JP2003114254A - Inspection method and inspection device - Google Patents

Inspection method and inspection device

Info

Publication number
JP2003114254A
JP2003114254A JP2001308214A JP2001308214A JP2003114254A JP 2003114254 A JP2003114254 A JP 2003114254A JP 2001308214 A JP2001308214 A JP 2001308214A JP 2001308214 A JP2001308214 A JP 2001308214A JP 2003114254 A JP2003114254 A JP 2003114254A
Authority
JP
Japan
Prior art keywords
inspection
information
volatile memory
flash rom
electronic control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001308214A
Other languages
Japanese (ja)
Inventor
Masahito Ogawa
雅仁 小川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2001308214A priority Critical patent/JP2003114254A/en
Publication of JP2003114254A publication Critical patent/JP2003114254A/en
Pending legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an inspection for confirming the executing state of an inspection process. SOLUTION: This inspection device writes inspection executing information in a FLASH ROM 17 in a process of manufacturing and inspecting an electronic control device 15 with built-in FLASH ROM 17, and confirms an inspection executing state of a pre-process by reading out the information in the FLASH ROM 17 in a post-process thereafter. Thus, even if a certain inspection process is not executed, a warning can be issued by identifying the fact in the post- process, and the executing state of the inspection process is confirmed to contribute to maintaining quality of a product.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、ある検査工程を実
施しなかった場合に、後工程において、それを識別し警
告を発することができる検査方法および検査装置に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection method and an inspection apparatus capable of identifying a certain inspection process and issuing a warning in a subsequent process when the inspection process is not performed.

【0002】[0002]

【従来の技術】従来、製造ラインには複数の検査工程が
あり、それぞれ項目が異なる検査を実施している。
2. Description of the Related Art Conventionally, a manufacturing line has a plurality of inspection processes, each of which carries out different inspections.

【0003】全ての検査工程を実施し検査に合格したも
のが良品として保証される。
A product that has passed all the inspection processes and passed the inspection is guaranteed as a good product.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、このよ
うな従来の検査にあっては、各検査工程を実施したかど
うかを確認する手段を持っていないため、各検査に合格
したものであるか否かを確認し得ない、という問題があ
った。
However, such a conventional inspection does not have a means for confirming whether or not each inspection process has been carried out, and therefore it is determined whether or not each inspection has been passed. There was a problem that it could not be confirmed.

【0005】本発明は、上記従来の問題を解決するため
になされたもので、検査工程の実施状況を確認すること
のできる検査方法および検査装置を提供することを目的
とする。
The present invention has been made to solve the above conventional problems, and an object of the present invention is to provide an inspection method and an inspection apparatus capable of confirming the implementation status of an inspection process.

【0006】[0006]

【課題を解決するための手段】本発明の検査方法は、不
揮発メモリを内蔵した電子制御装置を製造し検査する工
程で検査実施済み情報を前記不揮発メモリ内に書き込ん
で、この後の後工程で前記不揮発メモリ内の情報を読み
出すことにより前工程の検査実施状況を確認する構成を
有しており、前記検査実施済み情報として、検査履歴情
報を用いる構成を採用するのが好適である。
According to the inspection method of the present invention, the inspection completed information is written in the nonvolatile memory in the step of manufacturing and inspecting an electronic control unit having a built-in nonvolatile memory, and in the subsequent step. It is preferable to adopt a configuration in which the inspection execution status of the previous process is confirmed by reading the information in the nonvolatile memory, and the inspection history information is used as the inspection execution completion information.

【0007】本発明の検査装置は、電子制御装置の内蔵
不揮発メモリ内に検査実施済み情報を書き込む手段と、
前記不揮発メモリ内の前記検査実施済み情報を読み出す
手段とを備える構成を有しており、前記検査実施済み情
報として、検査履歴情報を用いる構成を採用するのが好
適である。
The inspection apparatus of the present invention comprises means for writing inspection completed information in the built-in non-volatile memory of the electronic control unit,
It is preferable to employ a configuration including a unit that reads out the inspection performed information in the nonvolatile memory, and to employ a configuration that uses inspection history information as the inspection performed information.

【0008】このような構成により、後工程において、
不揮発メモリ内の検査実施済み情報を読み出すことによ
り前工程の検査実施状況を確認することができ、検査実
施済み情報として、検査実施日時、使用した検査装置等
の検査履歴情報を用いることにより、検査実施の有無の
みならず検査履歴の調査を容易にすることができる。し
たがって、仮にある検査工程を実施しなかった場合で
も、後工程においてそれを識別し警告を発することがで
き、製品である電子制御装置に問題が生じた場合でも、
原因の解析に役立てることができる。
With such a structure, in the subsequent process,
The inspection execution status of the previous process can be confirmed by reading the inspection execution completion information in the non-volatile memory, and the inspection execution date and time and the inspection history information of the inspection device used can be used as the inspection execution completion information. The inspection history can be easily investigated as well as whether or not the inspection is performed. Therefore, even if a certain inspection process is not carried out, it can be identified and a warning can be issued in the subsequent process, and even if a problem occurs in the electronic control device as a product,
It can be useful for analyzing the cause.

【0009】[0009]

【発明の実施の形態】以下、本発明を図面に基づいて説
明する。図1および図2は本発明に係る検査方法および
検査装置の一実施形態を示す図である。
DETAILED DESCRIPTION OF THE INVENTION The present invention will be described below with reference to the drawings. 1 and 2 are diagrams showing an embodiment of an inspection method and an inspection apparatus according to the present invention.

【0010】まず、検査装置の構成を説明する。図1に
おいて、検査装置10は、パーソナルコンピュータ(以
下、PC)11と、検査装置本体(以下、本体)12
と、擬似負荷装置13とにより構成されており、PC1
1が検査プログラムを実行して、ケーブル14を介して
検査対象である電子制御装置(以下、ECU)15に接
続される本体12および擬似負荷装置13を制御するよ
うになっている。
First, the structure of the inspection apparatus will be described. In FIG. 1, an inspection apparatus 10 includes a personal computer (hereinafter, PC) 11 and an inspection apparatus main body (hereinafter, main body) 12
And the pseudo load device 13, the PC 1
1 executes an inspection program, and controls a main body 12 and a pseudo load device 13 connected to an electronic control unit (hereinafter, ECU) 15 to be inspected via a cable 14.

【0011】ECU15は、入力インターフェース16
と、FLASH ROM(不揮発メモリ)17を内蔵し
たCPU18と、出力インターフェース19とを有して
おり、FLASH ROM17にはプログラムおよびデ
ータが外部(検査装置等)から書き換え可能に格納され
ている。
The ECU 15 has an input interface 16
And a CPU 18 having a built-in FLASH ROM (non-volatile memory) 17, and an output interface 19. The FLASH ROM 17 stores programs and data rewritably from the outside (inspection device or the like).

【0012】次に、検査装置10を用いた検査方法を、
図2のフローチャートによりその動作・作用とともに説
明する。
Next, an inspection method using the inspection device 10 will be described.
The operation and action will be described with reference to the flowchart of FIG.

【0013】まず、検査工程においては、PC11が検
査プログラムを実行して(ステップS1)、例えば、そ
の検査プログラムで設定された電源電圧、パルス信号、
アナログ信号、SW信号、シリアル信号が本体12から
ケーブル14を介してECU15に供給されることによ
り(ステップS2、S3)、ECU15が動作して、出
力信号が本体12および擬似負荷装置13に伝達される
(ステップS4)。
First, in the inspection process, the PC 11 executes the inspection program (step S1), and, for example, the power supply voltage, the pulse signal, and the like set by the inspection program,
When the analog signal, the SW signal, and the serial signal are supplied from the main body 12 to the ECU 15 via the cable 14 (steps S2 and S3), the ECU 15 operates and the output signal is transmitted to the main body 12 and the pseudo load device 13. (Step S4).

【0014】次いで、PC11がこの信号を測定して
(ステップS5)、測定結果が規格と合致している場合
はOK、合致していない場合はNGと判断する(ステッ
プS6)。なお、この測定結果および判断結果は保存さ
れる。
Next, the PC 11 measures this signal (step S5), and if the measurement result conforms to the standard, it is judged as OK, and if not, it is judged as NG (step S6). The measurement result and the judgment result are saved.

【0015】このステップS6でNGと判断された場合
は、検査プログラムを再実行する一方、OKの場合は現
在の日時(すなわち検査実施日時)や検査装置のID
(使用した検査装置の識別用)等の検査実施情報(検査
履歴情報)をECU15に送信し、ECU15は、その
データを受信したらユーザープログラムモードに移行し
て、受信したデータを用いてFLASH ROM17の
規定の領域を書き換える(ステップS7)。なお、書き
換える前は「00」または「FF」が書き込まれてい
る。
If it is determined to be NG in step S6, the inspection program is re-executed, while if it is OK, the current date and time (that is, the inspection execution date and time) and the inspection device ID.
The inspection execution information (inspection history information) such as (for identifying the used inspection device) is transmitted to the ECU 15, and the ECU 15 shifts to the user program mode upon receiving the data, and uses the received data to store the data in the FLASH ROM 17. The prescribed area is rewritten (step S7). Before rewriting, "00" or "FF" is written.

【0016】ここまでで一連の検査は終了し、次の後検
査工程に移る。そこでは、まず、前工程で書き換えた領
域のFLASH ROM17内の情報を読み出し(ステ
ップS8)、この領域が「00」または「FF」の場
合、前工程を実施していないため、NGと判断して、以
降の検査を行なわずに警告表示をするとともに検査を中
止する一方、それ以外の場合は前工程を実施しているた
め、OKと判断して検査を続行する(ステップS9)。
The series of inspections are completed up to this point, and the next post-inspection step is performed. There, first, the information in the FLASH ROM 17 of the area rewritten in the previous step is read (step S8), and if this area is "00" or "FF", the previous step has not been performed, so it is judged as NG. While the subsequent inspection is not performed, the warning is displayed and the inspection is stopped, but in other cases, since the previous process is being performed, it is determined to be OK and the inspection is continued (step S9).

【0017】このように本実施形態においては、検査実
施情報をFLASH ROM17に書き込むことによ
り、後工程で前工程の検査実施有無を判断することがで
き、製品の品質維持に貢献できる。
As described above, in the present embodiment, by writing the inspection execution information in the FLASH ROM 17, it is possible to judge whether or not the inspection is executed in the previous process in the subsequent process, which contributes to maintaining the quality of the product.

【0018】また、電子制御装置15に問題が生じた場
合でも、そのFLASH ROM17内の検査実施日時
や検査装置ID等の検査履歴情報を原因の解析に役立て
ることができる。
Further, even when a problem occurs in the electronic control unit 15, the inspection history information such as the inspection execution date and time and the inspection device ID in the FLASH ROM 17 can be used for the analysis of the cause.

【0019】[0019]

【発明の効果】以上説明したように、本発明によれば、
後工程において、不揮発メモリ内の検査実施済み情報を
読み出すことにより前工程の検査実施状況を確認するこ
とができるので、仮にある検査工程を実施しなかった場
合でも、後工程においてそれを識別し警告を発すること
ができる。したがって、検査工程の実施状況を確認し
て、製品の品質維持に貢献できる、という優れた効果を
有する検査方法を提供することができる。
As described above, according to the present invention,
In the subsequent process, the inspection execution status of the previous process can be confirmed by reading the inspection completion information in the non-volatile memory, so even if some inspection process was not executed, it will be identified and warned in the subsequent process. Can be issued. Therefore, it is possible to provide an inspection method having an excellent effect of being able to confirm the implementation status of the inspection process and contribute to maintaining the quality of the product.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る検査装置の一実施形態を示すブロ
ック図
FIG. 1 is a block diagram showing an embodiment of an inspection apparatus according to the present invention.

【図2】本発明に係る検査方法の一実施形態を示すフロ
ーチャート
FIG. 2 is a flowchart showing an embodiment of an inspection method according to the present invention.

【符号の説明】[Explanation of symbols]

10 検査装置 11 パーソナルコンピュータ 12 検査装置本体 13 擬似負荷装置 14 ケーブル 15 電子制御装置 16 入力インターフェース 17 FLASH ROM 18 CPU 19 出力インターフェース 10 Inspection device 11 personal computer 12 Inspection device body 13 Pseudo load device 14 cables 15 Electronic control unit 16 input interface 17 FLASH ROM 18 CPU 19 Output interface

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 不揮発メモリを内蔵した電子制御装置を
製造し検査する工程で検査実施済み情報を前記不揮発メ
モリ内に書き込んで、この後の後工程で前記不揮発メモ
リ内の情報を読み出すことにより前工程の検査実施状況
を確認することを特徴とする検査方法。
1. An electronic control device having a built-in non-volatile memory is manufactured and inspected, and inspection completed information is written in the non-volatile memory, and then information is read from the non-volatile memory in a subsequent process. An inspection method characterized by confirming the inspection implementation status of a process.
【請求項2】 前記検査実施済み情報として、検査履歴
情報を用いることを特徴とする請求項1に記載の検査方
法。
2. The inspection method according to claim 1, wherein inspection history information is used as the inspection completion information.
【請求項3】 電子制御装置の内蔵不揮発メモリ内に検
査実施済み情報を書き込む手段と、前記不揮発メモリ内
の前記検査実施済み情報を読み出す手段とを備えること
を特徴とする検査装置。
3. An inspection apparatus comprising: means for writing inspection completed information in a built-in non-volatile memory of the electronic control unit; and means for reading out the inspection completed information in the non-volatile memory.
【請求項4】 前記検査実施済み情報として、検査履歴
情報を用いることを特徴とする請求項3に記載の検査装
置。
4. The inspection apparatus according to claim 3, wherein inspection history information is used as the inspection completion information.
JP2001308214A 2001-10-04 2001-10-04 Inspection method and inspection device Pending JP2003114254A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001308214A JP2003114254A (en) 2001-10-04 2001-10-04 Inspection method and inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001308214A JP2003114254A (en) 2001-10-04 2001-10-04 Inspection method and inspection device

Publications (1)

Publication Number Publication Date
JP2003114254A true JP2003114254A (en) 2003-04-18

Family

ID=19127558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001308214A Pending JP2003114254A (en) 2001-10-04 2001-10-04 Inspection method and inspection device

Country Status (1)

Country Link
JP (1) JP2003114254A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005054883A1 (en) * 2003-12-01 2005-06-16 Fujitsu Ten Limited Control device inspection device, pattern signal generation device, and inspection program creation device
JP2014106067A (en) * 2012-11-27 2014-06-09 Aisin Seiki Co Ltd Control device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005054883A1 (en) * 2003-12-01 2005-06-16 Fujitsu Ten Limited Control device inspection device, pattern signal generation device, and inspection program creation device
JP2005164338A (en) * 2003-12-01 2005-06-23 Fujitsu Ten Ltd Inspection device for control unit, pattern signal generation device and inspection program generation device
JP2014106067A (en) * 2012-11-27 2014-06-09 Aisin Seiki Co Ltd Control device

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