JP3144224B2 - Screening method for ceramic capacitors - Google Patents
Screening method for ceramic capacitorsInfo
- Publication number
- JP3144224B2 JP3144224B2 JP15675194A JP15675194A JP3144224B2 JP 3144224 B2 JP3144224 B2 JP 3144224B2 JP 15675194 A JP15675194 A JP 15675194A JP 15675194 A JP15675194 A JP 15675194A JP 3144224 B2 JP3144224 B2 JP 3144224B2
- Authority
- JP
- Japan
- Prior art keywords
- ceramic capacitor
- defective
- time
- screening
- insulation resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Ceramic Capacitors (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
【０００１】[0001]
【産業上の利用分野】この発明は、セラミックコンデン
サの製品中から絶縁抵抗の低い不良品を除去するための
スクリーニング方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a screening method for removing defective products having low insulation resistance from ceramic capacitor products.
【０００２】[0002]
【従来の技術】セラミックコンデンサの製造工法では、
その最終工程で、製造中に生じたコンデンサ素子の欠陥
（ボイド，デラミネーション，クラック等）による不良
品を除去するために、絶縁抵抗の測定を行い、抵抗値の
低いものをスクリーニングしている。2. Description of the Related Art In a method of manufacturing a ceramic capacitor,
In the final step, insulation resistance is measured to remove defective products due to defects (voids, delaminations, cracks, etc.) of the capacitor elements generated during manufacturing, and those having a low resistance value are screened.
【０００３】従来、上記のようなスクリーニングの精度
を向上させるためには、測定電圧のアップ，測定時の極
性反転，測定時間のアップ等の方法が採られている。Conventionally, in order to improve the accuracy of the screening as described above, methods such as increasing the measurement voltage, inverting the polarity during measurement, and increasing the measurement time have been adopted.
【０００４】良品積層セラミックコンデンサ及び欠陥に
より絶縁抵抗の低い積層セラミックコンデンサの抵抗値
−時間特性（以下充電特性という）を図１に示す。FIG. 1 shows resistance-time characteristics (hereinafter referred to as charging characteristics) of a non-defective multilayer ceramic capacitor and a multilayer ceramic capacitor having a low insulation resistance due to a defect.
【０００５】良品セラミックコンデンサの充電特性は、
時間に対して線（Ａ）のカーブで抵抗値が推移する。即
ち、充電完了までは抵抗は時間に比例して直線で上昇
し、充電が終了すると誘電体の絶縁体としての抵抗値に
飽和する。The charging characteristics of a good ceramic capacitor are as follows:
The resistance value changes with the curve of the line (A) with respect to time. That is, the resistance rises linearly in proportion to time until charging is completed, and saturates to the resistance value of the dielectric as an insulator when charging is completed.
【０００６】これに対し、欠陥のある不良品セラミック
コンデンサの充電特性は、欠陥により絶縁抵抗値の低下
が生じた誘電体の上記飽和値が低くなるため一般的に
は、線（Ｂ）のカーブを描く。従って、セラミックコン
デンサのスクリーニングを行う際は、より長い時間で測
定を行い、飽和値により近い場所で抵抗値を測定した方
が、良品と不良品の選別が容易となる。On the other hand, the charging characteristic of a defective ceramic capacitor having a defect generally shows a curve (B) because the saturation value of the dielectric material whose insulation resistance value has decreased due to the defect becomes low. Draw. Therefore, when screening a ceramic capacitor, it is easier to select a non-defective product from a defective product if the measurement is performed for a longer time and the resistance value is measured at a location closer to the saturation value.
【０００７】[0007]
【発明が解決しようとする課題】しかし、実際には、セ
ラミックコンデンサの素子間欠陥部に形成された電流の
パス路が微細な場合、ときとして充電時間の途中で一部
が溶融し、線（Ｃ）のカーブで示すように低下が回復し
たり、逆に線（Ｄ）のカーブのように、時間が進むにつ
れ劣化が進み、抵抗値が低下したりするものがある。However, in practice, when a current path formed in a defective portion between elements of a ceramic capacitor is minute, a part of the current path is sometimes melted during the charging time, and the line ( In some cases, the drop recovers as shown by the curve C), and on the other hand, as shown by the curve in the line D, the deterioration progresses with time and the resistance value drops.
【０００８】また、パス路自身が半導体的性質を持ち、
電流通過中の発熱により抵抗値が変化することもある。
従って、欠陥部分の挙動により一番選別が容易となる時
間（良品と欠陥含有不良品との抵抗に最大の差が生じる
時間）は、一概に長時間が良いとは云えなくなり、製品
中から不良品を確実に除去することができないという問
題がある。In addition, the path itself has semiconductor properties,
The resistance value may change due to heat generation during the passage of current.
Therefore, the time during which the sorting becomes the easiest due to the behavior of the defective portion (the time when the maximum difference occurs in the resistance between the non-defective product and the defective product) is generally not considered to be good for a long time. There is a problem that non-defective products cannot be reliably removed.
【０００９】そこで、この発明の課題は、種々の抵抗値
の挙動を示す欠陥含有不良品のスクリーニング精度を向
上させて、製品中に不良品が混入するのを防止すること
ができるセラミックコンデンサのスクリーニング方法を
提供することにある。SUMMARY OF THE INVENTION It is an object of the present invention to improve the screening accuracy of defective products having various resistance values and to prevent the defective products from being mixed into the products. It is to provide a method.
【００１０】[0010]
【課題を解決するための手段】上記のような課題を解決
するため、この発明は、セラミックコンデンサに所定の
電圧を印加するセラミックコンデンサのスクリーニング
方法であって、異なる充電時間で絶縁抵抗を二回以上測
定し、良品の同じ時間の絶縁抵抗と比較し、少なくとも
１つの時間における絶縁抵抗値が、良品の絶縁抵抗値よ
り低い場合に不良品とする構成を採用したものである。SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention provides a method of screening a ceramic capacitor for applying a predetermined voltage to the ceramic capacitor.
A method, measuring the insulation resistance more than once at different charge times
And compare it with the insulation resistance of a good product at the same time.
The insulation resistance at one time is equal to the insulation resistance of a good product.
In this case, a configuration in which the product is determined to be defective when the product is lower than the standard is adopted.
【００１１】[0011]
【作用】セラミックコンデンサのスクリーニングにおい
て、長い時間電圧を印加して飽和値に近い場所で抵抗値
を測定すれば、飽和値の低い一般的な欠陥不良品の除去
が行える。In the screening of a ceramic capacitor, if a voltage is applied for a long time and a resistance value is measured near a saturation value, a general defective defective product having a low saturation value can be removed.
【００１２】また、電圧印加時間を短くして測定を行な
うと、飽和値に至るまでに種々の抵抗値の挙動を示す欠
陥含有不良品の除去が行なえ、このように時間の異なる
電圧で抵抗値を測定すれば、欠陥含有不良品のスクリー
ニングに洩れがなくなり、精度が向上する。Further, when the measurement is performed with the voltage application time shortened, it is possible to remove a defect-containing defective product exhibiting various resistance values before reaching a saturation value. Is measured, there is no omission in screening for defective products containing defects, and the accuracy is improved.
【００１３】[0013]
【実施例】以下、この発明の実施例を説明する。Embodiments of the present invention will be described below.
【００１４】この発明は、積層セラミックコンデンサの
製造最終工程で、製造中に生じた素子の欠陥による不良
品を除去するため、セラミックコンデンサに二種類以上
の時間の異なる電圧を順次印加し、それぞれの時間にお
ける絶縁抵抗の測定を行い、抵抗値の低い不良品をスク
リーニングする方法である。According to the present invention, in order to remove defective products due to element defects generated during the manufacturing in the final step of manufacturing a multilayer ceramic capacitor, two or more kinds of voltages having different times are sequentially applied to the ceramic capacitor. This method measures the insulation resistance over time and screens for defective products having low resistance values.
【００１５】このように、時間を変えて二回以上の電圧
印加による絶縁抵抗の測定を行うと、長い時間の電圧印
加により飽和値により近い場所で抵抗値を測定し、一般
的な欠陥による不良品の除去が行なえる。As described above, when the insulation resistance is measured by applying a voltage two or more times while changing the time, the resistance value is measured at a location closer to the saturation value by applying the voltage for a long time, and an error due to a general defect is detected. Non-defective products can be removed.
【００１６】また、電圧印加時間を短くして絶縁抵抗の
測定を行うと、飽和値に達するまでの間に抵抗値の変化
の挙動を示す欠陥含有不良品の除去が行なえる。Further, when the insulation resistance is measured with the voltage application time shortened, it is possible to remove a defect-containing defective product exhibiting a change in the resistance value until the saturation value is reached.
【００１７】積層セラミックコンデンサに電圧を印加し
て絶縁抵抗を測定するスクリーニング時において、欠陥
部分の挙動により、良品と欠陥含有不良品との抵抗に最
大の差が生じるいちばん選別が容易な時間は、先に述べ
たように長時間とは云えず、このため、二種類以上の時
間の異なる電圧を印加して抵抗値の測定を行なうと、欠
陥含有不良品のスクリーニング精度が向上する。At the time of screening where a voltage is applied to a multilayer ceramic capacitor to measure the insulation resistance, the time at which the largest difference occurs in the resistance between a non-defective product and a defective product having a defect due to the behavior of a defective portion is most easily selected. As described above, it cannot be said that it is a long time. For this reason, when two or more types of voltages having different times are applied and the resistance value is measured, the screening accuracy for defective products containing defects is improved.
【００１８】なお、スクリーニング時の印加電圧の値や
印加時間と回数は、セラミックコンデンサの容量等に応
じて任意に選択すればよい。It should be noted that the value of the applied voltage, the application time, and the number of times of the screening may be arbitrarily selected according to the capacity of the ceramic capacitor.
【００１９】以上のように、この発明によると、セラミ
ックコンデンサに所定の電圧を印加するセラミックコン
デンサのスクリーニング方法であって、異なる充電時間
で絶縁抵抗を二回以上測定し、良品の同じ時間の絶縁抵
抗と比較し、少なくとも１つの時間における絶縁抵抗値
が、良品の絶縁抵抗値より低い場合に不良品とするよう
にしたので、種々の抵抗値の挙動を示す欠陥含有不良品
のスクリーニング精度が大幅に向上し、不良品の除去が
確実に行なえるので、セラミックコンデンサ使用時の故
障発生率を低下させることができる。As described above, according to the present invention, a ceramic capacitor for applying a predetermined voltage to a ceramic capacitor is provided.
This is a method of screening for a capacitor, in which insulation resistance is measured twice or more at different charging times, and insulation
Insulation resistance value in at least one time compared to resistance
However, when the insulation resistance value of the non-defective product is lower than that of the non-defective product, it is determined that the product is defective . Therefore, the screening accuracy of the defect-containing defective product showing various resistance value behaviors is greatly improved, and the defective product can be surely removed. Therefore, the rate of occurrence of failure when using a ceramic capacitor can be reduced.
【図１】セラミックコンデンサにおける電圧印加時間と
抵抗値の関係を示す特性図である。FIG. 1 is a characteristic diagram showing a relationship between a voltage application time and a resistance value in a ceramic capacitor.
Claims (1)
加するセラミックコンデンサのスクリーニング方法であ
って、異なる充電時間で絶縁抵抗を二回以上測定し、良
品の同じ時間の絶縁抵抗と比較し、少なくとも１つの時
間における絶縁抵抗値が、良品の絶縁抵抗値より低い場
合に不良品とすることを特徴とするセラミックコンデン
サのスクリーニング方法。1. A method for screening a ceramic capacitor, wherein a predetermined voltage is applied to the ceramic capacitor.
The insulation resistance at different charging times
At least one time compared to the insulation resistance of the product at the same time
If the insulation resistance between
A method for screening a ceramic capacitor, characterized in that the product is a defective product .
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15675194A JP3144224B2 (en) | 1994-06-14 | 1994-06-14 | Screening method for ceramic capacitors |
| SG1995000633A SG32368A1 (en) | 1994-06-14 | 1995-06-13 | Method for screening ceramic capacitors |
| MYPI9501566 MY117890A (en) | 1994-06-14 | 1995-06-13 | Method for screening ceramic capacitors |
| CN95108552A CN1071923C (en) | 1994-06-14 | 1995-06-14 | Method for screening ceramic capacitors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15675194A JP3144224B2 (en) | 1994-06-14 | 1994-06-14 | Screening method for ceramic capacitors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH07335482A JPH07335482A (en) | 1995-12-22 |
| JP3144224B2 true JP3144224B2 (en) | 2001-03-12 |
Family
ID=15634527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15675194A Expired - Fee Related JP3144224B2 (en) | 1994-06-14 | 1994-06-14 | Screening method for ceramic capacitors |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP3144224B2 (en) |
| CN (1) | CN1071923C (en) |
| MY (1) | MY117890A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3603640B2 (en) * | 1999-02-04 | 2004-12-22 | 松下電器産業株式会社 | Screening method of multilayer ceramic capacitor |
| JP3859079B2 (en) * | 2003-09-25 | 2006-12-20 | Ｔｄｋ株式会社 | Screening method for multilayer ceramic capacitors |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2969666B2 (en) * | 1989-08-22 | 1999-11-02 | 松下電器産業株式会社 | Manufacturing method of multilayer ceramic capacitor |
| JP2989310B2 (en) * | 1991-04-24 | 1999-12-13 | ティーディーケイ株式会社 | Judgment method for multilayer ceramic capacitors |
-
1994
- 1994-06-14 JP JP15675194A patent/JP3144224B2/en not_active Expired - Fee Related
-
1995
- 1995-06-13 MY MYPI9501566 patent/MY117890A/en unknown
- 1995-06-14 CN CN95108552A patent/CN1071923C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH07335482A (en) | 1995-12-22 |
| CN1128399A (en) | 1996-08-07 |
| MY117890A (en) | 2004-08-30 |
| CN1071923C (en) | 2001-09-26 |
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