JP3093865B2 - Cleaning water closed system in solder plating equipment for electronic components - Google Patents

Cleaning water closed system in solder plating equipment for electronic components

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Publication number
JP3093865B2
JP3093865B2 JP04100985A JP10098592A JP3093865B2 JP 3093865 B2 JP3093865 B2 JP 3093865B2 JP 04100985 A JP04100985 A JP 04100985A JP 10098592 A JP10098592 A JP 10098592A JP 3093865 B2 JP3093865 B2 JP 3093865B2
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JP
Japan
Prior art keywords
section
electronic component
water
liquid
closed system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP04100985A
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Japanese (ja)
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JPH05299554A (en
Inventor
弘 中島
Original Assignee
株式会社イデヤ
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Publication of JPH05299554A publication Critical patent/JPH05299554A/en
Application granted granted Critical
Publication of JP3093865B2 publication Critical patent/JP3093865B2/en
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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、電子部品の半田めっき
装置における洗浄水クローズドシステムに関し、特に、
たとえば、IC用リードフレームの半田めっきを施す際
の洗浄水のクローズド化を行う洗浄水クローズドシステ
ムに適用して有効な技術に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning water closed system in an electronic component solder plating apparatus,
For example, the present invention relates to a technique that is effective when applied to a cleaning water closed system that closes cleaning water when solder plating an IC lead frame.

【0002】[0002]

【従来の技術】この種の電子部品の半田めっき装置にお
ける洗浄水クローズドシステムとしては、たとえば、以
下に示すようなものがある。
2. Description of the Related Art As a closed system for washing water in a solder plating apparatus of this kind for electronic parts, there is, for example, the following one.

【0003】すなわち、この電子部品の半田めっき装置
における洗浄水クローズドシステムは、IC用リードフ
レームの半田めっき装置の場合に適用したもので、脱脂
部、水洗部、化学研磨部、水洗部、めっき部、水洗部、
中和部、湯洗部および乾燥部を備え、前記各水洗部から
の排水を水処理する水処理装置を設け、洗浄水のクロー
ズド化を行う構造となっている。
[0003] That is, the washing water closed system in the solder plating apparatus for electronic parts is applied to a solder plating apparatus for an IC lead frame. , Washing section,
It has a neutralization section, a hot water washing section, and a drying section, and a water treatment device for treating the wastewater from each of the water washing sections is provided, so that the washing water is closed.

【0004】[0004]

【発明が解決しようとする課題】しかし、前記した電子
部品の半田めっき装置における洗浄水クローズドシステ
ムでは、各水洗部に前工程における薬液やめっき液が多
量に持ち込まれる構造となっているので、洗浄水の汚染
が著しく、水処理が困難であるという問題があった。
However, the closed system for washing water in the above-mentioned solder plating apparatus for electronic parts has a structure in which a large amount of chemical solution or plating solution in the previous process is brought into each washing section. There was a problem that water contamination was remarkable and water treatment was difficult.

【0005】このため、洗浄水のクローズド化を実用レ
ベルで達成できず、排水レス化が困難であるという問題
があった。
[0005] For this reason, there has been a problem that it is not possible to achieve a closed level of the washing water at a practical level, and it is difficult to eliminate drainage.

【0006】本発明の目的は、洗浄部への薬液などの持
込み量を減少させ、洗浄排水の汚染度を減少させること
のできる電子部品の半田めっき装置における洗浄水クロ
ーズドシステムを提供することにある。
An object of the present invention is to provide a cleaning water closed system in an electronic component solder plating apparatus which can reduce the amount of a chemical solution or the like brought into a cleaning section and reduce the degree of contamination of cleaning drainage. .

【0007】本発明の他の目的は、洗浄水のクローズド
化を実用レベルで達成し、排水レス化を図ることのでき
る電子部品の半田めっき装置における洗浄水クローズド
システムを提供することにある。
Another object of the present invention is to provide a cleaning water closed system in an electronic component solder plating apparatus which can achieve the cleaning water closed at a practical level and can reduce drainage.

【0008】本発明の前記ならびにその他の目的と新規
な特徴は、本明細書の記述および添付図面から明らかに
なるであろう。
The above and other objects and novel features of the present invention will become apparent from the description of the present specification and the accompanying drawings.

【0009】[0009]

【課題を解決するための手段】本願において開示される
発明のうち、代表的なものの概要を簡単に説明すれば、
以下のとおりである。
SUMMARY OF THE INVENTION Among the inventions disclosed in the present application, the outline of a representative one will be briefly described.
It is as follows.

【0010】すなわち、本発明による電子部品の半田め
っき装置における洗浄水クローズドシステムは、前処理
を行う前処理部と、前処理された電子部品のめっきを行
うめっき部と、めっきされた電子部品に対して後処理を
行う後処理部とを備え、前記前処理部、めっき部および
後処理部に設けられる洗浄部の直前に電子部品に付着し
た液体を除去する液切り部を設けた構造としたものであ
る。
That is, the cleaning water closed system in the solder plating apparatus for electronic parts according to the present invention comprises a pre-processing part for performing pre-treatment, a plating part for plating the pre-treated electronic parts, and a plating part for the electronic parts. And a post-processing unit for performing post-processing on the pre-processing unit, a plating unit, and a cleaning unit provided in the post-processing unit. Things.

【0011】この場合、前記液切り部は、電子部品を保
持して高速回転させることにより電子部品に付着した液
体を除去する回転式液切り機構よりなる構造とすること
ができる。
[0011] In this case, the liquid draining section may have a structure including a rotary liquid draining mechanism that removes liquid adhering to the electronic component by holding and rotating the electronic component at high speed.

【0012】また、この場合、前記回転式液切り機構
は、電子部品に高速回転を与えるモータと、回転位置お
よび回転速度を検出するエンコーダとを備えた構造とす
ることができる。
Further, in this case, the rotary liquid draining mechanism may have a structure including a motor for rotating the electronic component at a high speed and an encoder for detecting a rotational position and a rotational speed.

【0013】[0013]

【作用】前記した本発明の電子部品の半田めっき装置に
おける洗浄水クローズドシステムによれば、前処理部、
めっき部および後処理部に設けられる洗浄部の直前に電
子部品に付着した液体を除去する液切り部を設けた構造
としたので、洗浄部への薬液などの持込み量を減少さ
せ、洗浄排水の汚染度を減少させることができる。
According to the washing water closed system in the electronic component solder plating apparatus of the present invention described above, the pre-processing unit,
The structure has a liquid drain section that removes liquid adhering to electronic components immediately before the cleaning section provided in the plating section and the post-processing section.This reduces the amount of chemicals brought into the cleaning section and reduces the amount of cleaning drainage. Pollution degree can be reduced.

【0014】したがって、洗浄水のクローズド化を実用
レベルで達成し、排水レス化を図ることができる。
Therefore, it is possible to achieve the closed level of the cleaning water at a practical level and to reduce drainage.

【0015】この場合、前記液切り部は、電子部品を保
持して高速回転させることにより電子部品に付着した液
体を除去する回転式液切り機構よりなる構造としたの
で、電子部品に付着した液体を遠心力により除去するこ
とができる。
In this case, the liquid draining section has a structure including a rotary liquid draining mechanism for holding the electronic component and rotating it at a high speed to remove the liquid attached to the electronic component. Can be removed by centrifugal force.

【0016】また、この場合、前記回転式液切り機構
は、電子部品に高速回転を与えるモータと、回転位置お
よび回転速度を検出するエンコーダとを備えた構造とし
たので、液切り時間や回転速度などの液切り条件を自由
に設定でき、位置決めを容易に行うことができる。
Also, in this case, the rotary liquid draining mechanism has a structure including a motor for rotating the electronic parts at a high speed and an encoder for detecting the rotational position and the rotational speed. And the like can be set freely, and positioning can be easily performed.

【0017】[0017]

【実施例】図1は本発明の一実施例である電子部品の半
田めっき装置における洗浄水クローズドシステムを示す
ブロック図、図2は図1の液切り部を示す断面図であ
る。
FIG. 1 is a block diagram showing a cleaning water closed system in an electronic component solder plating apparatus according to one embodiment of the present invention, and FIG. 2 is a cross-sectional view showing a liquid drainage section in FIG.

【0018】本実施例である電子部品の半田めっき装置
における洗浄水クローズドシステムは、IC用リードフ
レームWの半田めっき装置に適用し、洗浄水のクローズ
ド化を可能にした構造としたものである。
The closed cleaning water system in the solder plating apparatus for electronic components according to the present embodiment is applied to a solder plating apparatus for an IC lead frame W, and has a structure that enables closed cleaning water.

【0019】すなわち、この半田めっき装置は、最も左
側に脱脂液で脱脂を行う脱脂部1、脱脂液の除去を行う
液切り部2aが順次配置されている。
That is, in this solder plating apparatus, a degreasing section 1 for degreasing with a degreasing liquid and a liquid removing section 2a for removing the degreasing liquid are sequentially arranged on the leftmost side.

【0020】前記液切り部2aの次には、水洗を行う水
洗部3aが配置されている。この水洗部3aに続いて、
化学研磨液で化学研磨を行う化学研磨部4、化学研磨液
を除去する液切り部2bが順次設けられ、さらに、水洗
する水洗部3b、水洗水を除去する液切り部2cが配置
されている。
A washing section 3a for washing with water is disposed next to the drain section 2a. Following this washing section 3a,
A chemical polishing section 4 for performing chemical polishing with a chemical polishing liquid and a liquid removing section 2b for removing the chemical polishing liquid are sequentially provided. Further, a water washing section 3b for washing with water and a liquid removing section 2c for removing washing water are provided. .

【0021】この液切り部2cに続いて、めっき槽より
なるめっき部5が配置され、このめっき部5の次には、
めっき液を除去する液切り部2dが配置されている。
Following the draining section 2c, a plating section 5 composed of a plating tank is disposed.
A drainer 2d for removing the plating solution is provided.

【0022】前記液切り部2dに続いて、水洗を行う水
洗部3cが設けられ、この水洗部3cの次段には、中和
液により中和を行う中和部6、中和液の除去を行う液切
り部2eが順次配置されている。
A water washing section 3c for washing with water is provided following the liquid draining section 2d. In the next stage of the water washing section 3c, a neutralizing section 6 for neutralizing with a neutralizing solution, a removal of the neutralizing solution. Are sequentially arranged.

【0023】次に、前記液切り部2eに続いて、湯洗を
行う湯洗部3dが配置され、さらに、湯洗水の液切りを
行う液切り部2fが配置されている。最後に、液切りさ
れたIC用リードフレームWを乾燥させて水分を排除す
る乾燥部7が配置されている。
Next to the liquid draining section 2e, a hot water washing section 3d for performing hot water washing is disposed, and further, a liquid draining section 2f for performing hot water draining is disposed. Finally, a drying unit 7 for drying the drained IC lead frame W to remove moisture is provided.

【0024】めっき装置の外部に水処理装置11が設け
られ、この水処理装置11は水洗部3a〜3cからの排
水を水処理し、この水処理により生成された純水を水洗
部3a〜3cに循環供給する構造となっている。
A water treatment apparatus 11 is provided outside the plating apparatus. The water treatment apparatus 11 treats waste water from the water washing sections 3a to 3c with water, and purifies pure water generated by the water treatment with the water washing sections 3a to 3c. It is structured to circulate the water.

【0025】また、水処理装置11は湯洗部3dからの
排湯を熱交換部9および冷却部10を経て常温水で水処
理を行い、この水処理により生成された純水を前記熱交
換部9およびヒータ8を経由させて温純水として湯洗部
3dに循環供給する構造となっている。
Further, the water treatment device 11 performs a water treatment on the discharged hot water from the hot water washing section 3d through the heat exchange section 9 and the cooling section 10 with normal temperature water, and purifies the pure water generated by the water treatment with the heat exchange section. The hot water is circulated and supplied to the hot water washing section 3d as hot pure water via the section 9 and the heater 8.

【0026】前記液切り部2a〜2fは回転式液切り機
構18より構成され、この回転式液切り機構18は、I
C用リードフレームWを保持して高速回転させることに
よりIC用リードフレームWに付着した薬液などの液体
を除去するもので、IC用リードフレームWに高速回転
を与えるモータ15を備えている。
The liquid draining sections 2a to 2f are constituted by a rotary liquid draining mechanism 18, and the rotary liquid draining mechanism 18
A liquid, such as a chemical solution, attached to the IC lead frame W is removed by holding and rotating the C lead frame W at a high speed. A motor 15 for rotating the IC lead frame W at a high speed is provided.

【0027】このモータ15にエンコーダ14が設けら
れ、このエンコーダ14は回転位置および回転速度を検
出するもので、この検出した回転位置および回転速度に
基づき液切り時間や回転速度などの液切り条件を設定
し、位置決めを行う構造となっている。
The motor 15 is provided with an encoder 14. The encoder 14 detects a rotation position and a rotation speed. Based on the detected rotation position and the rotation speed, a drainage condition such as a drainage time and a rotation speed is determined. It has a structure for setting and positioning.

【0028】また、前記モータ軸13に回転軸12が直
結されて液切り室17内に延在し、この液切り室17内
の回転軸12にホルダ16が設けられ、このホルダ16
はIC用リードフレームWを保持する構造となってい
る。
The rotary shaft 12 is directly connected to the motor shaft 13 and extends into the liquid draining chamber 17. A holder 16 is provided on the rotary shaft 12 in the liquid draining chamber 17.
Has a structure for holding an IC lead frame W.

【0029】次に、本実施例の作用について説明する。Next, the operation of this embodiment will be described.

【0030】水洗あるいは湯洗に先立ってモータ15に
よりIC用リードフレームWに高速回転を与えると、I
C用リードフレームWに付着していた薬液などの液体は
遠心力により周囲に吹き飛ばされて液切りが行われる。
When high speed rotation is applied to the IC lead frame W by the motor 15 prior to washing with water or hot water,
A liquid such as a chemical solution attached to the lead frame W for C is blown off to the surroundings by centrifugal force to be drained.

【0031】このように、水洗部3a〜3cあるいは湯
洗部3dの直前に液切り部2a〜2eを設けた構造とし
たので、水洗部3a〜3cおよび湯洗部3dへの薬液な
どの持込み量を減少させ、洗浄排水の汚染度を減少させ
ることができる。
As described above, since the liquid draining sections 2a to 2e are provided immediately before the water washing sections 3a to 3c or the hot water washing section 3d, chemicals and the like are brought into the water washing sections 3a to 3c and the hot water washing section 3d. The amount can be reduced, and the pollution degree of the washing wastewater can be reduced.

【0032】したがって、洗浄水のクローズド化を実用
レベルで達成し、排水レス化を図ることができる。
Therefore, it is possible to achieve a closed level of the washing water at a practical level, and to reduce drainage.

【0033】この場合、前記回転式液切り機構18は、
IC用リードフレームWに高速回転を与えるモータ15
と、回転位置および回転速度を検出するエンコーダ14
とを備えた構造としたので、液切り時間や回転速度など
の液切り条件を自由に設定でき、位置決めを容易に行う
ことができる。
In this case, the rotary liquid draining mechanism 18
Motor 15 for giving high speed rotation to IC lead frame W
And an encoder 14 for detecting a rotational position and a rotational speed
With the structure provided, the drainage conditions such as the drainage time and the rotation speed can be freely set, and positioning can be easily performed.

【0034】以上、本発明者によってなされた発明を実
施例に基づき具体的に説明したが、本発明は、前記実施
例に限定されるものでなく、その要旨を逸脱しない範囲
で種々変更可能であることはいうまでもない。
Although the invention made by the inventor has been specifically described based on the embodiments, the present invention is not limited to the above-described embodiments, and can be variously modified without departing from the gist of the invention. Needless to say, there is.

【0035】以上の説明では、主として本発明者によっ
てなされた発明をその利用分野であるIC用リードフレ
ームの半田めっき装置における洗浄水クローズドシステ
ムについて説明したが、これに限定されるものではな
く、たとえばIC用リードフレーム以外のリードフレー
ム状の電子部品の半田めっき装置における洗浄水クロー
ズドシステムにも適用できる。
In the above description, the invention made mainly by the present inventor has been described with respect to a cleaning water closed system in an IC lead frame solder plating apparatus, which is a field of application, but the invention is not limited to this. The present invention can also be applied to a cleaning water closed system in a solder plating apparatus for a lead frame-shaped electronic component other than an IC lead frame.

【0036】[0036]

【発明の効果】本願において開示される発明のうち、代
表的なものによって得られる効果を簡単に説明すれば、
以下のとおりである。
Advantageous effects obtained by typical ones of the inventions disclosed in the present application will be briefly described.
It is as follows.

【0037】(1).前処理部、めっき部および後処理部に
設けられる洗浄部の直前に電子部品に付着した液体を除
去する液切り部を設けた構造としたので、洗浄部への薬
液などの持込み量を減少させ、洗浄排水の汚染度を減少
させることができる。
(1) Since a liquid draining section is provided immediately before the cleaning section provided in the pre-processing section, the plating section, and the post-processing section to remove liquid adhering to the electronic component, a chemical solution to the cleaning section is provided. It is possible to reduce the carry-in amount and the like and reduce the pollution degree of the washing wastewater.

【0038】(2).前記(1) の効果により、洗浄水のクロ
ーズド化を実用レベルで達成し、排水レス化を図ること
ができる。
(2) By the effect of the above (1), it is possible to achieve a closed level of the cleaning water at a practical level and to reduce drainage.

【0039】(3).前記(1) の場合、液切り部は、電子部
品を保持して高速回転させることにより電子部品に付着
した液体を除去する回転式液切り機構よりなる構造とし
たので、電子部品に付着した液体を遠心力により除去す
ることができる。
(3) In the case of the above (1), the liquid draining section has a structure including a rotary liquid draining mechanism for removing the liquid adhering to the electronic component by holding the electronic component and rotating it at a high speed. In addition, the liquid attached to the electronic component can be removed by centrifugal force.

【0040】(4).前記(1) の場合、回転式液切り機構
は、電子部品に高速回転を与えるモータと、回転位置お
よび回転速度を検出するエンコーダとを備えた構造とし
たので、液切り時間や回転速度などの液切り条件を自由
に設定でき、位置決めを容易に行うことができる。
(4) In the case of the above (1), the rotary liquid draining mechanism has a structure including a motor for rotating the electronic parts at a high speed and an encoder for detecting the rotational position and the rotational speed. Liquid draining conditions such as the draining time and the rotation speed can be freely set, and positioning can be easily performed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例である電子部品のめっき装置
における洗浄水クローズドシステムを示すブロック図で
ある。
FIG. 1 is a block diagram showing a cleaning water closed system in an electronic component plating apparatus according to one embodiment of the present invention.

【図2】図1の液切り部を示す断面図である。FIG. 2 is a cross-sectional view showing a liquid drain portion of FIG.

【符号の説明】[Explanation of symbols]

1 脱脂部 2a 液切り部 2b 液切り部 2c 液切り部 2d 液切り部 2e 液切り部 2f 液切り部 3a 水洗部 3b 水洗部 3c 水洗部 3d 湯洗部 4 化学研磨部 5 めっき部 6 中和部 7 乾燥部 8 ヒータ 9 熱交換部 10 冷却部 11 水処理装置 12 回転軸 13 モータ軸 14 エンコーダ 15 モータ 16 ホルダ 17 液切り室 18 回転式液切り機構 W IC用リードフレーム DESCRIPTION OF SYMBOLS 1 Degreasing part 2a Drain part 2b Drain part 2c Drain part 2d Drain part 2e Drain part 2f Drain part 3a Rinsing part 3b Rinsing part 3c Rinsing part 3d Rinsing part 4 Chemical polishing part 5 Plating part 6 Neutralization Part 7 Drying part 8 Heater 9 Heat exchange part 10 Cooling part 11 Water treatment device 12 Rotary shaft 13 Motor shaft 14 Encoder 15 Motor 16 Holder 17 Drain chamber 18 Rotary drain mechanism W IC lead frame

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 前処理を行う前処理部と、前処理された
電子部品のめっきを行うめっき部と、めっきされた電子
部品に対して後処理を行う後処理部とを備え、前記前処
理部、めっき部および後処理部に設けられる洗浄部の直
前に電子部品に付着した液体を除去する液切り部を設
、前記液切り部は、電子部品を保持して高速回転させ
ることにより電子部品に付着した液体を除去する回転式
液切り機構よりなることを特徴とする電子部品の半田め
っき装置における洗浄水クローズドシステム。
1. A pre-processing unit, comprising: a pre-processing unit for performing pre-processing; a plating unit for plating a pre-processed electronic component; and a post-processing unit for performing post-processing on the plated electronic component. Section, a plating section and a drain section for removing liquid attached to the electronic component immediately before the cleaning section provided in the post-processing section, and the liquid drain section holds the electronic component and rotates at a high speed.
Rotary type that removes liquid adhering to electronic components by removing
A cleaning water closed system in an electronic component solder plating apparatus, comprising a liquid draining mechanism.
【請求項2】 前記回転式液切り機構は、電子部品に高
速回転を与えるモータと、回転位置および回転速度を検
出するエンコーダとを備えた構造としたことを特徴とす
る請求項記載の電子部品の半田めっき装置における洗
浄水クローズドシステム。
Wherein said rotary fluid cutting mechanism, electronic of claim 1 wherein a motor providing a high-speed rotation to the electronic component, that it has to have an encoder for detecting the rotational position and rotational velocity structure wherein Washing water closed system in parts solder plating equipment.
JP04100985A 1992-04-21 1992-04-21 Cleaning water closed system in solder plating equipment for electronic components Expired - Lifetime JP3093865B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04100985A JP3093865B2 (en) 1992-04-21 1992-04-21 Cleaning water closed system in solder plating equipment for electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04100985A JP3093865B2 (en) 1992-04-21 1992-04-21 Cleaning water closed system in solder plating equipment for electronic components

Publications (2)

Publication Number Publication Date
JPH05299554A JPH05299554A (en) 1993-11-12
JP3093865B2 true JP3093865B2 (en) 2000-10-03

Family

ID=14288621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04100985A Expired - Lifetime JP3093865B2 (en) 1992-04-21 1992-04-21 Cleaning water closed system in solder plating equipment for electronic components

Country Status (1)

Country Link
JP (1) JP3093865B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101845253B (en) * 2009-03-25 2013-10-30 罗门哈斯公司 Composition for producing porous eva coatings

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110252732A (en) * 2019-06-29 2019-09-20 新乡市七星钎焊科技有限公司 A kind of cleaning method of brazing solder

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101845253B (en) * 2009-03-25 2013-10-30 罗门哈斯公司 Composition for producing porous eva coatings

Also Published As

Publication number Publication date
JPH05299554A (en) 1993-11-12

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