JP3117682B2 - Contactless semiconductor card - Google Patents

Contactless semiconductor card

Info

Publication number
JP3117682B2
JP3117682B2 JP11065048A JP6504899A JP3117682B2 JP 3117682 B2 JP3117682 B2 JP 3117682B2 JP 11065048 A JP11065048 A JP 11065048A JP 6504899 A JP6504899 A JP 6504899A JP 3117682 B2 JP3117682 B2 JP 3117682B2
Authority
JP
Japan
Prior art keywords
substrate
card
resin layer
resin
molded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP11065048A
Other languages
Japanese (ja)
Other versions
JPH11316816A (en
Inventor
洋介 片山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Maxell Energy Ltd
Original Assignee
Hitachi Maxell Energy Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Maxell Energy Ltd filed Critical Hitachi Maxell Energy Ltd
Priority to JP11065048A priority Critical patent/JP3117682B2/en
Publication of JPH11316816A publication Critical patent/JPH11316816A/en
Application granted granted Critical
Publication of JP3117682B2 publication Critical patent/JP3117682B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、基板とそれに搭載
された電子部品をカード基体内に埋設してなる非接触型
半導体カードに係り、特にその基板と電子部品の封止構
造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-contact type semiconductor card in which a substrate and an electronic component mounted on the substrate are embedded in a card base, and more particularly to a structure for sealing the substrate and the electronic component.

【0002】[0002]

【従来の技術】近年、メモリICやCPU、それにデー
タ入出力用のコイルなど、所定の電子部品が搭載された
プリント基板などの基板を樹脂製のカード基体内に完全
に埋設し、リーダ/ライタに備えられたデータ入出力用
コイルと前記基板に搭載された前記コイルとの間でデー
タの授受を行なう非接触型の半導体カードが提案されて
いる。
2. Description of the Related Art In recent years, a substrate such as a printed circuit board on which predetermined electronic components such as a memory IC, a CPU, and a data input / output coil are mounted is completely embedded in a resin card base, and a reader / writer is provided. A non-contact type semiconductor card has been proposed in which data is exchanged between a data input / output coil provided in the device and the coil mounted on the substrate.

【0003】この半導体カードは、カードの表面に外部
端子を露出し、リーダ/ライタに備えられた接続端子を
前記外部端子に接触することによってデータの授受を行
う接触型の半導体カードに比べて、外部端子が汚損した
り摩耗するということがなく、耐久性に優れ、かつ信頼
性の高いデータ通信ができるという特長を有する。
[0003] This semiconductor card is different from a contact type semiconductor card in which external terminals are exposed on the surface of the card and data is transferred by contacting a connection terminal provided in a reader / writer with the external terminal. The external terminals do not become dirty or worn, and are characterized by excellent durability and high-reliability data communication.

【0004】従来、この種の非接触型半導体カードにお
いて、特開平2−204096号公報に記載されている
ような製造方法が提案されている。この製造方法は、回
路基板の電子部品が搭載されていない個所に貫通孔を形
成し、この回路基板を第1の金型に装着して回路基板の
電子部品が搭載されていない個所に電子部品とほぼ同じ
高さを有する枠体を形成するとともに、前記貫通孔を通
して樹脂の一部を回路基板の裏面から突出させて突起を
形成する。
Conventionally, a manufacturing method of this kind of non-contact type semiconductor card has been proposed as described in Japanese Patent Application Laid-Open No. Hei 2-204096. According to this manufacturing method, a through hole is formed in a portion of the circuit board where no electronic component is mounted, and the circuit board is mounted in a first mold, and the electronic component is mounted in a portion of the circuit board where the electronic component is not mounted. And a protrusion is formed by projecting a part of the resin from the back surface of the circuit board through the through hole.

【0005】この枠体付きの回路基板を別の第2の金型
に入れて、周囲の全体を封止樹脂層で封止する。このと
き回路基板の裏側に突起が設けられているから、金型底
面と回路基板の間に隙間が形成され、回路基板の裏側に
も樹脂を回り込ませることができ、回路基板を封止樹脂
層内に完全に埋設するようになっている。
[0005] The circuit board with the frame is placed in another second mold, and the entire periphery is sealed with a sealing resin layer. At this time, since the projection is provided on the back side of the circuit board, a gap is formed between the bottom surface of the mold and the circuit board, so that the resin can also flow around the back side of the circuit board, and the circuit board is sealed with a sealing resin layer. It is designed to be completely buried inside.

【0006】[0006]

【発明が解決しようとする課題】しかしこの半導体カー
ドは、封止樹脂層内において回路基板の位置が裏側に偏
って埋設されており、従って回路基板の上側に形成され
た上側封止樹脂層の樹脂量と下側に形成された下側封止
樹脂層の樹脂量に差があり、量的にアンバランスであ
る。
However, in this semiconductor card, the position of the circuit board is buried in the sealing resin layer so as to be deviated to the rear side, and therefore, the upper sealing resin layer formed on the circuit board has an upper side. There is a difference between the amount of resin and the amount of resin of the lower sealing resin layer formed on the lower side, which is quantitatively unbalanced.

【0007】このように上側封止樹脂層と下側封止樹脂
層の充填樹脂量に差があると、基板の上側と下側では樹
脂の硬化収縮の度合いが異なり、その結果、封止樹脂層
に反りなどの変形を生じ、内部の基板ならびにそれに搭
載されている電子部品に機械的に悪影響を及ぼし、動作
信頼性に問題がある。
[0007] When there is a difference in the amount of resin filled between the upper sealing resin layer and the lower sealing resin layer, the degree of curing shrinkage of the resin is different between the upper and lower sides of the substrate. Deformation such as warpage occurs in the layer, which mechanically adversely affects the internal substrate and the electronic components mounted thereon, resulting in a problem in operation reliability.

【0008】また、半導体カード全体が反ると商品価値
が低下するばかりでなく、反りの状態によってリーダ/
ライタ側の入出力用コイルと半導体カード側の入出力用
コイルとの対向状態(カップリング状態)が不揃いにな
り、そのために通信特性がばらつく。さらに半導体カー
ド全体が反るとリーダ/ライタでの半導体カードの出し
入れがスムーズでなくなり、出し入れに伴って半導体カ
ードが部分的に磨耗するなどの欠点を有している。
When the entire semiconductor card warps, not only does the commercial value decrease, but also the leader /
The opposing state (coupling state) between the input / output coil on the writer side and the input / output coil on the semiconductor card side is not uniform, so that communication characteristics vary. Further, when the entire semiconductor card is warped, there is a drawback that the semiconductor card cannot be smoothly taken in and out of the reader / writer, and the semiconductor card is partially worn as the card is taken in and out.

【0009】本発明は、この従来技術の欠点を解消し、
動作信頼性が高く、商品価値の低下がなく、製品毎の通
信特性が安定しており、しかも取扱性の良好な非接触型
半導体カードを提供することを目的とする。
The present invention overcomes this disadvantage of the prior art,
It is an object of the present invention to provide a non-contact type semiconductor card which has high operation reliability, does not decrease the commercial value, has stable communication characteristics for each product, and has good handleability.

【0010】[0010]

【課題を解決するための手段】前記目的を達成するた
、本発明は、基板およびその基板に搭載されたデータ
入出力コイルならびに半導体チップを含む電子部品を樹
脂製のカード基体内に埋設してなる非接触型半導体カー
ドにおいて、前記基板がカード基体の厚さ方向のほぼ中
央位置に埋設され、そのカード基体が少なくとも第1の
成形部と第2の成形部を有し、その第2の成形部が半導
体カードの厚さを規定するための成形部であり、その第
2の成形部の外周に形成される前記第1の成形部が、基
板の上側に形成された上側樹脂層と、基板の下側に形成
された下側樹脂層を有し、その上側樹脂層の樹脂量と下
側樹脂層の樹脂量がほぼ等しいことを特徴とするもので
ある。
In order to achieve the above object , the present invention provides an electronic component including a substrate, a data input / output coil mounted on the substrate and a semiconductor chip embedded in a resin card base. In the non-contact type semiconductor card, the substrate is embedded at a substantially central position in the thickness direction of the card base, and the card base is at least the first base.
It has a molding part and a second molding part, and the second molding part is semiconductive.
A molded part for defining the thickness of the body card.
The first molded part formed on the outer periphery of the molded part 2 is
Upper resin layer formed on the upper side of the board and formed on the lower side of the board
With a lower resin layer, and the amount of resin in the upper resin layer
The resin amount of the side resin layers is substantially equal .

【0011】[0011]

【0012】[0012]

【発明の実施の形態】前述のように本発明は、基板がカ
ード基体の厚さ方向のほぼ中央位置に埋設されており、
そのカード基体が少なくとも第1の成形部と第2の成形
部を有し、そのうちの第2の成形部が半導体カードの厚
さを規定するための成形部であって、その第2の成形部
の外周に形成される前記第1の成形部が、基板の上側に
形成された上側樹脂層と、基板の下側に形成された下側
樹脂層を有し、その上側樹脂層の樹脂量と下側樹脂層の
樹脂量がほぼ等しい。そのため上側樹脂層と下側樹脂層
の樹脂の硬化収縮に起因する内部応力が基板の表裏両面
でほぼ均等になり、従ってカード基体に生じる反り等の
変形を小さくすることができる。またカード基体の反り
による基板ならびに電子部品への機械的影響を最小限に
止めることもできる。このようなことから、基板ならび
にそれに搭載されている電子部品への機械的な悪影響が
少なくなり、従って動作信頼性の向上が図れる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS As described above, according to the present invention, a substrate is buried at a substantially central position in a thickness direction of a card base .
The card base has at least a first molded portion and a second molded portion.
Parts, of which the second molding part is the thickness of the semiconductor card.
Forming part for defining the second forming part
The first molded portion formed on the outer periphery of the
The formed upper resin layer and the lower formed below the substrate
It has a resin layer, the amount of resin in the upper resin layer and the lower resin layer.
Resin amount is almost equal. Therefore, the internal stress caused by the curing shrinkage of the resin of the upper resin layer and the lower resin layer becomes substantially equal on both the front and back surfaces of the substrate, and therefore, deformation such as warpage generated in the card base can be reduced. Further, the mechanical influence on the substrate and the electronic components due to the warpage of the card base can be minimized. As a result, mechanical adverse effects on the substrate and the electronic components mounted thereon are reduced, and the operation reliability can be improved.

【0013】また半導体カード全体に反りなどの変形を
生じることがなくなり、そのため商品価値の低下が防止
でき、製品毎の通信特性が安定しており、しかもリーダ
/ライタでの半導体カードの出し入れがスムーズで、半
導体カードが部分的に磨耗することがなく、取扱性が良
好となる。
[0013] Further, deformation such as warpage does not occur in the entire semiconductor card, so that a reduction in commercial value can be prevented, the communication characteristics of each product are stable, and the semiconductor card can be smoothly taken in and out of a reader / writer. Thus, the semiconductor card is not partially worn, and the handling is improved.

【0014】[0014]

【0015】[0015]

【0016】以下、本発明の実施形態を図とともに説明
する。図1は本発明に係る半導体カードの断面図、図2
はその半導体カードの平面図、図3はその半導体カード
の製造工程を説明するための断面図である。
An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a sectional view of a semiconductor card according to the present invention, and FIG.
Is a plan view of the semiconductor card, and FIG. 3 is a cross-sectional view for explaining a manufacturing process of the semiconductor card.

【0017】半導体カードは、図2に示すように例えば
メモリIC1aやCPU1b、それにデータ入出力用の
コイル1cなどの電子部品1が搭載されたプリント基板
などの基板2が、カード基体3内に完全に埋設され、そ
のカード基体3の表裏両面にラミネートフイルム5,5
を貼着している。
As shown in FIG. 2, a semiconductor card includes a substrate 2 such as a printed circuit board on which electronic components 1 such as a memory IC 1a and a CPU 1b and a data input / output coil 1c are mounted. And laminated film 5 on both sides of the card base 3
Is affixed.

【0018】カード基体3は図1及び図2に示すよう
に、それの外周部分を構成し、その厚さ方向のほぼ中央
位置に電子部品1と基板2を保持する第1の成形部3a
と、基板2の電池4を封入するケース状の第2の成形部
3bとからなる。図1に示すように第1の成形部3aと
第2の成形部3bの表面(表裏両面)はほぼ同一平面状
になっており、両者の接合部を隠すようにカード基体3
の表裏両面にラミネートフイルム5,5が貼着されてい
る。またこの接合部は、カード基体3の外周部に達して
おらずカード基体3の内側部分に存在する。
As shown in FIGS. 1 and 2, the card base 3 constitutes an outer peripheral portion thereof, and has a first molded portion 3a for holding the electronic component 1 and the substrate 2 at a substantially central position in the thickness direction.
And a case-shaped second molded portion 3b for enclosing the battery 4 of the substrate 2. As shown in FIG. 1, the surfaces (both front and back) of the first molded portion 3a and the second molded portion 3b are substantially flush with each other.
Laminated films 5 and 5 are stuck on both front and back sides. Further, the joining portion does not reach the outer peripheral portion of the card base 3 but exists in the inner portion of the card base 3.

【0019】第1の成形部3aと第2の成形部3bは、
同種または異種の樹脂材料によって成形される。カード
基体3(第1の成形部3a及び第2の成形部3b)は、
任意の樹脂材料でもって成形することができるが、電子
部品保護のため、なるべく溶融温度が低くかつ硬化収縮
率が小さい樹脂材料が好ましい。かかる好ましい樹脂材
料としては、不飽和ポリエステルを挙げることができ
る。
The first forming part 3a and the second forming part 3b
Molded with the same or different resin materials. The card base 3 (the first molded part 3a and the second molded part 3b)
Although any resin material can be used for molding, a resin material having a low melting temperature and a small cure shrinkage is preferable for protecting electronic components. Such preferred resin materials include unsaturated polyesters.

【0020】基板2の電子部品1が搭載されていない位
置に、1個ないし複数個の樹脂層連結用のスルーホール
6が開設されている。第1の成形部3aの成形時に、こ
の第1の成形部3aを構成する樹脂の一部がスルーホー
ル6内に充填されるとともに、そのスルーホール6内の
充填樹脂により基板2の上側に形成される上側樹脂層3
a−1と、基板2の下側に形成される下側樹脂層3a−
2が相互に連結される(図3参照)。また、第1の成形
部3aを構成する樹脂の一部は図1、図2に示すように
基板2の外周全体に回り込み、その外周側樹脂層3a−
3により上側樹脂層3a−1と下側樹脂層3a−2も相
互に連結される。
One or more through-holes 6 for connecting resin layers are formed on the substrate 2 at positions where the electronic components 1 are not mounted. At the time of molding the first molded portion 3a, a part of the resin constituting the first molded portion 3a is filled in the through hole 6, and is formed on the upper side of the substrate 2 by the filled resin in the through hole 6. Upper resin layer 3
a-1 and a lower resin layer 3a- formed below the substrate 2.
2 are interconnected (see FIG. 3). A part of the resin forming the first molded portion 3a goes around the entire outer periphery of the substrate 2 as shown in FIGS.
3, the upper resin layer 3a-1 and the lower resin layer 3a-2 are also connected to each other.

【0021】以下、この実施形態に係る半導体カードの
製造方法について説明する。図3に示すように金型11
は、上金型11aと下金型11bとからなり、両金型1
1a,11bの対向面に、カード基体3の外形と同形の
キャビティ13と、そのキャビティ13に連通する樹脂
注入部14とが形成されている。
Hereinafter, a method for manufacturing a semiconductor card according to this embodiment will be described. As shown in FIG.
Consists of an upper mold 11a and a lower mold 11b.
A cavity 13 having the same shape as the outer shape of the card base 3 and a resin injection portion 14 communicating with the cavity 13 are formed on the opposing surfaces of 1a and 11b.

【0022】この金型11に装着される前に、第2の成
形部3bは図示しない別の金型により成形されている。
第1の成形部3aの成形に際しては、上金型11aと下
金型11bとを開き、基板2に搭載された電池4をカバ
ーするように基板2の電池搭載部をケース状の第2の成
形部3bで上下から挟み込んだ状態で、基板2と第2の
成形部3bを下金型11b内に設置して、上金型11a
を閉じ、基板2を介して上下の第2の成形部3bを上金
型11aと下金型11bで挟む。
Before being mounted on the mold 11, the second molding portion 3b is molded by another mold (not shown).
At the time of forming the first forming portion 3a, the upper mold 11a and the lower mold 11b are opened, and the battery mounting portion of the substrate 2 is covered with the second case-shaped second cover so as to cover the battery 4 mounted on the substrate 2. The substrate 2 and the second molding part 3b are placed in the lower mold 11b while being sandwiched between the molding parts 3b from above and below.
Is closed, and the upper and lower second molding portions 3b are sandwiched between the upper mold 11a and the lower mold 11b via the substrate 2.

【0023】このとき第2の成形部3bの凹部15と金
型11の凸部16が係合し、キャビティ13内における
基板2の面内方向(カードの厚さ方向と直交する平面方
向)の位置決めがなされる。また、電子部品1ならびに
基板2は上下の第2の成形部3bで挟まれた状態で、キ
ャビティ13の上下方向のほぼ中央位置に固定される。
At this time, the concave portion 15 of the second molded portion 3b engages with the convex portion 16 of the mold 11, and the substrate 2 in the cavity 13 in the in-plane direction (the plane direction orthogonal to the card thickness direction). Positioning is performed. Further, the electronic component 1 and the substrate 2 are fixed at a substantially central position in the vertical direction of the cavity 13 while being sandwiched between the upper and lower second molded portions 3b.

【0024】この状態で樹脂注入口4から樹脂が注入さ
れ、図3に示すように第1の成形部3aが形成される。
上金型11aと下金型11bがそれぞれ上下の第2の成
形部3bに当接した状態で金型11が閉じられてキャビ
ティ13が形成され、そこに樹脂を注入して第1の成形
部3aが形成されるから、結局、上下の第2の成形部3
bによって第1の成形部3aの厚さ、すなわちカード基
体3の厚さが規定されることになる。
In this state, the resin is injected from the resin injection port 4, and the first molded portion 3a is formed as shown in FIG.
When the upper mold 11a and the lower mold 11b are in contact with the upper and lower second molding portions 3b, respectively, the mold 11 is closed to form the cavity 13, and the resin is injected into the cavity 13 to form the first molding portion. 3a are formed, so that the upper and lower second molded portions 3
The thickness of the first molded portion 3a, that is, the thickness of the card base 3 is defined by b.

【0025】このようにして形成された第1の成形部3
aの上下表面は、図1に示すように第2の成形部3bの
上下表面とほぼ同一平面状になる。第1の成形部3aと
第2の成形部3bによって構成されたカード基体3の上
下両面にラミネートフィルム5,5が貼着され、第1の
成形部3aと第2の成形部3bの接合部がラミネートフ
ィルム5によって覆われる。
The first formed part 3 thus formed
The upper and lower surfaces of “a” are substantially flush with the upper and lower surfaces of the second molded portion 3b as shown in FIG. Laminate films 5 and 5 are stuck on the upper and lower surfaces of the card base 3 composed of the first molded part 3a and the second molded part 3b, and the joint between the first molded part 3a and the second molded part 3b. Is covered with the laminate film 5.

【0026】図中の3cは第2の成形部3bの外周に設
けられた鍔部、12は上金型11aと上側の第2の成形
部3bとの間、ならびに下金型11bと下側の第2の成
形部3bとの間に設けられた空間部で、電池4に対する
金型温度の熱的影響を軽減するために設けられている。
In the figure, reference numeral 3c denotes a flange provided on the outer periphery of the second molding portion 3b, 12 denotes a portion between the upper mold 11a and the upper second molding portion 3b, and a portion between the lower mold 11b and the lower mold 11b. This space is provided between the second molding portion 3b and the second molding portion 3b in order to reduce the thermal effect of the mold temperature on the battery 4.

【0027】基板2にスルーホール6を設け、そのスル
ーホール6内に樹脂が充填されて基板2の表裏両面側に
成形された樹脂層3a−1、3a−2がスルーホール6
内に樹脂によって相互に連結されるので、基板2とカー
ド基体3を強固に一体化できる。
A through hole 6 is provided in the substrate 2, and resin is filled in the through hole 6, and the resin layers 3 a-1 and 3 a-2 formed on the front and back surfaces of the substrate 2 form the through hole 6.
Since they are connected to each other by a resin, the substrate 2 and the card base 3 can be firmly integrated.

【0028】[0028]

【発明の効果】発明は、基板がカード基体の厚さ方向
のほぼ中央位置に埋設されており、そのカード基体が少
なくとも第1の成形部と第2の成形部を有し、そのうち
の第2の成形部が半導体カードの厚さを規定するための
成形部であって、その第2の成形部の外周に形成される
前記第1の成形部が、基板の上側に形成された上側樹脂
層と、基板の下側に形成された下側樹脂層を有し、その
上側樹脂層の樹脂量と下側樹脂層の樹脂量がほぼ等し
い。そのため上側樹脂層と下側樹脂層の樹脂の硬化収縮
に起因する内部応力が基板の表裏両面でほぼ均等にな
り、従ってカード基体に生じる反り等の変形を小さくす
ることができる。またカード基体の反りによる基板なら
びに電子部品への機械的影響を最小限に止めることもで
きる。このようなことから、基板ならびにそれに搭載さ
れている電子部品への機械的な悪影響が少なくなり、従
って動作信頼性の向上が図れる。
According to the present invention, the substrate is buried at a substantially central position in the thickness direction of the card base, and the card base is small.
At least a first molded part and a second molded part, of which
A second molding part for defining the thickness of the semiconductor card
A molded part, formed on the outer periphery of the second molded part
An upper resin formed on an upper side of the substrate;
And a lower resin layer formed on the lower side of the substrate.
The amount of resin in the upper resin layer is almost equal to the amount of resin in the lower resin layer.
No. Therefore, the internal stress caused by the curing shrinkage of the resin in the upper resin layer and the lower resin layer is substantially equal on both the front and back surfaces of the substrate, and therefore, deformation such as warpage of the card base can be reduced. Further, the mechanical influence on the substrate and the electronic components due to the warpage of the card base can be minimized. As a result, mechanical adverse effects on the substrate and the electronic components mounted thereon are reduced, and the operation reliability can be improved.

【0029】また半導体カード全体に反りなどの変形を
生じることがなくなり、そのため商品価値の低下が防止
でき、製品毎の通信特性が安定しており、しかもリーダ
/ライタでの半導体カードの出し入れがスムーズで、半
導体カードが部分的に磨耗することがなく、取扱性が良
好となる。
Further, deformation such as warpage does not occur in the entire semiconductor card, so that a reduction in commercial value can be prevented, communication characteristics of each product are stable, and the semiconductor card can be smoothly taken in and out of a reader / writer. Thus, the semiconductor card is not partially worn, and the handling is improved.

【0030】[0030]

【0031】[0031]

【0032】[0032]

【0033】[0033]

【0034】[0034]

【0035】[0035]

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態に係る半導体カードの断面
図である。
FIG. 1 is a sectional view of a semiconductor card according to an embodiment of the present invention.

【図2】この半導体カードの平面図である。FIG. 2 is a plan view of the semiconductor card.

【図3】この半導体カードの製造工程を説明するための
断面図である。
FIG. 3 is a cross-sectional view for explaining a manufacturing process of the semiconductor card.

【符号の説明】[Explanation of symbols]

1 電子部品 1a メモリIC 1b CPU 1c データ入出力用のコイル 2 基板 3 カード基体 3a 第1の成形部 3a−1 上側樹脂層 3a−2 下側樹脂層 3a−3 外周側樹脂層 3b 第2の成形部 4 電池 5 ラミネートフィルム 6 スルーホール 11 金型 11a 上金型 11b 下金型 13 キャビテ 15 凹部 16 凸部 DESCRIPTION OF SYMBOLS 1 Electronic component 1a Memory IC 1b CPU 1c Data input / output coil 2 Substrate 3 Card base 3a First molded part 3a-1 Upper resin layer 3a-2 Lower resin layer 3a-3 Outer peripheral resin layer 3b Second Molding part 4 Battery 5 Laminate film 6 Through hole 11 Mold 11a Upper mold 11b Lower mold 13 Cavity 15 Concave part 16 Convex part

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 基板およびその基板に搭載されたデータ
入出力コイルならびに半導体チップを含む電子部品を樹
脂製のカード基体内に埋設してなる非接触型半導体カー
ドにおいて、 前記基板がカード基体の厚さ方向のほぼ中央位置に埋設
され、そのカード基体が少なくとも第1の成形部と第2の成形
部を有し、 その第2の成形部が半導体カードの厚さを規定するため
の成形部であり、 その第2の成形部の外周に形成される前記第1の成形部
が、基板の上側に形成された上側樹脂層と、基板の下側
に形成された下側樹脂層を有し、その上側樹脂層の樹脂
量と下側樹脂層の樹脂量がほぼ等しい ことを特徴とする
非接触型半導体カード。
1. A non-contact type semiconductor card comprising a substrate, a data input / output coil mounted on the substrate, and an electronic component including a semiconductor chip embedded in a resin card substrate, wherein the substrate has a thickness of the card substrate. The card base is buried at a substantially central position in the vertical direction, and at least the first molded part and the second molded part
Part having a second molded part for defining the thickness of the semiconductor card
A of the forming section, the first molding portion formed on the outer circumference of the second molding part
The upper resin layer formed on the upper side of the substrate and the lower side of the substrate
Having a lower resin layer formed on the upper resin layer
A non-contact type semiconductor card, wherein the amount is substantially equal to the amount of resin in the lower resin layer .
JP11065048A 1999-03-11 1999-03-11 Contactless semiconductor card Expired - Fee Related JP3117682B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11065048A JP3117682B2 (en) 1999-03-11 1999-03-11 Contactless semiconductor card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11065048A JP3117682B2 (en) 1999-03-11 1999-03-11 Contactless semiconductor card

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP02283479A Division JP3117455B2 (en) 1990-10-23 1990-10-23 Built-in battery integrated card

Publications (2)

Publication Number Publication Date
JPH11316816A JPH11316816A (en) 1999-11-16
JP3117682B2 true JP3117682B2 (en) 2000-12-18

Family

ID=13275698

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11065048A Expired - Fee Related JP3117682B2 (en) 1999-03-11 1999-03-11 Contactless semiconductor card

Country Status (1)

Country Link
JP (1) JP3117682B2 (en)

Also Published As

Publication number Publication date
JPH11316816A (en) 1999-11-16

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