JP3663251B2 - Capacitor leakage current measurement method - Google Patents

Capacitor leakage current measurement method Download PDF

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JP3663251B2
JP3663251B2 JP4985696A JP4985696A JP3663251B2 JP 3663251 B2 JP3663251 B2 JP 3663251B2 JP 4985696 A JP4985696 A JP 4985696A JP 4985696 A JP4985696 A JP 4985696A JP 3663251 B2 JP3663251 B2 JP 3663251B2
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leakage current
capacitor
current
voltage
measured
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JPH09243695A (en
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寛 丹羽
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Rohm Co Ltd
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Rohm Co Ltd
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Description

【０００１】
【発明の属する技術分野】
本発明はコンデンサのリーク電流の測定方法に関する。さらに詳しくは、少なくとも２種類の電圧を印加し、それぞれの一定時間後の電流により検査をする場合に製造ラインの異常などに伴う測定誤差を少なくしたコンデンサのリーク電流の測定方法に関する。
【０００２】
【従来の技術】
従来、たとえばタンタルコンデンサなどのコンデンサは、図３（ａ）に示されるように、電流制限抵抗Ｒを直列に接続し、一定電圧Ｖを印加し、一定時間経過後の電流を電流計Ａにより測定することにより、リーク電流の良否の検査が行われる。一般にコンデンサの等価回路は、図３（ｂ）に示されるように、リーク電流の原因となる抵抗ＲISO と、誘電体吸収電流として抵抗Ｒ0 およびキャパシタンスＣ0 とがコンデンサのキャパシタンスＣと並列接続されたものに、直列等価抵抗ＥＳＲおよびインダクタンスＬを直列接続したものである。タンタルコンデンサの場合のリーク電流の検査規格としては、定格電圧より低い電圧Ｖ1 を印加した場合の一定時間後の電流と定格電圧の２倍程度の高い電圧Ｖ2 を印加したときの一定時間後の電流が共に一定値以内に入っているか否かにより判定されている。
【０００３】
このようなリーク電流の測定方法は、たとえば図４に模式図が示されるように、リードフレームなどに多数個並列に連結されたコンデンサ１がフレームごと搬送され、各測定器の前に送られてきたコンデンサ１が数個ずつ測定され、その測定個数ごと矢印Ａの方向に間欠的に搬送される。
【０００４】
図４において、第１のリーク電流測定器２（ＬＣ１測定）により、図に示される例では４個のコンデンサ１にプローブ２１を接続し、一度に４個のコンデンサに低い電圧Ｖ1 を印加し、たとえば２０〜３２秒程度の時間放置し、その後の各々の電流Ｉ1 を測定する。その間にすでに第１のリーク電流測定器２（ＬＣ１測定）による測定を終り、第２のリーク電流測定器３（ＬＣ２測定）の前に搬送されたコンデンサ１に第２のリーク電流測定器３のプローブ３１を接続する。そして、一度に４個のコンデンサ１に高い電圧Ｖ2 を印加し、たとえば同じ時間の２０〜３２秒程度の時間放置し、その後の各コンデンサの電流Ｉ2 を測定する。第１と第２のリーク電流測定器２、３による測定の両方が終了後に、連結されたコンデンサ１は測定された個数分搬送される。
【０００５】
この第１および第２のリーク電流測定により印加された電圧とそのときの電流との関係を図５（ａ）に示す。図５（ａ）において、時間ｔ1 は第１のリーク電流測定器２により測定されている時間で、電圧Ｖ1 が印加され、最初に多く流れた充電電流が指数関数的に減少し、時間ｔ1 の経過時の電流Ｉ1 を第１のリーク電流値として測定する。時間ｔ0 は第１のリーク電流測定器２による測定を終了して第２のリーク電流測定器３に至るまでの搬送途中の時間で、その間は第１のリーク電流測定電圧Ｖ1 の残留電圧Ｖ0 がコンデンサに印加されている。つぎの時間ｔ2 は第２のリーク電流測定器３による測定時間で、電圧Ｖ2 が印加されている。このときも電圧印加の最初に多くの充電電流が流れ、指数関数的に減少し、時間ｔ2 の経過時の電流値Ｉ2 が第２のリーク電流値として測定される。時間ｔ2 の経過後電圧が０にされると、瞬間的に逆方向の電流Ｄが流れる。
【０００６】
第２のリーク電流の測定も終って放電器４の前に搬送されたコンデンサ１はコンデンサ１の両電極間に抵抗器が接続されて放電される。この一連の作業がたとえば４個づつ順次間欠的に行われる。また、放電が終ったコンデンサ１は、さらにつぎの工程に搬送され、リーク電流の測定結果により、不良品は切断されて除去され良品はそのまま次工程に送られる。
【０００７】
【発明が解決しようとする課題】
従来のコンデンサを連結してコンデンサの製造工程の各ステーションを搬送しながらそのステーションの１つで前記リーク電流を測定する方法においては、製造ラインのどこかで手動停止もしくはアラーム異常停止が生じてフレームの搬送が中断した場合に、第２のリーク電流測定器３による測定において、異常時はリーク電流値が少なめの値になるという問題がある。
【０００８】
本発明者はフレームの搬送が中断した場合に第２のリーク電流測定器によるリーク電流の測定値が低めになる原因を鋭意検討して調べた結果、以下の点に原因があることを見出した。すなわち、従来のリーク電流測定は、前述のように、第１のリーク電流測定と第２のリーク電流測定とが別の測定器で、別のステーションで行われている。そのため、第１および第２のリーク電流測定器２、３の間などに搬送途中のコンデンサ１が存在し、時間ｔ0 の間残留電圧Ｖ0 が印加されている。製造ラインにトラブルがなく、常に一定個数ごとに搬送されておれば第１のリーク電流測定と第２のリーク電流測定との間の時間は一定で、測定条件が同じであれば問題はないが、製造ラインにたとえば不良品カットのトラブルなどの故障が発生するとその時間ｔf （図５（ｂ）参照）が異常に長くなる。第２のリーク電流の測定までの時間が長くなると、残留電圧Ｖ0 によりコンデンサの誘電体吸収が多く進行し、図５（ｂ）に示されるように、第２のリーク電流の測定値が低くなる（破線が正常の場合の電流変化を示す）。その結果、第１のリーク電流の測定値とかけ離れた測定値になる場合が生じ、測定器として確度（信頼性）が低下することを見出した。
【０００９】
一方、第１のリーク電流の測定後放電して測定電圧Ｖ1 の残留電圧をなくすることも考えられるが、数十秒程度の放電では完全に放電をすることができず、一度電圧を印加したコンデンサを電圧印加前の状態に戻すことは、長時間の放電時間を必要とし、実用的でない。
【００１０】
本発明はこのような問題を解決するためになされたもので、製造ラインが何らかの異常でストップした場合でもコンデンサのリーク電流の測定に影響を及ぼさない、信頼性の高いコンデンサのリーク電流の測定方法を提供することを目的とする。
【００１１】
【課題を解決するための手段】
本発明によるコンデンサのリーク電流の測定方法は、コンデンサに２種類の電圧を印加してそれぞれの一定時間後の電流値が所定範囲に入っているか否かを検査するコンデンサのリーク電流の測定方法であって、複数個のコンデンサを長尺のフレームに並列に連結して、該フレームをコンデンサの各製造工程のステーションを通過するように搬送し、第１のステーションで前記複数個のコンデンサの一部について、第１の電圧を印加することにより第１のリーク電流を測定し、引き続き連続して第２の電圧を印加することにより第２のリーク電流を測定し、その後前記フレームを移動して、第２のステーションで前記リーク電流の測定をした一部のコンデンサについて残留電圧を放電すると共に、他の一部のコンデンサについて前記第１および第２のリーク電流の測定を連続して前記第１のステーションで行うことを特徴とするものである。
【００１２】
本発明によるコンデンサのリーク電流の測定方法の他の形態は、コンデンサに２種類の電圧を印加してそれぞれの一定時間後の電流値が所定範囲に入っているか否かを検査するコンデンサのリーク電流の測定方法であって、複数個のコンデンサを長尺のフレームに並列に連結して、該フレームをコンデンサの各製造工程のステーションを通過するように搬送し、第１のステーションで前記複数個のコンデンサの一部について、第１の電圧を印加することにより第１のリーク電流を測定し、引き続き連続して第２の電圧を印加することにより第２のリーク電流を測定し、さらに引き続き残留電圧を放電し、その後前記フレームを移動して、第２のステーションで前記リーク電流の測定をした一部のコンデンサについて別の工程を行うと共に、他の一部のコンデンサについて前記第１および第２のリーク電流の測定および放電作業を連続して前記第１のステーションで行うことを特徴とする。
【００１３】
【発明の実施の形態】
つぎに、図面を参照しながら本発明のコンデンサのリーク電流の測定方法を説明する。
【００１４】
図１の（ａ）は本発明のリーク電流の測定方法を説明する模式図、（ｂ）および（ｃ）はそのフローチャートである。コンデンサ１は従来と同様に長尺の銅フレームなどに並列に連結され、順次搬送されながらリーク電流測定器５のプローブ端子の数（図１では３個で、図４と異なるが個数には限定されない）だけ接続され、その個数のコンデンサのリーク電流の測定を一度に行う。本発明では、このリーク電流測定器５がコントローラ６により２種類の測定電圧に切り替えられるようになっており、まず、一方の電圧、たとえば低い電圧Ｖ1 を印加して所定時間の経過後の電流値を測定した後、直ちにリーク電流測定器５の電圧をコントローラ６により切り替えて、高い電圧Ｖ2 にし、所定時間の経過後の電流値を測定することに特徴がある。
【００１５】
すなわち、本発明によれば、リーク電流の測定を始めたら２種類の電圧の測定を必ず連続して行うため、第１のリーク電流を測定した後に長時間放置されてその後に第２のリーク電流の測定が行われるということは起こらない。もし製造ラインのどこかでラインが中断する故障が発生しても、リーク電流の測定が完了するまで行われ、その後に中断に至る。もともとリーク電流測定時間中は連結されたコンデンサの搬送はストップしており、リーク電流の測定などの各工程の作業が終了する度ごとに間欠的に搬送される仕組みになっているからである。
【００１６】
この２種類のリーク電流の測定が完了した後に、連結されたコンデンサ１はその個数分ずつ次工程に搬送され、放電器４のところに送られたコンデンサ１は放電器４に接続されて放電される。その後、不良排出器７に送られ、前の工程の電流測定器５の測定結果に基づきコントローラ６からの指示により不良品のみが連結部分から切り落とされ不良品箱に入れられ（ＮＧ）、良品は連結されたまま、さらに次工程に送られる（ＧＯ）。この一連の工程をフローチャートにしたのが図１（ｂ）である。
【００１７】
前述の方法では、リーク電流の測定の後一連のコンデンサを測定個数分ずつ搬送し、異なるステーションに設けられた放電器４により放電をした。そうすることによりリーク電流の測定と放電とを同じ時間に並列に行うことができるため、設備の回転数を向上させるのに都合がよい。しかし、リーク電流測定器５の電圧の切替をさらに０Ｖにも切り替えられるようにしておき、２種類の電流測定を終了した後にコンデンサ１に印加する電圧を０Ｖに切り替えて同じステーションで放電してもよい。このときの工程をフローチャートにしたのが図１（ｃ）である。このようにすれば、別途放電器を設ける必要がない。製造ラインの回転は、後述するように、電流測定器のプローブ端子の数を多くしたり、リーク電流測定器を複数台設けることにより、一度の測定個数を多くすることにより早くなる。
【００１８】
本発明の方法により、２種類の電圧を連続的に印加してリーク電流を測定するときの印加される電圧と電流との関係を図２に示す。図２において、まずＶ1 の電圧がコンデンサに印加されると充電電流が流れ、指数関数的に電流値Ｉが減る。たとえば２０秒程度の時間ｔ1 の間電圧Ｖ1 を印加し、時間ｔ1 が経過した時点の電流値Ｉ1 を測定する。その後、直ちにコンデンサに印加する電圧をＶ2 に切り替え、たとえば３２秒程度の時間ｔ2 の間放置する。この電圧が高くなった際に充電電流が再度急激に多く流れ、その後指数関数的に電流は少なくなる。時間ｔ2 が経過した時点の電流Ｉ2 を測定し、両方の電流Ｉ1 、Ｉ2 が共に規定値内に入っているか否かにより良否の判定をコントローラ６（図１参照）により行う。なお、図２において、Ｄは電圧を０にした瞬間に逆方向に流れる電流を示している。
【００１９】
本発明によれば、２種類のリーク電流の測定を１つの測定器で連続的に行うため、電流測定の工程の時間が多くかかり、他の放電などに要する時間とバランスが取れない場合は、設備の稼働率が低下する。しかし、そのような場合には、リーク電流測定器のプローブ端子の数を多くしたり、リーク電流測定器を２台以上並べることにより、コンデンサの搬送を一度に測定する個数ごとに行えばよい。むしろ第１と第２の電流測定時間が異なる場合は、２台でそれぞれ連続測定を行う方がスループットが向上する。
【００２０】
【発明の効果】
本発明によれば、２種類の電流測定を連続して測定し、その間に間欠時間がないため、いずれかの工程の故障などによりコンデンサの搬送ラインがストップしても、２種類の測定の間の時間がバラツクことがない。その結果、ラインに故障などが発生してコンデンサの搬送が中断した場合でも、リーク電流の測定値にバラツキの要因がなく、再検査の必要がないと共に、常に正確な測定をすることができ、信頼性の高い検査をすることができる。
【図面の簡単な説明】
【図１】本発明のリーク電流の測定方法を説明するための模式図およびフローチャートである。
【図２】本発明の方法によるリーク電流測定時の印加電圧と電流との関係図である。
【図３】コンデンサのリーク電流を測定する等価回路図である。
【図４】従来のコンデンサのリーク電流の測定方法を説明する図である。
【図５】従来の方法によるリーク電流測定時の印加電圧と電流との関係図である。
【符号の説明】
１ コンデンサ
４ 放電器
５ リーク電流測定器[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a method for measuring a leakage current of a capacitor. More specifically, the present invention relates to a method for measuring a leakage current of a capacitor in which at least two kinds of voltages are applied and inspection is performed using currents after a certain period of time, thereby reducing a measurement error caused by a production line abnormality.
[0002]
[Prior art]
Conventionally, for example, a capacitor such as a tantalum capacitor has a current limiting resistor R connected in series, a constant voltage V is applied, and a current after a predetermined time is measured by an ammeter A as shown in FIG. As a result, the quality of the leakage current is inspected. In general, as shown in FIG. 3B, an equivalent circuit of a capacitor is connected in parallel with a resistor R ISO that causes a leakage current and a resistor R 0 and a capacitance C 0 as a dielectric absorption current in parallel with the capacitance C of the capacitor. A series equivalent resistance ESR and an inductance L are connected in series to the above. The inspection standard for leakage current in the case of a tantalum capacitor is the current after a certain time when a voltage V 1 lower than the rated voltage is applied and the time after a certain time when a voltage V 2 that is about twice the rated voltage is applied. Is determined by whether or not both currents are within a certain value.
[0003]
As shown in the schematic diagram of FIG. 4, for example, such a leak current measuring method is carried in such a manner that a large number of capacitors 1 connected in parallel to a lead frame or the like are transported frame by frame and sent before each measuring instrument. Several capacitors 1 are measured, and the measured number is intermittently conveyed in the direction of arrow A.
[0004]
In FIG. 4, the first leak current measuring device 2 (LC1 measurement) connects the probe 21 to four capacitors 1 in the example shown in the figure, and applies a low voltage V 1 to the four capacitors at a time. For example, it is allowed to stand for about 20 to 32 seconds, and then each current I 1 is measured. In the meantime, the measurement by the first leak current measuring device 2 (LC1 measurement) is already finished, and the second leak current measuring device 3 is transferred to the capacitor 1 conveyed before the second leak current measuring device 3 (LC2 measurement). The probe 31 is connected. Then, a high voltage V 2 is applied to the four capacitors 1 at a time, and left for, for example, about 20 to 32 seconds of the same time, and then the current I 2 of each capacitor is measured. After both the measurements by the first and second leak current measuring devices 2 and 3 are completed, the connected capacitors 1 are conveyed by the measured number.
[0005]
FIG. 5A shows the relationship between the voltage applied by the first and second leakage current measurements and the current at that time. In FIG. 5A, the time t 1 is the time measured by the first leak current measuring device 2, the voltage V 1 is applied, and the charging current that has flowed first initially decreases exponentially. The current I 1 at the elapse of t 1 is measured as the first leakage current value. Time t 0 is the time during the transportation from the end of the measurement by the first leak current measuring device 2 to the second leak current measuring device 3, during which the residual voltage of the first leak current measuring voltage V 1 is reached. V 0 is applied to the capacitor. The next time t 2 is a measurement time by the second leak current measuring device 3, and the voltage V 2 is applied. Also at this time, a large amount of charging current flows at the beginning of voltage application and decreases exponentially, and the current value I 2 at the elapse of time t 2 is measured as the second leakage current value. When the elapsed after the voltage of the time t 2 is 0, momentarily reverse current D flows.
[0006]
After the measurement of the second leakage current is completed, the capacitor 1 conveyed before the discharger 4 is discharged with a resistor connected between both electrodes of the capacitor 1. This series of operations is performed intermittently, for example, every four pieces. Further, the discharged capacitor 1 is further transported to the next process, and the defective product is cut and removed by the measurement result of the leakage current, and the non-defective product is sent to the next process as it is.
[0007]
[Problems to be solved by the invention]
In the method of measuring the leakage current at one of the stations while connecting the conventional capacitors and transporting each station in the capacitor manufacturing process, a manual stop or an abnormal alarm stop occurs at some point in the manufacturing line. There is a problem that the leakage current value becomes a small value at the time of abnormality in the measurement by the second leakage current measuring device 3 when the conveyance of the current is interrupted.
[0008]
The present inventor has intensively studied the cause of a decrease in the leakage current measured by the second leakage current measuring device when the frame transportation is interrupted, and found that the following causes are found. . That is, in the conventional leak current measurement, as described above, the first leak current measurement and the second leak current measurement are performed by different measuring devices and at different stations. Therefore, the capacitor 1 in the middle of conveyance exists between the first and second leak current measuring devices 2 and 3 and the residual voltage V 0 is applied for the time t 0 . If there is no trouble in the production line and it is always transported at a fixed number, the time between the first leak current measurement and the second leak current measurement is constant, and there is no problem if the measurement conditions are the same. When a failure such as a trouble of defective product occurs in the production line, the time t f (see FIG. 5B) becomes abnormally long. When the time until the measurement of the second leakage current becomes longer, the dielectric absorption of the capacitor proceeds more due to the residual voltage V 0 , and as shown in FIG. 5B, the measured value of the second leakage current becomes lower. (The current change when the broken line is normal). As a result, it has been found that the measured value is far from the measured value of the first leakage current, and the accuracy (reliability) of the measuring instrument is reduced.
[0009]
On the other hand, it may be possible to eliminate the residual voltage of the measurement voltage V 1 by discharging after the measurement of the first leakage current, but it is impossible to completely discharge the discharge for several tens of seconds, and the voltage is applied once. Returning the capacitor to the state before voltage application requires a long discharge time and is not practical.
[0010]
The present invention has been made to solve such a problem, and even when the production line is stopped due to some abnormality, the method for measuring the leakage current of the capacitor with high reliability does not affect the measurement of the leakage current of the capacitor. The purpose is to provide.
[0011]
[Means for Solving the Problems]
The method for measuring the leakage current of a capacitor according to the present invention is a method for measuring the leakage current of a capacitor in which two kinds of voltages are applied to the capacitor and each current value after a predetermined time is inspected to be within a predetermined range. A plurality of capacitors are connected in parallel to a long frame, and the frame is transported so as to pass through each capacitor manufacturing process station. The first leakage current is measured by applying the first voltage, and then the second leakage current is measured by continuously applying the second voltage, and then the frame is moved, The residual voltage is discharged for some capacitors for which the leakage current has been measured at the second station, and the first and the other capacitors are discharged for the first and second capacitors. Continuously measuring the second leakage current is characterized in that performed by the first station.
[0012]
According to another aspect of the method for measuring a leakage current of a capacitor according to the present invention, two types of voltages are applied to the capacitor and each of the current values after a predetermined time is inspected to determine whether or not they are within a predetermined range. a measurement method, a plurality of capacitor coupled in parallel to the frame of a long, conveying the frame to pass through the stations of the manufacturing process of the capacitor, the plurality in the first station For a part of the capacitor, the first leakage current is measured by applying the first voltage, the second leakage current is continuously measured by applying the second voltage continuously, and the residual voltage continues. Discharge the voltage, then move the frame, and perform another process for some of the capacitors measured for the leakage current at the second station. For some of the capacitors are continuously measured and discharging operations of the first and second leakage current and performing at the first station.
[0013]
DETAILED DESCRIPTION OF THE INVENTION
Next, a method for measuring the leakage current of the capacitor of the present invention will be described with reference to the drawings.
[0014]
FIG. 1A is a schematic diagram for explaining a method for measuring a leakage current according to the present invention, and FIGS. 1B and 1C are flowcharts thereof. The capacitor 1 is connected in parallel to a long copper frame or the like as in the prior art, and the number of probe terminals of the leak current measuring device 5 while being sequentially conveyed (three in FIG. 1, different from FIG. 4, but limited to the number). The leakage current of that number of capacitors is measured at once. In the present invention, the leak current measuring device 5 is switched to two kinds of measurement voltages by the controller 6. First, one voltage, for example, a low voltage V 1 is applied and a current after a predetermined time has elapsed. After measuring the value, the voltage of the leak current measuring device 5 is immediately switched by the controller 6 to the high voltage V 2 , and the current value after the elapse of a predetermined time is measured.
[0015]
That is, according to the present invention, since the measurement of the two kinds of voltages is always performed continuously when the measurement of the leakage current is started, the first leakage current is measured and then left for a long time, and then the second leakage current is measured. This does not happen. If a failure that interrupts the line occurs somewhere in the production line, the measurement is performed until the measurement of the leakage current is completed, and then the interruption occurs. This is because the transport of the connected capacitors is originally stopped during the leakage current measurement time, and is intermittently transported every time work of each process such as measurement of the leakage current is completed.
[0016]
After the measurement of the two kinds of leakage currents is completed, the connected capacitors 1 are transported to the next process by the number of capacitors, and the capacitors 1 sent to the discharger 4 are connected to the discharger 4 and discharged. The Thereafter, the defective product is sent to the defective ejector 7 and only the defective product is cut off from the connected portion according to the instruction from the controller 6 based on the measurement result of the current measuring device 5 in the previous process (NG). While connected, it is further sent to the next process (GO). FIG. 1B is a flowchart showing this series of steps.
[0017]
In the above-described method, after measuring the leakage current, a series of capacitors are conveyed by the number of measurement, and discharged by the discharger 4 provided in a different station. By doing so, the measurement of the leakage current and the discharge can be performed in parallel at the same time, which is convenient for improving the rotation speed of the equipment. However, the voltage of the leak current measuring device 5 can be further switched to 0V, and the voltage applied to the capacitor 1 is switched to 0V after the two types of current measurement are finished, and then discharged at the same station. Good. FIG. 1C is a flowchart showing the process at this time. In this way, it is not necessary to provide a separate discharger. As will be described later, the rotation of the production line is accelerated by increasing the number of measurements at one time by increasing the number of probe terminals of the current measuring device or by providing a plurality of leak current measuring devices.
[0018]
FIG. 2 shows the relationship between the applied voltage and current when the leakage current is measured by continuously applying two kinds of voltages by the method of the present invention. In FIG. 2, when a voltage of V 1 is first applied to the capacitor, a charging current flows and the current value I decreases exponentially. For example between the voltage V 1 of the 20 seconds to time t 1 is applied to measure the current value I 1 of the elapse of time t 1. Thereafter, the voltage applied to the capacitor is immediately switched to V 2 and left for a time t 2 of, for example, about 32 seconds. When this voltage increases, the charging current suddenly increases again, and then the current decreases exponentially. The current I 2 at the time when the time t 2 has elapsed is measured, and whether or not both the currents I 1 and I 2 are within the specified values is determined by the controller 6 (see FIG. 1). In FIG. 2, D indicates a current flowing in the reverse direction at the moment when the voltage is set to zero.
[0019]
According to the present invention, since the measurement of two kinds of leakage currents is continuously performed with one measuring instrument, it takes a lot of time for the current measurement process, and when it cannot be balanced with the time required for other discharges, Equipment utilization rate decreases. However, in such a case, the number of probe terminals of the leak current measuring device may be increased, or two or more leak current measuring devices may be arranged to carry the capacitors for each number to be measured at a time. Rather, when the first and second current measurement times are different, throughput is improved by performing continuous measurement with two units.
[0020]
【The invention's effect】
According to the present invention, since two types of current measurement are continuously performed and there is no intermittent time between them, even if the capacitor transport line is stopped due to a failure of one of the processes, the two types of measurement are not performed. The time will not vary. As a result, even if the line breaks down and the conveyance of the capacitor is interrupted, there is no cause for variation in the measured value of the leakage current, and there is no need for re-inspection. Highly reliable inspection can be performed.
[Brief description of the drawings]
FIG. 1 is a schematic diagram and a flowchart for explaining a method for measuring a leakage current according to the present invention.
FIG. 2 is a relationship diagram between applied voltage and current when measuring leakage current by the method of the present invention.
FIG. 3 is an equivalent circuit diagram for measuring the leakage current of the capacitor.
FIG. 4 is a diagram illustrating a conventional method for measuring the leakage current of a capacitor.
FIG. 5 is a relationship diagram between applied voltage and current when measuring leakage current by a conventional method.
[Explanation of symbols]
1 Capacitor 4 Discharger 5 Leakage current measuring device

Claims (2)

コンデンサに２種類の電圧を印加してそれぞれの一定時間後の電流値が所定範囲に入っているか否かを検査するコンデンサのリーク電流の測定方法であって、複数個のコンデンサを長尺のフレームに並列に連結して、該フレームをコンデンサの各製造工程のステーションを通過するように搬送し、第１のステーションで前記複数個のコンデンサの一部について、第１の電圧を印加することにより第１のリーク電流を測定し、引き続き連続して第２の電圧を印加することにより第２のリーク電流を測定し、その後前記フレームを移動して、第２のステーションで前記リーク電流の測定をした一部のコンデンサについて残留電圧を放電すると共に、他の一部のコンデンサについて前記第１および第２のリーク電流の測定を連続して前記第１のステーションで行うことを特徴とするコンデンサのリーク電流の測定方法。Current value after each predetermined time by applying the two voltages to the capacitor is a method of measuring the leakage current of the capacitor to check whether or not within the predetermined range, a plurality of capacitors elongated frame Connected in parallel, the frame is transported so as to pass through the stations of the capacitor manufacturing processes, and a first voltage is applied to a part of the plurality of capacitors at the first station. 1 leakage current was measured, and then the second leakage current was measured by continuously applying the second voltage, and then the frame was moved to measure the leakage current at the second station. together to discharge the residual voltage of some of the capacitor, the first stearyl continuously measure the first and second leakage current for the other part of the capacitor Method of measuring the leakage current of the capacitor, which comprises carrying out in Deployment. コンデンサに２種類の電圧を印加してそれぞれの一定時間後の電流値が所定範囲に入っているか否かを検査するコンデンサのリーク電流の測定方法であって、複数個のコンデンサを長尺のフレームに並列に連結して、該フレームをコンデンサの各製造工程のステーションを通過するように搬送し、第１のステーションで前記複数個のコンデンサの一部について、第１の電圧を印加することにより第１のリーク電流を測定し、引き続き連続して第２の電圧を印加することにより第２のリーク電流を測定し、さらに引き続き残留電圧を放電し、その後前記フレームを移動して、第２のステーションで前記リーク電流の測定をした一部のコンデンサについて別の工程を行うと共に、他の一部のコンデンサについて前記第１および第２のリーク電流の測定および放電作業を連続して前記第１のステーションで行うことを特徴とするコンデンサのリーク電流の測定方法。 Current value after each predetermined time by applying the two voltages to the capacitor is a method of measuring the leakage current of the capacitor to check whether or not within the predetermined range, a plurality of capacitors long coupled in parallel to the frame, conveying the frame to pass through the stations of the manufacturing process of the capacitor, the portion of the plurality of capacitors in the first station, by applying a first voltage The first leakage current is measured, the second leakage current is continuously measured by continuously applying the second voltage, the residual voltage is further discharged, and then the frame is moved, A separate process is performed for some of the capacitors for which the leakage current is measured at the station, and the first and second leakage currents of the other capacitors are measured. Method of measuring the leakage current of the capacitor, wherein the constant and discharging work continuously carried out in the first station.
JP4985696A 1996-03-07 1996-03-07 Capacitor leakage current measurement method Expired - Fee Related JP3663251B2 (en)

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KR20040072285A (en) * 2003-02-10 2004-08-18 삼성전자주식회사 Apparatus for testing flexible printed circuit board
US7940058B2 (en) * 2007-05-24 2011-05-10 Electro Scientific Industries, Inc. Capacitive measurements with fast recovery current return
US8054085B2 (en) 2008-03-31 2011-11-08 Electro Scientific Industries, Inc. Programmable gain trans-impedance amplifier overload recovery circuit
CN108802554B (en) * 2018-06-13 2021-05-11 中车株洲电力机车有限公司 Capacitor leakage abnormity detection method and system and computer equipment
CN110676189B (en) * 2019-09-26 2021-09-14 大连理工大学 Test analysis method for determining failure position of GaN cascode device
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