JP3183098B2 - Substrate holder for substrate processing equipment - Google Patents

Substrate holder for substrate processing equipment

Info

Publication number
JP3183098B2
JP3183098B2 JP13173995A JP13173995A JP3183098B2 JP 3183098 B2 JP3183098 B2 JP 3183098B2 JP 13173995 A JP13173995 A JP 13173995A JP 13173995 A JP13173995 A JP 13173995A JP 3183098 B2 JP3183098 B2 JP 3183098B2
Authority
JP
Japan
Prior art keywords
substrate
substrate holding
groove
thin plate
holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP13173995A
Other languages
Japanese (ja)
Other versions
JPH0849073A (en
Inventor
和憲 藤川
研二 安井
久雄 西澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Screen Holdings Co Ltd, Dainippon Screen Manufacturing Co Ltd filed Critical Screen Holdings Co Ltd
Priority to JP13173995A priority Critical patent/JP3183098B2/en
Publication of JPH0849073A publication Critical patent/JPH0849073A/en
Application granted granted Critical
Publication of JP3183098B2 publication Critical patent/JP3183098B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning In General (AREA)
  • Packaging Frangible Articles (AREA)
  • Physical Vapour Deposition (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、半導体ウエハや液晶
用ガラス基板等の表面処理(洗浄処理や乾燥等を含む)
をなす基板処理装置において用いられる基板保持具に関
し、さらに詳しくは、起立姿勢で保持した複数の基板を
処理液中から相対的に引き上げる際に用いられる基板保
持具に関する。なお、後述するウエハボートやウエハチ
ャックも本発明に係る基板保持具である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to surface treatment (including cleaning and drying) of semiconductor wafers and liquid crystal glass substrates.
More particularly, the present invention relates to a substrate holder used when a plurality of substrates held in an upright posture are relatively pulled up from a processing liquid. Note that a wafer boat and a wafer chuck described later are also substrate holders according to the present invention.

【0002】[0002]

【従来の技術】この種の基板保持具が用いられる基板処
理装置の一例として、例えば本出願人の提案に係るもの
で、特願平5−140086号に開示された基板の洗浄
・乾燥装置がある。
2. Description of the Related Art As an example of a substrate processing apparatus using a substrate holder of this type, a cleaning and drying apparatus for a substrate disclosed in Japanese Patent Application No. Hei. is there.

【0003】それは図18(A)に示すように、密閉可能
に構成された密閉チャンバ1と、この密閉チャンバ1内
の底部に設けられたオーバーフロー型の洗浄槽2と、基
板保持具20で保持した複数の基板Wを洗浄液3中に浸
漬し又洗浄済みの基板Wを引き上げるためのリフター1
0とから構成されている。この洗浄・乾燥装置によれ
ば、基板Wを洗浄液3中に浸漬して洗浄するとともに、
洗浄液3中から基板Wを引き上げる際に、減圧下でアル
コール蒸気等を基板Wの周囲に供給して乾燥を促進する
ことができる。なお、図18(A)中の符号4は洗浄液の
供給口、5はオーバーフローした洗浄液の受け部、6は
開閉自在な上部開口、7は上部開口6の密閉蓋、8はラ
バーヒータ、9は例えばアルコール等の供給口である。
[0003] As shown in FIG. 18 (A), a closed chamber 1, which can be sealed, an overflow type cleaning tank 2 provided at the bottom of the closed chamber 1, and a substrate holder 20. Lifter 1 for immersing a plurality of substrates W thus cleaned in cleaning solution 3 and for lifting up cleaned substrates W
0. According to the cleaning / drying apparatus, the substrate W is immersed in the cleaning liquid 3 for cleaning.
When the substrate W is pulled up from the cleaning liquid 3, alcohol vapor or the like can be supplied to the periphery of the substrate W under reduced pressure to promote drying. In FIG. 18A, reference numeral 4 denotes a supply port for the cleaning liquid, 5 denotes a receiving portion for the overflowing cleaning liquid, 6 denotes an openable upper opening, 7 denotes a sealing lid of the upper opening 6, 8 denotes a rubber heater, and 9 denotes a rubber heater. For example, a supply port for alcohol or the like.

【0004】上記リフター10は、スラスト軸受11で
支持した出力ロッド12の上端部に逆L字状の部材13
を固設し、この部材13の下端部にウエハボート20を
略水平に固設して構成されている。上記ウエハボート2
0は、図18(B)に示すように、複数の基板Wを起立姿
勢で前後に並列させて保持する複数の基板保持枠21A
〜21Bを有し、これらの基板保持枠21A〜21Bの
前後両端部は固定枠26で固定されている。これらの基
板保持枠21には、図18(C)に示すように、複数の基
板Wを起立姿勢で前後に並列させて保持する多数のY字
状の基板保持溝22が形成されている。なお、図18
(D)に示すように、上記ウエハボート20に代えてウエ
ハチャック40で保持した複数の基板Wを洗浄液3中に
浸漬し、洗浄済みの基板Wを引き上げる場合もあるが、
このウエハチャック40の基板保持枠21にもY字状又
はV字状の基板保持溝が形成されている。
The lifter 10 has an inverted L-shaped member 13 at the upper end of an output rod 12 supported by a thrust bearing 11.
And the wafer boat 20 is fixed substantially horizontally at the lower end of the member 13. The above wafer boat 2
0 denotes a plurality of substrate holding frames 21A for holding a plurality of substrates W side by side in a standing posture, as shown in FIG.
21B, and the front and rear ends of these substrate holding frames 21A to 21B are fixed by fixed frames 26. As shown in FIG. 18C, a number of Y-shaped substrate holding grooves 22 for holding a plurality of substrates W side by side in a standing posture are formed in these substrate holding frames 21. Note that FIG.
As shown in (D), a plurality of substrates W held by the wafer chuck 40 instead of the wafer boat 20 may be immersed in the cleaning liquid 3 and the cleaned substrate W may be pulled up.
The substrate holding frame 21 of the wafer chuck 40 also has a Y-shaped or V-shaped substrate holding groove.

【0005】[0005]

【発明が解決しようとする課題】上記従来例では、処理
液中からウエハボート20やウエハチャック40を引き
上げる際に、基板保持溝22内の処理液が抜け難いとい
う問題がある。つまり基板保持溝22内に基板Wを収容
した状態では、基板保持溝22と基板Wとの隙間が狭く
なり、毛細管現象により当該隙間に処理液が残留するも
のと考えられる。このため、基板の浸漬処理工程におい
ては処理液の持ち出しに伴うクロスコンタミネーション
の問題が生ずる。また、引上式乾燥工程においては、基
板保持溝22内に処理液が残留するために基板を迅速に
乾燥をすることができない。本発明は基板保持溝内に処
理液が残留する不都合を大幅に改善して、基板の浸漬処
理工程におけるクロスコンタミネーションの問題を解消
することを主要な技術課題とする。
In the above conventional example, when the wafer boat 20 and the wafer chuck 40 are pulled up from the processing liquid, there is a problem that the processing liquid in the substrate holding groove 22 is hardly removed. That is, when the substrate W is accommodated in the substrate holding groove 22, the gap between the substrate holding groove 22 and the substrate W is narrowed, and it is considered that the processing liquid remains in the gap due to the capillary phenomenon. For this reason, in the substrate immersion processing step, there is a problem of cross-contamination accompanying the removal of the processing liquid. In addition, in the pull-up drying process, the substrate cannot be dried quickly because the processing liquid remains in the substrate holding groove 22. SUMMARY OF THE INVENTION It is a main technical object of the present invention to significantly improve the inconvenience of processing liquid remaining in a substrate holding groove and to eliminate the problem of cross contamination in a substrate immersion processing step.

【0006】[0006]

【課題を解決するための手段】上記課題を解決するため
に、本発明は以下のように構成される。請求項1の発明
は、複数の基板を起立姿勢で前後に並列させて保持する
複数の基板保持枠を有し、起立姿勢で保持した複数の基
板を処理液中から相対的に引き上げる基板処理装置の基
板保持具において、上記基板保持枠の各基板保持溝の
底面に基板の厚さより大きな直径を有する液抜き孔を貫
通形成し、上記基板保持枠に上記溝底面と平行をなして
いる別の液抜き孔を貫通形成し、上記液抜き孔の下端を
上記別の液抜き孔に連通させていることを特徴とするも
のである。
In order to solve the above-mentioned problems, the present invention is configured as follows. The invention according to claim 1 includes a substrate processing apparatus having a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a front-to-back direction, and for relatively pulling up the plurality of substrates held in the standing posture from a processing solution. in the substrate holder, the groove of each board holding grooves of the substrate holding frame
A drain hole having a diameter greater than the thickness of the substrate is formed through the bottom surface, and the substrate holding frame is formed in parallel with the groove bottom surface.
Through another drainage hole, and connect the lower end of the drainage hole
It is characterized in that it communicates with the another liquid drain hole .

【0007】請求項2の発明は、複数の基板を起立姿勢
で前後に並列させて保持する複数の基板保持枠を有し、
起立姿勢で保持した複数の基板を処理液中から相対的に
引き上げる基板処理装置の基板保持具において、上記基
板保持枠の各基板保持溝は、V字溝部、垂直溝部、及び
溝底面を備え、各基板保持溝の少なくとも左右いずれか
の側より上記基板保持溝の上記V字溝部から上記溝底面
にかけて液抜き段落凹部を凹入形成したことを特徴とす
るものである。
According to a second aspect of the present invention, there are provided a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a back-and-forth parallel manner,
In a substrate holder of a substrate processing apparatus that relatively pulls up a plurality of substrates held in a standing posture from a processing liquid, each substrate holding groove of the substrate holding frame has a V-shaped groove, a vertical groove, and
A groove bottom surface, wherein at least one of the left and right sides of each substrate holding groove, the V-shaped groove portion of the substrate holding groove extends from the groove bottom surface;
, The liquid draining paragraph concave portion is recessed and formed.

【0008】請求項3の発明は、複数の基板を起立姿勢
で前後に並列させて保持する複数の基板保持枠を有し、
起立姿勢で保持した複数の基板を処理液中から相対的に
引き上げる基板処理装置の基板保持具において、上記基
板保持枠の各基板保持溝は、V字状溝部、垂直溝部、及
び溝底面を備え、上記各基板保持溝の溝幅を液抜き可能
に大きく形成するとともに、上記V字状溝部の傾斜面に
沿わせて基板を保持する突起を形成したことを特徴とす
るものである。
According to a third aspect of the present invention, there is provided a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a back-and-forth direction.
In the substrate holder of the substrate processing apparatus for relatively pulling up a plurality of substrates held in the standing posture from the processing liquid, each substrate holding groove of the substrate holding frame has a V-shaped groove, a vertical groove, and
And a groove bottom surface, the groove width of each of the substrate holding grooves is formed large enough to allow liquid to be drained, and the V-shaped groove portion has an inclined surface.
Thereby along and is characterized in that the formation of the protrusions to hold the substrate.

【0009】請求項4の発明は、複数の基板を起立姿勢
で前後に並列させて保持する複数の基板保持枠を有し、
起立姿勢で保持した複数の基板を処理液中から相対的に
引き上げる基板処理装置の基板保持具において、上記複
数の基板保持枠は、それぞれ上部に基板を保持する基板
保持溝が形成された薄板材を間隔を空けて起立状態で固
定部材に固定して構成した、ことを特徴とするものであ
る。
According to a fourth aspect of the present invention, there is provided a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a back-and-forth parallel manner,
In a substrate holder of a substrate processing apparatus for relatively pulling up a plurality of substrates held in an upright position from a processing liquid, the plurality of substrate holding frames each have a thin plate material having a substrate holding groove formed thereon for holding a substrate. Are fixed to the fixing member in an upright state with an interval therebetween.

【0010】請求項5の発明は、請求項4に記載した基
板処理装置の基板保持具において、各基板保持枠は、基
板の一方の面と接触する基板保持溝が設けられた第1薄
板材と、前記基板の他方の面と接触する基板保持溝が設
けられた第2薄板材とを有するものである。
According to a fifth aspect of the present invention, in the substrate holder of the substrate processing apparatus according to the fourth aspect, each of the substrate holding frames is provided with a substrate holding groove that is in contact with one surface of the substrate. And a second thin plate member provided with a substrate holding groove in contact with the other surface of the substrate.

【0011】請求項6の発明は、請求項5に記載した基
板処理装置の基板保持具において、各基板保持枠は、相
互に対向して設けられ、基板の厚み方向に相対移動可能
な一組の第1薄板材と第2薄板材とを有するものであ
る。
According to a sixth aspect of the present invention, in the substrate holder of the substrate processing apparatus according to the fifth aspect, each of the substrate holding frames is provided so as to face each other and is relatively movable in the thickness direction of the substrate. The first thin plate member and the second thin plate member.

【0012】請求項7の発明は、請求項4乃至請求項5
のいずれかに記載した基板処理装置の基板保持具におい
て、各基板保持枠は、2枚の薄板材と、当該2枚の薄板
材を対向させて固定する薄板固定部材とを備え、各薄板
材は、その厚み方向に前記薄板固定部材上の処理液を排
出する排液孔を貫通形成したものである。
The invention of claim 7 is the invention of claims 4 and 5.
In each of the substrate holders of the substrate processing apparatus described in any one of the above, each of the substrate holding frames includes two thin plate members and a thin plate fixing member that fixes the two thin plate members so as to face each other. Is formed by penetrating a drainage hole for discharging the processing liquid on the thin plate fixing member in the thickness direction thereof.

【0013】[0013]

【作用】請求項1の発明では、基板保持枠の各基板保持
溝の底部に基板の厚さより大きな直径を有する液抜き孔
を貫通形成したことから、起立姿勢で保持した複数の基
板を処理液中から相対的に引き上げる際に、処理液が自
重により引きつられて基板保持溝から液抜き孔内へと流
下し、基板保持溝内に残留する処理液はごく僅かにな
る。
According to the first aspect of the present invention, a plurality of substrates held in an upright posture are processed with a processing liquid because a liquid drain hole having a diameter larger than the thickness of the substrate is formed through the bottom of each substrate holding groove of the substrate holding frame. When the processing liquid is relatively pulled up from the inside, the processing liquid is pulled by its own weight and flows down from the substrate holding groove into the liquid drain hole, and the processing liquid remaining in the substrate holding groove becomes very small.

【0014】請求項2の発明では、基板保持枠の各基板
保持溝の少なくとも左右いずれかの側より液抜き段落凹
部を凹入形成したことから、各基板保持溝の長さが十分
に短くなり、基板と基板保持溝との接触面積は小さくな
る。従って起立姿勢で保持した複数の基板を処理液中か
ら相対的に引き上げる際に、処理液は基板保持溝から流
出して液抜き段落凹部へ流下し、基板保持溝内に残留す
る処理液はごく僅かになる。
According to the second aspect of the present invention, the length of each substrate holding groove is sufficiently short because the liquid draining paragraph recess is formed from at least one of the left and right sides of each substrate holding groove of the substrate holding frame. The contact area between the substrate and the substrate holding groove is reduced. Therefore, when the plurality of substrates held in the upright posture are relatively pulled up from the processing liquid, the processing liquid flows out of the substrate holding groove, flows down to the drain recess, and the processing liquid remaining in the substrate holding groove is extremely small. Become slight.

【0015】請求項3の発明では、基板保持枠の各基板
保持溝の溝幅を液抜き可能に大きく形成するとともに、
その溝部の前後の対向面に基板を保持する突起を形成し
たことから、基板と突起との接触面積は極端に小さくな
り、基板は実質的に点接触状態で保持される。従って、
起立姿勢で保持した複数の基板を処理液中から相対的に
引き上げる際に、処理液は溝幅を液抜き可能に大きく形
成した基板保持溝より流出して、基板保持溝内に残留す
ることが殆ど無くなる。
According to the third aspect of the present invention, the width of each of the substrate holding grooves of the substrate holding frame is formed large so that the liquid can be drained.
Since the protrusions for holding the substrate are formed on the opposing surfaces before and after the groove, the contact area between the substrate and the protrusions becomes extremely small, and the substrate is held substantially in a point contact state. Therefore,
When the plurality of substrates held in the upright posture are relatively pulled up from the processing liquid, the processing liquid may flow out of the substrate holding groove formed so that the groove width can be drained, and may remain in the substrate holding groove. Almost gone.

【0016】請求項4の発明では、複数の基板保持枠
は、それぞれ上部に基板を保持する基板保持溝が形成さ
れた薄板材を間隔を空けて起立状態で固定部材に固定し
て構成したことから、基板は間隔を空けて起立状態で固
定された複数の薄板材によって保持される。つまり、複
数の薄板材に形成された基板保持溝と各基板との接触面
積は小さく、実質的に線接触状態で基板を保持できる。
これにより起立姿勢で保持した複数の基板を処理液中か
ら相対的に引き上げる際に、処理液は薄板材の基板保持
溝から流出して当該基板保持溝内に残留することは殆ど
無くなる。
According to a fourth aspect of the present invention, the plurality of substrate holding frames are each formed by fixing a thin plate member having a substrate holding groove formed on an upper portion thereof to a fixed member in an upright state at intervals. Therefore, the substrate is held by a plurality of thin plate members fixed in an upright state at intervals. That is, the contact area between the substrate holding groove formed in the plurality of thin plate members and each substrate is small, and the substrate can be held substantially in a line contact state.
Thus, when the plurality of substrates held in the upright posture are relatively pulled up from the processing liquid, the processing liquid hardly flows out of the substrate holding groove of the thin plate material and remains in the substrate holding groove.

【0017】請求項5の発明では、各基板保持枠が、基
板の一方の面と接触する基板保持溝が設けられた第1薄
板材と、前記基板の他方の面と接触する基板保持溝が設
けられた第2薄板材とを有することから、各基板は第1
薄板材と第2薄板材とによって形成される基板保持溝で
保持される。従って、前記と同様に基板と基板保持溝と
の接触面積は小さく、起立姿勢で保持した複数の基板を
処理液中から相対的に引き上げる際に、処理液は基板保
持溝から流出して基板保持溝内に残留することが殆ど無
くなる。
According to the fifth aspect of the present invention, each substrate holding frame includes a first thin plate member provided with a substrate holding groove in contact with one surface of the substrate, and a substrate holding groove in contact with the other surface of the substrate. Since each of the substrates has the first sheet material provided,
It is held by a substrate holding groove formed by the thin sheet material and the second thin sheet material. Therefore, as described above, the contact area between the substrate and the substrate holding groove is small, and when the plurality of substrates held in the upright posture are relatively pulled up from the processing liquid, the processing liquid flows out of the substrate holding groove and holds the substrate. It hardly remains in the groove.

【0018】請求項6の発明では、各基板保持枠が、相
互に対向して設けられ、基板の厚み方向に相対移動可能
な一組の第1薄板材と第2薄板材とを有することから、
第1薄板材と第2薄板材とを相対移動させることによ
り、基板を保持する基板保持溝のギャップを調節するこ
とができ、また、そのギャップを調節することにより、
基板保持溝の側面視の形状を適宜変更することができ
る。
According to the sixth aspect of the present invention, since each of the substrate holding frames is provided to face each other and has a pair of the first thin plate member and the second thin plate member which are relatively movable in the thickness direction of the substrate. ,
By relatively moving the first thin plate and the second thin plate, the gap of the substrate holding groove for holding the substrate can be adjusted, and by adjusting the gap,
The shape of the substrate holding groove in a side view can be appropriately changed.

【0019】請求項7の発明では、各基板保持枠が、2
枚の薄板材と当該2枚の薄板材を対向させて固定する薄
板固定部材とを備え、各薄板材には、その厚み方向に排
液孔が貫通形成されていることから、起立姿勢で保持し
た複数の基板を処理液中から相対的に引き上げる際に、
処理液は上記排液孔から流出して薄板固定部材上に残留
することが殆ど無くなる。
According to the seventh aspect of the present invention, each substrate holding frame has two
It is provided with a thin plate member and a thin plate fixing member for fixing the two thin plate members so as to face each other, and each of the thin plate members has a drainage hole formed in a thickness direction thereof, so that the thin plate member is held in an upright posture. When pulling up multiple substrates relatively from the processing solution,
The treatment liquid hardly flows out of the drain hole and remains on the thin plate fixing member.

【0020】[0020]

【実施例】以下本発明の実施例を図面に基づいてさらに
詳しく説明する。図1は請求項1の発明に係る基板保持
枠を備えるウエハボートを示し、同図(A)はそのウエハ
ボートの縦断正面図、同図(B)はそのウエハボートの平
面図、同図(C)は同図(A)中の要部Aの拡大側面図、同
図(D)は当該要部Aを拡大して示す斜視図である。
Embodiments of the present invention will be described below in more detail with reference to the drawings. FIG. 1 shows a wafer boat provided with a substrate holding frame according to the invention of claim 1, wherein FIG. 1A is a longitudinal sectional front view of the wafer boat, and FIG. 1B is a plan view of the wafer boat. (C) is an enlarged side view of a main part A in FIG. (A), and FIG. (D) is a perspective view showing the main part A in an enlarged manner.

【0021】この実施例では、基板保持具20がウエハ
ボートとして構成されており、例えば前記基板洗浄・乾
燥装置にあってはリフターでチャック可能に構成され、
また、他の基板処理装置にあっては処理槽内に設置され
るが、いずれも起立姿勢で保持した複数の基板Wを処理
液中から相対的に引き上げる際に、基板保持溝からの処
理液の流出に優れる。
In this embodiment, the substrate holder 20 is configured as a wafer boat. For example, in the substrate cleaning / drying apparatus, the substrate holder 20 can be chucked by a lifter.
Further, in other substrate processing apparatuses, the processing liquid is installed in a processing tank, but when the plurality of substrates W held in an upright posture are relatively pulled up from the processing liquid, the processing liquid from the substrate holding groove is removed. Excellent for outflow.

【0022】上記ウエハボート20は、図1(A)(B)に
示すように、複数の基板Wを起立姿勢で前後に並列させ
て保持する3個の基板保持枠21A〜21Bを有し、こ
れらの基板保持枠21A〜21Bの前後両端部は固定枠
26で固定されている。上記固定枠26の前後の端面に
は、それぞれ一対のリフター用チャックピン27が突設
され、各固定枠26の下端面には、当該ウエハボート2
0を水平設置するための調節可能な4個の脚28が立設
されている。そして上記基板保持枠21A〜21Bに
は、複数の基板Wを起立姿勢で前後に並列させて保持す
る多数の基板保持溝が形成されている。
As shown in FIGS. 1A and 1B, the wafer boat 20 has three substrate holding frames 21A to 21B for holding a plurality of substrates W in a standing posture in a back-and-forth direction. Both front and rear ends of these substrate holding frames 21A to 21B are fixed by fixed frames 26. A pair of lifter chuck pins 27 project from front and rear end surfaces of the fixed frame 26, respectively.
Four adjustable legs 28 for horizontal installation of the 0 are provided. The substrate holding frames 21A to 21B are formed with a large number of substrate holding grooves for holding a plurality of substrates W side by side in a standing posture.

【0023】先ず、請求項1の発明の実施例に係る基板
保持枠の構造について説明する。上記基板保持枠21A
〜21Bのうち、中央部の基板保持枠21Aには、図1
(C)(D)に示すように、Y字状の基板保持溝22のV字
溝部22aと垂直溝部22bと溝底面22cとにわたり
垂直溝部22bの溝幅より大きな液抜き孔23aが貫通
形成されている。この液抜き孔23aを垂直溝部22b
の溝幅より大きくしたのは、当該垂直溝部22bの中央
を欠落させて基板Wの接触面積を実質的に小さくすると
ともに、液滴の流下を容易にするためである。上記垂直
溝部22bの下側には、溝底面22cと平行をなす別の
液抜き孔23bが貫通形成されており、上記液抜き孔2
3aの下端を上記別の液抜き孔23bに連通してある。
なお、溝底面22c及び液抜き孔23bは、処理液の流
下を促進するように少し傾斜させてある。
First, the structure of the substrate holding frame according to the first embodiment of the present invention will be described. The board holding frame 21A
1 to 21B, the substrate holding frame 21A at the center is
As shown in (C) and (D), a liquid drain hole 23a larger than the groove width of the vertical groove portion 22b is formed through the V-shaped groove portion 22a, the vertical groove portion 22b, and the groove bottom surface 22c of the Y-shaped substrate holding groove 22. ing. This drain hole 23a is inserted into the vertical groove 22b.
The reason why the groove width is made larger than the above is that the center of the vertical groove portion 22b is cut off to substantially reduce the contact area of the substrate W and facilitate the flow of the droplet. Under the vertical groove portion 22b, another drainage hole 23b parallel to the groove bottom surface 22c is formed to penetrate therethrough.
The lower end of 3a is communicated with another liquid drain hole 23b.
The groove bottom surface 22c and the liquid drain hole 23b are slightly inclined so as to promote the flow of the processing liquid.

【0024】この実施例では、基板保持枠21Aの各基
板保持溝22の底部に液抜き孔23a・23bを貫通形
成したことから、起立姿勢で保持した複数の基板Wを処
理液中から相対的に引き上げる際に、液滴が自重により
引きづられて基板保持溝22の垂直溝部22bから液抜
き孔23a・23b内へと流下するので、当該垂直溝部
22b内に残留する処理液はごく僅かになる。従って、
浸漬型基板処理装置においては、処理液の持ち出しによ
るクロスコンタミネーションが大幅に改善される。ま
た、前記基板洗浄・乾燥装置(図18)における引上式
乾燥工程においては、基板の乾燥を一層促進することが
できる。なお、これらの効果は後述する実施例において
も共通する効果である。
In this embodiment, since the drain holes 23a and 23b are formed through the bottom of each of the substrate holding grooves 22 of the substrate holding frame 21A, the plurality of substrates W held in the upright posture are relatively removed from the processing liquid. When the liquid is pulled up, the liquid drops are attracted by their own weight and flow down from the vertical grooves 22b of the substrate holding groove 22 into the drain holes 23a and 23b, so that the processing liquid remaining in the vertical grooves 22b is very slight. Become. Therefore,
In the immersion type substrate processing apparatus, cross contamination caused by taking out the processing liquid is greatly improved. Further, in the pull-up drying step in the substrate cleaning / drying apparatus (FIG. 18), drying of the substrate can be further promoted. These effects are common to the embodiments described later.

【0025】上記実施例では中央部の基板保持枠21A
の基板保持溝22をY字状に形成したことから、基板と
溝との接触面積を減少させつつ、基板の倒れを確実に防
止することができるという利点がある。ただし、中央部
の基板保持枠21Aの基板保持溝22をV字状に形成す
る場合を排除するものではない。この場合でも複数の基
板Wを起立姿勢で前後に並列させて保持することができ
るからである。また、上記実施例では従来の基板保持枠
21に液抜き孔23a・23bを追加加工するだけでよ
く改造が容易である。なお、上記液抜き孔23aは、図
1(D)中の2点鎖線で示すように、基板保持枠21Aの
下面に達するように貫通させてもよい。さらに、上記液
抜き孔23a・23bは少なくとも基板Wの厚さより大
きな直径を有するものであれば足りる。毛細管現象を回
避して液滴の流下を促進できるからである。
In the above embodiment, the central substrate holding frame 21A
Since the substrate holding groove 22 is formed in a Y-shape, there is an advantage that the contact area between the substrate and the groove can be reduced and the falling of the substrate can be reliably prevented. However, this does not exclude the case where the substrate holding groove 22 of the central substrate holding frame 21A is formed in a V-shape. This is because, even in this case, the plurality of substrates W can be held side by side in a standing posture in a back-and-forth direction. Further, in the above-described embodiment, the remodeling is easy only by additionally processing the drain holes 23a and 23b in the conventional substrate holding frame 21. The liquid drain hole 23a may be penetrated so as to reach the lower surface of the substrate holding frame 21A as shown by a two-dot chain line in FIG. Further, it is sufficient that the liquid drain holes 23a and 23b have at least a diameter larger than the thickness of the substrate W. This is because a capillary phenomenon can be avoided and the flow of the droplet can be promoted.

【0026】図2は中央部の基板保持枠21Aについて
の他の実施例であり、請求項2の発明に係る基板保持枠
の第1の実施例を示す。即ち、同図(A)はその基板保持
枠21Aの縦断正面図、同図(B)はその基板保持枠21
Aの平面図、同図(C)はその基板保持枠21Aの要部の
拡大側面図、同図(D)はその基板保持枠21Aの要部の
拡大斜視図である。この基板保持枠21Aは、前記Y字
状の各基板保持溝22の左右両側より、そのV字溝部2
2aの溝幅と同程度の円弧幅の液抜き段落凹部24を凹
入形成したものである。
FIG. 2 shows another embodiment of the substrate holding frame 21A at the center, and shows a first embodiment of the substrate holding frame according to the second aspect of the present invention. That is, FIG. 7A is a vertical sectional front view of the substrate holding frame 21A, and FIG.
2A is a plan view, FIG. 2C is an enlarged side view of a main part of the substrate holding frame 21A, and FIG. 2D is an enlarged perspective view of a main part of the substrate holding frame 21A. The board holding frame 21A is provided with V-shaped groove portions 2 from both left and right sides of each of the Y-shaped board holding grooves 22.
The liquid draining paragraph concave portion 24 having an arc width approximately equal to the groove width of the groove 2a is formed in a concave shape.

【0027】上記液抜き段落凹部24は、上記基板保持
溝22のV字溝部22aから溝底面22cにかけて凹入
形成され、その底面24bは基板保持溝22の溝底面2
2cよりも段落状に低く、かつ、左右両側へ下り傾斜さ
せて形成されている。この液抜き段落凹部24を形成す
ることにより、上記基板保持溝22の垂直溝部22bの
長さを短くして、基板Wと垂直溝部22bとの接触面積
を小さくすることができるという利点がある。これによ
り、起立姿勢で保持した複数の基板Wを処理液中から相
対的に引き上げる際に、処理液は垂直溝部22bから流
出して液抜き段落凹部24へ流下するので、垂直溝部2
2b内に残留する処理液はごく僅かになる。
The liquid draining recess 24 is recessed from the V-shaped groove portion 22a of the substrate holding groove 22 to the groove bottom surface 22c.
It is formed in a paragraph lower than 2c, and is inclined downward to both left and right sides. By forming the liquid draining paragraph concave portion 24, there is an advantage that the length of the vertical groove portion 22b of the substrate holding groove 22 can be shortened and the contact area between the substrate W and the vertical groove portion 22b can be reduced. Accordingly, when the plurality of substrates W held in the upright posture are relatively pulled up from the processing liquid, the processing liquid flows out of the vertical groove 22b and flows down to the drainage recess 24, so that the vertical groove 2
The processing liquid remaining in 2b is very small.

【0028】図3は図1(A)中の左右一対の基板保持枠
21Bについての実施例であり、請求項2の発明に係る
基板保持枠の第2の実施例を示す。即ち、同図(A)は図
1(A)中の基板保持枠21Bの要部Bの縦断正面図、同
図(B)はその基板保持枠21Bの平面図、同図(C)はそ
の要部Bの拡大側面図、同図(D)はその要部Bの拡大斜
視図である。この基板保持枠21Bは、図2と同様に当
該基板保持枠21BのY字状の各基板保持溝22の左右
両側より、液抜き段落凹部24を凹入形成したものであ
る。この場合も垂直溝部22b内に残留する処理液はご
く僅かになる。
FIG. 3 shows an embodiment of a pair of left and right substrate holding frames 21B in FIG. 1A, and shows a second embodiment of the substrate holding frame according to the second aspect of the present invention. 1A is a longitudinal sectional front view of a main part B of the substrate holding frame 21B in FIG. 1A, FIG. 1B is a plan view of the substrate holding frame 21B, and FIG. FIG. 3D is an enlarged perspective view of the main part B. FIG. This substrate holding frame 21B is formed by recessing the liquid draining paragraph recess 24 from both left and right sides of each of the Y-shaped substrate holding grooves 22 of the substrate holding frame 21B as in FIG. Also in this case, the processing liquid remaining in the vertical groove portion 22b becomes very small.

【0029】図4は左右一対の基板保持枠21Bについ
ての別の実施例であり、請求項2の発明に係る基板保持
枠の第3の実施例を示す。即ち、同図(A)はその基板保
持枠21Bの要部の縦断正面図、同図(B)はその基板保
持枠21Bの平面図、同図(C)はその要部の拡大側面
図、同図(D)はその要部の拡大斜視図である。この基板
保持枠は、上記一対の基板保持枠21BのY字状の各基
板保持溝22の対向する内側(片側)より前記同様の液
抜き段落凹部24を凹入形成したものである。なお、上
記基板保持溝22は対向する内側へ向けて傾斜させてあ
る。この場合も垂直溝部22b内に残留する処理液はご
く僅かになる。
FIG. 4 shows another embodiment of the pair of left and right substrate holding frames 21B, and shows a third embodiment of the substrate holding frame according to the second aspect of the present invention. That is, FIG. 2A is a longitudinal sectional front view of a main part of the substrate holding frame 21B, FIG. 2B is a plan view of the substrate holding frame 21B, and FIG. 2C is an enlarged side view of the main part. FIG. 1D is an enlarged perspective view of the main part. This substrate holding frame is formed by recessing the same liquid draining paragraph recess 24 from the inside (one side) of each of the Y-shaped substrate holding grooves 22 of the pair of substrate holding frames 21B opposed to each other. The substrate holding groove 22 is inclined toward the inside facing the groove. Also in this case, the processing liquid remaining in the vertical groove portion 22b becomes very small.

【0030】図5は中央部の基板保持枠21A及び左右
一対の基板保持枠21Bについてのさらに別の実施例で
あり、請求項3の発明に係る基板保持枠の実施例を示
す。即ち、同図(A)はその基板保持枠の要部の拡大側
面図、同図(B)はその基板保持枠の要部の拡大斜視図
である。この基板保持枠は、上記Y字状の基板保持溝2
2の垂直溝部22bの溝幅を液抜き可能に大きく形成す
るとともに、その溝部の前後の対向面に基板Wを保持す
る一対の突起25を形成したものである。
FIG. 5 shows still another embodiment of the substrate holding frame 21A at the center and a pair of left and right substrate holding frames 21B, and shows an embodiment of the substrate holding frame according to the third aspect of the present invention. That is, FIG. 2A is an enlarged side view of a main part of the substrate holding frame, and FIG. 2B is an enlarged perspective view of a main part of the substrate holding frame. The substrate holding frame is provided with the Y-shaped substrate holding groove 2.
The groove width of the second vertical groove portion 22b is formed large enough to allow liquid to be drained, and a pair of projections 25 for holding the substrate W are formed on opposing surfaces before and after the groove portion.

【0031】上記一対の突起25は、基板保持溝22の
垂直溝部22bに基板Wを収納する際の障害とならない
ように、V字状溝部22aの傾斜面に添わせて設けるこ
とが望ましい。また、基板保持溝22の溝底面22cは
上向きに山形をなすように形成する。上記構成により、
基板Wと突起25との接触面積は極端に小さくなり、基
板Wは溝底面22cの山頂部で実質的に点接触状態で支
持され、この基板Wを処理液中から相対的に引き上げる
際に、処理液は溝幅を大きく形成した基板保持溝より流
出して、基板保持溝22内に残留することはない。
The pair of protrusions 25 are desirably provided along the inclined surface of the V-shaped groove 22a so as not to hinder the accommodation of the substrate W in the vertical groove 22b of the substrate holding groove 22. Further, the groove bottom surface 22c of the substrate holding groove 22 is formed so as to form an upward mountain shape. With the above configuration,
The contact area between the substrate W and the projection 25 becomes extremely small, and the substrate W is supported in a substantially point contact state at the top of the groove bottom surface 22c. When the substrate W is relatively pulled up from the processing solution, The processing liquid does not flow out of the substrate holding groove having a large groove width and remains in the substrate holding groove 22.

【0032】図6は請求項4の発明に係るウエハボート
の第1の実施例を示す縦断正面図、図7はその斜視図で
ある。このウエハボート20は、複数の基板Wを起立姿
勢で前後に並列させて保持する3組の基板保持枠21A
〜21Bを有し、これらの基板保持枠21A〜21Bの
前後の両端部は固定梁26bに固定されている。そして
図6に示すように、各組の基板保持枠21A〜21B
は、それぞれ2枚の薄板材32で構成され、各薄板材3
2相互間には処理液が流下可能なスペースSが設けてあ
る。
FIG. 6 is a vertical sectional front view showing a first embodiment of the wafer boat according to the fourth aspect of the present invention, and FIG. 7 is a perspective view thereof. The wafer boat 20 has three sets of substrate holding frames 21A that hold a plurality of substrates W in a standing posture in a back-and-forth direction.
21B, and both front and rear ends of these substrate holding frames 21A to 21B are fixed to fixed beams 26b. Then, as shown in FIG. 6, each set of substrate holding frames 21A to 21B
Are each composed of two thin plate members 32, and each thin plate member 3
A space S through which the processing liquid can flow is provided between the two.

【0033】図7に示すように、中央部の基板保持枠2
1Aを構成する各薄板材32aにはY字状の基板保持溝
22が形成され、左右一対の基板保持枠21Bを構成す
る各薄板材32bにはV字状の基板保持溝22dが形成
されている。上記構成により各薄板材32の幅で基板W
が保持され、基板Wと各基板保持溝22・22dとの接
触面積は小さくなる。また、起立姿勢で保持した複数の
基板Wを処理液中から相対的に引き上げる際に、処理液
は上記スペースSから流下して基板保持溝22・22d
内に残留することはない。
As shown in FIG. 7, the substrate holding frame 2 at the center is
A substrate holding groove 22 in a Y-shape is formed in each thin plate member 32a constituting 1A, and a V-shaped substrate holding groove 22d is formed in each thin plate member 32b constituting a pair of left and right substrate holding frames 21B. I have. With the above configuration, the substrate W
Is held, and the contact area between the substrate W and each of the substrate holding grooves 22 becomes small. When the plurality of substrates W held in the upright posture are relatively pulled up from the processing liquid, the processing liquid flows down from the space S and flows into the substrate holding grooves 22.
Will not remain in the interior.

【0034】図8は請求項4の発明に係るウエハボート
の第2の実施例を示す斜視図である。このウエハボート
20は、図8に示すように、上記図6と同様のスペース
Sを有し、3組の基板保持枠21A〜21Bはそれぞれ
2枚の薄板材32で構成されている。各基板保持枠21
A〜21Bを構成する各薄板材32には、その上端縁に
沿って基板Wの配列ピッチの2倍のピッチで凸部33と
凹部34とが交互に形成されている。
FIG. 8 is a perspective view showing a second embodiment of the wafer boat according to the fourth aspect of the present invention. As shown in FIG. 8, the wafer boat 20 has the same space S as in FIG. 6, and each of the three sets of substrate holding frames 21A to 21B is composed of two thin plate members 32. Each board holding frame 21
In each of the thin plate members 32 constituting A to 21B, convex portions 33 and concave portions 34 are alternately formed along the upper edge thereof at a pitch twice as large as the arrangement pitch of the substrates W.

【0035】ただし、中央部の1組の基板保持枠21A
を構成する各薄板材32aと、左右一対の基板保持枠2
1Bを構成する各薄板材32bとでは凹部34の深さが
少し異なる。そして各組みの薄板材32・32の凸部3
3と凹部34とを組み合わせることにより、中央部の1
組の基板保持枠21Aでは、側面視でY字状の基板保持
溝22が形成され、左右一対の基板保持枠21Bでは側
面視でV字状の基板保持溝22dが形成される。
However, a set of substrate holding frames 21A at the center is provided.
And a pair of left and right substrate holding frames 2
The depth of the concave portion 34 is slightly different from each of the thin plate members 32b constituting 1B. And the convex part 3 of the thin plate material 32
3 and the recess 34, the central part 1
In the set of substrate holding frames 21A, a Y-shaped substrate holding groove 22 is formed in a side view, and in a pair of left and right substrate holding frames 21B, a V-shaped substrate holding groove 22d is formed in a side view.

【0036】上記実施例では基板配列の2倍のピッチで
凸部33と凹部34とが交互に形成さることから、図7
のように単にY字状の基板保持溝22やV字状の基板保
持溝22dを形成する場合に比較して簡単に製造でき、
また、各組みの薄板材32・32の凸部33と凹部34
とを組み合わせるだけでY字状の基板保持溝22やV字
状の基板保持溝22dを簡単に形成することができると
いう利点がある。この実施例においても基板Wと各基板
保持溝22・22dとの接触面積は小さくなり、処理液
が基板保持溝22・22d内に残留することはない。
In the above embodiment, the convex portions 33 and the concave portions 34 are alternately formed at a pitch twice as large as the substrate arrangement.
Can be easily manufactured as compared with the case of simply forming the Y-shaped substrate holding groove 22 or the V-shaped substrate holding groove 22d,
Further, the convex portions 33 and the concave portions 34 of the thin plate members 32
There is an advantage that the Y-shaped substrate holding groove 22 and the V-shaped substrate holding groove 22d can be easily formed only by combining. Also in this embodiment, the contact area between the substrate W and each of the substrate holding grooves 22 and 22d is reduced, and the processing liquid does not remain in the substrate holding grooves 22 and 22d.

【0037】図9は請求項4の発明に係るウエハボート
の第3の実施例を示す斜視図である。この実施例では中
央部の基板保持枠21Aのみが、2枚の薄板材32a・
32aを組み合わせて構成されており、図8と同様のス
ペースSと側面視でY字状の基板保持溝22とを有して
いる。そして左右一対の基板保持枠21Bは、図8と同
様の1枚の薄板材32bで構成されているが、2枚の薄
板材32bで基板Wを支持するために各薄板材32bの
凸部33と凹部34とを互い違いに配置している。この
実施例においてもウエハボートを簡単に製造でき、処理
液が基板保持溝22内に残留することはない。
FIG. 9 is a perspective view showing a third embodiment of the wafer boat according to the fourth aspect of the present invention. In this embodiment, only the substrate holding frame 21A at the center portion has two thin plate members 32a.
32a, and has a space S similar to that shown in FIG. 8 and a substrate holding groove 22 which is Y-shaped when viewed from the side. The pair of left and right substrate holding frames 21B are formed of a single thin plate 32b similar to that shown in FIG. 8, but the protrusions 33 of each thin plate 32b are used to support the substrate W with the two thin plates 32b. And the recess 34 are alternately arranged. Also in this embodiment, the wafer boat can be easily manufactured, and the processing liquid does not remain in the substrate holding groove 22.

【0038】図10は請求項4の発明に係るウエハボー
トの第4の実施例を示す斜視図である。この実施例では
中央部の基板保持枠21A及び左右一対の基板保持枠2
1Bがそれぞれ図8中の薄板材32aと同一形状のもの
で構成されている。ただし、左右一対の基板保持枠21
Bの凹部34に対して中央部の基板保持枠21Aの凸部
33が対応するように配置されており、全体として側面
視ではY字状の基板保持溝を形成する。従って、この実
施例においても複数の基板Wを起立姿勢で前後に並列さ
せて保持することが可能である。また、ウエハボートを
簡単に製造でき、処理液が基板保持枠21A・21Bを
組み合わせることにより形成される基板保持溝内に残留
することはない。
FIG. 10 is a perspective view showing a fourth embodiment of the wafer boat according to the present invention. In this embodiment, a substrate holding frame 21A at the center and a pair of left and right substrate holding frames 2 are provided.
1B have the same shape as the thin plate member 32a in FIG. However, a pair of left and right substrate holding frames 21
The central projection 33 of the substrate holding frame 21A is disposed so as to correspond to the recess 34 of B, and a Y-shaped substrate holding groove is formed as a whole in side view. Therefore, in this embodiment as well, it is possible to hold a plurality of substrates W side by side in a standing posture in front and rear. Further, the wafer boat can be easily manufactured, and the processing liquid does not remain in the substrate holding groove formed by combining the substrate holding frames 21A and 21B.

【0039】図11は請求項4の発明に係る基板保持枠
を、例えば図18(A)中のリフター10に適用した第
5の実施例を示し、同図(A)は当該リフター10を部
分的に破断して示した側面図、同図(B)は図11
(A)中のB−B線矢視正面図、同図(C)は図11
(B)中の中央部の基板保持枠21Aの先端部分の拡大
平面図、同図(D)は当該基板保持枠21Aの基板保持
部Dの拡大側面図、同図(E)は図11(B)中の左右
の基板保持枠21Bの基板保持部Eの拡大側面図であ
る。
FIG. 11 shows a fifth embodiment in which the substrate holding frame according to the fourth aspect of the present invention is applied to, for example, the lifter 10 shown in FIG. 18A, and FIG. FIG. 11 (B) is a side view showing a partially cutaway view, and FIG.
FIG. 11A is a front view taken along the line BB in FIG. 11A, and FIG.
11B is an enlarged plan view of the front end portion of the substrate holding frame 21A in the center, FIG. 11D is an enlarged side view of the substrate holding portion D of the substrate holding frame 21A, and FIG. It is an enlarged side view of the board holding part E of the left and right board holding frames 21B in B).

【0040】このリフター10は、図11(A)(B)に示
すように、リフト部材13の下部前面中央部に基板保持
枠21Aを、その左右に一対の基板保持枠21B・21
Bを並設固定して成り、これら3組の基板保持枠21A
・21B・21Bにより複数の基板Wを起立姿勢で前後
に並列させて保持するように構成されている。上記リフ
ト部材13は、石英ガラスから成り、その表面は処理液
に対して耐食性を有する樹脂でコーティングされてい
る。また、基板保持枠21A〜21Bの先端部は固定枠
26で固定されている。以下、各基板保持枠21A・2
1Bについて説明する。
As shown in FIGS. 11A and 11B, the lifter 10 has a substrate holding frame 21A in the center of the lower front surface of the lift member 13, and a pair of substrate holding frames 21B
B, and these three sets of substrate holding frames 21A
The plurality of substrates W are configured to be held side by side in a standing posture by 21B. The lift member 13 is made of quartz glass, and its surface is coated with a resin having corrosion resistance to the processing liquid. Further, the distal ends of the substrate holding frames 21A to 21B are fixed by a fixing frame 26. Hereinafter, each substrate holding frame 21A / 2
1B will be described.

【0041】先ず、中央部の基板保持枠21Aについて
説明する。この基板保持枠21Aは、上記リフト部材1
3の下部前面中央部にその一端が固設された薄板固定部
材32Aと、この薄板固定部材32Aに固定され、複数
の基板Wの下縁中央部を支える2枚の薄板材32a・3
2bとから成る。上記薄板固定部材32Aは、後述する
薄板固定部材32Bとともに、その先端部を固定枠26
により一体に固定して剛性をもたせてある。また、上記
薄板固定部材32Aには、図11(B)(C)に示すよう
に、前後方向に走るスリット状の液抜き孔23が縦向き
に貫通形成され、この薄板固定部材32Aの上面の液抜
き孔23の周囲には傾斜部23cが形成されている。処
理液の流下を促進するためである。
First, the substrate holding frame 21A at the center will be described. The substrate holding frame 21A is provided with the lift member 1
3. A thin plate fixing member 32A, one end of which is fixed to the lower front central portion of the lower plate 3, and two thin plate members 32a.3 fixed to the thin plate fixing member 32A and supporting the lower edge central portions of the plurality of substrates W.
2b. The thin plate fixing member 32A, together with a thin plate fixing member 32B described later, has
To secure rigidity. As shown in FIGS. 11B and 11C, the thin plate fixing member 32A is formed with a slit-shaped liquid draining hole 23 which runs in the front-rear direction and extends vertically. An inclined portion 23c is formed around the liquid drain hole 23. This is to promote the flow of the processing liquid.

【0042】上記薄板材32a・32bは、フッ素樹
脂、PCTFE(ポリクロロトリフルオロエチレン)、
PTFE(ポリテトラフルオロエチレン)等の樹脂から
成り、上記各薄板材32a・32bには、基板Wの配列
ピッチと略等しい基板保持溝22が形成されている。ま
た、図11(A)(C)に示すように、各薄板材32a・3
2bの厚手方向には、排液孔23eと当該薄板材32a
・23bを薄板固定部材32Aに組付けるための長孔3
8が貫通形成され、薄板固定部材32Aの左右両側面に
ボルト39a及びナット39bで垂直に固定されてい
る。つまり、組み付け時に左右一組の薄板材32a・3
2bを長手(水平)方向に相対移動させて左右一組の基
板保持溝22の相対位置を調節するように構成されてい
る。
The thin plate members 32a and 32b are made of fluororesin, PCTFE (polychlorotrifluoroethylene),
Substrate holding grooves 22 which are made of a resin such as PTFE (polytetrafluoroethylene) are formed in each of the thin plate members 32a and 32b. Further, as shown in FIGS. 11A and 11C, each of the thin plate members 32a
2b, the drain hole 23e and the thin plate material 32a
A long hole 3 for assembling 23b to the thin plate fixing member 32A;
8 are formed to penetrate, and are vertically fixed to both left and right side surfaces of the thin plate fixing member 32A with bolts 39a and nuts 39b. That is, a pair of left and right thin plate members 32a
2b is relatively moved in the longitudinal (horizontal) direction to adjust the relative position of the pair of left and right substrate holding grooves 22.

【0043】上記各薄板材32a・32bの上部には、
図11(A)(D)に示すように、傾斜凸部33と凹部34
とが交互に形成され、傾斜凸部33と凹部34には、処
理液の流下を促進するために、それぞれ面取り加工面3
3c・34cが形成されている。このように形成された
左右一組の薄板材32a・32bは、図11(D)に示す
ように、左右の傾斜凸部33・33の各傾斜稜線が側面
視で相互に交差してV字状の基板保持溝22を形成する
ように配設され、各基板Wは上記V字状の基板保持溝の
傾斜稜線と点接触の状態で支持されている。なお、垂直
溝部22bの高さを高くすることにより、基板Wと傾斜
凸部33との間に留まろうとする処理液が流下し易くな
るので、基板保持枠21Aに残留する処理液が少なくな
る。従って、基板の表面処理後の乾燥時間を短縮するこ
とができる。
On the upper part of each of the thin plate members 32a and 32b,
As shown in FIGS. 11A and 11D, the inclined convex portion 33 and the concave portion 34 are provided.
Are formed alternately, and the inclined convex portion 33 and the concave portion 34 have chamfered surfaces 3 in order to promote the flow of the processing liquid.
3c and 34c are formed. As shown in FIG. 11 (D), the pair of left and right thin plate members 32a and 32b thus formed has a V-shape in which the inclined ridge lines of the left and right inclined convex portions 33 intersect each other in side view. The substrate W is disposed so as to form a substrate holding groove 22, and each substrate W is supported in a point contact with the inclined ridge line of the V-shaped substrate holding groove. In addition, by increasing the height of the vertical groove portion 22b, the processing liquid that tends to stay between the substrate W and the inclined convex portion 33 easily flows down, so that the processing liquid remaining in the substrate holding frame 21A decreases. . Therefore, the drying time after the surface treatment of the substrate can be shortened.

【0044】次に左右の基板保持枠21Bの一方につい
て説明する。上記各基板保持枠21Bは、上記リフト部
材13の下部前面の左右にその一端が固設された薄板固
定部材32Bと、この薄板固定部材32Bに固定され、
複数の基板Wの下縁左右部を保持するそれぞれ2枚の薄
板材32c・32dとから構成されている。上記薄板固
定部材32B及び薄板材32c・32dは、中央部の薄
板固定部材32A及び薄板材32a・32bと同様に構
成されており、薄板固定部材32Bの左右両側面に組み
付けた一組の薄板材32c・32dを長手(水平)方向
に相対移動させて、当該薄板材32c・32dの基板保
持溝22の相互の位置を調節して、Y字状の基板保持溝
22の溝幅あるいはギャップを適宜調節するように構成
されている。
Next, one of the left and right substrate holding frames 21B will be described. Each of the substrate holding frames 21B is fixed to a thin plate fixing member 32B having one end fixed to the left and right of the lower front surface of the lift member 13, and is fixed to the thin plate fixing member 32B.
Each of the plurality of substrates W is formed of two thin plate members 32c and 32d that hold the lower edge left and right portions. The thin plate fixing member 32B and the thin plate members 32c and 32d are configured in the same manner as the thin plate fixing member 32A and the thin plate members 32a and 32b at the center, and a pair of thin plate members assembled to the left and right sides of the thin plate fixing member 32B. 32c and 32d are relatively moved in the longitudinal (horizontal) direction to adjust the mutual positions of the substrate holding grooves 22 of the thin plate members 32c and 32d, and the groove width or gap of the Y-shaped substrate holding groove 22 is appropriately adjusted. It is configured to adjust.

【0045】即ち、上記一組の薄板材32c・32d
は、図11(A)(E)に示すように、傾斜凸部33の各傾
斜稜線が相互に対向しており、側面視ではY字状の基板
保持溝22を構成するように配設されている。そして各
基板WはY字状の基板保持溝22の垂直溝部22bとそ
の下縁(凹部34)と接触する状態で保持される。従っ
て、この実施例においても上記3組の基板保持枠21A
・21B・21Bにより複数の基板Wを起立姿勢で前後
に並列させて保持することが可能である。
That is, the pair of thin plate members 32c and 32d
As shown in FIGS. 11 (A) and 11 (E), each inclined ridge line of the inclined convex portion 33 is opposed to each other, and is arranged so as to form a Y-shaped substrate holding groove 22 in side view. ing. Each substrate W is held in a state of being in contact with the vertical groove portion 22b of the Y-shaped substrate holding groove 22 and its lower edge (recess 34). Therefore, also in this embodiment, the three sets of substrate holding frames 21A are used.
The plurality of substrates W can be held side by side in a standing posture by 21B.

【0046】上記実施例では、各薄板固定部材32A・
32Bにスリット状の液抜き孔23が縦向きに貫通形成
され、この薄板固定部材32A・32Bの上面で、液抜
き孔23の周囲に傾斜部23cが設けられ、また、各薄
板材32a〜32dの厚手方向には排液孔23eが設け
られているので、基板Wを処理液中から引き上げたとき
処理液の流下が促進される。これにより、基板保持枠2
1A〜21Bに付着残留する処理液が少なくなり、基板
の表面処理後の乾燥時間を短縮することができる。
In the above embodiment, each thin plate fixing member 32A
A slit-shaped drainage hole 23 is formed in the vertical direction through the slit 32B. An inclined portion 23c is provided around the drainage hole 23 on the upper surface of the thin plate fixing members 32A and 32B, and each of the thin plate members 32a to 32d is formed. Since the drainage holes 23e are provided in the thickness direction of the substrate W, the flow of the processing liquid is promoted when the substrate W is pulled up from the processing liquid. Thereby, the substrate holding frame 2
The processing liquid adhering and remaining on 1A to 21B is reduced, and the drying time after the surface treatment of the substrate can be shortened.

【0047】また、上記実施例では、各薄板材32a〜
32dに長孔38が貫通形成され、組み付け時に一組の
薄板材32a・32b又は32c・32dを長手方向に
相対移動して左右の基板保持溝22の相対位置を調節す
るように構成したので、基板保持溝の側面視の形状をY
字状にしたり、V字状にすることができる。従って、Y
字状やV字状専用の薄板材を個別に製作する必要がな
く、薄板材を共通化してコスト低減をはかることができ
る。
In the above embodiment, each of the thin plate members 32a to 32a
A long hole 38 is formed in the through hole 32d, and a set of thin plate members 32a and 32b or 32c and 32d is relatively moved in the longitudinal direction at the time of assembly to adjust the relative position of the left and right substrate holding grooves 22. The shape of the substrate holding groove in side view is Y
It can be shaped like a letter or a letter V. Therefore, Y
It is not necessary to separately manufacture a thin sheet material dedicated to the letter shape or the V-shape, and it is possible to reduce the cost by sharing the thin sheet material.

【0048】図12は上記基板保持枠の変形例1を示す
図11(C)相当図であり、この変形例1は、各薄板材
32fが排液スペース23dを隔てて薄板固定部材32
Fに固定され、処理液の流下を促進するように構成され
ている。その他の点は前記図11(A)(B)の実施例と同
様に構成されている。なお、このような構成は図11
(C)において、薄板材32a・32bと薄板固定部材
32Aとをボルト39a及びナット39bで締結固定す
る際に、当該薄板材32a・32bと薄板固定部材32
Aとの間にそれぞれワッシャを介在させることにより実
現できる。
FIG. 12 is a view corresponding to FIG. 11 (C) showing a first modification of the above-mentioned substrate holding frame. In this first modification, each thin plate member 32f has a thin plate fixing member 32 separated by a drainage space 23d.
F and is configured to promote the flow of the processing liquid. Other points are the same as those of the embodiment of FIGS. 11A and 11B. Note that such a configuration is shown in FIG.
In (C), when the thin plate members 32a and 32b and the thin plate fixing member 32A are fastened and fixed by bolts 39a and nuts 39b, the thin plate members 32a and 32b and the thin plate fixing member 32 are fixed.
A can be realized by interposing washers between the first and second A.

【0049】また、図13は上記基板保持枠のさらに別
の変形例2を示す斜視図であり、この変形例2は、各薄
板材32gと薄板固定部材32Gとが一体に形成され、
薄板固定部材32Gに形成されたスリット状の液抜き孔
23を介して処理液の流下を促進するように構成されて
いる。これらの変形例1及び変形例2においても、基板
Wを処理液中から引き上げたとき、基板保持枠21に付
着残留する処理液が少なくなり、基板の表面処理後の乾
燥時間を短縮することができる。
FIG. 13 is a perspective view showing still another modified example 2 of the substrate holding frame. In this modified example 2, each of the thin plate members 32g and the thin plate fixing member 32G are integrally formed.
The configuration is such that the flow of the processing liquid is promoted through the slit-shaped drainage hole 23 formed in the thin plate fixing member 32G. Also in these Modifications 1 and 2, when the substrate W is pulled up from the processing liquid, the processing liquid remaining on the substrate holding frame 21 is reduced, and the drying time after the surface processing of the substrate is reduced. it can.

【0050】図14は前記薄板材の変形例1を示し、同
図(A)はその要部の平面図、同図(B)はその要部の
斜視図である。この変形例1では薄板材32hの基板保
持溝22の基板Wと接触する縦溝部分22bに面取り加
工が施されている。また、図15は、図11の薄板材の
変形例2を示し、同図(A)はその要部の平面図、同図
(B)はその要部の側面図である。この変形例2では薄
板材32jの基板保持溝22の基板Wと接触する縦溝部
分22bに、図5と同様の突起25が形成されている。
その他の点は前記図11の実施例と同様に構成されてい
る。これらの変形例1及び変形例2においては、縦溝部
分22bで基板面と薄板材との接触面積が小さくなり、
基板Wが処理液にさらされない部分の面積が極端に小さ
くなる。これにより、基板の表面処理品質を向上させる
ことができる。
FIG. 14 shows a first modification of the thin plate material, wherein FIG. 14A is a plan view of a main part thereof, and FIG. 14B is a perspective view of the main part thereof. In the first modification, the vertical groove portion 22b of the substrate holding groove 22 of the thin plate material 32h that comes into contact with the substrate W is chamfered. 15 shows a second modification of the thin plate material shown in FIG. 11, wherein FIG. 15 (A) is a plan view of the main part and FIG. 15 (B) is a side view of the main part. In this modified example 2, a projection 25 similar to that of FIG. 5 is formed in a vertical groove portion 22b of the substrate holding groove 22 of the thin plate material 32j that contacts the substrate W.
Other points are the same as those of the embodiment of FIG. In these modified examples 1 and 2, the contact area between the substrate surface and the thin plate material is reduced in the vertical groove portion 22b,
The area of the portion where the substrate W is not exposed to the processing liquid becomes extremely small. Thereby, the surface treatment quality of the substrate can be improved.

【0051】図16は別の基板保持枠を備えるウエハボ
ートの実施例を示す縦断正面図である。上記ウエハボー
ト20は、複数の基板Wを起立姿勢で前後に並列させて
保持する3個の基板保持枠21A〜21Bを有し、これ
らの基板保持枠21A〜21Bの前後両端部は固定枠2
6で固定されている。この実施例では3個の基板保持枠
21A〜21Bをそれぞれ管状部材35で構成し、その
外曲面にY字状の基板保持溝22を形成し、この基板保
持溝22を当該管状部材35の管内に貫通するととも
に、当該管状部材35の下面に管内に貫通する液抜け孔
36があけてある。
FIG. 16 is a longitudinal sectional front view showing an embodiment of a wafer boat provided with another substrate holding frame. The wafer boat 20 has three substrate holding frames 21A to 21B for holding a plurality of substrates W in a standing posture in a back-and-forth direction, and the front and rear ends of these substrate holding frames 21A to 21B are fixed frames 2.
It is fixed at 6. In this embodiment, three substrate holding frames 21A to 21B are each formed of a tubular member 35, and a Y-shaped substrate holding groove 22 is formed on the outer curved surface thereof. In addition, a liquid drain hole 36 is formed in the lower surface of the tubular member 35 so as to penetrate into the pipe.

【0052】この実施例においても基板Wと基板保持溝
22との接触面積は小さく、実質的に線接触状態で保持
され、起立姿勢で保持した複数の基板を処理液中から相
対的に引き上げる際に、処理液が基板保持溝22内に残
留することはない。なお、上記管状部材35に代えて、
例えば管状部材を半割り状に形成した半割り状部材(図
示せず)を内曲面を下側に向けて固定することにより、
上記基板保持枠21A〜21Bを構成することも可能で
ある。この場合には、その外曲面に形成した各基板保持
溝22が半割り状部材の内曲面に貫通することから処理
液の抜け孔36をあける必要はない。
Also in this embodiment, the contact area between the substrate W and the substrate holding groove 22 is small, the substrate W is held substantially in a line contact state, and when the plurality of substrates held in the standing posture are relatively pulled up from the processing liquid. In addition, the processing liquid does not remain in the substrate holding groove 22. Note that instead of the tubular member 35,
For example, by fixing a half-split member (not shown) in which a tubular member is formed in a half-split shape with the inner curved surface facing downward,
It is also possible to configure the substrate holding frames 21A to 21B. In this case, since each substrate holding groove 22 formed on the outer curved surface penetrates the inner curved surface of the half-split member, it is not necessary to make a hole 36 for the treatment liquid.

【0053】図17は上記管状部材35で構成された基
板保持枠を備えるウエハチャックの実施例を示す縦断正
面図である。上記ウエハチャック40は、揺動可能に設
けられた左右一対の揺動アーム41と、各揺動アーム4
1に2個づつ固設された基板保持枠21とを具備して成
り、複数の基板Wを起立姿勢で前後に並列させて挟持す
るとともに、起立姿勢で挟持した複数の基板を処理液に
浸漬し、及び処理液中から引き上げ可能に構成されてい
る。
FIG. 17 is a longitudinal sectional front view showing an embodiment of a wafer chuck provided with a substrate holding frame constituted by the tubular member 35. The wafer chuck 40 includes a pair of left and right swing arms 41 that are swingably provided, and each of the swing arms 4.
A plurality of substrate holding frames 21 fixed to each other, and holding a plurality of substrates W in front and back in parallel in a standing posture, and immersing a plurality of substrates held in a standing posture in a processing liquid. And can be pulled up from the processing solution.

【0054】この実施例では各基板保持枠21をそれぞ
れ管状部材35で構成し、挟持側外曲面にV字状の基板
保持溝22cを形成し、この基板保持溝22cを当該管
状部材35の管内に貫通してある。この実施例において
も基板Wと基板保持溝22cとの接触面積は小さく、実
質的に線接触状態で保持され、起立姿勢で保持した複数
の基板を処理液中から相対的に引き上げる際に、処理液
が基板保持溝22内に残留することはない。
In this embodiment, each substrate holding frame 21 is formed of a tubular member 35, and a V-shaped substrate holding groove 22c is formed on the outer curved surface on the sandwiching side. It penetrates. Also in this embodiment, the contact area between the substrate W and the substrate holding groove 22c is small, and the substrate W is held substantially in a line contact state. The liquid does not remain in the substrate holding groove 22.

【0055】なお、ウエハチャック40は上記実施例に
限るものではなく、また、基板保持枠21として上記管
状部材35に代えて管状部材を半割り状に形成した半割
り状部材(図示せず)を用いることも可能である。さら
に、基板保持枠21として図1〜図11に開示した基板
保持枠21A〜21Bを用いることも可能である。ま
た、上記実施例では、いずれも基板(半導体ウエハ)W
のオリエンテーションフラットを下方又は上方に向けて
を保持するものについて例示したが、これに限らず基板
の種類等によって保持する位置や基板保持枠の個数につ
いてもを適宜変更を加えて本発明を実施することができ
る。
It should be noted that the wafer chuck 40 is not limited to the above embodiment, and a half-split member (not shown) in which a tubular member is formed as the substrate holding frame 21 in place of the tubular member 35 in a half-split shape. Can also be used. Further, the substrate holding frames 21A to 21B disclosed in FIGS. 1 to 11 can be used as the substrate holding frame 21. In each of the above embodiments, the substrate (semiconductor wafer) W
The orientation flat is held downward or upward by way of example, but the present invention is not limited to this, and the present invention is practiced by appropriately changing the holding position and the number of substrate holding frames depending on the type of substrate and the like. be able to.

【0056】[0056]

【発明の効果】本発明は以下の効果を奏する。 請求項1〜請求項7の発明は、前記のように構成さ
れ、基板保持溝内に残留する処理液はごく僅かになるこ
とから、浸漬型基板処理工程において、処理液の持ち出
しによるクロスコンタミネーションが大幅に改善され、
しかも、後続の乾燥工程において乾燥時間の短縮が可能
となる。 請求項1の発明では、基板保持枠の各基板保持溝の
底部に基板の厚さより大きな直径を有する液抜き孔を貫
通形成したことから、従来の基板保持枠に液抜き孔を追
加加工するだけでよく、改造が容易である。
The present invention has the following effects. According to the first to seventh aspects of the present invention, since the processing liquid remaining in the substrate holding groove is very small, the cross-contamination due to the removal of the processing liquid in the immersion type substrate processing step is achieved. Has been greatly improved,
Moreover, the drying time can be reduced in the subsequent drying step. According to the first aspect of the present invention, since a drain hole having a diameter larger than the thickness of the substrate is formed through the bottom of each substrate holding groove of the substrate holding frame, the additional drain hole is simply formed in the conventional substrate holding frame. It is easy to remodel.

【0057】 請求項2の発明では、基板保持枠の各
基板保持溝の少なくとも左右いずれかの側より液抜き段
落凹部を凹入形成したことから、各基板保持溝の長さを
十分に短くして、基板と基板保持溝との接触面積を小さ
くすることができるという利点がある。 請求項3の発明では、基板保持枠の各基板保持溝の
溝幅を液抜き可能に大きく形成するとともに、その溝部
の前後の対向面に基板を保持する突起を形成したことか
ら、基板と突起との接触面積は極端に小さくなり、基板
を実質的に点接触状態で保持できるという利点がある。
According to the second aspect of the present invention, since the liquid-removing paragraph recess is formed in at least one of the left and right sides of each of the substrate holding grooves of the substrate holding frame, the length of each of the substrate holding grooves can be made sufficiently short. Therefore, there is an advantage that the contact area between the substrate and the substrate holding groove can be reduced. According to the third aspect of the present invention, the width of each of the substrate holding grooves of the substrate holding frame is formed large so as to be able to drain the liquid, and the projections for holding the substrate are formed on the opposing surfaces before and after the groove. Has an advantage that the contact area with the substrate is extremely small, and the substrate can be held substantially in a point contact state.

【0058】 請求項4の発明では、複数の基板保持
枠が、それぞれ上部に基板を保持する基板保持溝が形成
された薄板材を間隔を空けて起立状態で固定部材に固定
して構成したことから、基板と基板保持溝との接触面積
を小さくして、基板を実質的に線接触状態で保持できる
という利点がある。 請求項5の発明では、各基板保持枠が、基板の一方
の面と接触する基板保持溝が設けられた第1薄板材と、
前記基板の他方の面と接触する基板保持溝が設けられた
第2薄板材とを有することから、各基板は第1薄板材と
第2薄板材とによって形成される基板保持溝で保持さ
れ、上記と同様に基板を実質的に線接触状態で保持でき
るという利点がある。
According to the fourth aspect of the present invention, the plurality of substrate holding frames are configured such that the thin plate members each having a substrate holding groove formed thereon for holding the substrate are fixed to the fixing member in an upright state at intervals. Therefore, there is an advantage that the contact area between the substrate and the substrate holding groove can be reduced and the substrate can be held substantially in a line contact state. In the invention according to claim 5, each of the substrate holding frames has a first thin plate member provided with a substrate holding groove that is in contact with one surface of the substrate;
Since it has a second thin plate member provided with a substrate holding groove that comes into contact with the other surface of the substrate, each substrate is held by a substrate holding groove formed by the first thin plate member and the second thin plate member, As described above, there is an advantage that the substrate can be held substantially in line contact.

【0059】 請求項6の発明では、各基板保持具
が、相互に対向して設けられ、基板の厚み方向に相対移
動可能な一組の第1薄板材と第2薄板材とを有すること
から、基板を保持する基板保持溝のギャップを調節する
ことができ、また、そのギャップを調節することによ
り、基板保持溝の側面視の形状を適宜変更することがで
きるので、専用の薄板材を製作する必要がなく、薄板材
を共通化して製造コストを低減できる。 請求項7の発明では、各基板保持具が、2枚の薄板
材と当該2枚の薄板材を対向させて固定する薄板固定部
材とを備え、各薄板材には、その厚み方向に排液孔が貫
通形成されていることから、基板を処理液中から引き上
げたとき処理液の流下が促進され、基板保持枠に付着残
留する処理液が少なくなり、基板の表面処理後の乾燥時
間を短縮することができる。
According to the sixth aspect of the present invention, each of the substrate holders is provided so as to face each other, and has a pair of the first thin plate member and the second thin plate member which are relatively movable in the thickness direction of the substrate. The gap of the substrate holding groove for holding the substrate can be adjusted, and by adjusting the gap, the shape of the substrate holding groove in a side view can be appropriately changed. It is not necessary to use the same sheet material, and the manufacturing cost can be reduced. In the invention according to claim 7, each substrate holder includes two thin plate members and a thin plate fixing member for fixing the two thin plate members so as to face each other, and each of the thin plate members is drained in its thickness direction. Since the holes are formed through, the flow of the processing liquid is promoted when the substrate is pulled up from the processing liquid, the processing liquid remaining on the substrate holding frame is reduced, and the drying time after the surface processing of the substrate is reduced. can do.

【図面の簡単な説明】[Brief description of the drawings]

【図1】請求項1の発明に係る基板保持枠を備えるウエ
ハボートを示し、同図(A)はそのウエハボートの縦断正
面図、同図(B)はそのウエハボートの平面図、同図(C)
は同図(A)中の要部Aの拡大側面図、同図(D)は当該要
部Aの拡大して示す斜視図である。
1A and 1B show a wafer boat provided with a substrate holding frame according to the invention of claim 1, wherein FIG. 1A is a longitudinal sectional front view of the wafer boat, and FIG. 1B is a plan view of the wafer boat; (C)
2 is an enlarged side view of a main part A in FIG. 2A, and FIG. 2D is an enlarged perspective view of the main part A.

【図2】請求項2の発明に係る基板保持枠の第1の実施
例を示し、同図(A)はその基板保持枠の縦断正面図、同
図(B)はその基板保持枠の平面図、同図(C)はその基板
保持枠の要部の拡大側面図、同図(D)はその基板保持枠
の要部の拡大斜視図である。
FIGS. 2A and 2B show a first embodiment of a substrate holding frame according to the invention of claim 2, wherein FIG. 2A is a longitudinal sectional front view of the substrate holding frame, and FIG. FIG. 3C is an enlarged side view of a main part of the substrate holding frame, and FIG. 3D is an enlarged perspective view of a main part of the substrate holding frame.

【図3】請求項2の発明に係る基板保持枠の第2の実施
例を示す図2相当図である。
FIG. 3 is a view corresponding to FIG. 2, showing a second embodiment of the substrate holding frame according to the invention of claim 2;

【図4】請求項2の発明に係る基板保持枠の第3の実施
例を示す図2相当図である。
FIG. 4 is a view corresponding to FIG. 2, showing a third embodiment of the substrate holding frame according to the invention of claim 2;

【図5】請求項3の発明に係る基板保持枠の実施例を示
し、同図(A)はその基板保持枠の要部の拡大側面図、同
図(B)はその基板保持枠の要部の拡大斜視図である。
5A and 5B show an embodiment of a substrate holding frame according to the invention of claim 3, wherein FIG. 5A is an enlarged side view of a main part of the substrate holding frame, and FIG. It is an expansion perspective view of a part.

【図6】請求項4の発明に係るウエハボートの第1の実
施例を示す縦断正面図である。
FIG. 6 is a vertical sectional front view showing a first embodiment of the wafer boat according to the invention of claim 4;

【図7】請求項4の発明に係るウエハボートの第1の実
施例を示す斜視図である。
FIG. 7 is a perspective view showing a first embodiment of a wafer boat according to the invention of claim 4;

【図8】請求項4の発明に係るウエハボートの第2の実
施例を示す斜視図である。
FIG. 8 is a perspective view showing a second embodiment of the wafer boat according to the invention of claim 4;

【図9】請求項4の発明に係るウエハボートの第3の実
施例を示す斜視図である。
FIG. 9 is a perspective view showing a third embodiment of the wafer boat according to the invention of claim 4;

【図10】請求項4の発明に係るウエハボートの第4の
実施例を示す斜視図である。
FIG. 10 is a perspective view showing a fourth embodiment of the wafer boat according to the invention of claim 4;

【図11】請求項4の発明に係る基板保持枠を、図18
(A)中のリフターに適用した第5の実施例を示し、同
図(A)は当該リフターを部分的に破断して示した側面
図、同図(B)は図1(A)中のB−B線矢視正面図、
同図(C)は図1(B)中の中央部の基板保持枠の先端
部分の拡大平面図、同図(D)は当該基板保持枠の基板
保持部の拡大側面図、同図(E)は図1(B)中の左右
の基板保持枠の基板保持部の拡大側面図である。
FIG. 11 is a perspective view of the substrate holding frame according to the invention of FIG.
5A shows a fifth embodiment applied to the lifter in FIG. 1A, FIG. 1A is a side view showing the lifter partially broken away, and FIG. 1B is a side view in FIG. BB line arrow front view,
FIG. 1C is an enlarged plan view of the front end portion of the substrate holding frame at the center in FIG. 1B, FIG. 2D is an enlarged side view of the substrate holding portion of the substrate holding frame, and FIG. 2) is an enlarged side view of the substrate holding portions of the left and right substrate holding frames in FIG.

【図12】図11の基板保持枠の変形例1を示す図11
(B)相当図である。
12 is a view showing a first modification of the substrate holding frame of FIG. 11;
(B) It is an equivalent figure.

【図13】図11の基板保持枠のさらに別の変形例2を
示す斜視図である。
FIG. 13 is a perspective view showing still another modified example 2 of the substrate holding frame of FIG. 11;

【図14】図11の薄板材の変形例1を示し、同図
(A)はその要部の平面図、同図(B)はその要部の斜
視図である。
14A and 14B show Modification Example 1 of the thin plate material of FIG. 11, wherein FIG. 14A is a plan view of a main part thereof, and FIG. 14B is a perspective view of the main part thereof.

【図15】図11の薄板材の変形例2を示し、同図
(A)はその要部の平面図、同図(B)はその要部の側
面図である。
15 shows a second modification of the thin plate material of FIG. 11, wherein FIG. 15 (A) is a plan view of a main part thereof, and FIG. 15 (B) is a side view of the main part thereof.

【図16】基板保持枠を備えるウエハボートの実施例を
示す縦断正面図である。
FIG. 16 is a longitudinal sectional front view showing an embodiment of a wafer boat provided with a substrate holding frame.

【図17】基板保持枠を備えるウエハチャックの実施例
を示す縦断正面図である。
FIG. 17 is a longitudinal sectional front view showing an embodiment of a wafer chuck provided with a substrate holding frame.

【図18】従来例を示し、同図(A)は基板の洗浄・乾燥
装置の縦断面図、同図(B)はウエハボートの縦断正面
図、同図(C)はその基板保持枠の要部の拡大側面図、同
図(D)はウエハチャックの縦断正面図である。
18 (A) is a longitudinal sectional view of a substrate cleaning / drying apparatus, FIG. 18 (B) is a longitudinal sectional front view of a wafer boat, and FIG. 18 (C) is a view of the substrate holding frame. FIG. 4D is an enlarged side view of a main part, and FIG.

【符号の説明】[Explanation of symbols]

W…基板(ウエハ)、20…基板保持具(ウエハボー
ト)、21・21A・21B…基板保持枠、22・22
b・22c…基板保持溝、23・23a・23b…液抜
き孔、23e…排液孔、24…液抜き段落凹部、25…
突起、26・26b…固定部材(固定枠)、32A・3
2B…薄板固定部材、32a・32c…第1薄板材、3
2b・32d…第2薄板材、40…基板保持具(ウエハ
チャック)。
W: substrate (wafer), 20: substrate holder (wafer boat), 21 / 21A / 21B: substrate holding frame, 22/22
b · 22c · · · substrate holding groove, 23 · 23a · 23b · · · liquid drain hole, 23e · · · drain hole, 24 · · · liquid drainage recess, 25 · · · ·
Projection, 26 / 26b ... fixed member (fixed frame), 32A / 3
2B: Thin plate fixing member, 32a / 32c: First thin plate material, 3
2b, 32d: second thin plate material, 40: substrate holder (wafer chuck).

───────────────────────────────────────────────────── フロントページの続き 審査官 森川 元嗣 (56)参考文献 特開 昭61−161724(JP,A) 特開 平3−22547(JP,A) 特開 平7−17589(JP,A) 特開 平6−216102(JP,A) 特開 平6−286869(JP,A) 特開 平7−6988(JP,A) 特開 平7−86373(JP,A) 実開 昭63−16446(JP,U) 実開 昭61−177450(JP,U) (58)調査した分野(Int.Cl.7,DB名) H01L 21/304 648 B08B 11/02 B08B 3/04 H01L 21/68 ──────────────────────────────────────────────────続 き Continued on the front page Examiner Mototsugu Morikawa (56) References JP-A-61-161724 (JP, A) JP-A-3-22547 (JP, A) JP-A-7-17589 (JP, A) JP-A-6-216102 (JP, A) JP-A-6-286869 (JP, A) JP-A-7-6988 (JP, A) JP-A-7-86373 (JP, A) (JP, U) Shokai Sho 61-177450 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) H01L 21/304 648 B08B 11/02 B08B 3/04 H01L 21/68

Claims (7)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】複数の基板を起立姿勢で前後に並列させて
保持する複数の基板保持枠を有し、起立姿勢で保持した
複数の基板を処理液中から相対的に引き上げる基板処理
装置の基板保持具において、 上記基板保持枠の各基板保持溝の溝底面に基板の厚さよ
り大きな直径を有する液抜き孔を貫通形成し、上記基板
保持枠に上記溝底面と平行をなしている別の液抜き孔を
貫通形成し、上記液抜き孔の下端を上記別の液抜き孔に
連通させていることを特徴とする基板処理装置の基板保
持具。
1. A substrate processing apparatus, comprising: a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a back-and-forth direction, wherein the plurality of substrates held in the standing posture are relatively pulled up from a processing liquid. in the holder, formed through a weep hole having a diameter greater than the thickness of the substrate to the groove bottom surface of each substrate holding groove of the substrate holding frame, the substrate
Insert another drain hole in the holding frame parallel to the bottom of the groove.
The through hole is formed, and the lower end of the drain hole is connected to the another drain hole.
A substrate holder for a substrate processing apparatus, wherein the substrate holder is in communication.
【請求項2】複数の基板を起立姿勢で前後に並列させて
保持する複数の基板保持枠を有し、起立姿勢で保持した
複数の基板を処理液中から相対的に引き上げる基板処理
装置の基板保持具において、 上記基板保持枠の各基板保持溝は、V字溝部、垂直溝
部、及び溝底面を備え、各基板保持溝の少なくとも左右
いずれかの側より上記基板保持溝の上記V字溝部から上
記溝底面にかけて液抜き段落凹部を凹入形成したことを
特徴とする基板処理装置の基板保持具。
2. A substrate processing apparatus, comprising: a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a back-and-forth direction, wherein the plurality of substrates held in the standing posture are relatively pulled up from a processing solution. In the holder, each substrate holding groove of the substrate holding frame has a V-shaped groove, a vertical groove,
Part, and a groove bottom surface, from above the V-shaped groove part of the substrate holding groove from at least one of the left and right sides of each substrate holding groove.
A substrate holder for a substrate processing apparatus, wherein a liquid draining paragraph concave portion is formed so as to extend over a bottom surface of the groove.
【請求項3】複数の基板を起立姿勢で前後に並列させて
保持する複数の基板保持枠を有し、起立姿勢で保持した
複数の基板を処理液中から相対的に引き上げる基板処理
装置の基板保持具において、 上記基板保持枠の各基板保持溝は、V字状溝部、垂直溝
部、及び溝底面を備え、上記各基板保持溝の溝幅を液抜
き可能に大きく形成するとともに、上記V字状溝部の傾
斜面に沿わせて基板を保持する突起を形成したことを特
徴とする基板処理装置の基板処理具。
3. A substrate processing apparatus, comprising: a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a back-and-forth direction, wherein the plurality of substrates held in the standing posture are relatively pulled up from a processing solution. In the holder, each substrate holding groove of the substrate holding frame has a V-shaped groove, a vertical groove,
Portion, and a groove bottom surface, the width of each of the substrate holding grooves is formed large enough to allow liquid to be drained , and the inclination of the V-shaped groove is
A substrate processing tool for a substrate processing apparatus, wherein a projection for holding a substrate is formed along a slope .
【請求項4】 複数の基板を起立姿勢で前後に並列させ
て保持する複数の基板保持枠を有し、起立姿勢で保持し
た複数の基板を処理液中から相対的に引き上げる基板処
理装置の基板保持具において、 上記複数の基板保持枠は、それぞれ上部に基板を保持す
る基板保持溝が形成された薄板材を間隔を空けて起立状
態で固定部材に固定して構成した、ことを特徴とする基
板処理装置の基板保持具。
4. A substrate processing apparatus, comprising: a plurality of substrate holding frames for holding a plurality of substrates in a standing posture in a back-and-forth direction, wherein the plurality of substrates held in the standing posture are relatively pulled up from a processing solution. In the holder, the plurality of substrate holding frames are configured by fixing thin plate members each having a substrate holding groove formed on an upper portion thereof to a fixing member in an upright state at intervals. Substrate holder for substrate processing equipment.
【請求項5】 各基板保持枠は、基板の一方の面と接触
する基板保持溝が設けられた第1薄板材と、前記基板の
他方の面と接触する基板保持溝が設けられた第2薄板材
とを有する請求項4に記載した基板処理装置の基板保持
具。
5. Each of the substrate holding frames has a first thin plate member provided with a substrate holding groove in contact with one surface of the substrate and a second thin plate member provided with a substrate holding groove in contact with the other surface of the substrate. The substrate holder of the substrate processing apparatus according to claim 4, further comprising a thin plate.
【請求項6】 各基板保持枠は、相互に対向して設けら
れ、基板の厚み方向に相対移動可能な一組の第1薄板材
と第2薄板材とを有する請求項5に記載した基板処理装
置の基板保持具。
6. The substrate according to claim 5, wherein each of the substrate holding frames includes a pair of a first sheet material and a second sheet material which are provided to face each other and are relatively movable in a thickness direction of the substrate. Substrate holder for processing equipment.
【請求項7】 各基板保持枠は、2枚の薄板材と、当該
2枚の薄板材を対向させて固定する薄板固定部材とを備
え、各薄板材は、その厚み方向に前記薄板固定部材上の
処理液を排出する排液孔を貫通形成した請求項4乃至請
求項5のいずれかに記載した基板処理装置の基板保持
具。
7. Each of the substrate holding frames includes two thin plate members and a thin plate fixing member for fixing the two thin plate members so as to face each other, and each thin plate member is provided in the thickness direction thereof. 6. The substrate holder of the substrate processing apparatus according to claim 4, wherein a drainage hole for discharging the processing liquid is formed through the drainage hole.
JP13173995A 1994-05-31 1995-05-30 Substrate holder for substrate processing equipment Expired - Fee Related JP3183098B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13173995A JP3183098B2 (en) 1994-05-31 1995-05-30 Substrate holder for substrate processing equipment

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP6-117741 1994-05-31
JP11774194 1994-05-31
JP13173995A JP3183098B2 (en) 1994-05-31 1995-05-30 Substrate holder for substrate processing equipment

Publications (2)

Publication Number Publication Date
JPH0849073A JPH0849073A (en) 1996-02-20
JP3183098B2 true JP3183098B2 (en) 2001-07-03

Family

ID=26455804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13173995A Expired - Fee Related JP3183098B2 (en) 1994-05-31 1995-05-30 Substrate holder for substrate processing equipment

Country Status (1)

Country Link
JP (1) JP3183098B2 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3212508B2 (en) * 1995-09-20 2001-09-25 東京エレクトロン株式会社 Cleaning equipment
KR100673063B1 (en) * 2000-01-18 2007-01-22 삼성전자주식회사 Equipment for sealing a seal for a liquid crystal pannel
JP2007019238A (en) * 2005-07-07 2007-01-25 Dainippon Screen Mfg Co Ltd Substrate processing apparatus
KR100921521B1 (en) 2007-10-12 2009-10-12 세메스 주식회사 Unit for supporting a substrate and Apparatus for treating a substrate using the same
JP4974996B2 (en) * 2008-10-15 2012-07-11 東京エレクトロン株式会社 Substrate processing equipment
JP5871478B2 (en) * 2011-03-28 2016-03-01 株式会社Screenホールディングス Substrate holder and substrate processing apparatus
JP5774341B2 (en) * 2011-03-28 2015-09-09 株式会社Screenホールディングス Substrate holder and substrate processing apparatus
DE102012010940A1 (en) * 2012-06-04 2013-12-05 ACI eco Tec GmbH Device for wet treatment of substrates e.g. silicon wafer, has support elements on which substrate support is pointed up and down, such that substrates are in parallel state at constant, limiting distance force
JP6042143B2 (en) * 2012-09-11 2016-12-14 株式会社Screenホールディングス Substrate holding member and substrate processing apparatus including the same
KR102143884B1 (en) * 2013-09-11 2020-08-12 삼성전자주식회사 Wafer loaders having buffer regions
JP7040871B2 (en) * 2017-07-28 2022-03-23 株式会社Screenホールディングス Board processing equipment and parts inspection method for substrate processing equipment
EP3840021B1 (en) * 2019-12-18 2022-10-19 Siltronic AG Improved device for drying semiconductor substrates

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