JPH0432600A - Method and device for plating - Google Patents

Method and device for plating

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Publication number
JPH0432600A
JPH0432600A JP14045490A JP14045490A JPH0432600A JP H0432600 A JPH0432600 A JP H0432600A JP 14045490 A JP14045490 A JP 14045490A JP 14045490 A JP14045490 A JP 14045490A JP H0432600 A JPH0432600 A JP H0432600A
Authority
JP
Japan
Prior art keywords
plating
plated
holding plate
plate
window hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14045490A
Other languages
Japanese (ja)
Other versions
JP2608485B2 (en
Inventor
Takamitsu Orimoto
織本 隆充
Etsufumi Kobayashi
小林 悦文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2140454A priority Critical patent/JP2608485B2/en
Publication of JPH0432600A publication Critical patent/JPH0432600A/en
Application granted granted Critical
Publication of JP2608485B2 publication Critical patent/JP2608485B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Electroplating Methods And Accessories (AREA)

Abstract

PURPOSE:To prevent the infiltration of a plating soln. into the succeeding device by inclining a holding plate above the plating soln. at the time of pulling up the holding plate to which plural plating electrodes carrying a member to be plated are fixed from a plating bath, etc. CONSTITUTION:A substrate holder H is held by a conveyor mechanism 13 through a hand 18, and a member 3 to be plated is placed on plural plating electrodes 10 fixed to the holding plate 1 of the holder H and pressed by a flat spring 22. The holder H is then dipped in the plating bath to plate the member 3 and then pulled up. At this time, the hand 18 is turned in direction of the arrow a1 along with the holder H above the plating soln. surface to incline the plate 1 of the holder H, and the plating soln. deposited on the member 3 and plate 1 is dropped. Consequently, the infiltration of the plating soln. into the succeeding water washing tank is prevented, the infiltration of cleaning water into the plating bath from the water washing tank before the plating bath is also prevented, and plating is excellently carried out.

Description

【発明の詳細な説明】 〔概要〕 板状の被めっき部材が水平状態でめっき処理されるめっ
き装置におけるめっき方法およびめっき処理装置に関し
、 めっき槽と前後の洗浄水槽との間における処理液の移動
に起因するめっき浴や洗浄水の組成変動を防止するとと
もに、めっき面の変色・シミを未然に防止することを目
的とし、 保持板に固定された複数のめっき電極の上に、被めっき
部材を載置した状態で、保持板と一緒にめっき層および
洗浄槽に入れてめっきおよび洗浄を行なうめっき処理装
置において、 めっき層および洗浄槽から保持板を引き上げる際に、液
面より上方位置において、保持板を傾けて、液切れを良
くする。
[Detailed Description of the Invention] [Summary] Regarding a plating method and a plating processing apparatus in a plating apparatus in which a plate-shaped member to be plated is plated in a horizontal state, the present invention relates to the movement of a processing liquid between a plating tank and front and rear cleaning water tanks. The purpose of this system is to prevent changes in the composition of the plating bath and cleaning water caused by this process, as well as to prevent discoloration and stains on the plating surface. In plating processing equipment where the holding plate is placed in the plating layer and cleaning tank together with the holding plate for plating and cleaning, when the holding plate is pulled up from the plating layer and the cleaning tank, the holding plate is placed above the liquid level. Tilt the plate to drain the liquid better.

〔産業上の利用分野] 本発明は、板状の被めっき部材が水平状態でめっき処理
されるめっき装置におけるめっき方法およびめっき処理
装置に関する。
[Industrial Application Field] The present invention relates to a plating method and a plating apparatus in a plating apparatus in which a plate-shaped member to be plated is plated in a horizontal state.

〔従来の技術〕[Conventional technology]

薄膜型の磁気ヘッドを製造するには、予め基板上に多数
の薄膜型の磁気回路およびコイルを一斉に作成しておき
、最後に各薄膜型磁気ヘッドごとに切離すことで、同時
に多数の薄膜型ヘッドを得るようにしている。
To manufacture thin-film magnetic heads, a large number of thin-film magnetic circuits and coils are created on a substrate all at once, and then each thin-film magnetic head is separated at the end. Trying to get a type head.

薄膜型磁気ヘッドにおける下部磁極や上部磁極は、パー
マロイをめっきし、バターニングすることで作成される
The lower magnetic pole and upper magnetic pole in a thin-film magnetic head are made by plating permalloy and patterning.

第6図は従来の薄膜型磁気ヘッド用の基板をめっきする
装置における基板ホルダーHを示す斜視図である。基板
の保持板1の中央に窓穴2が開けられ、その中に被めっ
き部材となる基板3が載置され、保持されている。保持
板1の上方には、複数本の支柱4を介して搬送フレーム
5が取り付けられている。
FIG. 6 is a perspective view showing a substrate holder H in a conventional apparatus for plating a substrate for a thin film magnetic head. A window hole 2 is made in the center of a substrate holding plate 1, and a substrate 3 to be plated is placed and held in the window hole 2. A transport frame 5 is attached above the holding plate 1 via a plurality of support columns 4 .

第7図は従来の基板ホルダーの中心断面図である。保持
板1の下面には、めっき電極板6、絶縁体スペーサ板7
、補助電極板8の順に積層され、絶縁性のあるボルト9
で保持板lに固定されている。めっき電極板6、絶縁体
スペーサ板7および補助電極板8は、リング状をしてお
り、まためっき電極部10が、保持板lの窓穴2中に突
出し、その上に基板3が載置されている。
FIG. 7 is a central sectional view of a conventional substrate holder. The lower surface of the holding plate 1 includes a plated electrode plate 6 and an insulating spacer plate 7.
, an auxiliary electrode plate 8 are laminated in this order, and an insulating bolt 9
It is fixed to the holding plate l. The plated electrode plate 6, the insulator spacer plate 7, and the auxiliary electrode plate 8 are ring-shaped, and the plated electrode part 10 protrudes into the window hole 2 of the holding plate l, and the substrate 3 is placed thereon. has been done.

この基板ホルダーを、めっき槽中に入れて、めっき電極
板6を電源の負極に接続すると、第8図に示すように、
めっきfill中において基板3が電源の負極に接続さ
れ、また補助電極板8も電源の負極に接続される。めっ
き浴中には、基板3に対向して、アノード板12に配設
されている。
When this substrate holder is placed in a plating bath and the plating electrode plate 6 is connected to the negative electrode of the power source, as shown in FIG.
During plating filling, the substrate 3 is connected to the negative electrode of the power source, and the auxiliary electrode plate 8 is also connected to the negative electrode of the power source. In the plating bath, an anode plate 12 is disposed facing the substrate 3.

このように、被めっき部材である基板3の近傍に補助電
極板8を配設し、補助電極板8にもめっきが行なわれる
ようにすることで、基板3へのめっき処理が均一に行な
われる。
In this way, by disposing the auxiliary electrode plate 8 near the substrate 3, which is the member to be plated, so that the auxiliary electrode plate 8 is also plated, the plating process on the substrate 3 can be uniformly performed. .

〔発明が解決しようとする課題] 基板3は、めっき槽11中において水平状態でめっき処
理が行なわれ、めっき処理が終わると、めっき槽11の
上方に配設されている搬送機構13が下部して、そのフ
ック14が搬送フレーム5のフック15に係合した状態
で、上昇することによって、基板ホルダーHがめつき槽
から引き上げられる。そして、搬送機構13が次の洗浄
槽の上まで移動した後、下降して洗浄槽中に基板3を浸
漬し、洗浄が行なわれる。このめっき処理後の水洗浄は
、通常5回程度行なわれる。また、めっき処理の前処理
として、水洗浄が3回程度行なわれる。したがって、め
っき槽の前段に前処理水洗槽が3槽配設され、めっき槽
の後段には後処理水洗槽が5層配設されている。
[Problems to be Solved by the Invention] The substrate 3 is plated in a horizontal state in the plating tank 11, and when the plating process is finished, the transport mechanism 13 disposed above the plating tank 11 is moved to the bottom. Then, the substrate holder H is lifted out of the plating tank by rising with the hook 14 engaged with the hook 15 of the transport frame 5. After the transport mechanism 13 moves to the top of the next cleaning tank, it descends and immerses the substrate 3 in the cleaning tank to perform cleaning. Water washing after this plating treatment is usually performed about five times. Further, as a pretreatment for plating, water washing is performed about three times. Therefore, three pre-treatment rinsing tanks are arranged before the plating tank, and five post-treatment rinsing tanks are arranged after the plating tank.

めっき槽におけるめっき処理が終わると、前記のように
して搬送機構13で基板ホルダーをめっき槽中のめっき
液から引き上げるが、めっき槽中におけるめっき処理は
、基板3が水平の状態で行なわれるため、基板3をめっ
き処理液から引上げた状態においても、第7図に示すよ
うに基板3や保持板1の上に、めっき処理液16が表面
張力で盛り上がった状態で残る。そのため、常に負極性
の付近の陽イオン化分子の多いめっき処理液16を載せ
た状態で、次の後処理水洗槽に搬送されることになり、
その結果、めっき槽中のめっき浴の組成が徐々に変化す
ることになる。
When the plating process in the plating tank is completed, the substrate holder is lifted up from the plating solution in the plating tank by the transport mechanism 13 as described above, but since the plating process in the plating tank is performed with the substrate 3 in a horizontal state, Even when the substrate 3 is pulled up from the plating solution, the plating solution 16 remains on the substrate 3 and the holding plate 1 in a raised state due to surface tension, as shown in FIG. Therefore, the plating solution 16 containing many cationized molecules near the negative polarity is always carried to the next post-processing washing tank.
As a result, the composition of the plating bath in the plating tank gradually changes.

また、前処理水洗槽からめっき槽に移送されるときは、
前処理水洗槽から引き上げたときに基板3および保持板
1上に残った前処理洗浄水がめつき槽中に運び込まれる
。そのため、めっき浴が水で薄められ、めっき浴の組成
変化が一層早まり、安定性が極めて悪い。
Also, when transferred from the pre-treatment washing tank to the plating tank,
The pretreatment cleaning water remaining on the substrate 3 and the holding plate 1 when lifted from the pretreatment washing tank is carried into the plating tank. As a result, the plating bath is diluted with water, and the composition of the plating bath changes more quickly, resulting in extremely poor stability.

各前処理水洗槽間を移送されるとき、あるいは各後処理
水洗槽間を移送されるときも、次の水槽に洗浄水が移さ
れるために、それぞれの水槽における洗浄水の純度が低
下していく。
When transferred between each pre-treatment rinsing tank or between each post-treatment rinsing tank, the purity of the washing water in each tank decreases as the washing water is transferred to the next tank. go.

前記のように、保持板1の下面に、リング状板から成る
めっき電極[6、絶縁体スペーサ板7および補助電極板
8が積層固定されているが、これらの間の隙間にもめっ
き処理液や洗浄水がしみ込むため、これによってもめっ
き処理液や洗浄水の種間の移動が行なわれる。
As mentioned above, the plating electrode [6] consisting of a ring-shaped plate, the insulator spacer plate 7, and the auxiliary electrode plate 8 are stacked and fixed on the lower surface of the holding plate 1, and the plating solution is also applied to the gap between them. This also allows the plating solution and cleaning water to move between species.

また別の問題として、基板3の下面17すなわちめっき
処理が行なわれた面が変色しシミが出来やすい。めっき
浴から基板ホルダーを引き上げると、基板3に付着して
いるめっき処理液が、めっき処理が行なわれた下面17
において、水滴となる。この水滴が膨大していくと、つ
いには自重で落下する。このように基板3のめっき面1
7において局所的に水滴が発生すると、その部分のみめ
っき処理液におけるめっき作用が進行することによって
、変色を来たしてシミとなり、めっき品質が低下する。
Another problem is that the lower surface 17 of the substrate 3, that is, the surface on which the plating process has been performed, tends to discolor and stain. When the substrate holder is lifted out of the plating bath, the plating solution adhering to the substrate 3 is removed from the bottom surface 17 where the plating process has been performed.
At this point, it becomes a water droplet. As these water droplets grow in size, they eventually fall under their own weight. In this way, the plating surface 1 of the substrate 3
When water droplets are locally generated in step 7, the plating action of the plating solution progresses only in that area, resulting in discoloration and staining, deteriorating the plating quality.

本発明の技術的課題は、このような問題に着目し、めっ
き槽と前後の洗浄水槽との間における処理液の移動に起
因するめっき浴や洗浄水の組成変動を防止するとともに
、めっき面の変色・シミを未然に防止することにある。
The technical problem of the present invention is to focus on such problems, and to prevent changes in the composition of the plating bath and cleaning water caused by the movement of processing liquid between the plating tank and the front and rear cleaning tanks, and to improve the quality of the plating surface. The purpose is to prevent discoloration and stains.

(課題を解決するための手段] 第1図は本発明によるめっき方法およびめっき処理装置
の基本原理を説明する部分断面側面図である。Hは被め
っき部材のホルダーであり、保持板1の下面に取り付け
られた複数のめっき電極10上に、被めっき部材(基板
)3が載置された状態で、めっき層および洗浄槽に入れ
てめっきおよび洗浄が行なわれる。
(Means for Solving the Problems) Fig. 1 is a partial cross-sectional side view illustrating the basic principle of the plating method and plating processing apparatus according to the present invention. A member to be plated (substrate) 3 is placed on a plurality of plating electrodes 10 attached to the plating layer and is placed in a cleaning tank to perform plating and cleaning.

請求項1 搬送機構13には、ホルダーHを把持するハンド部18
が取り付けられており、このハンド部18は、ホルダー
Hを把持した状態で矢印a1方向に回動できる。めっき
層および洗浄槽から、被めっき部材3を保持しているホ
ルダーHを引き上げる際に、液面より上方位置において
、ハンド部18を回動させることで、ホルダーHの保持
板1を傾ける。
Claim 1: The transport mechanism 13 includes a hand portion 18 that grips the holder H.
is attached, and this hand portion 18 can rotate in the direction of arrow a1 while gripping the holder H. When pulling up the holder H holding the plated member 3 from the plating layer and the cleaning tank, the holding plate 1 of the holder H is tilted by rotating the hand portion 18 at a position above the liquid level.

請求項2 請求項1に記載の方法で使用される基板ホルダーHの保
持Fi、lは、被めっき部材を取り付ける位置が窓穴2
になっており、保持板1の下面に取り付けられた複数の
めっき電極10が、窓穴2内に突出し、その上に被めっ
き部材である基板3が載置された状態でめっきや洗浄が
行なわれる。
Claim 2 The holding Fi,l of the substrate holder H used in the method according to claim 1 has a window hole 2 at which the member to be plated is attached.
A plurality of plating electrodes 10 attached to the lower surface of the holding plate 1 protrude into the window hole 2, and plating and cleaning are performed with the substrate 3, which is the member to be plated, placed thereon. It will be done.

前記の窓穴2の縁部は、保持板1の上側が19で示すよ
うにテーパ状に傾斜している。しかも、請求項1に記載
の方法で保持板1を傾けたときに下側に位置する窓穴縁
部20の傾斜角βが、前記のテーパ状傾斜部19の傾斜
角αより小さくなっている。
The edge of the window hole 2 is tapered as shown at 19 on the upper side of the holding plate 1. Moreover, when the holding plate 1 is tilted by the method according to claim 1, the inclination angle β of the window hole edge 20 located on the lower side is smaller than the inclination angle α of the tapered inclined portion 19. .

請求項3 請求項1に記載の方法で使用される基板ホルダーHの保
持板1は、被めっき部材を取り付ける位置が窓穴2にな
っており、保持板1の下面に取り付けられた複数のめっ
き電極10が、窓穴2内に突出し、その上に被めっき部
材である基板3が載置された状態でめっきや洗浄が行な
われる。
Claim 3 The holding plate 1 of the substrate holder H used in the method according to claim 1 has a window hole 2 at the position where the member to be plated is attached, and a plurality of plating plates attached to the lower surface of the holding plate 1. Plating and cleaning are performed with the electrode 10 protruding into the window hole 2 and the substrate 3, which is a member to be plated, placed thereon.

二の保持板1の下面に、窓穴のあいためっき電極板6と
窓穴のあいた補助電極板8とを絶縁体スペーサ21を挟
んで取り付け、めっき電極板6から窓穴2内に突出した
複数の舌片6bに形成されためっき電極IOの上に被め
っき部材3が載置される。
A plated electrode plate 6 with a window hole and an auxiliary electrode plate 8 with a window hole are attached to the lower surface of the second holding plate 1 with an insulator spacer 21 in between, and a plurality of plated electrode plates 6 protrude into the window hole 2. The member to be plated 3 is placed on the plating electrode IO formed on the tongue piece 6b.

前記のめっき電極板6と補助電極板8との間の絶縁体2
1は、複数個所において、かつ局部的な領域に配設され
、スペーサの作用をしている。
Insulator 2 between the plated electrode plate 6 and the auxiliary electrode plate 8
1 is disposed at a plurality of locations and in a local area, and acts as a spacer.

また、保持板1の下面とめっき電極板6との間は、複数
個所において、かつ局部的な領域において接触しており
、めっき電極板6、絶縁スペーサ21および補助電極板
8は、前記の複数の局部的な領域において、保持板lに
固定されている。
Further, the lower surface of the holding plate 1 and the plated electrode plate 6 are in contact with each other at multiple locations and in local areas, and the plated electrode plate 6, the insulating spacer 21, and the auxiliary electrode plate 8 are is fixed to the retaining plate l in a local area of .

〔作用〕[Effect]

請求項1 水平状態の保持板1が、めっき浴の上で傾けられるため
、被めっき部材である基板3や保持板1の上のめっき処
理液は、斜面に沿って容易に流れ落ちる。その結果、め
っき処理液が次の後処理水洗槽に持ち出され、めっき浴
の組成が変動するような問題が抑制される。また、各水
洗槽から引き上げる場合にも、同様に保持板1が傾けら
れるため、前処理水洗槽からめっき槽に移送する場合に
、洗浄水がめつき槽に持ち込まれることによるめっき浴
の組成変動も抑制される。
Claim 1: Since the horizontal holding plate 1 is tilted above the plating bath, the plating solution on the substrate 3, which is the member to be plated, and the holding plate 1 easily flows down along the slope. As a result, problems such as the plating solution being taken out to the next post-treatment washing tank and the composition of the plating bath changing can be suppressed. In addition, since the holding plate 1 is tilted in the same way when lifting from each washing tank, compositional fluctuations in the plating bath due to wash water being brought into the plating tank when transferred from the pre-treatment washing tank to the plating tank are also suppressed. be done.

また、めっき槽11から引き上げた直後に、保持板1が
傾斜するため、基板3のめっき面17のめっき処理液も
円滑に流れ落ちるので、基板3のめっき面17に水滴が
漂うようなことはな(、水滴に起因する変色・シミの発
生が防止される。
In addition, since the holding plate 1 is tilted immediately after being lifted from the plating bath 11, the plating solution on the plating surface 17 of the substrate 3 also flows down smoothly, so water droplets will not float on the plating surface 17 of the substrate 3. (Prevents discoloration and stains caused by water droplets.

請求項2 基板3を装着し易いように、保持板1の窓穴2の上側縁
部は、19で示すようにテーパ状に傾斜している。しか
しながら、このような傾斜がついた状態の保持板lを傾
けると、傾けたときに下側に位置する部分は、鎖線で示
すように、水平状態に近くなり、この部分にめっき処理
液が溜まり易くなる。ところが、本発明では、めっき処
理液の溜まり易い下側部分の傾斜角を、βで示すように
、極めて小さくしているため、保持板1を傾けたときに
、基板3などの面と同程度の傾きとなり、めっき処理液
が溜まることなく、確実かつ円滑に流れ落ちる。
Claim 2: The upper edge of the window hole 2 of the holding plate 1 is tapered as shown at 19 so that the board 3 can be easily mounted. However, when the holding plate l is tilted, the lower part becomes almost horizontal as shown by the chain line, and the plating solution accumulates in this part. It becomes easier. However, in the present invention, the angle of inclination of the lower part where the plating solution tends to accumulate is extremely small, as shown by β, so that when the holding plate 1 is tilted, the angle of inclination is the same as that of the surface of the substrate 3, etc. The plating solution flows down reliably and smoothly without accumulating.

請求項3 請求項1に記載の方法で使用される基板ホルダーHの保
持板lの下面には、窓穴の開いためっき電極Fi6と窓
穴のあいた補助電極Fi8とが絶縁体スペーサ21を挟
んで取り付は固定されているが、この絶縁体スペーサ2
1は、複数個所において、かつ局部的な領域に配設され
ている。そのため、絶縁体スペーサ21の無い領域は空
間となり、隣接する部材との間にめっき処理液がしみ込
む微小隙間の生じる領域は、絶縁体スペーサ210部分
のみである。その結果、従来のように微小隙間にめっき
処理液や洗浄水がしみ込んで溜まり、次の槽に移送され
るといった問題が解消される。
Claim 3: On the lower surface of the holding plate l of the substrate holder H used in the method according to claim 1, a plating electrode Fi6 with a window hole and an auxiliary electrode Fi8 with a window hole are arranged with an insulator spacer 21 in between. The installation is fixed with this insulator spacer 2.
1 are arranged at multiple locations and in localized areas. Therefore, the area without the insulator spacer 21 becomes a space, and the only area where a minute gap between adjacent members, through which the plating solution permeates, occurs is the insulator spacer 210 portion. As a result, the conventional problem of plating solution and cleaning water penetrating into minute gaps, accumulating therein, and being transferred to the next tank is resolved.

また、保持板1とめっき電極IfJi6との間も、複数
個所において、かつ局部的な領域において接触している
ので、この部分においても、隙間の面積が大幅に減少し
、めっき処理液や洗浄水のしみ込み量を抑制できる。
Furthermore, since the holding plate 1 and the plating electrode IfJi6 are in contact with each other at multiple locations and in a localized area, the area of the gap is greatly reduced in this area as well, and the plating solution and cleaning water are in contact with each other. The amount of seepage can be suppressed.

〔実施例〕〔Example〕

次に本発明によるめっき方法およびめっき処理装置が実
際上どのように具体化されるかを実施例で説明する。
Next, examples will be used to explain how the plating method and plating apparatus according to the present invention are actually implemented.

請求項1の実施例 めっき槽や洗浄槽から基板3を引き上げる場合の保持板
1の傾は角は、45度前後が適しているが、さらに大き
な角度に傾けても差支えない。傾ける時間は数秒程度で
足りる。また、保持板1を逆方向に45度あるいは45
度以上傾けることで、逆向きに傾けるとか、液面の上で
数回スイングするなども可能である。
Embodiment of Claim 1 When the substrate 3 is pulled up from the plating tank or the cleaning tank, the angle of inclination of the holding plate 1 is preferably around 45 degrees, but it may be tilted to a larger angle. It only takes a few seconds to tilt. Also, rotate the holding plate 1 at 45 degrees or 45 degrees in the opposite direction.
By tilting it more than a degree, it is possible to tilt it in the opposite direction or swing it several times above the liquid level.

基板ホルダーHの回転やスイングは、例えば図示のよう
に搬送機構13側に取り付けたモータMでハンド部18
を回転することによって可能である。
The rotation and swing of the substrate holder H is controlled by the hand unit 18 by a motor M attached to the transport mechanism 13, for example, as shown in the figure.
This is possible by rotating the .

ハンド部18の開閉は、モータMを兼用して、あるいは
別に設けたエアシリンダなどでも行なえる。
The hand portion 18 can be opened and closed by using the motor M or by using a separately provided air cylinder.

請求項2の実施例 第2図は被めっき部材の保持板の実施例を示す平面図と
b−b断面図である。(a)に示す平面図から明らかな
ように、保持Fi、1に形成された窓穴2の上側の縁は
、19で示されるようにテーパ状の傾斜になっており、
窓穴部2の中に基板3を挿入し易くなっている。
Embodiment 2 FIG. 2 is a plan view and a sectional view taken along line bb, showing an embodiment of a holding plate for a member to be plated. As is clear from the plan view shown in (a), the upper edge of the window hole 2 formed in the holding Fi, 1 has a tapered slope as shown by 19,
The board 3 can be easily inserted into the window hole 2.

また、保持板1を傾けたときに下側に位置する窓穴縁部
12[Dの傾斜角βが小さくなっている。この角度は、
数度ないし10度前後が適している。
Further, when the holding plate 1 is tilted, the inclination angle β of the window hole edge 12 [D] located on the lower side is small. This angle is
A temperature of several degrees to around 10 degrees is suitable.

さらに、この窓穴の下側縁部20は、基板3の押さえ板
ばね22の退避部を兼ねている。保持板1を傾けたとき
、あるいは搬送時などに、基板3が移動したり落下した
りしないように、板ばね22で押圧している。第3図は
第2図(a)におけるIII−III断面図であり、N
字状に折り曲げられた板ばね22の一端23が、ネジ2
4によって、保持板1の上面に回動可能に支持されてお
り、先端の下向きの折り曲げ部25が、基板3の上面に
バネ力で圧接している。
Further, the lower edge portion 20 of this window hole also serves as a retraction portion for the pressing leaf spring 22 of the substrate 3. A leaf spring 22 is used to press the substrate 3 so that it does not move or fall when the holding plate 1 is tilted or during transportation. FIG. 3 is a cross-sectional view taken along line III-III in FIG.
One end 23 of the leaf spring 22 bent into a letter shape is attached to the screw 2.
4, it is rotatably supported on the upper surface of the holding plate 1, and the downwardly bent portion 25 at the tip is pressed against the upper surface of the substrate 3 by spring force.

この板ばね22を、鎖線で示すように、取り付はネジ2
4を中心にして下側縁部20側に移動すると、基板3の
押さえ部すなわち下向きの折り曲げ部25が下側縁部2
0上に移動して落下し、基板3の押圧力が解除される。
This leaf spring 22 is attached with screws 2 as shown by the chain line.
4 to the lower edge 20 side, the holding part of the board 3, that is, the downward bent part 25, touches the lower edge 2.
0 and falls, and the pressing force on the substrate 3 is released.

このように、窓穴2の下側縁部20の傾斜角を小さくす
ることで、基板押さえばね22の退避領域が形成され、
また基板3の上面との間に段差が形成される。そのため
、吸着アームなどが、矢印a2方向に移動して、板ばね
22の上向き突出部26に当たると、板ばね22が基板
3の上面をスライドして、ついには下側縁部20上に落
下する。次いで吸着盤などによって、基板3を取り出す
ことができ、自動化が可能となる。
In this way, by reducing the inclination angle of the lower edge 20 of the window hole 2, a retraction area for the substrate pressing spring 22 is formed,
Further, a step is formed between the upper surface of the substrate 3 and the upper surface of the substrate 3. Therefore, when the suction arm moves in the direction of arrow a2 and hits the upward protrusion 26 of the leaf spring 22, the leaf spring 22 slides on the upper surface of the board 3 and finally falls onto the lower edge 20. . Next, the substrate 3 can be taken out using a suction cup or the like, making automation possible.

なお、次の基板を窓穴部2中に挿入した後、板ばね22
を下側縁部20から基板3の上に移動するのは、人手で
行なわれる。
Note that after inserting the next board into the window hole 2, the leaf spring 22
The moving from the lower edge 20 onto the substrate 3 is done manually.

請求項3の実施例 第4図は、保持板1の下面へのめっき電極板6、絶縁ス
ペーサ21および補助電極板8の取り付は部を示す分解
斜視図である。保持板1は絶縁体からなっており、下面
には、窓穴部2の周りに、複数個所において、段差tだ
け突出した取り付は座27が一体形成されている。各取
り付は座27の位置には、固定ナンドの挿入穴28と、
位置決め用のダボ29.30が形成されている。
Embodiment 3 FIG. 4 is an exploded perspective view showing how the plated electrode plate 6, the insulating spacer 21 and the auxiliary electrode plate 8 are attached to the lower surface of the holding plate 1. The holding plate 1 is made of an insulator, and mounting seats 27 are integrally formed on the lower surface of the holding plate 1 at a plurality of locations around the window hole portion 2 and protruding by a step t. Each installation has an insertion hole 28 for a fixed nand at the position of the seat 27,
Dowels 29 and 30 for positioning are formed.

保持板1の裏面に取り付けられるめっき電極板6および
補助電極板8は、保持板1の窓穴2と同程度の大きさの
窓穴6a、8aが開いている。また、めっき電極板6は
、保持板1の取り付は座27・・・と対応する位置に、
窓穴6a側に突出した舌片6b・・・を有している。補
助電極板8も同様に、保持板1の取り付は座27・・・
と対応する位置に、窓穴8a側に突出した舌片8b・・
・を有している。
The plated electrode plate 6 and the auxiliary electrode plate 8 attached to the back surface of the holding plate 1 have window holes 6a and 8a of approximately the same size as the window hole 2 of the holding plate 1. Furthermore, the plated electrode plate 6 is attached to the holding plate 1 at a position corresponding to the seat 27...
It has a tongue piece 6b that protrudes toward the window hole 6a side. Similarly, the auxiliary electrode plate 8 is attached to the holding plate 1 at the seat 27...
At a position corresponding to the tongue piece 8b protruding toward the window hole 8a side...
·have.

さらに、補助電極板8は、各舌片8b・・・に対応する
位置に、第5図に示すように、取り付はナツト35が固
設されている。
Further, the auxiliary electrode plate 8 has nuts 35 fixedly attached thereto at positions corresponding to the respective tongues 8b, as shown in FIG.

21は絶縁スペーサであり、めっき電極板6と補助電極
板8との間に挟まれる。従来の絶縁スペーサは、めっき
電極板6や補助電極板8と同様に窓穴の開いたリング状
をしているので、全面においてめっき電極板6や補助電
極板8と接触し、微小隙間の面積が大きくなる。そのた
めに、めっき処理液や洗浄水が大量にしみ込むという問
題があった。本発明では、図示のように絶縁スペーサ2
1は、取り付はナツト35の挿通穴31と位置決めダボ
29.30の挿通穴32.33および舌片34を有する
小片となっている。
21 is an insulating spacer, which is sandwiched between the plated electrode plate 6 and the auxiliary electrode plate 8. The conventional insulating spacer has a ring shape with a window hole like the plated electrode plate 6 and the auxiliary electrode plate 8, so it contacts the plated electrode plate 6 and the auxiliary electrode plate 8 on its entire surface, reducing the area of the minute gap. becomes larger. Therefore, there was a problem that a large amount of plating solution and cleaning water seeped into the plate. In the present invention, as shown in the figure, the insulating spacer 2
1 is attached to a small piece having an insertion hole 31 for a nut 35, an insertion hole 32, 33 for a positioning dowel 29, 30, and a tongue piece 34.

組立てに際しては、保持板1の取り付は座27上に、め
っき電極板6を載置し、その上に4個の絶縁スペーサ2
1・・・を挟んで補助電極板8を載置する。
When assembling, the holding plate 1 is attached by placing the plated electrode plate 6 on the seat 27, and placing four insulating spacers 2 on top of it.
The auxiliary electrode plate 8 is placed with 1... sandwiched therebetween.

このとき、補助電極板8のナツト35が、絶縁スペーサ
21の穴31、めっき電極板6の穴6cを貫通して、保
持板1のナツト収納穴28に入る。また、取り付は座2
7のダボ29.30が、めっき電極板6の位置決め孔3
6.37を貫通して、絶縁スペーサ21の位置決め孔3
2.33に嵌入する。この状態において、保持Fj、1
の反対側からボルト38を挿入して、ナツト35に幌合
させることで、第5図のように組立て完了となる。
At this time, the nut 35 of the auxiliary electrode plate 8 passes through the hole 31 of the insulating spacer 21 and the hole 6c of the plated electrode plate 6, and enters the nut storage hole 28 of the holding plate 1. Also, the installation is done on seat 2.
The dowels 29 and 30 of No. 7 are the positioning holes 3 of the plating electrode plate 6.
6. Through 37, the positioning hole 3 of the insulating spacer 21
Insert into 2.33. In this state, holding Fj,1
By inserting the bolt 38 from the opposite side and fitting it to the nut 35, the assembly is completed as shown in FIG.

このように組立てた状態で、補助電極板8の舌片8bの
上に、絶縁スペーサ21の舌片34を挟んでめっき電極
板6の舌片6bが載置された構造となる。
In this assembled state, the tongue piece 6b of the plating electrode plate 6 is placed on the tongue piece 8b of the auxiliary electrode plate 8 with the tongue piece 34 of the insulating spacer 21 in between.

そして、めっき電極板6の舌片6bに、めっき電極10
が突起状に形成されているため、めっき電極10の上に
基板を載置すると、その荷重は、補助電極板8の舌片8
bで支持される。
Then, a plating electrode 10 is attached to the tongue piece 6b of the plating electrode plate 6.
is formed in a protruding shape, so when a substrate is placed on the plating electrode 10, the load is transferred to the tongue piece 8 of the auxiliary electrode plate 8.
Supported by b.

取り付は座27および絶縁スペーサ21は、保持板1と
めっき電極板6との間、めっき電極板6と補助電極板8
との間に、めっき処理液や洗浄水が毛管現象でしみ込ま
ない程度の間隔を形成するためであり、少なくとも0.
5〜1 、0mm程度の厚さを要する。保持板1は、取
り付は座27を形成しないで平坦状とし、絶縁スペーサ
21と同様な小さな絶縁スペーサを挟むこともできる。
The seat 27 and the insulating spacer 21 are installed between the holding plate 1 and the plated electrode plate 6, and between the plated electrode plate 6 and the auxiliary electrode plate 8.
This is to create a gap between the plating solution and cleaning water that is at least 0.
It requires a thickness of about 5 to 1.0 mm. The holding plate 1 may be mounted in a flat shape without forming the seat 27, and a small insulating spacer similar to the insulating spacer 21 may be sandwiched therebetween.

なお、めっき電極板6は、めっき電極10の領域以外を
テフロンコートし、また補助電極板8は、めっき電極板
6側の面をテフロンコートし、ナ。
It should be noted that the plated electrode plate 6 is coated with Teflon on the area other than the plated electrode 10, and the auxiliary electrode plate 8 is coated with Teflon on the side facing the plated electrode plate 6.

ト35やボルト38もテフロンコートすることで、表面
を絶縁している。
The bolts 35 and bolts 38 are also coated with Teflon to insulate their surfaces.

[発明の効果] 以上のように本発明によれば、めっき電極板6と保持板
1および補助電極板8との間に間隔を設けて、めっき処
理液や洗浄水がしみ込みにくいようにすると共に、被め
っき部材である基板3をめっき槽や洗浄槽から引き上げ
る際に、液面の上で基板3を傾けるため、めっき処理液
や洗浄水が容易にかつ確実に流れ落ちる。また、基板3
を傾けた場合に、基板取り付は用の窓穴の下側縁部に処
理液が溜まらないように、下側のみ傾斜角を小さくし、
基板3と同程度の傾きとなるようにしているので、処理
液が溜まりにくい。
[Effects of the Invention] As described above, according to the present invention, a space is provided between the plating electrode plate 6, the holding plate 1, and the auxiliary electrode plate 8 to prevent the plating solution and cleaning water from penetrating. At the same time, when the substrate 3, which is a member to be plated, is pulled up from the plating tank or the cleaning tank, the substrate 3 is tilted above the liquid level, so that the plating solution and cleaning water easily and reliably flow down. Also, the board 3
To prevent processing liquid from accumulating on the lower edge of the window hole when mounting the board, the angle of inclination is made smaller only on the lower side.
Since the inclination is about the same as that of the substrate 3, the processing liquid is less likely to accumulate.

その結果、めっき処理液が次の洗浄槽に持ち出されたり
、前処理水洗槽から洗浄水がめつき槽に持ち込まれるこ
とで、めっき浴の組成が変化し、浴組成が不安定になる
といった問題が解消される。
As a result, the problem of plating solution being carried out to the next cleaning tank, or cleaning water being brought into the plating tank from the pre-treatment rinsing tank, changes the composition of the plating bath and makes the bath composition unstable. be done.

また、水切れが良くなり、基板3のめっき面に水滴が発
生して漂ったりする恐れもないため、めっき面が変色し
たりシミが発生するなどの問題も解消される。
In addition, water drains better and there is no risk of water droplets forming and floating on the plated surface of the substrate 3, which eliminates problems such as discoloration and staining of the plated surface.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明によるめっき方法およびめっき処理装置
の基本原理を説明する部分断面側面図、第2図は被めっ
き部材の保持板の実施例を示す平面図と断面図、 第3図は第2図における■−■断面図、第4図は保持板
の下面へのめっき電極板、絶縁スペーサおよび補助電極
板の取り付は部を示す分解斜視図、 第5図は保持板の下面へのめっき電極板、絶縁スペーサ
および補助電極板の組立て状態を示す断面図、 第6図は従来のめっき装置における基板ホルダーの斜視
図、 第7図は従来の基板ホルダーの中心断面図、第8図はめ
っき処理装置における配線図である。 図において、Hは基板ホルダー 1は保持板、2は窓穴
部、3は被めっき部材(基板)、6はめっき電極板、6
aは窓穴部、6bは舌片、6cはす、ト挿通孔、7.2
1は絶縁スペーサ、8は補助電極板、8aは窓穴部、8
bは舌片、10はめっき電極、13は搬送機構、16は
めっき処理液、17はめっき面(基板の下面)、18は
ハンド部、19はテーパ状傾斜面、20は下側縁部、2
2は板ばね(基板押さえばね)、26は上向き突出部、
27は取り付は座、28はナツト収納穴、35はナツト
、38はボルトをそれぞれ示す。 特許出願人     冨士通株式会社 復代理人 弁理士  福 島 康 文 本発明の基ホ猷理 萬/r21 第4図 82図 第5図 86図
Fig. 1 is a partially sectional side view explaining the basic principle of the plating method and plating processing apparatus according to the present invention, Fig. 2 is a plan view and a sectional view showing an embodiment of a holding plate for a member to be plated, and Fig. Figure 2 is a cross-sectional view taken along ■-■ in Figure 2, Figure 4 is an exploded perspective view showing how the plated electrode plate, insulating spacer, and auxiliary electrode plate are attached to the lower surface of the retainer plate, and Figure 5 is an exploded perspective view showing the attachment of the plated electrode plate, insulating spacer, and auxiliary electrode plate to the lower surface of the retainer plate. FIG. 6 is a perspective view of a substrate holder in a conventional plating device; FIG. 7 is a central sectional view of a conventional substrate holder; FIG. It is a wiring diagram in a plating processing apparatus. In the figure, H is a substrate holder, 1 is a holding plate, 2 is a window hole, 3 is a member to be plated (substrate), 6 is a plating electrode plate, 6
a is the window hole part, 6b is the tongue piece, 6c is the slot, G is the insertion hole, 7.2
1 is an insulating spacer, 8 is an auxiliary electrode plate, 8a is a window hole portion, 8
b is a tongue piece, 10 is a plating electrode, 13 is a transport mechanism, 16 is a plating treatment liquid, 17 is a plating surface (lower surface of the substrate), 18 is a hand part, 19 is a tapered inclined surface, 20 is a lower edge, 2
2 is a leaf spring (substrate holding spring), 26 is an upward protrusion,
Reference numeral 27 indicates a mounting seat, 28 indicates a nut storage hole, 35 indicates a nut, and 38 indicates a bolt. Patent Applicant Fujitsu Co., Ltd. Sub-Agent Patent Attorney Yasushi Fukushima Text of the Invention Kiho Rirman/r21 Figure 4, 82, Figure 5, 86

Claims (1)

【特許請求の範囲】 1、保持板(1)に固定された複数のめっき電極(10
)の上に、被めっき部材(3)を載置した状態で、保持
板(1)と一緒にめっき層および洗浄槽に入れてめっき
および洗浄を行なうめっき処理装置において、めっき層
および洗浄槽から保持板(1)を引き上げる際に、液面
より上方位置において、保持板(1)を傾けることを特
徴とするめっき方法。 2、請求項1に記載の方法で使用される保持板(1)は
、被めっき部材(3)を取り付ける位置が窓穴(2)に
なっており、 この保持板(1)の下面に取り付けられた複数の電極(
10)が、窓穴(2)内に突出し、その上に被めっき部
材(3)が載置される構造となっていること、前記の窓
穴(2)の縁部は、保持板(1)の上側がテーパ状に傾
斜しており、かつ請求項1に記載の方法で保持板(1)
を傾けたときに下側に位置する窓穴縁部(20)の傾斜
角(β)を前記のテーパ状傾斜部の傾斜角(α)より小
さくしたことを特徴とするめっき装置。 3、請求項1に記載の方法で使用される保持板(1)は
、被めっき部材(3)を取り付ける位置が窓穴(2)に
なっており、 この保持板(1)の下面に、窓穴のあいためっき電極板
(6)と窓穴のあいた補助電極板(8)とを、絶縁体ス
ペーサ(21)を挟んで取り付け、めっき電極板(6)
から、窓穴(2)内に複数の舌片(6b)を突出させ、
該舌片(6b)に形成されためっき電極(10)の上に
被めっき部材(3)が載置される構造とし、 前記のめっき電極板(6)と補助電極板(8)との間に
は、複数個所において、かつ局部的な領域において、前
記の絶縁体スペーサ(21)が挟まれており、保持板(
1)の下面とめっき電極板(6)とは、複数個所におい
て、かつ局部的な領域において接触しており、 めっき電極板(6)、絶縁体スペーサ(21)および補
助電極板(8)は、前記の複数の局部的な領域において
、保持板(1)に固定されていることを特徴とするめっ
き装置。
[Claims] 1. A plurality of plating electrodes (10
), the plated member (3) is placed in the plating layer and cleaning tank together with the holding plate (1), and plating and cleaning are carried out in the plating processing equipment. A plating method characterized in that the holding plate (1) is tilted at a position above the liquid level when the holding plate (1) is pulled up. 2. The holding plate (1) used in the method according to claim 1 has a window hole (2) at the position where the member to be plated (3) is attached, and the plated member (3) is attached to the lower surface of the holding plate (1). multiple electrodes (
10) protrudes into the window hole (2) and the member to be plated (3) is placed on top of it, and the edge of the window hole (2) is connected to the holding plate (1). ) has a tapered upper side, and the retaining plate (1) is formed by the method according to claim 1.
A plating apparatus characterized in that the inclination angle (β) of the window hole edge (20) located on the lower side when the window hole edge (20) is tilted is smaller than the inclination angle (α) of the tapered inclined portion. 3. The holding plate (1) used in the method according to claim 1 has a window hole (2) at the position where the member to be plated (3) is attached, and on the lower surface of this holding plate (1), The plated electrode plate (6) with a window hole and the auxiliary electrode plate (8) with a window hole are attached with an insulating spacer (21) in between, and the plated electrode plate (6) is attached.
A plurality of tongue pieces (6b) are made to protrude into the window hole (2) from the window hole (2),
A member to be plated (3) is placed on the plating electrode (10) formed on the tongue (6b), and between the plating electrode plate (6) and the auxiliary electrode plate (8). The above-mentioned insulating spacer (21) is sandwiched in a plurality of places and in a local area, and the holding plate (
1) The lower surface of the plated electrode plate (6) is in contact with the plated electrode plate (6) at multiple locations and in local areas, and the plated electrode plate (6), the insulator spacer (21), and the auxiliary electrode plate (8) are in contact with each other at multiple locations and in local areas. . A plating apparatus, characterized in that it is fixed to a holding plate (1) in the plurality of local areas.
JP2140454A 1990-05-30 1990-05-30 Plating equipment Expired - Fee Related JP2608485B2 (en)

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JP2140454A JP2608485B2 (en) 1990-05-30 1990-05-30 Plating equipment

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Application Number Priority Date Filing Date Title
JP2140454A JP2608485B2 (en) 1990-05-30 1990-05-30 Plating equipment

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JPH0432600A true JPH0432600A (en) 1992-02-04
JP2608485B2 JP2608485B2 (en) 1997-05-07

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001086600A (en) * 1999-09-17 2001-03-30 Nec Home Electronics Ltd Surround system
JP2007119923A (en) * 1998-11-28 2007-05-17 Acm Research Inc Methods and apparatus for holding and positioning semiconductor workpiece during electropolishing and/or electroplating of the workpiece
JP2008174770A (en) * 2007-01-16 2008-07-31 Fujikura Ltd Plating fixture

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5419649A (en) * 1977-07-15 1979-02-14 Hitachi Ltd Wafer holding jig for electrtolytic plating
JPS6414164U (en) * 1987-07-13 1989-01-25

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5419649A (en) * 1977-07-15 1979-02-14 Hitachi Ltd Wafer holding jig for electrtolytic plating
JPS6414164U (en) * 1987-07-13 1989-01-25

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007119923A (en) * 1998-11-28 2007-05-17 Acm Research Inc Methods and apparatus for holding and positioning semiconductor workpiece during electropolishing and/or electroplating of the workpiece
JP2001086600A (en) * 1999-09-17 2001-03-30 Nec Home Electronics Ltd Surround system
JP2008174770A (en) * 2007-01-16 2008-07-31 Fujikura Ltd Plating fixture

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