at the next step SP9.
Go to 10.

◆ In step SP10, the inspection command signal 2
It is determined whether the content of 0a is a command for "No. 2 inspection item". If the item is "No. 2 inspection item", the process proceeds to step SP13, and if not, the next step S13.
Move to P11.

In step SP11, the elapsed time from a predetermined step, for example, "No. 1" in step SP4.
The elapsed time from the start of the operation corresponding to the "inspection item" is determined by an appropriate timer, for example, the elapsed time obtained by counting the clock of the microcomputer 11 or the timepiece circuit attached to the microcomputer 11 or the like. If the predetermined time has elapsed, the process proceeds to the next step SP12, and if not, step S
Return to P9.

In step SP12, a display indicating that the inspection for "No. 1 inspection item" is abnormal, for example,
The number "01" is displayed on the display unit 15, and the [inspected device side] process flow is suspended. In this case, since the determination in step SP7 continues to be returned to step SP6, the processing flow on the [inspection device side] is also stagnant at this step portion.

In step SP13, the operation corresponding to "No. 2 inspection item" is performed, and next step SP14
Move to. Here, the control signal 17a for performing the operation corresponding to the state where the operation portion 124A is operated is output.

In step SP14, the inspection response signal 10a that sets the operation data corresponding to "No. 2 inspection item" as "No. 2 inspection data" is output to the control unit 20 and the next step SP15. Move to. here,
Detection signal 124 output from operation detection terminal 124
A signal indicating that “a is“ No. 2 inspection data ”is output as the inspection response signal 10a.

In step SP15, the control unit 20 fetches the contents of the inspection response signal 10a, and the next step S15.
Move to P16.

◆ In step SP16, the inspection response signal 1
0a includes "No. 2 inspection data",
Further, it is determined whether or not the content of the "No. 2 inspection data" is predetermined data. If there is "No. 2 inspection data" and the data is predetermined data, the process proceeds to the next step SP17, and if not, step SP
Return to 15. Whether or not it is the predetermined data is determined by reading and comparing predetermined data corresponding to “No. 2 inspection data” stored in the processing memory 23 in advance. Here, since the signal indicating that the detection signal 124a is "No. 2 inspection data" is the inspection response signal 10a, the data by the detection signal 124a from the input port 27 is "No. 2 inspection data". It will be taken in as content.

In step SP17, the inspection command signal 20a for inspecting the third inspection item, that is, "No. 3 inspection item" is given to the control unit 10, and the process proceeds to the next step SP18. Here, “No. 3 inspection item” means, for example, the detection terminal 12 arranged in the control unit 10.
It is an inspection of the operating state for 1.

◆ Step SP18 to Step SPe09
Then, a processing flow for sequentially performing inspections from “No. 3 inspection items” to final stage inspection items, that is, “No. N inspection items” by the same process flow as steps SP2 to SP16 described above. After performing each step operation by, the process proceeds to the next step SPe10.

In step SPe10, "inspection end item" indicating that the inspection is terminated is given to the control unit 10 as the inspection command signal 20a, and the process proceeds to the next step SPe11. Here, the “inspection end item” is, for example, the display 1
5 is a signal for instructing to display the character "EN". Further, the [inspection device side] processing flow is assumed to be completed at this stage.

At step SPe11, the control unit 10 fetches the contents of the inspection command signal 20a, and then proceeds to the next step SPe12.

In step SPe12, it is determined whether or not the content of the inspection command signal 20a is a command for the "inspection end item". If the item is "inspection end item", step SP
e15, and if not, next step SPe
Move to 13.

In step SPe13, the time elapsed from the predetermined step, for example, "N in step SPe06"
o. The elapsed time from the start time of the operation corresponding to "N-1 inspection item" is determined in the same manner as in step SP11 described above, and when the predetermined time has elapsed, the next step SPe
If not, the process returns to step SPe11.

In step SPe14, a display indicating that the inspection for "No. N inspection item" is abnormal, for example,
The number "32" is displayed on the display unit 15, and the [inspected device side] process flow is suspended. In this case, since the determination in step SPe09 continues to be returned to step SPe08, the [inspection device side] process flow also becomes stagnant at this step portion.

◆ At step SPe15, "normal end"
A message to that effect is displayed and the process ends. Here, in the display of "normal end", the character "EN" is displayed on the display unit 15.

By performing the control processing according to the above-described processing flow, it is possible to automatically advance the inspection up to the inspection item having an abnormality, and at the stage where the inspection of the previous inspection item is performed. If there is an abnormality, the control unit 20 of the inspection apparatus 200 displays the abnormal portion on the display unit 15 of the inspected apparatus 100 by the process of not outputting the inspection command signal 20a for performing the next inspection item. It has the convenience of being able to do it.

A specific configuration for inspecting the control function of the ice making machine by the control function inspection device 500 is disclosed in Japanese Patent Application Laid-Open No. 5-143384, which is filed by the applicant of the present application.

The ROM has an electrically erasable and writable read-only memory, which is generally an EEPROM (Electror).
ically Erasable Program
It is called “LeRead Only Memory”.

This electrically erasable and writable read-only memory erases the previous memory contents and writes new memory contents by applying a signal of new memory contents while applying a predetermined voltage to the write enable terminal. Which can be manufactured, for example, a commercial product 93C manufactured by SGS Thomson
There is a 46S-6 type EEPROM or the like.

When an EEPROM is used for the storage portion of the device under test 100 as described above, the EEPROM is
Since a manufacturing accident such as a defect of M itself or a defective wiring of the EEPROM occurs, it is necessary to include a test step for testing the memory function of the EEPROM in the above-mentioned test procedure.

[0052]

In the device 100 to be inspected as described above, the processing memory 13 for storing the processing flow is formed by the electrically erasable and writable read-only memory (which is referred to as an EEPROM in the present invention). It is possible to configure.

However, in such a configuration, the fixed memory contents related to the control function are stored in the expensive EEPROM, and there is a disadvantage that the device cannot be provided at a low cost.

If an unexpected voltage is applied to the write enable terminal due to some accident in the electric circuit, the entire control function of the device under test 100 will be destroyed, and operation of the device will be completely disabled, or serious problems will occur. There is an inconvenience such as leading to a serious driving accident.

Therefore, it is desirable to provide a device 100 to be inspected that does not have such inconvenience, and to provide a configuration in which the function of the EEPROM provided therein can be optimally inspected by the inspection device 200. There is a problem of being rare.

[0056]

The present invention provides a control process based on the processing procedure stored in the ROM as described above, that is, the processing procedure of the device under test and the data such as the reference value, that is, the data of the device under test. Control for inspecting the control function of each part of the inspected device configured to perform inspection by the inspection device configured to perform the inspection process sequentially by the control process based on the processing procedure stored in the ROM and the data such as the reference value. A function inspection apparatus, which is a storage configuration means for storing predetermined inspected device side data excluding the above inspected device side processing procedure in an EEPROM provided in the inspected device, and a final stage of the above inspecting process, A first configuration provided with an inspection means for providing inspection processing for inspecting the storage function of the EEPROM;

In addition to the first configuration, after the inspection of the above-mentioned storage function is completed, a predetermined device-to-be-inspected device side data stored in the ROM of the above-mentioned inspection device is stored in the EEPROM. The above-mentioned problem can be solved by the second configuration provided with the means.

[0058]

According to the first configuration, since the content stored in the EEPROM is only the data such as the reference value, the device under test can be constructed at low cost. Further, since the inspection of the memory function for the EEPROM is carried out at the final stage of the inspection of each control function, it is assumed that the EEPROM has the memory function because the unexpected voltage is applied to the EEPROM at various inspection stages before that. Even if a destruction accident of being damaged occurs, the destruction accident can be surely inspected without overlooking, so that the memory storage portion of the device to be inspected can be guaranteed and provided.

Further, according to the second configuration, in addition to the above-mentioned operation, after the inspection of the storage function of the EEPROM is completed, the predetermined device-to-be-inspected data stored in the inspection device is stored in the EEPROM. Therefore, the stored content of the EEPROM is not disturbed by an unexpected voltage in another inspection stage, so that the control function of the device under inspection can be guaranteed and provided.

[0060]

EXAMPLES Examples will be described below with reference to FIGS.
1 to 2, portions having the same reference numerals as those in FIGS. 3 to 7 have the same functions as the portions having the same reference numerals described in FIGS. 3 to 7.

[First Embodiment] A first embodiment will be described with reference to FIG. In the configuration of the control unit 10 of the device under inspection 100 of FIG. 1, instead of the processing memory 13 configured of the ROM in the control unit 10 of FIG.
And a data memory 13B composed of an EEPROM are provided.

In the processing memory 13A, a processing flow mainly for controlling the operation of each part of the device under inspection 100,
That is, the processing procedure and the processing flow for controlling the operation related to the inspection, that is, the processing procedure and the like are stored.
Data related to each control of the device under test 100, that is,
All or part of data such as the operation data of the apparatus, various set values, and error display data (referred to as a reference value in the present invention) is stored in the data memory 13B.

The processing flow for the inspection is the same as the processing flow shown in FIGS. 5 to 7, but the storage function of the EEPROM constituting the data memory 13B is used for the "No. N inspection item" at the final stage of FIG. It is an inspection item to inspect. This inspection is, for example, "1" for all the memory locations.
Is written to check whether or not it has been written normally, and then rewrites everything to "0" to check whether or not it has been written normally, or a predetermined stored content Is written to check whether it is written normally or not by using a second method or the like. Further, in the case of the second method, the reference data necessary for the control function of the device to be inspected may be stored and collated.

To summarize the configuration of the first embodiment, the processing procedure stored in the ROM such as the processing memory 13A, that is, the processing procedure on the device under test and the data such as the reference value, that is, the data on the device under test. An inspection process for sequentially inspecting the control function of each part of the inspected device 100 configured to perform the control process based on the control process based on the process procedure stored in the ROM of the process memory 23 and the data such as the reference value is performed. A control function inspection device 500 for inspecting by an inspection device 200 having a configuration,

A storage configuration means for storing predetermined inspected device side data excluding the inspected device side processing procedure in the EEPROM of the data memory 13B provided in the inspected device, and the final stage of the inspecting process, that is, , No. N inspection item, an inspection means for providing an inspection process for inspecting the memory function of the EEPROM is provided.

[Second Embodiment] A second embodiment will be described with reference to FIGS. Inspected Device 1 of FIG. 1 in Second Embodiment
The configuration of the control unit 10 of 00 is the same as the configuration of the first embodiment described above, and in addition to this, the processing memory 23 in the control unit 20 of the inspection device 200 of FIG. 1 configured similarly to FIG. In advance, data such as a reference value to be stored in the EEPROM constituting the data memory 13B of the control unit 10 of the device under test 100 is stored in advance.

The processing flow for the inspection is the same as the processing flow shown in FIGS. 5 to 7, but instead of the “end command” after the “No. N inspection item” at the final stage of FIG. As shown in FIG. 2, "data writing" is performed.

In the following, in the process flow of FIG. 2, a part that performs a process different from the process flow of FIG. 7 will be described.

In step SPe09, the control unit 10 is provided with an inspection command signal 20a for storing the storage content to be finally stored in the data memory 13B. As the inspection command signal 20a, the data to be stored is read from the processing memory 23 and output together.

In step SPe15, the data sent together with the inspection command signal 20a is written and stored in the data memory 13B, and then the processing flow is ended.

In summary of the configuration of the second embodiment described above, in addition to the first configuration described above, "No. N.
After the inspection of the storage function based on the “inspection item” is completed, the predetermined device-to-be-inspected data stored in the ROM of the processing memory 23 of the inspection device 200 is transferred to the EEP of the data memory 13B.
The second configuration is provided with an EEPROM data storage means for storing in a ROM. In the case of this second configuration, the contents of the "No. N inspection items" at the final stage are EEP by the first method described in the first embodiment.
It can be configured to test the ROM.

[Modified Embodiment] The present invention includes the following modifications and implementations. (1) As shown in FIG. 1, the inspection device 200 is provided with a display / alarm for performing an abnormal display by a character display and an abnormal alarm by a warning sound such as a buzzer, and the inspection result is abnormal and the processing flow is delayed. If there is, the N of the “inspection item” that is stagnant
o. Is displayed and a warning sound is generated.

(2) While displaying each abnormality, the No. of "inspection item" corresponding to the abnormality is displayed. Device under test 100
Working memory 14 or data memory 13 of the control unit 10
After being stored in B, the processing flow is automatically advanced by arranging to proceed to each of the steps, and to the next step below the step. To read a list of abnormal inspection items. That is, for example, in the case of step SP12 of FIG. 5, “01” is set to the work memory 14 or the data memory 13.
After the data is stored in B, the process proceeds to step SP13.

(3) In the above configuration (2), the stored abnormality inspection items are sequentially displayed on the display device 15 before the final "end".

[0075]

According to the present invention, since the content stored in the EEPROM is only the data such as the reference value, the EEPROM
Since the capacity of M can be reduced, the device to be inspected can be constructed inexpensively, and the memory function of the EEPROM is inspected at the final stage of the inspection, so that the EEPROM due to an unexpected voltage during inspection of other control functions A reliable inspection can be performed without overlooking the destruction.

Further, since the necessary data is stored after the inspection of the storage function of the EEPROM, the E data is stored at the other inspection stage.
Since the contents stored in the EPROM are not disturbed, there is a feature that the control function of the device under test can be ensured and provided.

[Brief description of drawings]

1 to 2 show an embodiment of the present invention, and FIGS. 3 to 7 show a prior art. The contents of each drawing are as follows.

FIG. 1 is a block diagram

[Fig. 2] Process flow diagram of main parts

FIG. 3 is a block diagram

FIG. 4 is a block diagram

FIG. 5: First part of processing flow diagram

FIG. 6 is the second part of the processing flow chart.

FIG. 7: Process flow diagram third part

[Explanation of symbols]

10 Control unit 10a Inspection correspondence signal 11 Microcomputer 12 Detection connection terminal 12A Each detection part 12B Each operation part 12a Each detection signal 13 Processing memory 13A processing memory 13B data memory 14 working memory 15 Indicator 16 signal lines 17 Control connection terminal 17a each control signal 18 Inspection connection terminal 19 Operation keys 20 Control unit 20a inspection signal 21 Microcomputer 22 Inspection connection terminal 23 Processing memory 24 working memory 26 signal lines 27 Input port 28 Connection terminal for inspection 29 Operation keys 100 device under test 121 Detection terminal 121A detection part 121a detection signal 122 detection terminal 122a detection signal 122A detection part 123 Detection terminal 123A detection part 124 Operation detection terminal 124A operation part 125 Operation detection terminal 125A operation part 200 inspection equipment 301 Inspection communication connection line 302 Connection line for detection communication 401 Connection line for each control 500 Control function inspection device

Claims (2)

(57) [Claims] 1. An inspected device having a configuration for performing a control process based on a processing procedure stored in a ROM (hereinafter referred to as an inspected device side processing procedure) and data such as a reference value (hereinafter referred to as inspected device side data). A control function inspection device for inspecting a control function of each part of the device by an inspection device configured to perform an inspection process for sequentially inspecting by a control process based on a processing procedure stored in a ROM and data such as a reference value, Storage configuration means for storing the predetermined device-to-be-tested-side data excluding the device-to-be-tested-side processing procedure in an EEPROM provided in the device-to-be-inspected, and a storage function of the EEPROM is tested at the final stage of the test processing. A control function inspection device, comprising: an inspection means for providing an inspection process. 2. An inspected device having a configuration for performing a control process based on a processing procedure stored in a ROM (hereinafter referred to as an inspected device side processing procedure) and data such as a reference value (hereinafter referred to as inspected device side data). A control function inspection device for inspecting a control function of each part of the device by an inspection device configured to perform an inspection process for sequentially inspecting by a control process based on a processing procedure stored in a ROM and data such as a reference value, Storage configuration means for storing the predetermined device-to-be-tested-side data excluding the device-to-be-tested-side processing procedure in an EEPROM provided in the device-to-be-inspected, and a storage function of the EEPROM is tested at the final stage of the test processing. Inspection means for providing inspection processing; and RO of the inspection device after the inspection of the memory function is completed.
An EEPROM data storage means for storing the predetermined device-to-be-inspected device side data stored in M in the EEPROM.