JPH0661387A - Semiconductor device heat dissipating board - Google Patents
Semiconductor device heat dissipating boardInfo
- Publication number
- JPH0661387A JPH0661387A JP21500392A JP21500392A JPH0661387A JP H0661387 A JPH0661387 A JP H0661387A JP 21500392 A JP21500392 A JP 21500392A JP 21500392 A JP21500392 A JP 21500392A JP H0661387 A JPH0661387 A JP H0661387A
- Authority
- JP
- Japan
- Prior art keywords
- heat dissipating
- silicon carbide
- heat dissipation
- semiconductor chip
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】この発明は、半導体チップを搭載
できる半導体装置用放熱基板に関し、特に、半導体チッ
プから発生する熱を効率よく放散できる半導体装置用放
熱基板について提案する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device heat dissipation board on which a semiconductor chip can be mounted, and more particularly to a semiconductor device heat dissipation board capable of efficiently dissipating heat generated from the semiconductor chip.
【0002】[0002]
【従来の技術】最近の電子機器は、情報量の増大や需要
の多様化に伴う半導体装置の高密度化によって、半導体
チップの発熱量が増大する傾向にあり、この熱を放散さ
せるために、半導体装置に対し各種の放熱基板を取り付
けるのが通例である。2. Description of the Related Art Recent electronic devices tend to increase the amount of heat generated by semiconductor chips due to the increase in the density of semiconductor devices accompanying the increase in the amount of information and the diversification of demand. In order to dissipate this heat, It is customary to attach various heat dissipation substrates to the semiconductor device.
【0003】この放熱基板として、従来、窒化アルミニ
ウムや窒化けい素,炭化けい素などのセラミックスを素
材とした基板が用いられていた。ところが、これらの基
板は、搭載される半導体チップとの熱膨張差による剥離
等の接合不良がなく、ある程度の進歩が窺えるものの、
なお、熱伝導性(いわゆる放熱性)や軽量性の点で改良
が必要であり、半導体装置の高密度化の要請に対して十
分に対応できるものではなかった。Conventionally, as the heat dissipation substrate, a substrate made of ceramics such as aluminum nitride, silicon nitride, and silicon carbide has been used. However, although these substrates do not have a bonding defect such as peeling due to a difference in thermal expansion with a semiconductor chip to be mounted, and although some progress can be seen,
In addition, it is necessary to improve the heat conductivity (so-called heat dissipation) and the weight, and it is not possible to sufficiently meet the demand for higher density of the semiconductor device.
【0004】これに対し、上記セラミックス基板のもつ
欠点,すなわち、放熱性や軽量性を改善した種々の放熱
基板が提案されている。例えば、フィン構造を有する炭
化けい素基板(特開昭60−241239号公報)や複数のピン
状部材を接合したセラミック基板(特開平3−79064 号
公報)などが挙げられる。On the other hand, various heat dissipation substrates have been proposed, which have the drawbacks of the above-mentioned ceramics substrates, that is, the heat dissipation and the lightness are improved. Examples thereof include a silicon carbide substrate having a fin structure (JP-A-60-241239) and a ceramic substrate (JP-A-3-79064) in which a plurality of pin-shaped members are joined.
【0005】これらの刊行物で提案している従来放熱基
板は、放熱部がいずれもフィン構造を有するので、平板
のみの放熱基板に比べて、放熱基板の放熱性に優れてい
る他、放熱基板の軽量性にも優れている。The conventional heat dissipation boards proposed in these publications have fin structures in all of the heat dissipation parts, so that the heat dissipation board is superior to the heat dissipation board having only a flat plate in addition to the heat dissipation board. It is also lightweight.
【0006】[0006]
【発明が解決しようとする課題】しかしながら、上記従
来放熱基板の場合、フィン構造を有する炭化けい素基板
では、その部材が緻密体であるために硬くて脆く非常に
加工性が悪いという問題点があった。一方、複数のピン
状部材を接合した基板では、平板のみの場合に比べて放
熱性は優れているが、半導体装置の高密度化に十分対処
できるような放熱性を得るには限界があった。However, in the case of the above-described conventional heat dissipation substrate, the silicon carbide substrate having the fin structure has a problem that it is hard and brittle because the member is a dense body and has very poor workability. there were. On the other hand, a substrate having a plurality of pin-shaped members bonded to each other has better heat dissipation than a flat plate only, but there is a limit to obtaining heat dissipation sufficient to deal with high density of semiconductor devices. .
【0007】そこで、本発明は、従来技術が抱える課題
を克服できる放熱基板を得ることを目的とし、特に、フ
ィン構造の優れた軽量性を保ちながら、半導体装置の高
密度化に十分対処できるような放熱性を有し、かつ加工
性に優れた半導体装置用放熱基板を提供する。[0007] Therefore, the present invention aims to obtain a heat dissipation substrate that can overcome the problems of the prior art, and in particular, to sufficiently cope with the high density of semiconductor devices while maintaining the excellent lightness of the fin structure. Provided is a heat dissipation substrate for a semiconductor device, which has excellent heat dissipation properties and excellent workability.
【0008】[0008]
【課題を解決するための手段】本発明者らは、上掲の目
的を実現すべく鋭意研究した結果、半導体装置用放熱基
板を以下に示すような構成とすることにより、上記課題
を有利に解決できることを見い出し、本発明に想到し
た。As a result of intensive studies to realize the above-mentioned object, the inventors of the present invention have made the above-mentioned problem advantageous by forming a heat dissipation substrate for a semiconductor device as shown below. As a result of finding a solution, the present invention has been completed.
【0009】すなわち、本発明は、半導体チップを搭載
できる半導体装置用放熱基板において、半導体チップを
搭載する面を、炭化けい素緻密体からなる平板で構成
し、他方の面を、炭化けい素多孔質体からなる多数の中
空ピン状部材を突設した放熱フィンで構成したことを特
徴とする半導体装置用放熱基板である。That is, according to the present invention, in a heat dissipation substrate for a semiconductor device on which a semiconductor chip can be mounted, a surface on which the semiconductor chip is mounted is constituted by a flat plate made of a dense body of silicon carbide, and the other surface is porous of silicon carbide. A heat dissipation substrate for a semiconductor device, comprising a plurality of hollow pin-shaped members made of a material, each of which is formed by a heat dissipation fin.
【0010】[0010]
【作用】本発明の半導体装置用放熱基板の特徴は、炭化
けい素緻密体からなる平板と炭化けい素多孔質体からな
る多数の中空ピン状部材を突設した放熱フィンとから構
成されるところにある。The heat radiation substrate for a semiconductor device of the present invention is characterized by comprising a flat plate made of a silicon carbide dense body and a heat radiation fin having a large number of hollow pin-shaped members made of a silicon carbide porous body protruding therefrom. It is in.
【0011】このような構成とすることにより、半導体
チップの気密性の維持とともに軽量化を図ることがで
き、しかも半導体装置の高密度化に十分対処できるよう
な優れた放熱性を有し、さらに加工性にも優れた半導体
装置用放熱基板の提供が可能となる。With such a structure, the airtightness of the semiconductor chip can be maintained and the weight thereof can be reduced, and further, the semiconductor chip has excellent heat dissipation capable of coping with high density of the semiconductor device. It is possible to provide a heat dissipation board for a semiconductor device which is excellent in workability.
【0012】図1は、本発明の半導体装置用放熱基板の
一例を示す図である。図中の符号1は、炭化けい素緻密
体からなる平板であって、半導体チップを搭載する部材
である。この平板1の材質を炭化けい素緻密体とする理
由は、半導体チップを搭載した場合に、半導体チップが
空気と接触するのを防止して半導体チップの気密性を有
効に維持できるためである。なお、この平板1の半導体
チップ搭載面には、半導体チップの基板への接着性を向
上させるため、Ni,Auめっき層2を任意に設けることが
できる。FIG. 1 is a diagram showing an example of a heat dissipation substrate for a semiconductor device of the present invention. Reference numeral 1 in the drawing is a flat plate made of a silicon carbide dense body, which is a member on which a semiconductor chip is mounted. The reason why the material of the flat plate 1 is a silicon carbide dense body is that when a semiconductor chip is mounted, the semiconductor chip can be prevented from coming into contact with air and the airtightness of the semiconductor chip can be effectively maintained. The flat surface 1 may be provided with a Ni, Au plating layer 2 on the semiconductor chip mounting surface in order to improve the adhesion of the semiconductor chip to the substrate.
【0013】そして、上記平板1の半導体チップ搭載面
の反対側には、気孔率10〜40%の炭化けい素多孔質体か
らなる放熱フィン3を接合してある。この放熱フィン3
として気孔率10〜40%の多孔質体のものを用いる理由
は、緻密体に比べると熱伝導率はわずかに低下するもの
の、基板の加工性を大幅に改善することができるからで
ある。A radiating fin 3 made of a porous silicon carbide body having a porosity of 10 to 40% is joined to the side of the flat plate 1 opposite to the semiconductor chip mounting surface. This radiation fin 3
The reason for using a porous body having a porosity of 10 to 40% is that the workability of the substrate can be significantly improved although the thermal conductivity is slightly lower than that of the dense body.
【0014】この放熱フィン3は、基台3a部分とこの基
台3aから突設した多数の中空ピン状部材3bからなるもの
である。多数の中空ピン状部材3bを突設した理由は、従
来の中実ピン状部材に比べて、放熱フィン3の表面積が
約2倍となり、基板の放熱性が約 1.5〜2.0 倍に向上す
るからである。この中空ピン状部材3bは、ピン形状であ
ればどのような断面形状でもよく、例えば、三角断面や
四角断面などでよく、とりわけ、押し出し成形性を考慮
すると、四角断面が好適である。The heat radiation fin 3 comprises a base 3a and a large number of hollow pin-shaped members 3b protruding from the base 3a. The reason for providing a large number of hollow pin-shaped members 3b is that the surface area of the radiating fins 3 is about twice as large as that of the conventional solid pin-shaped member, and the heat radiation performance of the substrate is improved by about 1.5 to 2.0 times. Is. The hollow pin-shaped member 3b may have any cross-sectional shape as long as it has a pin shape, and may have, for example, a triangular cross-section or a square cross-section. Particularly, in consideration of the extrudability, a square cross-section is preferable.
【0015】このように本発明の半導体装置用放熱基板
は、上述した構造の放熱フィンを設けたので、半導体装
置の高密度化に十分対処できるような優れた放熱性を有
する。それ故に、この基板は、半導体チップを搭載した
場合には、半導体チップから発生する熱を効率よく放散
でき、半導体チップの温度上昇によるエラーを確実に防
止することができるようになる。As described above, since the heat dissipation substrate for semiconductor device of the present invention is provided with the heat dissipation fins having the above-mentioned structure, it has an excellent heat dissipation property capable of sufficiently dealing with high density of the semiconductor device. Therefore, when the semiconductor chip is mounted on this substrate, the heat generated from the semiconductor chip can be efficiently dissipated, and the error due to the temperature rise of the semiconductor chip can be surely prevented.
【0016】また、本発明の半導体装置用放熱基板は、
気孔率10〜40%の炭化けい素多孔質体の放熱フィンを用
いているので、放熱基板の軽量化を図ることができ、し
かも、緻密体に比べて加工しやすく、半導体装置用放熱
基板の生産性を大幅に向上することができる。Further, the heat dissipation substrate for semiconductor device of the present invention is
Since the radiation fin of porous silicon carbide with porosity of 10 to 40% is used, it is possible to reduce the weight of the radiation substrate, and moreover, it is easier to process than the dense body, and The productivity can be greatly improved.
【0017】次に、本発明の半導体装置用放熱基板は、
例えば以下に示すような方法にて作製することができる
(図2参照)。まず、炭化けい素粉末に、バインダーを
加えて混練したのち、押し出し成形を行い、所定形状の
成形体を得る(図2(a) 参照)。この炭化けい素粉末と
しては、平均粒径が 0.2〜8μmである粉末の混合粉を
用いることが好適である。この理由は、平均粒径の異な
る粉末を混合するとにより、多孔質体の気孔率を多様に
制御することができるからである。バインダーとして
は、既知の樹脂,例えば、メチルセルロースなどを用い
ることができる。Next, the heat dissipation substrate for semiconductor device of the present invention is
For example, it can be manufactured by the following method (see FIG. 2). First, a binder is added to silicon carbide powder and kneaded, and then extrusion molding is performed to obtain a molded product having a predetermined shape (see FIG. 2 (a)). As the silicon carbide powder, it is preferable to use a mixed powder of powders having an average particle size of 0.2 to 8 μm. The reason for this is that the porosity of the porous body can be controlled in various ways by mixing powders having different average particle sizes. As the binder, a known resin such as methyl cellulose can be used.
【0018】次に、上記成形体を炭化けい素の緻密体か
らなる平板に接合し、焼成炉にて脱脂したのち焼成し
て、所定形状の焼結体を得る(図2(b) 参照)。この接
合は、例えば、炭化けい素粉末(平均粒径 0.2〜8μ
m)に樹脂(α−テルピネオールとメチルセルロース)
を加えて適度な粘度にしたペーストを用いて行う。Next, the molded body is bonded to a flat plate made of a dense body of silicon carbide, degreased in a firing furnace and then fired to obtain a sintered body having a predetermined shape (see FIG. 2 (b)). . This joining is performed, for example, by using silicon carbide powder (average particle size 0.2 to 8 μm).
m) resin (α-terpineol and methyl cellulose)
Is added to obtain a paste having an appropriate viscosity.
【0019】そして、上記焼結体の放熱フィン形成部分
に、図1(b)に示すような独立した多数の中空ピン状部
材が林立する形にするための切り込みを縦横方向に入れ
る。この切り込み加工により、該放熱フィン部に多数の
中空ピン状部材が突出した形状の半導体装置用放熱基板
を得ることができる(図2(c) 参照)。Then, in the radiating fin forming portion of the sintered body, cuts are formed in the vertical and horizontal directions for forming a large number of independent hollow pin-shaped members as shown in FIG. 1 (b). By this cutting process, it is possible to obtain a heat dissipation board for a semiconductor device in which a large number of hollow pin-shaped members are projected in the heat dissipation fin portion (see FIG. 2 (c)).
【0020】なお、このようにして得られた上記基板の
半導体チップ接合面には、必要に応じてNiめっきやAuめ
っきを施して、半導体チップの基板への接着性を向上さ
せてもよい。これにより、半導体装置の信頼性を向上さ
せることも可能となる。The semiconductor chip bonding surface of the substrate thus obtained may be plated with Ni or Au, if necessary, to improve the adhesiveness of the semiconductor chip to the substrate. This also makes it possible to improve the reliability of the semiconductor device.
【0021】[0021]
【実施例】SiC 粉末(粒子径 0.2μmと8μmとの混合
粉体)に、バインダーを加えて混練した後、押し出し成
形を行い、30×30mm, 長さ200mm,ます目2mm, 肉厚0.3m
mの成形体を得た。次に、上記成形体を15mm幅毎に切り
出し、その切り出した成形体の一方の面にSiC 平板(30
×30×2mm)を接合し、焼成炉にて脱脂ならびに焼成し
た。そして、放熱フィン形成部分(格子部分)にピン状
部材形成のための深さ10mmの切り込みを入れ、一方、平
板の半導体チップ接合面にはNiめっき(膜厚2μm)お
よびAuめっき(膜厚0.25μm)を施して半導体装置用放
熱基板を作製した。[Example] SiC powder (mixed powder of particle size 0.2 μm and 8 μm) was kneaded by adding a binder and then extruded to form 30 × 30 mm, length 200 mm, square 2 mm, wall thickness 0.3 m
A molded body of m was obtained. Next, the above-mentioned molded body was cut into 15 mm widths, and a SiC flat plate (30
X 30 x 2 mm) were joined and degreased and fired in a firing furnace. Then, a notch having a depth of 10 mm is formed in the radiating fin forming portion (lattice portion) for forming the pin-shaped member, while Ni plating (film thickness 2 μm) and Au plating (film thickness 0.25) are formed on the flat surface of the semiconductor chip bonding surface. μm) to produce a heat dissipation substrate for a semiconductor device.
【0022】このようにして得られたNi,Auめっき付き
半導体装置用放熱基板に半導体チップを接合し、それの
熱特性を調べた。その結果、従来の SiCの緻密体からな
るピン構造の半導体装置用放熱基板に比べ、放熱性が1.
8 倍に向上することを確認した。A semiconductor chip was bonded to the heat-radiating substrate for a semiconductor device with Ni and Au plating thus obtained, and its thermal characteristics were examined. As a result, compared with the conventional heat dissipation board for semiconductor devices that has a pin structure made of dense SiC, the heat dissipation is 1.
It was confirmed that it improved 8 times.
【0023】さらに、格子部分に深さ10mmの切り込みを
入れるのに要する時間を測定して、放熱基板の加工性を
調べた。その結果、従来の SiC緻密体からなる基板の加
工時間が21時間20分であったのに対し、本発明の基板の
加工時間は1時間4分であり、基板の加工性が大幅に改
善できることが判った。Further, the workability of the heat dissipation substrate was examined by measuring the time required to make a cut having a depth of 10 mm in the lattice portion. As a result, the processing time of the conventional substrate composed of a dense SiC body was 21 hours and 20 minutes, whereas the processing time of the substrate of the present invention was 1 hour and 4 minutes, and the workability of the substrate can be significantly improved. I understood.
【0024】そしてさらに、放熱フィンの重量を測定し
て基板の軽量化について調べた。その結果、従来の SiC
緻密体からなる放熱フィンの重量が21.9gであったのに
対し、本発明の放熱フィンの重量は15.3gであり、基板
の軽量化が図れることが判った。Further, the weight of the radiation fin was measured to examine the weight reduction of the substrate. As a result, conventional SiC
It was found that the weight of the heat radiation fin of the present invention was 15.3 g, while the weight of the heat radiation fin made of a dense body was 21.9 g, and the weight of the substrate can be reduced.
【0025】[0025]
【発明の効果】以上説明したように、本発明の半導体装
置用放熱基板は、炭化けい素緻密体からなる平板と炭化
けい素多孔質体からなる多数の中空ピン状部材を突設し
た放熱フィンとから構成されているので、半導体チップ
の気密性の維持とともに軽量化を図ることができ、しか
も半導体装置の高密度化に十分対処できるような優れた
放熱性を有し、さらに加工性にも優れた半導体装置用放
熱基板の提供が可能となる。As described above, the heat dissipation substrate for a semiconductor device of the present invention is a heat dissipation fin in which a flat plate made of a silicon carbide dense body and a large number of hollow pin-shaped members made of a silicon carbide porous body are provided in a protruding manner. Since it is composed of and, it is possible to maintain the airtightness of the semiconductor chip as well as to reduce the weight, and also has an excellent heat dissipation property that can sufficiently cope with the high density of the semiconductor device, and further it is easy to process. It is possible to provide an excellent heat dissipation substrate for a semiconductor device.
【図1】本発明の半導体装置用放熱基板の一例を示す
(a) 正面図および (b)断面図である。FIG. 1 shows an example of a heat dissipation substrate for a semiconductor device of the present invention.
It is a front view and (b) sectional drawing.
【図2】本発明の半導体装置用放熱基板を製造する方法
の一例を示す図である。FIG. 2 is a diagram showing an example of a method for manufacturing a heat dissipation board for a semiconductor device of the present invention.
1 平板 2 Ni,Au めっき層 3 放熱フィン 3a 基台 3b 中空ピン状部材 1 Flat plate 2 Ni, Au plating layer 3 Radiating fin 3a Base 3b Hollow pin-shaped member
Claims (1)
放熱基板において、半導体チップを搭載する面を、炭化
けい素緻密体からなる平板で構成し、他方の面を、炭化
けい素多孔質体からなる多数の中空ピン状部材を突設し
た放熱フィンで構成したことを特徴とする半導体装置用
放熱基板。1. In a heat dissipation substrate for a semiconductor device on which a semiconductor chip can be mounted, a surface on which the semiconductor chip is mounted is constituted by a flat plate made of a silicon carbide dense body, and the other surface is made of a silicon carbide porous body. A heat dissipation board for a semiconductor device, comprising a plurality of heat dissipation fins provided with protruding hollow pin-shaped members.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4215003A JP3072189B2 (en) | 1992-08-12 | 1992-08-12 | Heat dissipation board for semiconductor devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4215003A JP3072189B2 (en) | 1992-08-12 | 1992-08-12 | Heat dissipation board for semiconductor devices |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0661387A true JPH0661387A (en) | 1994-03-04 |
JP3072189B2 JP3072189B2 (en) | 2000-07-31 |
Family
ID=16665098
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4215003A Expired - Lifetime JP3072189B2 (en) | 1992-08-12 | 1992-08-12 | Heat dissipation board for semiconductor devices |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3072189B2 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100805931B1 (en) * | 2006-11-22 | 2008-02-21 | 한국표준과학연구원 | Semiconductor chip having monolithic heat-sink structure |
JPWO2007017945A1 (en) * | 2005-08-11 | 2009-02-19 | 三菱電機株式会社 | Heat sink and manufacturing method thereof |
WO2012063942A1 (en) * | 2010-11-11 | 2012-05-18 | 北川工業株式会社 | Electronic circuit and heat sink |
CN109788709A (en) * | 2017-11-14 | 2019-05-21 | 佳能医疗系统株式会社 | Electronic equipment |
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-
1992
- 1992-08-12 JP JP4215003A patent/JP3072189B2/en not_active Expired - Lifetime
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