JP3072189B2 - Heat dissipation board for semiconductor devices - Google Patents

Heat dissipation board for semiconductor devices

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Publication number
JP3072189B2
JP3072189B2 JP4215003A JP21500392A JP3072189B2 JP 3072189 B2 JP3072189 B2 JP 3072189B2 JP 4215003 A JP4215003 A JP 4215003A JP 21500392 A JP21500392 A JP 21500392A JP 3072189 B2 JP3072189 B2 JP 3072189B2
Authority
JP
Japan
Prior art keywords
heat dissipation
semiconductor device
substrate
semiconductor chip
silicon carbide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP4215003A
Other languages
Japanese (ja)
Other versions
JPH0661387A (en
Inventor
智 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ibiden Co Ltd
Original Assignee
Ibiden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibiden Co Ltd filed Critical Ibiden Co Ltd
Priority to JP4215003A priority Critical patent/JP3072189B2/en
Publication of JPH0661387A publication Critical patent/JPH0661387A/en
Application granted granted Critical
Publication of JP3072189B2 publication Critical patent/JP3072189B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、半導体チップを搭載
できる半導体装置用放熱基板に関し、特に、半導体チッ
プから発生する熱を効率よく放散できる半導体装置用放
熱基板について提案する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a heat dissipation board for a semiconductor device on which a semiconductor chip can be mounted, and more particularly, to a heat dissipation board for a semiconductor device which can efficiently dissipate heat generated from the semiconductor chip.

【0002】[0002]

【従来の技術】最近の電子機器は、情報量の増大や需要
の多様化に伴う半導体装置の高密度化によって、半導体
チップの発熱量が増大する傾向にあり、この熱を放散さ
せるために、半導体装置に対し各種の放熱基板を取り付
けるのが通例である。
2. Description of the Related Art In recent electronic devices, the amount of heat generated by a semiconductor chip tends to increase due to the increase in the amount of information and the diversification of demand, and the heat generation of a semiconductor chip tends to increase. It is customary to attach various heat dissipation boards to the semiconductor device.

【0003】この放熱基板として、従来、窒化アルミニ
ウムや窒化けい素,炭化けい素などのセラミックスを素
材とした基板が用いられていた。ところが、これらの基
板は、搭載される半導体チップとの熱膨張差による剥離
等の接合不良がなく、ある程度の進歩が窺えるものの、
なお、熱伝導性(いわゆる放熱性)や軽量性の点で改良
が必要であり、半導体装置の高密度化の要請に対して十
分に対応できるものではなかった。
Conventionally, a substrate made of a ceramic material such as aluminum nitride, silicon nitride, or silicon carbide has been used as the heat dissipation substrate. However, these substrates have no bonding defects such as peeling due to the difference in thermal expansion with the semiconductor chip to be mounted, and although some progress can be seen,
It is necessary to improve the thermal conductivity (so-called heat dissipation) and the lightness, and it has not been able to sufficiently respond to the demand for higher density of the semiconductor device.

【0004】これに対し、上記セラミックス基板のもつ
欠点,すなわち、放熱性や軽量性を改善した種々の放熱
基板が提案されている。例えば、フィン構造を有する炭
化けい素基板(特開昭60−241239号公報)や複数のピン
状部材を接合したセラミック基板(特開平3−79064 号
公報)などが挙げられる。
[0004] On the other hand, there have been proposed various heat radiating substrates in which the above-mentioned drawbacks of the ceramic substrate, that is, heat radiating property and lightness are improved. For example, a silicon carbide substrate having a fin structure (Japanese Patent Application Laid-Open No. 60-241239) and a ceramic substrate in which a plurality of pin-shaped members are joined (Japanese Patent Application Laid-Open No. 3-79064) are exemplified.

【0005】これらの刊行物で提案している従来放熱基
板は、放熱部がいずれもフィン構造を有するので、平板
のみの放熱基板に比べて、放熱基板の放熱性に優れてい
る他、放熱基板の軽量性にも優れている。
[0005] The conventional heat-dissipating substrates proposed in these publications have excellent heat-dissipating properties of the heat-dissipating substrate as compared with a heat-dissipating substrate having only a flat plate, since the heat-dissipating portions each have a fin structure. It is also excellent in lightness.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、上記従
来放熱基板の場合、フィン構造を有する炭化けい素基板
では、その部材が緻密体であるために硬くて脆く非常に
加工性が悪いという問題点があった。一方、複数のピン
状部材を接合した基板では、平板のみの場合に比べて放
熱性は優れているが、半導体装置の高密度化に十分対処
できるような放熱性を得るには限界があった。
However, in the case of the above-mentioned conventional heat radiation substrate, the silicon carbide substrate having a fin structure has a problem that its members are hard, brittle and extremely poor in workability due to its dense body. there were. On the other hand, a substrate in which a plurality of pin-shaped members are joined has excellent heat radiation compared to a case of only a flat plate, but there is a limit in obtaining heat radiation enough to cope with high density of a semiconductor device. .

【0007】そこで、本発明は、従来技術が抱える課題
を克服できる放熱基板を得ることを目的とし、特に、フ
ィン構造の優れた軽量性を保ちながら、半導体装置の高
密度化に十分対処できるような放熱性を有し、かつ加工
性に優れた半導体装置用放熱基板を提供する。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a heat radiation board which can overcome the problems of the prior art, and in particular, can sufficiently cope with a high density of a semiconductor device while maintaining excellent light weight of a fin structure. Provided is a heat dissipation board for a semiconductor device having excellent heat dissipation and excellent workability.

【0008】[0008]

【課題を解決するための手段】本発明者らは、上掲の目
的を実現すべく鋭意研究した結果、半導体装置用放熱基
板を以下に示すような構成とすることにより、上記課題
を有利に解決できることを見い出し、本発明に想到し
た。
Means for Solving the Problems The inventors of the present invention have conducted intensive studies to achieve the above-mentioned objects, and as a result, the above-mentioned object has been advantageously achieved by forming a heat-radiating substrate for a semiconductor device as follows. The present inventors have found out that they can be solved, and have arrived at the present invention.

【0009】すなわち、本発明は、半導体チップを搭載
できる半導体装置用放熱基板において、半導体チップを
搭載する面を、炭化けい素緻密体からなる平板で構成
し、他方の面を、炭化けい素多孔質体からなる多数の中
空ピン状部材を突設した放熱フィンで構成したことを特
徴とする半導体装置用放熱基板である。
That is, according to the present invention, in a heat dissipation board for a semiconductor device on which a semiconductor chip can be mounted, the surface on which the semiconductor chip is mounted is constituted by a flat plate made of a silicon carbide dense body, and the other surface is formed by a silicon carbide porous body. A heat dissipation board for a semiconductor device, comprising: a plurality of hollow pin-shaped members made of a solid body;

【0010】[0010]

【作用】本発明の半導体装置用放熱基板の特徴は、炭化
けい素緻密体からなる平板と炭化けい素多孔質体からな
る多数の中空ピン状部材を突設した放熱フィンとから構
成されるところにある。
The heat dissipation board for a semiconductor device according to the present invention is characterized in that it is composed of a flat plate made of a dense silicon carbide body and a heat dissipation fin having a large number of hollow pin-shaped members made of a porous silicon carbide body. It is in.

【0011】このような構成とすることにより、半導体
チップの気密性の維持とともに軽量化を図ることがで
き、しかも半導体装置の高密度化に十分対処できるよう
な優れた放熱性を有し、さらに加工性にも優れた半導体
装置用放熱基板の提供が可能となる。
With this configuration, the airtightness of the semiconductor chip can be maintained and the weight thereof can be reduced, and the semiconductor chip has excellent heat dissipation that can sufficiently cope with the high density of the semiconductor device. It is possible to provide a heat dissipation board for a semiconductor device which is excellent in workability.

【0012】図1は、本発明の半導体装置用放熱基板の
一例を示す図である。図中の符号1は、炭化けい素緻密
体からなる平板であって、半導体チップを搭載する部材
である。この平板1の材質を炭化けい素緻密体とする理
由は、半導体チップを搭載した場合に、半導体チップが
空気と接触するのを防止して半導体チップの気密性を有
効に維持できるためである。なお、この平板1の半導体
チップ搭載面には、半導体チップの基板への接着性を向
上させるため、Ni,Auめっき層2を任意に設けることが
できる。
FIG. 1 is a view showing an example of a heat dissipation board for a semiconductor device according to the present invention. Reference numeral 1 in the drawing is a flat plate made of a dense silicon carbide body, which is a member on which a semiconductor chip is mounted. The reason why the material of the flat plate 1 is a silicon carbide dense body is that when the semiconductor chip is mounted, the semiconductor chip is prevented from coming into contact with air, and the airtightness of the semiconductor chip can be effectively maintained. In addition, on the semiconductor chip mounting surface of the flat plate 1, a Ni or Au plating layer 2 can be arbitrarily provided in order to improve the adhesion of the semiconductor chip to the substrate.

【0013】そして、上記平板1の半導体チップ搭載面
の反対側には、気孔率10〜40%の炭化けい素多孔質体か
らなる放熱フィン3を接合してある。この放熱フィン3
として気孔率10〜40%の多孔質体のものを用いる理由
は、緻密体に比べると熱伝導率はわずかに低下するもの
の、基板の加工性を大幅に改善することができるからで
ある。
A radiation fin 3 made of a porous silicon carbide material having a porosity of 10 to 40% is joined to the flat plate 1 on the side opposite to the semiconductor chip mounting surface. This radiation fin 3
The reason why a porous material having a porosity of 10 to 40% is used is that the workability of the substrate can be greatly improved although the thermal conductivity is slightly lower than that of a dense material.

【0014】この放熱フィン3は、基台3a部分とこの基
台3aから突設した多数の中空ピン状部材3bからなるもの
である。多数の中空ピン状部材3bを突設した理由は、従
来の中実ピン状部材に比べて、放熱フィン3の表面積が
約2倍となり、基板の放熱性が約 1.5〜2.0 倍に向上す
るからである。この中空ピン状部材3bは、ピン形状であ
ればどのような断面形状でもよく、例えば、三角断面や
四角断面などでよく、とりわけ、押し出し成形性を考慮
すると、四角断面が好適である。
The radiating fin 3 comprises a base 3a and a number of hollow pin-shaped members 3b protruding from the base 3a. The reason why a large number of hollow pin-shaped members 3b are protruded is that the surface area of the radiation fins 3 is about twice as large as that of the conventional solid pin-shaped members, and the heat radiation of the substrate is improved by about 1.5 to 2.0 times. It is. The hollow pin-shaped member 3b may have any cross-sectional shape as long as it has a pin shape, and may have, for example, a triangular cross-section or a square cross-section. In particular, a square cross-section is preferable in consideration of extrusion moldability.

【0015】このように本発明の半導体装置用放熱基板
は、上述した構造の放熱フィンを設けたので、半導体装
置の高密度化に十分対処できるような優れた放熱性を有
する。それ故に、この基板は、半導体チップを搭載した
場合には、半導体チップから発生する熱を効率よく放散
でき、半導体チップの温度上昇によるエラーを確実に防
止することができるようになる。
As described above, the heat dissipation board for a semiconductor device of the present invention is provided with the heat dissipation fins having the above-described structure, and thus has excellent heat dissipation properties that can sufficiently cope with high density of the semiconductor device. Therefore, when a semiconductor chip is mounted on this substrate, heat generated from the semiconductor chip can be efficiently dissipated, and an error due to a rise in the temperature of the semiconductor chip can be reliably prevented.

【0016】また、本発明の半導体装置用放熱基板は、
気孔率10〜40%の炭化けい素多孔質体の放熱フィンを用
いているので、放熱基板の軽量化を図ることができ、し
かも、緻密体に比べて加工しやすく、半導体装置用放熱
基板の生産性を大幅に向上することができる。
Further, a heat dissipation board for a semiconductor device according to the present invention comprises:
Since the radiation fins of porous silicon carbide having a porosity of 10 to 40% are used, it is possible to reduce the weight of the radiation substrate, and it is easier to process than a dense body. Productivity can be greatly improved.

【0017】次に、本発明の半導体装置用放熱基板は、
例えば以下に示すような方法にて作製することができる
(図2参照)。まず、炭化けい素粉末に、バインダーを
加えて混練したのち、押し出し成形を行い、所定形状の
成形体を得る(図2(a) 参照)。この炭化けい素粉末と
しては、平均粒径が 0.2〜8μmである粉末の混合粉を
用いることが好適である。この理由は、平均粒径の異な
る粉末を混合するとにより、多孔質体の気孔率を多様に
制御することができるからである。バインダーとして
は、既知の樹脂,例えば、メチルセルロースなどを用い
ることができる。
Next, the heat dissipation board for a semiconductor device of the present invention comprises:
For example, it can be manufactured by the following method (see FIG. 2). First, after adding and kneading a binder to silicon carbide powder, extrusion molding is performed to obtain a molded body having a predetermined shape (see FIG. 2A). As the silicon carbide powder, it is preferable to use a mixed powder of powders having an average particle diameter of 0.2 to 8 μm. This is because the porosity of the porous body can be variously controlled by mixing powders having different average particle sizes. As the binder, a known resin such as methylcellulose can be used.

【0018】次に、上記成形体を炭化けい素の緻密体か
らなる平板に接合し、焼成炉にて脱脂したのち焼成し
て、所定形状の焼結体を得る(図2(b) 参照)。この接
合は、例えば、炭化けい素粉末(平均粒径 0.2〜8μ
m)に樹脂(α−テルピネオールとメチルセルロース)
を加えて適度な粘度にしたペーストを用いて行う。
Next, the compact is bonded to a flat plate made of a dense silicon carbide body, degreased in a firing furnace, and then fired to obtain a sintered body having a predetermined shape (see FIG. 2 (b)). . This bonding is performed, for example, by using silicon carbide powder (average particle size 0.2 to 8 μm).
m) to resin (α-terpineol and methylcellulose)
And using a paste having an appropriate viscosity.

【0019】そして、上記焼結体の放熱フィン形成部分
に、図1(b)に示すような独立した多数の中空ピン状部
材が林立する形にするための切り込みを縦横方向に入れ
る。この切り込み加工により、該放熱フィン部に多数の
中空ピン状部材が突出した形状の半導体装置用放熱基板
を得ることができる(図2(c) 参照)。
Then, cuts are made in the vertical and horizontal directions in the portion where the heat radiation fins of the sintered body are formed, as shown in FIG. By this notch processing, a heat dissipation board for a semiconductor device having a shape in which a number of hollow pin-shaped members protrude from the heat dissipation fin portion can be obtained (see FIG. 2C).

【0020】なお、このようにして得られた上記基板の
半導体チップ接合面には、必要に応じてNiめっきやAuめ
っきを施して、半導体チップの基板への接着性を向上さ
せてもよい。これにより、半導体装置の信頼性を向上さ
せることも可能となる。
The semiconductor chip bonding surface of the substrate obtained as described above may be subjected to Ni plating or Au plating as necessary to improve the adhesiveness of the semiconductor chip to the substrate. As a result, the reliability of the semiconductor device can be improved.

【0021】[0021]

【実施例】SiC 粉末(粒子径 0.2μmと8μmとの混合
粉体)に、バインダーを加えて混練した後、押し出し成
形を行い、30×30mm, 長さ200mm,ます目2mm, 肉厚0.3m
mの成形体を得た。次に、上記成形体を15mm幅毎に切り
出し、その切り出した成形体の一方の面にSiC 平板(30
×30×2mm)を接合し、焼成炉にて脱脂ならびに焼成し
た。そして、放熱フィン形成部分(格子部分)にピン状
部材形成のための深さ10mmの切り込みを入れ、一方、平
板の半導体チップ接合面にはNiめっき(膜厚2μm)お
よびAuめっき(膜厚0.25μm)を施して半導体装置用放
熱基板を作製した。
[Example] After adding a binder to SiC powder (mixed powder of 0.2 μm and 8 μm in particle diameter) and kneading it, extrusion molding was performed, and 30 × 30 mm, length 200 mm, square 2 mm, wall thickness 0.3 m.
m was obtained. Next, the molded body was cut out at intervals of 15 mm, and a SiC flat plate (30
× 30 × 2 mm) and degreased and fired in a firing furnace. Then, a 10 mm deep cut for forming a pin-shaped member is made in the heat radiation fin forming portion (lattice portion), while Ni plating (film thickness 2 μm) and Au plating (film thickness 0.25 μm) to produce a heat dissipation substrate for a semiconductor device.

【0022】このようにして得られたNi,Auめっき付き
半導体装置用放熱基板に半導体チップを接合し、それの
熱特性を調べた。その結果、従来の SiCの緻密体からな
るピン構造の半導体装置用放熱基板に比べ、放熱性が1.
8 倍に向上することを確認した。
A semiconductor chip was bonded to the heat-radiating substrate for a semiconductor device with Ni and Au plating thus obtained, and its thermal characteristics were examined. As a result, heat dissipation is 1.
It was confirmed that it improved by 8 times.

【0023】さらに、格子部分に深さ10mmの切り込みを
入れるのに要する時間を測定して、放熱基板の加工性を
調べた。その結果、従来の SiC緻密体からなる基板の加
工時間が21時間20分であったのに対し、本発明の基板の
加工時間は1時間4分であり、基板の加工性が大幅に改
善できることが判った。
Further, the time required for making a 10 mm deep cut in the lattice portion was measured to examine the workability of the heat dissipation substrate. As a result, while the processing time of the conventional substrate made of dense SiC was 21 hours and 20 minutes, the processing time of the substrate of the present invention was 1 hour and 4 minutes, and the workability of the substrate could be greatly improved. I understood.

【0024】そしてさらに、放熱フィンの重量を測定し
て基板の軽量化について調べた。その結果、従来の SiC
緻密体からなる放熱フィンの重量が21.9gであったのに
対し、本発明の放熱フィンの重量は15.3gであり、基板
の軽量化が図れることが判った。
Further, the weight of the radiating fin was measured to examine the weight reduction of the substrate. As a result, conventional SiC
The weight of the heat radiation fin of the present invention was 15.3 g, while the weight of the heat radiation fin made of a dense body was 21.9 g. Thus, it was found that the weight of the substrate could be reduced.

【0025】[0025]

【発明の効果】以上説明したように、本発明の半導体装
置用放熱基板は、炭化けい素緻密体からなる平板と炭化
けい素多孔質体からなる多数の中空ピン状部材を突設し
た放熱フィンとから構成されているので、半導体チップ
の気密性の維持とともに軽量化を図ることができ、しか
も半導体装置の高密度化に十分対処できるような優れた
放熱性を有し、さらに加工性にも優れた半導体装置用放
熱基板の提供が可能となる。
As described above, the heat dissipation board for a semiconductor device according to the present invention is a heat dissipation fin having a flat plate made of a dense silicon carbide body and a large number of hollow pin-shaped members made of a porous silicon carbide body. , So that it is possible to maintain the airtightness of the semiconductor chip and to reduce the weight, and also has excellent heat dissipation that can sufficiently cope with the high density of the semiconductor device, and also to the workability. An excellent heat dissipation substrate for a semiconductor device can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の半導体装置用放熱基板の一例を示す
(a) 正面図および (b)断面図である。
FIG. 1 shows an example of a heat dissipation board for a semiconductor device of the present invention.
(a) is a front view and (b) is a sectional view.

【図2】本発明の半導体装置用放熱基板を製造する方法
の一例を示す図である。
FIG. 2 is a diagram illustrating an example of a method for manufacturing a heat dissipation board for a semiconductor device according to the present invention.

【符号の説明】[Explanation of symbols]

1 平板 2 Ni,Au めっき層 3 放熱フィン 3a 基台 3b 中空ピン状部材 DESCRIPTION OF SYMBOLS 1 Flat plate 2 Ni, Au plating layer 3 Heat radiation fin 3a Base 3b Hollow pin-shaped member

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 半導体チップを搭載できる半導体装置用
放熱基板において、半導体チップを搭載する面を、炭化
けい素緻密体からなる平板で構成し、他方の面を、炭化
けい素多孔質体からなる多数の中空ピン状部材を突設し
た放熱フィンで構成したことを特徴とする半導体装置用
放熱基板。
In a heat dissipation board for a semiconductor device on which a semiconductor chip can be mounted, a surface on which the semiconductor chip is mounted is constituted by a flat plate made of a dense silicon carbide body, and the other surface is made of a porous silicon carbide body. A heat dissipation board for a semiconductor device, comprising: a plurality of hollow pin-shaped members formed by projecting heat dissipation fins.
JP4215003A 1992-08-12 1992-08-12 Heat dissipation board for semiconductor devices Expired - Lifetime JP3072189B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4215003A JP3072189B2 (en) 1992-08-12 1992-08-12 Heat dissipation board for semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4215003A JP3072189B2 (en) 1992-08-12 1992-08-12 Heat dissipation board for semiconductor devices

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JPH0661387A JPH0661387A (en) 1994-03-04
JP3072189B2 true JP3072189B2 (en) 2000-07-31

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8371367B2 (en) 2005-08-11 2013-02-12 Mitsubishi Denki Kabushiki Kaisha Heat sink and fabricating method of the same
KR100805931B1 (en) * 2006-11-22 2008-02-21 한국표준과학연구원 Semiconductor chip having monolithic heat-sink structure
JP2012119671A (en) * 2010-11-11 2012-06-21 Kitagawa Ind Co Ltd Electronic circuit and heat sink
US10638643B2 (en) * 2017-11-14 2020-04-28 Canon Kabushiki Kaisha Electronic device
CN116110863B (en) * 2023-04-13 2023-06-16 深圳辰达行电子有限公司 Low-voltage high-current groove type MOS device

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JPH0661387A (en) 1994-03-04

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