JP3042446B2 - Electrostatic breakdown verification tool - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit data verification tool, and more particularly, to a verification method and a verification system suitable for use in verifying electrostatic breakdown of circuit diagram data.

[0002]

2. Description of the Related Art Conventionally, electrostatic breakdown verification of circuit diagram data has been performed.
For example, it is customarily performed by the designer through the work steps shown as a flowchart in FIG.

Referring to FIG. 13, a past circuit diagram 201
Based on the above, static electricity is applied to each terminal of the manufactured LSI, and the minimum amount of static electricity at which the function of the LSI is destroyed is defined as the electrostatic breakdown withstand result 202 of the LSI, and is compared with the circuit diagram data. And keep it in advance. In addition, for each element used in the LSI, when the element is connected to a terminal by itself, the minimum amount of static electricity at which the function of the element is destroyed is stored in advance as single element withstand information 204 of the element. .

Next, a new circuit diagram 203 and a past circuit diagram 2
01 is compared by a first comparison process 210 based on the topology of the circuit, and a circuit having the same configuration is subjected to a first The comparison result 211 is obtained.

[0005] In the new circuit diagram 203, an element connected to a terminal is extracted as single element information 221 by a single element information extraction function 220, and a second comparison processing 230 is performed.
Thus, the second comparison result 231 is obtained by referring to the single-element tolerance information 204 relating to the same element.

Finally, the first comparison result 211 and the second comparison result 211
Of the electrostatic breakdown verification result of the new circuit diagram is determined by the determination process 240 from the comparison result 231 of FIG.
I have one.

[0007]

However, the above-mentioned conventional verification method has the following problems.

(1) The first problem is the first comparison processing 2
10 is slow.

The reason is that the first comparison processing 210 needs to compare circuit topologies in order to compare the circuit configurations of the circuit diagrams.

(2) The second problem is that the second comparison processing 2
That is, the precision of 30 is low.

The reason is that the second comparison processing 230 verifies only the element connected to the terminal, and cannot consider the influence of the element connected to the periphery thereof.
This is because the verification by the comparison process 230 can be used only as a reference result.

(3) The third problem is that the first comparison processing 2
This means that confidentiality must be handled during the operation of No. 10.

The reason for this is that the first comparison processing 210 refers to the circuit configuration of the past circuit diagram 201, so that the configuration is not known to a third party such as an outsider. Is required.

Accordingly, the present invention has been made in view of the above problems, and has as its object to provide a circuit configuration of a past circuit diagram and a single unit of each element used in an LSI which has been conventionally used. A method and system that can perform high-speed and high-precision electrostatic breakdown verification of a new circuit diagram by extracting information from past circuit diagram data in place of element tolerance information and performing comparison processing using the extracted information. Is to provide.

[0015]

SUMMARY OF THE INVENTION In order to achieve the above object, the method for verifying electrostatic discharge breakdown according to the present invention has been outlined.
For example, by extracting path information between two terminals from the new and old circuit diagram data, further extracting element information in the path between the two terminals, and comparing the extracted path information between the two terminals and the element information, static information is obtained. a determination of appropriateness related breakdown, iodine
Ru der those in.

The electrostatic breakdown verification system according to the present invention comprises: first means for extracting path information between two terminals, which is formed by an element and a signal line, connecting any two terminals in circuit diagram data;
A second unit for extracting, from the elements included in the path information between the two terminals extracted by the first unit, element information in one path according to a predetermined condition for each element name; First comparing means for comparing the information extracted by the first means with the circuit diagram data and the second circuit diagram data, respectively, and the first circuit diagram data and the second circuit diagram data A second comparing means for comparing the information respectively extracted by the second means, and a judgment for performing an electrostatic breakdown verification judgment based on a comparison result of the first and second comparing means. Means , further comprising a first comparator
Stage and second comparison means, Ru is the following configuration.

In the present invention, the first comparing means may be configured to use the first circuit diagram as a reference based on path information between two terminals extracted from the second circuit diagram data to be compared. Searching for a path in which all the element names and pin names of the elements in the path match from the path information between the two terminals extracted from the data, or searching for a path that is a subset of the element names and pin names of the elements in the path Perform the comparison, compared with the element value of each element in the retrieved reference path information, the element value of each element in the path information of the comparison target, if all the equal or greater, the comparison result is allowed, It is characterized by the following.

Also, in the present invention, the second comparing means may be used as a reference based on element information in one path obtained for the second circuit diagram data before being compared. Element information having the same element name and pin name is searched from the element information in one path obtained for the first circuit diagram data, and the element value of the element information and the information of the peripheral element serving as the searched reference are obtained. Compared to the above, the comparison result is acceptable when the element value of the element information to be compared and the information of the peripheral element are equal or larger.

Further, in the present invention, the determination means makes a determination for each path, and if the first comparison means and the second comparison means all the comparison results are acceptable, the determination result is passed. And

[Outline of the Invention] The outline of the present invention will be described below. The present invention provides a process of extracting path information between two terminals (110 in FIG. 1) and a process of extracting element information in one path (12 in FIG. 1).
0), a first comparison process (130 in FIG. 1) and a second comparison process (140 in FIG. 1) for comparing information extracted by each means, and an electrostatic breakdown verification judgment is performed based on the comparison result. It has a determination process (150 in FIG. 1). In the present invention, each of these processes is realized by a program executed by an information processing device such as a computer, and the program can be distributed and provided as a computer-aided electrostatic breakdown verification tool on a recording medium.

Here, the process of extracting the path information between two terminals refers to a process of extracting path information formed by elements and signal lines connecting arbitrary two terminals in the circuit diagram data. Is extracted from all the routes that connect the route according to a predetermined condition.

The element information extraction processing in one path is as follows.
From all the elements included in the two-terminal path information, the elements are extracted for each element name according to a predetermined condition.

The two information extraction functions simplify and digitize the new and old circuit diagram data, so that later comparison processing can be executed at high speed.

Further, since the circuit configuration information is fragmented and stored in the path information between two terminals and the element information in one path, it is not necessary to handle confidentiality.

Further, such information sufficiently takes into account the complicated conditions around the element, and verification with higher accuracy than in the past becomes possible.

[0026]

Embodiments of the present invention will be described in detail below with reference to the drawings.

FIG. 1 is a diagram showing a processing flow of an embodiment of an electrostatic breakdown verification tool to which the present invention is applied. First,
Based on the past circuit diagram data 111 and its electrostatic breakdown withstand results 112, reference is made to circuit diagram data having a value of electrostatic breakdown withstand capability equal to or greater than a predetermined value, and extraction processing 11 of path information between two terminals 11
0, the path information A111 between two terminals is extracted, and the element information A121 in one path is extracted from the path information A111 in two paths by the element information extraction processing 120 in one path,
Both extracted information 111 and 121 are stored in advance.

Next, the two-terminal path information B11 is extracted from the new circuit diagram 103 by the two-terminal path information extraction processing 110.
2 is extracted, the first comparison processing 130 compares the two-terminal path information A111 and the two-terminal path information B112, and obtains a first comparison result 131.

Further, from the route information B112 between two terminals,
The one-path element information B 122 is extracted by the one-path element information extraction processing 120, and the one-path element information A 121 and the one-path element information B 12 are extracted by the second comparison processing 140.
2 and a second comparison result 141 is obtained.

Finally, the first comparison result 131 and the second comparison result 131
From the comparison result 141, the determination result 151 of the electrostatic breakdown verification is obtained for each path by the determination processing 150.

FIG. 2 shows path information 111 and 112 between two terminals.
1 shows an example of the data format. Referring to FIG. 2, the data of the path information between two terminals exists one by one for each path connecting two terminals of the circuit diagram data. The data includes
The terminal names of the two terminals (terminal 1 and terminal 2), the element names of the elements included between the terminals, the pin names of the elements, and the element values (parameter values or sizes, etc.) characterizing the elements
Is included. The length of the data is variable and depends on the number of elements included in the path.

FIG. 3 shows one-path element information 121, 122.
1 shows an example of the data format. The data includes an element name and a pin name for each element, an element value characterizing the element, information on a peripheral element defined for each element name, and the like. The data length is determined for each element name.

FIG. 4 schematically shows a processing flow of the first comparison processing 130. Based on the two-terminal path information B112 extracted from the new circuit diagram data 103, a search is made for a path in which the element names and pin names of the elements in the path are all the same from the two-terminal path information A111 (process 132). Alternatively, a search is made for a path that is a subset of the element names and pin names of the elements in the path (process 133).

If all the element values of each element in the original path information are equal to or greater than the element value of each element in the retrieved path information 134, the comparison result is permitted (processing 135). This comparison is performed for all the two-terminal route information B112.

FIG. 5 schematically shows a processing flow of the second comparison processing 140. Based on the one-path element information B122, the one-path element information A121 is searched for element information having the same element name and pin name (processing 14).
2). If the element value of the original element information and the information of the peripheral element are equal to or greater than the element value of the retrieved element information 143 and the information of the peripheral element, the comparison result is permitted (step 144). This comparison is performed for all the one-path element information B122.

Finally, in the determination processing 150, a determination is made for each path, and in the first comparison processing 130 and the second comparison processing 140, if all the comparison results are “OK”, the determination result is determined. Pass. Otherwise, it is rejected.

[0037]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing an embodiment of the present invention;

FIG. 6 is a diagram showing an example of past circuit diagram data. Referring to FIG. 6A, this circuit includes five terminals A to E and eight elements. The element names, element values, and pin names of each element are as shown in FIG. The element names of element 1, element 2, and element 3 are R (resistance),
The element values are 10K, 5K, 5K (Ω), the pin names are A and A, the element names of elements 4 to 6 are P (PNP bipolar transistor), and the element values (for example, the size ratio) are 5, 2,
2. Pin names are E, B, C (emitter, base, collector), elements 7 and 8 have an element name N (NPN bipolar transistor), element value is 1, and pin names are C, B, E.
This circuit includes a differential pair (element 5, element 6), a differential pair constant current source (element 4, element 1), and a differential pair load (element 7, element 8, element 2, element 3). Is a differential amplifier circuit.

It is assumed that the electrostatic breakdown withstand result corresponding to the past circuit diagram data is equal to or greater than a predetermined value, and the two-terminal path information A111 is extracted by using the two-terminal path information extraction processing 110. . In the extraction, only the path that satisfies the following condition is extracted from the path connecting the two terminals.

[Condition 1] A route that does not pass through the same element or signal line a plurality of times.

[Condition 2] A route that does not pass through a signal line directly connected to another terminal.

FIG. 7 shows all the route information from the terminal A to the terminal E in the route information A111 between the two terminals thus obtained.

Of these five paths, paths 1 and 5 and paths 2 to 4 are paths having the same element name, pin name and element value, respectively.
Only the route 1 and the route 2 are sufficient as the route information required in 30.

From the two route information A11 between the two terminals,
The one-path element information A 121 is extracted using the one-path element information extraction processing 120. In the extraction, only the elements satisfying the following conditions are extracted from the elements in the path, and the next information is also extracted as peripheral element information.

[Condition 1] Only elements whose element names are P or N are extracted.

[Information 1] As peripheral element information 1, the sum of the element values of the element having the element name R existing in front of the element in the route (leftward in FIG. 7) is extracted.

[Information 2] As the peripheral element information 2, the total value of the element values of the element having the element name R existing behind the element on the route (rightward in FIG. 7) is extracted.

FIG. 8 shows all the element information for the path 1 and the path 2 thus obtained. Of the six element information, the first of path 1 and the first of path 2, the second of path 1 and the second of path 2 are element information having the same element name, pin name and element value, respectively. From
The element information required in the second comparison processing 140 later includes:
Only all the element information of the path 1 and the third element information of the path 2 are sufficient.

FIG. 9 is a diagram showing an example of the new circuit diagram data 103. The difference from the past circuit diagram data shown in FIG. 6 is only the element values of element 1, element 3, and element 5. In the new circuit diagram data 103, the element value of the element 1 is 15
K (Ω) and larger than the element 1 of the past circuit diagram data,
The element 3 is 3K and the element 5 is 1 which is smaller than the element values of the elements 3 and 5 in the past circuit diagram data.

The method for verifying electrostatic discharge breakdown according to the present invention does not depend on the difference in the circuit configuration. In this example, the new circuit diagram data uses the same circuit configuration as the past circuit diagram data. .

FIG. 10 shows two-terminal path information B112 (see FIG. 10A) extracted from the new circuit diagram data shown in FIG. Path information retrieved from the path information A111 between two terminals by the comparison processing 130 (see FIG. 10B)
And the first comparison result obtained as a result of the numerical comparison (FIG. 10)
(C).

In the first comparison processing 130, the two-terminal route information B112 is selected from the two-terminal route information A111.
As a result of searching for a path in which the element name and the pin name of the element all match the path of the two-terminal path information A111 that matches the path 1 and the path 5 of the two-terminal path information B112, the path 1 and the path 5 The routes of the two-terminal route information A111 that match the routes 2 to 4 of the two-terminal route information B12 are the second to fourth routes.

Subsequently, as a result of the numerical comparison, only the path 4 (terminal A, element 1, element 4, element 6, element 6, element 7, element 2, terminal E) becomes "OK", and the other paths are included in the paths. Since element 3 or element 5 is included, its element value is 2
The value of the two-terminal route information B112 is smaller than the value of the inter-terminal route information A111, and is not marked "OK" but remains unmarked.

FIG. 11 is a diagram showing one extracted by the element information extraction processing 120 in one path from the path information B112 between two terminals.
In-path element information B (see FIG. 11A) and a second comparison result obtained by the second comparison processing (FIG. 11A)
(See (B)).

In the second comparison processing 140, the one-path element information B122 is selected from the one-path element information A121.
Are searched for element information having the same element name and pin name for each of them, and as a result of comparing the element values and all peripheral element information, the first and third paths 1 and the first and third paths 2 , All the elements in the path 4 are “OK”, and the other elements remain unmarked because either the element value or the peripheral element information is smaller than the element information A21 in one path.

FIG. 12 is a list of comparison results (FIG. 12A).
12) and a determination result 150 (see FIG. 12B). Regarding the path 4, in the first comparison processing 130 and the second comparison processing 140, the comparison results are all “OK”, and thus the determination result is “Pass”. For other routes, the result is “fail”.

[0057]

As described above, according to the present invention,
The following effects are obtained.

The first effect of the present invention is that the verification of electrostatic breakdown can be executed at high speed.

The reason is that, in the present invention, the circuit diagram information is digitized or simplified by the means for extracting path information between two terminals and the element information extracting means in one path, and can be determined by numerical comparison. It depends.

The second effect of the present invention is that highly accurate electrostatic breakdown verification can be performed.

The reason for this is that, in the present invention, since the information of the complicated peripheral elements in the new and old circuit diagrams is extracted by the means for extracting the path information between terminals and the element information extracting means in one path, This is because it is possible to perform a comparison that takes these into consideration sufficiently in the comparison processing.

A third effect of the present invention is that information extracted from past circuit diagram data, which is necessary for electrostatic breakdown verification, is
This eliminates the need to handle confidentiality.

The reason for this is that, in the present invention, the extracted path information between two terminals and the in-path element information are both pieces of circuit configuration information fragmented for each path. This is because they cannot be restored.

[Brief description of the drawings]

FIG. 1 is a diagram showing a processing flow according to an embodiment of the present invention.

FIG. 2 is a diagram illustrating an example of a format of path information between two terminals according to the embodiment of the present invention.

FIG. 3 is a diagram illustrating an example of a format of element information in one path according to the embodiment of the present invention.

FIG. 4 is a diagram showing a processing flow of a first comparison processing according to the embodiment of the present invention.

FIG. 5 is a diagram showing a processing flow of a second comparison processing in the embodiment of the present invention.

FIG. 6 is a diagram for explaining an embodiment of the present invention, and is a diagram showing a specific example of past circuit diagram data.

FIG. 7 is a diagram for explaining an embodiment of the present invention,
FIG. 6 is a diagram showing inter-terminal route information A.

FIG. 8 is a diagram for explaining an embodiment of the present invention, and FIG.
It is a figure which shows the element information A in a path | route.

FIG. 9 is a diagram for explaining an embodiment of the present invention, and is a diagram showing a specific example of new circuit diagram data.

FIG. 10 is a diagram for explaining an embodiment of the present invention;
(A) is a diagram showing path information B between two terminals, and (B) is a diagram showing a first comparison result.

FIG. 11 is a diagram for explaining an embodiment of the present invention;
(A) is a diagram showing element information B in one path, and (B) is a diagram showing a second comparison result.

FIG. 12 is a diagram for explaining an embodiment of the present invention;
(A) is a list of comparison results, (B) is a diagram showing a determination result.

FIG. 13 is a diagram showing a conventional electrostatic breakdown verification flow.

[Explanation of symbols]

 101 Past Circuit Diagram 102 Electrostatic Breakdown Withstand Result 103 New Circuit Diagram 110 Two Terminal Path Information Extraction Function 111 Two Terminal Path Information A 120 Element Information Extraction Function in One Path 121 Element Information A in One Path 122 One Path Element information B 130 First comparison process 131 First comparison result 140 Second comparison process 141 Second comparison result 150 Judgment process 151 Judgment result 201 Past circuit diagram 202 Electrostatic breakdown tolerance result 203 New circuit diagram 204 Single unit Element tolerance information 210 First comparison processing 211 First comparison result 220 Single element information extraction function 221 Single element information 230 Second comparison processing 231 Second comparison result 240 Judgment processing 241 Judgment result

──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. ⁷ Identification code FI H01L 21/82 T

Claims (4)

(57) [Claims] A circuit for connecting any two terminals in the circuit diagram data;
First means for extracting path information between two terminals constituted by an element and a signal line; and pre-determined for each element name from elements included in the path information between two terminals extracted by the first means. Second means for extracting element information in one path in accordance with the obtained condition, and for the first circuit diagram data and the second circuit diagram data,
First comparing means for comparing the information respectively extracted by the first means; and information respectively extracted by the second means with respect to the first circuit diagram data and the second circuit diagram data. And a determination unit for performing an electrostatic breakdown verification determination based on a comparison result of the first and second comparison units, wherein the first comparison unit compares Based on the path information between two terminals extracted from the target second circuit diagram data, the element of the element in the path from the path information between two terminals extracted from the first circuit diagram data serving as a reference A search is made for a path whose names and pin names are all the same, or for a path that is a subset of the element names and pin names of the elements in the path. Compared to the value, Element value of the element, and allowed the comparison results when all or large equal, and wherein the electrostatic breakdown verification system. 2. The first circuit diagram serving as a reference, based on element information in one path obtained with respect to the second circuit diagram data to be compared with the second circuit diagram data to be compared. The device information that matches the device name and the pin name is searched from the device information in one path obtained for the data, and compared with the device value of the searched device information and the information of the peripheral device, and compared. towards the information element values and the peripheral elements of the device information is subject, the value is the variable of the comparison result is greater or equal, and wherein the electrostatic breakdown verification system according to claim 1. 3. The determination means makes a determination for each route,
3. The electrostatic breakdown verification system according to claim 1, wherein the first comparison unit and the second comparison unit pass a determination result when all comparison results are acceptable. 4. . 4. Connecting any two terminals in the circuit diagram data.
Two-terminal path information extraction processing for extracting two-terminal path information constituted by elements and signal lines; and the two terminals extracted by the two-terminal path information extraction processing.
From the elements included in the inter-terminal path information, for each element name,
One-path element information processing for extracting one-path element information according to a predetermined condition; and first circuit diagram data and second circuit diagram data,
A first comparison process of comparing information extracted by the two-terminal path information extraction process; and a first comparison process of comparing the first circuit diagram data and the second circuit diagram data with the one-path element information processing. A second comparison process of comparing the extracted information; and a determination process of performing an electrostatic breakdown verification determination based on a comparison result of the first and second comparison processes, wherein the first comparison process is performed. Based on path information between two terminals extracted from the second circuit diagram data to be compared, based on path information between two terminals extracted from the first circuit diagram data serving as a reference, an element in a path Search for a path that matches all of the element names and pin names of the path, or search for paths that are a subset of the element names and pin names of the elements in the path. Compared to the element value of If the element values of the respective elements in the path information are all equal or greater than each other, the comparison result is permitted, and the second comparison processing is performed on the second circuit diagram data before being compared. Based on the one-path element information, element information having the same element name and pin name is searched from the one-path element information obtained for the first circuit diagram data serving as a reference. Compared with the element value of the element information and the information of the peripheral element, which are the reference, the element value of the element information and the information of the peripheral element to be compared are better if the values are equal or larger, and the comparison result is acceptable. The determination process performs a determination for each path, and the first comparison unit and the second comparison unit pass the determination result if all comparison results are acceptable. Program to perform electrostatic breakdown verification by executing A recording medium on which a program is recorded.