JP3374498B2 - Infrared sensor - Google Patents
Infrared sensorInfo
- Publication number
- JP3374498B2 JP3374498B2 JP35458293A JP35458293A JP3374498B2 JP 3374498 B2 JP3374498 B2 JP 3374498B2 JP 35458293 A JP35458293 A JP 35458293A JP 35458293 A JP35458293 A JP 35458293A JP 3374498 B2 JP3374498 B2 JP 3374498B2
- Authority
- JP
- Japan
- Prior art keywords
- light receiving
- infrared sensor
- receiving portion
- infrared
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
- Micromachines (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、赤外線センサに関し、
特に、赤外線を吸収した熱により信号を得る熱型赤外線
センサに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an infrared sensor,
In particular, it relates to a thermal infrared sensor that obtains a signal by the heat that has absorbed infrared rays.
【0002】[0002]
【従来の技術】近年、熱型赤外線センサを半導体微細加
工を利用して作成する技術が種々開発されている。この
熱型赤外線センサは、受光メンブレンを基板から浮かせ
た断熱構成としてあり、受光メンブレンに赤外線が当た
ると、赤外線吸収膜により吸収されて熱となり、受光メ
ンブレンの温度を上昇させる。この温度変化で感熱素子
1が電気的信号の変化を生じて外部に赤外線量の信号と
して出力する。この温度変化は照射された赤外線量によ
る。それで温度上昇は受光メンブレンの膜厚にも依存す
るため、従来より、より薄膜化されるような構成が取ら
れてきた。しかし、強度の面から膜厚は1μm程度が限
度であり、さらに効率を上げるためには断熱性を向上さ
せるしかなく、さまざまな提案がなされている。2. Description of the Related Art In recent years, various techniques have been developed for producing a thermal infrared sensor by utilizing semiconductor fine processing. This thermal infrared sensor has a heat insulating structure in which the light receiving membrane is floated from the substrate, and when infrared rays hit the light receiving membrane, it is absorbed by the infrared absorbing film and becomes heat, which raises the temperature of the light receiving membrane. Due to this temperature change, the heat sensitive element 1 causes a change in the electric signal and outputs it as an infrared ray amount signal to the outside. This change in temperature depends on the amount of infrared rays irradiated. Therefore, since the temperature rise also depends on the film thickness of the light receiving membrane, the structure has been conventionally made thinner. However, from the viewpoint of strength, the film thickness is limited to about 1 μm, and in order to further improve efficiency, there is no choice but to improve the heat insulating property, and various proposals have been made.
【0003】例えば、特開平3-212979号公報ではセンサ
部と基板の間に空洞部を設けて熱的分離を行い断熱性を
向上させたものであり、Jin-Shown Shie等の文献("Desi
gn considerations of metal-film bolometer with mic
romachined flooting membrane," Sensors & Actuator
s,A33(1992),183-189) では、図4に示すような、薄膜
の受光メンブレン400が四本の梁42で支えられた構
造となっている。このような構造によれば、受光した赤
外線による温度上昇の熱が基板に逃げていく率が少なく
て検出感度が上がるために、この四点支持の断熱構造は
効率良い方法として注目されている。[0003] For example, in Japanese Patent Laid-Open No. 3-212979, a cavity is provided between a sensor section and a substrate to improve thermal insulation by thermal separation, which is disclosed in Jin-Shown Shie et al.
gn considerations of metal-film bolometer with mic
romachined flooting membrane, "Sensors & Actuator
s, A33 (1992), 183-189) has a structure in which a thin film light receiving membrane 400 is supported by four beams 42 as shown in FIG. According to such a structure, the heat of the temperature rise due to the received infrared ray escapes to the substrate at a small rate, and the detection sensitivity is improved. Therefore, the heat insulating structure of four-point support attracts attention as an efficient method.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、もとも
と赤外線吸収による熱の温度上昇で感熱素子の変化を信
号として取り出すため、温度計測などに使用する場合で
は、赤外線吸収による温度上昇が極めて微小であるため
温度分解能が粗く、実用的とは言えないという問題があ
る。However, since the change in the heat-sensitive element is originally taken out as a signal due to the temperature rise of heat due to infrared absorption, the temperature rise due to infrared absorption is extremely small when used for temperature measurement or the like. There is a problem that the temperature resolution is rough and not practical.
【0005】従って、本発明の目的は、温度分解能など
を向上させるために、僅かな赤外線でも温度上昇が容易
な断熱性の良い、従って感度の良い赤外線センサを提供
することである。SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an infrared sensor having a good heat insulating property and therefore a high sensitivity, in which even a slight infrared ray can easily raise the temperature in order to improve the temperature resolution and the like.
【0006】[0006]
【課題を解決するための手段】上記の課題を解決するた
め本発明の構成は、薄膜に形成され、感熱素子を含んだ
赤外線の受光部と、該受光部を断熱的に宙吊りで支える
梁と、該梁を支える基板とを備えて成る赤外線センサに
おいて、前記基板から延びる前記梁が、複数方向に分岐
して、前記受光部と連結しており、前記感熱素子のリー
ド線が通る梁以外の梁に、前記リード線と略同一構成
で、どこにも接続しないダミー配線を設けることを特徴
とする。また本発明の別の構成は、薄膜に形成され、感
熱素子を含んだ赤外線の受光部と、該受光部を断熱的に
宙吊りで支える梁と、該梁を支える基板とを備えて成る
赤外線センサにおいて、前記梁に、前記受光部の外周に
沿った、少なくとも二重以上のスリットを有しており、
前記感熱素子のリード線が通る梁以外の梁に、前記リー
ド線と略同一構成で、どこにも接続しないダミー配線を
設けることを特徴とする。 In order to solve the above-mentioned problems, the structure of the present invention comprises an infrared ray receiving portion which is formed in a thin film and includes a heat sensitive element, and a beam which supports the light receiving portion by adiabatic suspension. An infrared sensor comprising a substrate supporting the beam, wherein the beam extending from the substrate branches in a plurality of directions and is connected to the light receiving section, and
The same structure as the lead wire except for the beam through which the lead wire passes.
Therefore , it is characterized in that a dummy wiring which is not connected anywhere is provided . Another structure of the present invention is an infrared sensor comprising a thin-film infrared ray receiving portion including a heat-sensitive element, a beam that supports the light receiving portion by adiabatic suspension, and a substrate that supports the beam. in, the beam, along the outer periphery of the light receiving portion, and have at least double or more slits,
On the beam other than the beam through which the lead wire of the heat sensitive element passes,
Dummy wiring that has almost the same configuration as the
It is characterized in that it is provided .
【0007】[0007]
【作用および発明の効果】受光部を支える梁が二股に別
れ、一つの基板側支持部が二点の受光側支持部を離れた
位置で支える構造となり、基板と受光部との熱流路が長
くとれる。受光側支持部はまた、基板側支持部二点に共
通に支持される形をとることもできる。あるいは梁を構
成する際に、基板と受光部との間の梁部分にスリットを
設ける。二重のスリットの場合では、梁は基板と受光部
との間を受光部の各辺と平行に形成されて受光面積を小
さくすることなく梁を長く形成できる。これらの梁形状
は、梁の実効長を単純に受光部に接続する場合より長く
することができ、熱流経路としても長くなるので、熱伝
導が抑制される。また梁が複数方向に分岐しているた
め、梁に発生する応力を打ち消しあって緩和することが
できる。更にダミー配線を設けることで、各梁の力学的
条件がほぼ同一になり、赤外線センサの機能に影響せず
構造的強度を向上させることができる。このダミー配線
はリード線を形成する際に同時に形成できるため付加的
工程を必要としない。 [Advantageous Effects of the Invention] The beam supporting the light receiving portion is divided into two parts, and one substrate side supporting portion supports the two light receiving side supporting portions at positions separated from each other, and the heat flow path between the substrate and the light receiving portion is long. Can be taken. The light-receiving side support part can also be in the form of being commonly supported by the two substrate-side support parts. Alternatively, when forming the beam, a slit is provided in the beam portion between the substrate and the light receiving portion. In the case of the double slit, the beam is formed between the substrate and the light receiving portion in parallel with each side of the light receiving portion, so that the beam can be formed long without reducing the light receiving area. With these beam shapes, the effective length of the beam can be made longer than that in the case where the beam is simply connected to the light receiving section, and the length of the heat flow path is also increased, so that heat conduction is suppressed. Further, since the beams are branched in a plurality of directions, the stresses generated in the beams can be canceled out and relaxed. Furthermore, by providing dummy wiring, the mechanical strength of each beam
The conditions are almost the same and the function of the infrared sensor is not affected.
The structural strength can be improved. This dummy wiring
Can be formed at the same time when the lead wire is formed
No process required.
【0008】[0008]
【実施例】以下、本発明を具体的な実施例に基づいて説
明する。
(第一実施例)図1(a) は、基板12に設けられた、断
面が台形の矩形空洞部11の四隅からのびる梁2が二股
に分岐して、矩形の受光部であるフローティングメンブ
レン(受光メンブレン、受光部)100の各辺の中央部
に支点を有する場合の赤外線センサを上部正面から見た
もので、図1(b) は(a) のA-A 断面を示す。EXAMPLES The present invention will be described below based on specific examples. (First Embodiment) FIG. 1 (a) shows that a beam 2 extending from four corners of a rectangular cavity 11 having a trapezoidal cross section provided on a substrate 12 is bifurcated, and a floating membrane (rectangular light receiving portion) ( The infrared sensor having a fulcrum at the center of each side of the light-receiving membrane (light-receiving membrane) 100 is viewed from the top front, and FIG. 1 (b) shows the AA cross section of (a).
【0009】フローティングメンブレン100(1、
6、7、8、9から成る)は、メンブレンの基板となる
絶縁層(Si3N4、SiO2など)7の中央部に、感温材料で構
成された感熱素子1が形成され、絶縁層(Si3N4、SiO2な
ど)8を介して該感熱素子1からリード線3が引き出さ
れて、梁のうち2本を通って基板側の外部電極13に信
号が出される。またフローティングメンブレン100に
は下部の空洞部11を形成する際に使用するエッチング
液がよく入り込むように四か所小穴5が貫通させてあ
り、フローティングメンブレン100の表面には絶縁層
(Si3N4、SiO2など)9を介して、熱をよく吸収する金ブ
ラックやNiCrなどの赤外線吸収膜6で覆ってある。The floating membrane 100 (1,
6,7,8,9) is formed by forming a thermosensitive element 1 made of a thermosensitive material in the center of an insulating layer (Si 3 N 4 , SiO 2, etc.) 7 serving as a substrate of the membrane, and A lead wire 3 is drawn out from the thermosensitive element 1 through a layer (Si 3 N 4 , SiO 2, etc.) 8, and a signal is output to the external electrode 13 on the substrate side through two of the beams. The floating membrane 100 has four small holes 5 penetrating therethrough so that the etching solution used for forming the lower cavity portion 11 may well enter the surface of the floating membrane 100.
It is covered with an infrared absorbing film 6 such as gold black or NiCr which absorbs heat well through (Si 3 N 4 , SiO 2 etc.) 9.
【0010】図1の構造の梁2は矩形空洞部の四隅から
延ばすので、四か所の支持部を有するが、リード線3は
この内の二本を通る。そこで残った二本の梁はリード線
が通らず、リード線3の分だけ肉厚がないことになる。
そこでリード線3が通過しない梁のうち、リード線3と
略同一構成で、どこにも接続しないダミー配線4を設け
ることにしておくと、各梁の力学的条件がほぼ同一にな
り、赤外線センサの機能に影響せず構造的強度を向上さ
せることができる。このダミー配線4はリード線3を形
成する際に同時に形成できるため付加的工程を必要とし
ない。Since the beam 2 of the structure shown in FIG. 1 extends from the four corners of the rectangular cavity, it has four supporting portions, but the lead wire 3 passes through two of them. Therefore, the two remaining beams do not pass through the lead wire, and the thickness of the lead wire 3 is not enough.
Therefore, among the beams through which the lead wires 3 do not pass, if the dummy wirings 4 having substantially the same structure as the lead wires 3 and not connected to any place are provided, the mechanical conditions of the respective beams become substantially the same, and the infrared sensor The structural strength can be improved without affecting the function. Since the dummy wiring 4 can be formed at the same time when the lead wire 3 is formed, no additional process is required.
【0011】この実施例の構造と図4の従来例とを比較
するために、両構造に対してシミュレーションを行っ
た。入射赤外線の量が3.12(W/m2)の同一条件のもとで、
この赤外線センサの温度上昇がどの程度になるかを理論
計算したところ、図5ないし図6に示すように、本発明
の構成のフローティングメンブレンの温度上昇は最高で
7.86(mK)の値となる。従来構造の場合、図7、図8に示
すように、最高上昇温度は2.03(mK)にしかならず、本実
施例の構成では約四倍の断熱効果があることがわかる。
図の各分割部分の差異は温度上昇の程度を示すもので、
ハッチングの密度の高い部分が温度上昇の高い部分であ
る。温度上昇の程度は1/1000度のオーダーであるので、
四倍程度の断熱性向上でもかなりの効果がある。In order to compare the structure of this embodiment with the conventional example of FIG. 4, simulations were performed for both structures. Under the same condition that the amount of incident infrared rays is 3.12 (W / m 2 ),
Theoretically calculating the temperature rise of this infrared sensor, the temperature rise of the floating membrane of the present invention is the highest as shown in FIGS.
The value is 7.86 (mK). In the case of the conventional structure, as shown in FIGS. 7 and 8, the maximum rise temperature is only 2.03 (mK), and it can be seen that the configuration of this embodiment has a heat insulation effect of about four times.
The difference between the divided parts in the figure shows the degree of temperature rise.
The part where the hatching density is high is the part where the temperature rises high. Since the temperature rise is on the order of 1/1000 degrees,
Even if the heat insulation is improved by a factor of 4, it will be quite effective.
【0012】また、基板に熱が伝わりにくいことから基
板部の温度上昇が抑制されるために、この赤外線センサ
をマトリクス状に配置させる場合に、より高密度に配置
させることができ、隣接素子とのクロストークが生じに
くく、空間分解能を向上させた平面赤外線センサが提供
できる。Further, since it is difficult for heat to be transferred to the substrate, the temperature rise of the substrate portion is suppressed. Therefore, when the infrared sensors are arranged in a matrix, they can be arranged at a higher density and the adjacent elements are It is possible to provide a planar infrared sensor that is less likely to cause crosstalk and has improved spatial resolution.
【0013】このフローティングメンブレン100を有
する構造の赤外線センサの製造は、構造的に従来と異な
る特徴をもつが、従来より使用されている表面マイクロ
マシニング技術などを用いて作成できる。まずSi基板1
2上の空洞部11を設ける部分に、後に空洞部を形成す
る際にエッチングされる犠牲層を形成する。その上に絶
縁層7を形成し、そしてその上に感熱素子1をマスクパ
ターンで形成し、素子1を保護する絶縁層8を形成し
て、コンタクトを取る孔を形成して電極形成し、Alなど
でリード線3をパターン形成する。リード線3と同時に
ダミー配線4もパターン形成する。その上に絶縁層9を
形成した後、受光部分であるフローティングメンブレン
部に金ブラックで赤外線吸収膜6を形成する。特徴ある
工程は、空洞部11を形成する部分で、エッチングで開
口したスリット部10と小孔5とでエッチング液を受光
部の裏面側に到らしめて異方性エッチングでフローティ
ングメンブレン下に空洞部11を穿ち、本構造の赤外線
センサを形成する。Although the infrared sensor having the structure having the floating membrane 100 has structurally different characteristics from the conventional one, it can be manufactured by using the surface micromachining technique which has been used conventionally. First, Si substrate 1
A sacrificial layer, which is etched when the cavity is formed later, is formed in the portion on which the cavity 11 is provided. An insulating layer 7 is formed on the insulating layer 7, a thermosensitive element 1 is formed on the insulating layer 7 with a mask pattern, an insulating layer 8 for protecting the element 1 is formed, a hole for contacting is formed to form an electrode, and The lead wire 3 is formed into a pattern by, for example. At the same time as the lead wire 3, the dummy wiring 4 is also patterned. After forming the insulating layer 9 thereon, the infrared absorbing film 6 is formed of gold black on the floating membrane portion which is the light receiving portion. A characteristic step is that in the portion where the cavity portion 11 is formed, the etching solution is made to reach the back surface side of the light receiving portion by the slit portion 10 and the small hole 5 opened by etching, and the cavity portion is formed under the floating membrane by anisotropic etching. 11 is punched to form the infrared sensor of this structure.
【0014】(第二実施例)図2は、梁の分岐をさらに
二重にして、スリットが三本となった梁構造の場合であ
る。この場合は、より熱流経路が長くとれ、より微弱な
赤外線受光の場合に適している。梁が一本分増加する分
だけ受光面積が減少するが、この構造は特殊な目的、例
えば微弱でスポットビーム的な赤外線を検出する赤外線
センサとして向いている。(Second Embodiment) FIG. 2 shows a case of a beam structure in which the beams are further branched to have three slits. In this case, a longer heat flow path can be taken, which is suitable for weaker infrared light reception. Although the light-receiving area decreases as the number of beams increases, this structure is suitable for a special purpose, for example, an infrared sensor for detecting weak infrared rays like spot beams.
【0015】(第三実施例)図3の場合は、支点の数を
図1の半分の二箇所にした場合で、受光メンブレンを支
える強度は半分になるが、熱流経路が図1の倍になるの
で、断熱性が向上し、感度が向上する。また梁の周囲の
スリット形状も比較的単純なので形成し易く、無駄の少
ない構造とできる。この構造の場合は、梁を軸とする回
転モーメントがあり、共振する振動周波数が存在するの
で、そのような共振条件を含まない使用環境に利用され
る。(Third Embodiment) In the case of FIG. 3, when the number of fulcrums is set to two, which is half of that of FIG. 1, the strength of supporting the light receiving membrane is halved, but the heat flow path is double that of FIG. Therefore, the heat insulating property is improved and the sensitivity is improved. Further, since the slit shape around the beam is relatively simple, it is easy to form and the structure can be made less wasteful. In the case of this structure, since there is a rotation moment about the beam and there is a vibration frequency that resonates, it is used in a usage environment that does not include such resonance conditions.
【0016】なお、上記第一ないし第三実施例では、梁
の支持や分岐は対称位置で行っていたが、対称位置から
ずれた位置で実施してもよい。In the first to third embodiments, the beams are supported and branched at symmetrical positions, but they may be displaced at positions deviated from the symmetrical positions.
【0017】以上のように本発明の構成により、僅かな
赤外線でも従来の倍以上の分解能が得られる赤外線セン
サを提供することができた。As described above, with the configuration of the present invention, it is possible to provide an infrared sensor capable of obtaining a resolution more than double that of the conventional one, even with a small amount of infrared light.
【図1】本発明の第一実施例の梁構造を示す構造図。FIG. 1 is a structural diagram showing a beam structure according to a first embodiment of the present invention.
【図2】本発明の第二実施例の梁構造を示す構造図。FIG. 2 is a structural diagram showing a beam structure according to a second embodiment of the present invention.
【図3】本発明の第三実施例の梁構造を示す構造図。FIG. 3 is a structural diagram showing a beam structure according to a third embodiment of the present invention.
【図4】従来の受光メンブレン構成の赤外線センサを示
す説明図。FIG. 4 is an explanatory view showing an infrared sensor having a conventional light receiving membrane structure.
【図5】第一実施例の構成で赤外線を定量照射された場
合のシミュレーションによる熱分布図。FIG. 5 is a heat distribution diagram by simulation when infrared rays are radiated quantitatively in the configuration of the first embodiment.
【図6】図5の部分拡大図。6 is a partially enlarged view of FIG.
【図7】従来構成の図4に示す構成で、図5と同一条件
で赤外線を照射された場合のシミュレーションによる熱
分布図。FIG. 7 is a heat distribution diagram obtained by simulation when infrared rays are irradiated under the same conditions as in FIG. 5 in the conventional structure shown in FIG.
【図8】図7の部分拡大図。FIG. 8 is a partially enlarged view of FIG.
1、21、31、41 感熱素子
2、22、32、42 梁
3、23、33、43 電極配線
4、24、34 ダミー配線
5、25、35 空気抜き孔
6、26、36、46 赤外線吸収膜
7 絶縁層(Si3N4 、SiO2など)
8 絶縁層(Si3N4 、SiO2など)
9 絶縁層(Si3N4 、SiO2など)
10a、10b、30a、30b、40a、40b、5
0 スリット
11 空洞部
12 基板(Si基板)
13、27、37、47 電極
100、200、300、400 フローティングメン
ブレン
(受光メンブレン、受光部)1, 21, 31, 41 Thermal element 2, 22, 32, 42 Beam 3, 23, 33, 43 Electrode wiring 4, 24, 34 Dummy wiring 5, 25, 35 Air vent hole 6, 26, 36, 46 Infrared absorbing film 7 Insulating layer (Si 3 N 4 , SiO 2 etc.) 8 Insulating layer (Si 3 N 4 , SiO 2 etc.) 9 Insulating layer (Si 3 N 4 , SiO 2 etc.) 10a, 10b, 30a, 30b, 40a, 40b 5,
0 slit 11 cavity 12 substrate (Si substrate) 13, 27, 37, 47 electrode 100, 200, 300, 400 floating membrane (light receiving membrane, light receiving portion)
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01J 1/00 - 1/60 G01J 5/00 - 5/62 ─────────────────────────────────────────────────── ─── Continuation of front page (58) Fields surveyed (Int.Cl. 7 , DB name) G01J 1/00-1/60 G01J 5/00-5/62
Claims (2)
の受光部と、該受光部を断熱的に宙吊りで支える梁と、
該梁を支える基板とを備えて成る赤外線センサにおい
て、 前記基板から延びる前記梁が、複数方向に分岐して、 前記受光部と連結しており、 前記感熱素子のリード線が通る梁以外の梁に、前記リー
ド線と略同一構成で、どこにも接続しないダミー配線を
設けること を特徴とする赤外線センサ。1. A light receiving portion for infrared rays, which is formed in a thin film and includes a heat sensitive element, and a beam which supports the light receiving portion by suspending it in adiabatic manner.
An infrared sensor comprising a substrate supporting the beam, wherein the beam extending from the substrate branches in a plurality of directions and is connected to the light receiving section, and a beam other than a beam through which a lead wire of the thermosensitive element passes. To the Lee
Dummy wiring that has almost the same configuration as the
An infrared sensor characterized by being provided .
の受光部と、該受光部を断熱的に宙吊りで支える梁と、
該梁を支える基板とを備えて成る赤外線センサにおい
て、 前記梁に、前記受光部の外周に沿った、少なくとも二重
以上のスリットを有しており、 前記感熱素子のリード線が通る梁以外の梁に、前記リー
ド線と略同一構成で、どこにも接続しないダミー配線を
設けること を特徴とする赤外線センサ。2. A light receiving portion for infrared rays, which is formed in a thin film and includes a heat sensitive element, and a beam which supports the light receiving portion by suspending it in adiabatic manner.
In the infrared sensor composed of a substrate supporting the the beams, the beams, the along the outer periphery of the light receiving portion, and have at least double or more slits, other than beam leads of the thermosensitive element passes On the beam, the Lee
Dummy wiring that has almost the same configuration as the
An infrared sensor characterized by being provided .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP35458293A JP3374498B2 (en) | 1993-12-27 | 1993-12-27 | Infrared sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP35458293A JP3374498B2 (en) | 1993-12-27 | 1993-12-27 | Infrared sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07198474A JPH07198474A (en) | 1995-08-01 |
JP3374498B2 true JP3374498B2 (en) | 2003-02-04 |
Family
ID=18438530
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP35458293A Expired - Fee Related JP3374498B2 (en) | 1993-12-27 | 1993-12-27 | Infrared sensor |
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JP (1) | JP3374498B2 (en) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3637665B2 (en) * | 1996-01-23 | 2005-04-13 | 松下電器産業株式会社 | Pyroelectric infrared detector |
JP3529596B2 (en) * | 1997-08-06 | 2004-05-24 | 株式会社東芝 | Infrared solid-state imaging device and method of manufacturing the same |
JP3175662B2 (en) * | 1997-10-07 | 2001-06-11 | 日本電気株式会社 | Manufacturing method of thermal infrared detecting element |
JP3809718B2 (en) * | 1997-12-26 | 2006-08-16 | 日産自動車株式会社 | Infrared detector |
JP3109480B2 (en) * | 1998-06-15 | 2000-11-13 | 日本電気株式会社 | Thermal infrared detector |
WO2000037905A1 (en) * | 1998-12-18 | 2000-06-29 | Daewoo Electronics Co., Ltd. | Infrared bolometer |
JP3812881B2 (en) * | 2000-11-22 | 2006-08-23 | 株式会社アイ・エイチ・アイ・エアロスペース | Infrared detector |
JP3672516B2 (en) * | 2001-09-28 | 2005-07-20 | 株式会社東芝 | Infrared sensor device and manufacturing method thereof |
JP4241245B2 (en) * | 2002-10-25 | 2009-03-18 | 株式会社デンソー | Sensor device |
JP4528720B2 (en) * | 2005-12-28 | 2010-08-18 | 株式会社東芝 | Infrared detecting element, manufacturing method thereof and infrared camera |
JP4848826B2 (en) * | 2006-04-24 | 2011-12-28 | パナソニック電工株式会社 | Infrared sensor |
JP5054628B2 (en) * | 2008-07-15 | 2012-10-24 | パナソニック株式会社 | Infrared sensor |
JP2011033393A (en) * | 2009-07-30 | 2011-02-17 | Ricoh Co Ltd | Semiconductor device having membrane part, and method for manufacturing the semiconductor device |
CN103708406B (en) * | 2013-12-12 | 2019-04-16 | 中国计量学院 | It is a kind of can insulation package stress resonant mode infrared detector structure and production method |
JP2015175728A (en) * | 2014-03-14 | 2015-10-05 | 株式会社リコー | Microdevice and image forming apparatus including the same |
WO2017094280A1 (en) * | 2015-11-30 | 2017-06-08 | 国立大学法人東京大学 | Bolometer-type terahertz wave detection element and bolometer-type terahertz wave detection element array |
-
1993
- 1993-12-27 JP JP35458293A patent/JP3374498B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH07198474A (en) | 1995-08-01 |
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