JP2922508B1 - Automatic ultrasonic flaw detector - Google Patents

Automatic ultrasonic flaw detector

Info

Publication number
JP2922508B1
JP2922508B1 JP10216933A JP21693398A JP2922508B1 JP 2922508 B1 JP2922508 B1 JP 2922508B1 JP 10216933 A JP10216933 A JP 10216933A JP 21693398 A JP21693398 A JP 21693398A JP 2922508 B1 JP2922508 B1 JP 2922508B1
Authority
JP
Japan
Prior art keywords
probe
oblique
vertical
test material
vertical probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP10216933A
Other languages
Japanese (ja)
Other versions
JP2000046813A (en
Inventor
洋次 田中
貴章 石川
善己 福高
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp, Kawasaki Steel Corp filed Critical Mitsubishi Electric Corp
Priority to JP10216933A priority Critical patent/JP2922508B1/en
Application granted granted Critical
Publication of JP2922508B1 publication Critical patent/JP2922508B1/en
Publication of JP2000046813A publication Critical patent/JP2000046813A/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/023Solids
    • G01N2291/0234Metals, e.g. steel
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

【要約】 【課題】 この発明は丸棒等の被検材の全断面を検査
し、特に表面直下に存在する欠陥の深さと円周方向の位
置を精度良く検出するための鉄鋼ラインで使用される自
動超音波探傷装置を提供することを目的としている。 【解決手段】 垂直探触子の両側に配置される1対の斜
角探触子と、各探触子の送受信部を制御する送受信制御
部を備え、さらに斜角探触子の垂直探触子の主ビームが
通過する側に吸音材を設け、垂直探触子の被検材と対向
する側に斜め板と、上記斜め板の垂直探触子の主ビーム
が通過する領域以外の周囲に吸音材とを備えたものであ
る。
The present invention is used in a steel line for inspecting the entire cross section of a test material such as a round bar, and particularly for accurately detecting the depth and the circumferential position of a defect existing immediately below a surface. It is an object of the present invention to provide an automatic ultrasonic flaw detector. SOLUTION: A pair of oblique probes arranged on both sides of a vertical probe, a transmission / reception control unit for controlling a transmission / reception unit of each probe, and a vertical probe of the oblique probe A sound absorbing material is provided on the side where the main beam of the probe passes, and the oblique plate on the side of the vertical probe facing the test material, around the area other than the area where the main beam of the vertical probe of the diagonal plate passes It is provided with a sound absorbing material.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は鉄鋼ラインの中で
も特に断面形状が円柱状のビレット、棒材等の内部に存
在するきずをオンラインで検査するための自動超音波探
傷装置の改良に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement in an automatic ultrasonic flaw detector for online inspection of flaws existing in a billet, a bar or the like having a columnar cross section in a steel line. .

【0002】[0002]

【従来の技術】図5(a)は従来の自動超音波探傷装置
における探触子ホルダー部の探触子配列を示す丸棒材の
軸長断面図、図5(b)は探触子ホルダー部の垂直探触
子部の円周断面図、図5(c)は探触子ホルダー部の第
1の斜角探触子部の円周断面図、図5(d)は探触子ホ
ルダー部の第2の斜角探触子部の円周断面図である。図
において1は丸棒等の被検材、2は被検材1の中心に対
して超音波を送受信する垂直探触子、3は被検材1の回
転方向Bと対向する方向に斜めに超音波を送受信する第
1の斜角探触子、4は被検材1の回転方向Bと同一方向
に斜めに超音波を送受信する第2の斜角探触子、5は上
記垂直探触子2と斜角探触子3、4を所定の位置で固定
する探触子ホルダー、6は探触子ホルダー5の被検材1
と対向面に備えられて被検材1表面に当接するシュー、
7は水等から成る接触媒質、8は被検材1の略中心に存
在する欠陥、9は被検材1の表面付近に存在する欠陥、
10は垂直探触子2で得られる探傷図形、11は第1の
斜角探触子3で得られる探傷図形、12は第2の斜角探
触子4で得られる探傷図形、GIは垂直探触子2で検出
する領域を限定するゲート、GA1は第1の斜角探触子
3で検出する領域を限定するゲート、GA2は第2の斜
角探触子3で検出する領域を限定するゲート、TIは垂
直探触子2の送信パルス、SIは垂直探触子2における
被検材1表面からの表面エコー、FIは被検材1の略中
心に存在する欠陥8からの欠陥エコー、BIは被検材1
の底面から反射する底面エコー、TA1は第1の斜角探
触子2の送信パルス、SA1は第1の斜角探触子におけ
る被検材1表面からの表面エコー、TA2は第2の斜角
探触子の送信パルス、SA2は第2の斜角探触子におけ
る被検材1表面からの表面エコー、FAは被検材1の表
面付近に存在する欠陥9からの欠陥エコー、イは垂直探
触子2で生じる端部未探傷領域、ロは第1の斜角探触子
3で生じる端部未探傷領域、ハは第2の斜角探触子で生
じる端部未探傷領域である。
2. Description of the Related Art FIG. 5 (a) is an axially sectional view of a round bar showing a probe arrangement of a probe holder portion in a conventional automatic ultrasonic flaw detector, and FIG. 5 (b) is a probe holder. 5 (c) is a circumferential cross-sectional view of a first angle beam probe part of the probe holder part, and FIG. 5 (d) is a probe holder. FIG. 7 is a circumferential cross-sectional view of a second oblique probe section of the section. In the figure, 1 is a test material such as a round bar, 2 is a vertical probe that transmits and receives ultrasonic waves to and from the center of the test material 1, and 3 is an oblique direction in a direction opposite to the rotation direction B of the test material 1. A first angle beam probe for transmitting and receiving ultrasonic waves, 4 is a second angle beam probe for transmitting and receiving ultrasonic waves obliquely in the same direction as the rotation direction B of the test material 1, and 5 is the vertical probe. A probe holder for fixing the probe 2 and the angled probes 3 and 4 at predetermined positions;
And a shoe provided on the facing surface and abutting against the surface of the test material 1;
7 is a couplant made of water or the like, 8 is a defect existing substantially at the center of the test material 1, 9 is a defect existing near the surface of the test material 1,
10 is a flaw detection pattern obtained by the vertical probe 2, 11 is a flaw detection pattern obtained by the first angle beam probe 3, 12 is a flaw detection pattern obtained by the second angle beam probe 4, and GI is a vertical pattern. A gate for limiting an area to be detected by the probe 2, a gate GA1 for limiting an area to be detected by the first oblique probe 3, and a GA2 for an area to be detected by the second oblique probe 3. , TI is a transmission pulse of the vertical probe 2, SI is a surface echo from the surface of the test material 1 in the vertical probe 2, and FI is a defect echo from a defect 8 existing substantially at the center of the test material 1. , BI is the test material 1
, TA1 is the transmission pulse of the first oblique probe 2, SA1 is the surface echo from the surface of the test piece 1 at the first oblique probe, and TA2 is the second oblique. A transmission pulse of the angle probe, SA2 is a surface echo from the surface of the test piece 1 in the second oblique probe, FA is a defect echo from a defect 9 existing near the surface of the test piece 1, and A is An end non-detection area generated by the vertical probe 2, an end non-detection area generated by the first angle probe 3, and an end undetection area generated by the second angle probe. is there.

【0003】従来の自動超音波探傷装置は図5(a)の
ように構成されており、垂直探触子2と斜角探触子3、
4のそれぞれの入射点が被検材1の軸長方向の表面で同
一線上になるように垂直探触子2と第1の斜角探触子3
と第2の斜角探触子4がそれぞれが探触子ホルダー5に
固定され、探触子ホルダー5の被検材1と対向する面に
設けられたシュー6は被検材1の直径に応じて交換する
ことにより、それぞれの探触子2、3、4の入射点位置
が大きく変化しないようにしている。上記に示すそれぞ
れの探触子2、3、4の配列条件のもとで探触子ホルダ
ー5は被検材1表面上を矢印Aの方向に移動しながら探
傷試験を行うと、例えば被検材1の先端側で探触子ホル
ダー5を被検材1の端部に接材させると垂直探触子2に
は端部未探傷領域イがわずかに生じ、第1の斜角探触子
3には端部未探傷領域イより広い端部未探傷領域ロが生
じ、さらに第2の斜角探触子4では端部未探傷領域ロよ
り広い端部未探傷領域ハが生じる。すなわち、被検材1
を全断面にわたって探傷できない探部未探傷領域ハが被
検材1の先端側と後端側の両方に発生することになる。
さらに、垂直探触子2と第1の斜角探触子3と第2の斜
角探触子4が被検材1の軸長方向に並んで寸法が大きく
なっているため、被検材1の軸長方向における表面の凹
凸や曲りに対して探触子ホルダー5に備えられたシュー
6が密着できない状態がしばしば発生し、探傷結果が不
安定になることが生じる。
[0003] A conventional automatic ultrasonic flaw detector is configured as shown in FIG. 5 (a), and comprises a vertical probe 2, an oblique probe 3,
The vertical probe 2 and the first oblique probe 3 are so arranged that the respective incident points 4 are on the same line on the surface of the test material 1 in the axial direction.
And the second angled probe 4 are respectively fixed to the probe holder 5, and the shoe 6 provided on the surface of the probe holder 5 facing the test material 1 has a diameter of the test material 1. By exchanging accordingly, the position of the incident point of each of the probes 2, 3, and 4 does not significantly change. When the probe holder 5 performs the flaw detection test while moving in the direction of the arrow A on the surface of the test piece 1 under the arrangement conditions of the probes 2, 3, and 4 shown above, for example, When the probe holder 5 is brought into contact with the end of the test material 1 on the tip side of the material 1, the vertical probe 2 slightly has an end undetected flaw area A, and the first angle beam probe 3 has an end undetected area B wider than the end undetected area A, and the second oblique probe 4 has an end undetected area C wider than the end undetected area B. That is, the test material 1
The undetected area c in which the flaw cannot be detected over the entire cross section occurs on both the front end side and the rear end side of the test sample 1.
Further, since the vertical probe 2, the first oblique probe 3, and the second oblique probe 4 are arranged in the axial direction of the test material 1 and have large dimensions, the test material is large. A state in which the shoe 6 provided on the probe holder 5 cannot adhere to irregularities or bends on the surface in the axial direction often occurs, and the flaw detection result becomes unstable.

【0004】また、従来の自動超音波探傷装置は上記の
ように構成されており、垂直探触子2から送信された超
音波は接触媒質7を経由して被検材1表面に到達し、一
部は垂直探触子2に反射して表面エコーSIとして受信
され、被検材1内部に透過した超音波は被検材1の底面
に向かって伝搬し、途中の経路に欠陥8が存在する時に
は欠陥8からの反射波が欠陥エコーFIとして垂直探触
子2に受信され、さらに進んだ超音波は被検材1の底面
に到達して底面エコーBIとして垂直探触子2に受信さ
れる。この時、欠陥信号の検出範囲はゲートGIの設定
により決定され、一般的には垂直探触子2では被検材1
の直径の約10%に相当する寸法を表面側から除いた内
部の範囲を検査範囲としている。一方、斜角探触子3、
4から送信された超音波は接触媒質7を経由して被検材
1表面に到達し、一部は斜角探触子3、4に反射して表
面エコーSA1、SA2として受信され、被検材1内部
に透過した超音波は被検材1の側面に向かって伝搬し、
途中の経路に欠陥9が存在する時には欠陥9からの反射
波が欠陥エコーFAとして第2の斜角探触子4に受信さ
れる。第1の斜角探触子3と第2の斜角探触子4は上記
垂直探触子2の検査範囲外の表面付近部だけが検査範囲
となるようにゲートGA1、GA2が設定される。ま
た、第1の斜角探触子3と第2の斜角探触子4はそれぞ
れ被検材1に対して超音波の入射方向が異なる様に配置
されており、傾いた欠陥で超音波の反射特性に偏りがあ
ってもどちらかの斜角探触子3、4で確実に欠陥9を検
出できるようになっている。尚、上記垂直探触子2と第
1の斜角探触子3と第2の斜角探触子4は被検材1の軸
長方向にずれて配置されているため相互の超音波の干渉
は生じないので同時に送受信することができる。
Further, the conventional automatic ultrasonic flaw detector is configured as described above, and the ultrasonic wave transmitted from the vertical probe 2 reaches the surface of the test material 1 via the couplant 7, A part of the ultrasonic wave is reflected by the vertical probe 2 and received as a surface echo SI, and the ultrasonic wave transmitted inside the test material 1 propagates toward the bottom surface of the test material 1, and a defect 8 exists on a path along the way. In this case, the reflected wave from the defect 8 is received by the vertical probe 2 as a defect echo FI, and the further advanced ultrasonic wave reaches the bottom surface of the test piece 1 and is received by the vertical probe 2 as a bottom surface echo BI. You. At this time, the detection range of the defect signal is determined by the setting of the gate GI.
The inside range excluding a dimension corresponding to about 10% of the diameter from the surface side is defined as the inspection range. On the other hand, bevel probe 3,
The ultrasonic wave transmitted from the probe 4 reaches the surface of the test material 1 via the couplant 7 and a part of the ultrasonic wave is reflected on the oblique probes 3 and 4 and received as surface echoes SA1 and SA2. The ultrasonic wave transmitted inside the material 1 propagates toward the side surface of the test material 1,
When the defect 9 is present on the way along the way, the reflected wave from the defect 9 is received by the second angle beam probe 4 as a defect echo FA. The gates GA1 and GA2 of the first angle beam probe 3 and the second angle beam probe 4 are set so that only the vicinity of the surface outside the inspection range of the vertical probe 2 becomes the inspection range. . Further, the first angle beam probe 3 and the second angle beam probe 4 are arranged so that the directions of incidence of ultrasonic waves to the test material 1 are different from each other. Defect 9 can be reliably detected by one of the oblique probes 3 and 4 even if the reflection characteristics of the laser beam are biased. The vertical probe 2, the first oblique probe 3, and the second oblique probe 4 are arranged so as to be shifted from each other in the axial direction of the test sample 1. Since there is no interference, transmission and reception can be performed simultaneously.

【0005】[0005]

【発明が解決しようとする課題】従来の自動超音波探傷
装置では欠陥8、9の存在位置の大まかな識別は垂直探
触子2で受信された欠陥エコーFIは被検材1の内部側
として、斜角探触子3、4で受信された欠陥エコーFA
は表面付近としているだけなので、特に表面付近におい
ては表面下何mmの深さに欠陥が存在するかの定量的寸
法の把握と円周断面上の位置の把握は斜角探触子3、4
の超音波の広がりの影響で精度良くできないため、次工
程のグラインダー手入れが効率的にできないと言う課題
があった。
In the conventional automatic ultrasonic flaw detector, the existence positions of the defects 8 and 9 are roughly identified by using the defect echo FI received by the vertical probe 2 as the inside of the test material 1. Echoes FA received by the angle probes 3 and 4
Is only near the surface, and especially in the vicinity of the surface, it is necessary to know the depth of the defect at a depth of several mm below the surface, and to determine the quantitative dimensions and the position on the circumferential cross section.
However, there is a problem that the grinder in the next step cannot be efficiently maintained because the ultrasonic wave cannot be spread accurately.

【0006】また、垂直探触子2と斜角探触子3、4が
それぞれ被検材1の軸長方向に並んで配列されているた
め、探触子ホルダー5の長さが長くなり、被検材1の軸
長方向の凹凸、曲りに対して各探触子2、3、4の姿勢
を安定に保つことが難しいという課題があった。
Further, since the vertical probe 2 and the oblique probes 3 and 4 are arranged side by side in the axial direction of the test material 1, the length of the probe holder 5 becomes longer. There is a problem that it is difficult to stably maintain the posture of each of the probes 2, 3, and 4 with respect to unevenness and bending in the axial direction of the test material 1.

【0007】また、垂直探触子2と斜角探触子3、4が
それぞれ被検材1の軸長方向に並んで配列されているた
め、探触子ホルダー5の長さが長くなり、被検材1の先
端と後端における端部未探傷領域ハが小さくならないと
いう課題があった。
Further, since the vertical probe 2 and the oblique probes 3 and 4 are arranged side by side in the axial direction of the test material 1, the length of the probe holder 5 becomes longer. There is a problem that the end undetected area c at the front end and the rear end of the test material 1 does not become small.

【0008】この発明はかかる課題を解決するためにな
されたものであり、被検材表面付近に存在する欠陥の深
さと円周断面上の位置を精度良く検出でき、さらに探触
子ホルダーの長さを短くすることにより各探触子の姿勢
の安定性と被検材1の先端と後端における端部未探傷領
域を小さくする自動超音波探傷装置を提供することを目
的としている。
SUMMARY OF THE INVENTION The present invention has been made to solve such a problem, and can accurately detect the depth of a defect existing near the surface of a test material and the position on a circumferential cross section. It is an object of the present invention to provide an automatic ultrasonic flaw detector that reduces the length of each probe, thereby reducing the stability of the posture of each probe and the undetected end area at the front and rear ends of the test sample 1.

【0009】[0009]

【課題を解決するための手段】この発明における自動超
音波探傷装置においては、被検材の同一円周断面上に被
検材の直径の四分の一以上の水距離を設けた位置に配置
した垂直探触子と、上記垂直探触子の主ビームの両側に
第1の斜角探触子と第2の斜角探触子と、上記垂直探触
子に接続される送受信部と、第1の斜角探触子に接続さ
れる送受信部と、第2の斜角探触子に接続される送受信
部と、それぞれの送受信部を制御する送受信制御部とを
設けたものである。
In the automatic ultrasonic flaw detector according to the present invention, the test piece is disposed at a position on the same circumferential cross section of the test piece having a water distance of not less than a quarter of the diameter of the test piece. A vertical probe, a first bevel probe and a second bevel probe on both sides of a main beam of the vertical probe, and a transmitting / receiving unit connected to the vertical probe, A transmission / reception unit connected to the first angle beam probe, a transmission / reception unit connected to the second angle beam probe, and a transmission / reception control unit for controlling the respective transmission / reception units are provided.

【0010】また、第1の斜角探触子と第2の斜角探触
子の垂直探触子の主ビーム側に対向した面に吸音材を設
けたものである。
In addition, a sound absorbing material is provided on a surface of the vertical probe of the first angle beam probe and the second angle beam probe facing the main beam side.

【0011】また、垂直探触子の被検材表面に対向する
側に垂直探触子の主ビーム通過範囲以外に吸音材を備え
たアクリル材から成る斜め板を設けたものである。
Further, an oblique plate made of an acrylic material provided with a sound absorbing material is provided on the side of the vertical probe facing the surface of the test piece, in addition to the main beam passage area of the vertical probe.

【0012】[0012]

【発明の実施の形態】実施の形態1.図1、図2、及び
表1はこの発明の実施の形態1を示す自動超音波探傷装
置を示す図・表で、図1は探触子ホルダーと探触子の配
置と送受信制御部を示す図である。図2(a)は各探触
子の送受信のタイミングと探傷図形を示す図である。図
2(b)は垂直探触子と斜角探触子による二探触子法を
示す図である。表1は各探触子に接続される送信部と受
信部の動作状況を示す表である。図において1〜12は
従来の装置と同じであり、13は垂直探触子2用の垂直
送信部、14は垂直探触子2用の垂直受信部、15は第
1の斜角探触子3用の第1斜角送信部、16は第1の斜
角探触子3用の第1斜角受信部、17は第2の斜角探触
子4用の第2斜角送信部、18は第2の斜角探触子4用
の第2斜角受信部、19は上記各送受信部13から18
を制御する送受信制御部、20は垂直探触子2の主ビー
ム、21は第1のタイミング、22は第2のタイミン
グ、23は垂直探触子2と第1の斜角探触子3間による
二探触子法による探傷図形、24は垂直探触子2と第2
の斜角探触子4間による二探触子法による探傷図形、F
IAは二探触子法により検出される欠陥エコー、GIA
1は垂直探触子2と第1の斜角探触子3間の二探触子法
による探傷範囲を限定するゲート、GIA2は垂直探触
子2と第2の斜角探触子4間の二探触子法による探傷範
囲を限定するゲートである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiment 1 1 and 2 and Table 1 are diagrams and tables showing an automatic ultrasonic flaw detector according to Embodiment 1 of the present invention. FIG. 1 shows the arrangement of a probe holder and a probe and a transmission / reception control unit. FIG. FIG. 2A is a diagram showing transmission / reception timing of each probe and a flaw detection pattern. FIG. 2B is a diagram showing a two-probe method using a vertical probe and an oblique probe. Table 1 is a table showing the operation status of the transmission unit and the reception unit connected to each probe. In the figure, 1 to 12 are the same as those of the conventional apparatus, 13 is a vertical transmission unit for the vertical probe 2, 14 is a vertical reception unit for the vertical probe 2, and 15 is a first angle beam probe. A first bevel transmitting unit for 3; 16 a first bevel receiving unit for the first bevel probe 3; 17 a second bevel transmitting unit for the second bevel probe 4; Reference numeral 18 denotes a second oblique angle receiving unit for the second oblique angle probe 4, and 19 denotes each of the transmitting / receiving units 13 to 18.
, 20 is the main beam of the vertical probe 2, 21 is the first timing, 22 is the second timing, and 23 is between the vertical probe 2 and the first oblique probe 3. Figure 24 shows the flaw detection pattern by the two probe method,
Flaws detected by the two-probe method between the oblique probes 4 of FIG.
IA is a defect echo detected by the two-probe method, GIA
Reference numeral 1 denotes a gate for limiting a flaw detection range between the vertical probe 2 and the first oblique probe 3 by the two-probe method, and GIA2 denotes a gate between the vertical probe 2 and the second oblique probe 4. This is a gate that limits the flaw detection range by the two-probe method.

【0013】上記のように構成された自動超音波探傷装
置では垂直探触子2が探触子ホルダー5の上面に取付け
られるのは従来の装置と同じであるが、第1の斜角探触
子3と第2の斜角探触子4が探触子ホルダー5の両側面
で、かつ垂直探触子2と同一断面内に取付けられている
ため、被検材1に探触子ホルダー5が接材した位置にお
いてそれぞれの探触子2、3、4に発生する被検材1端
部の端部未探傷領域イはいずれの探触子2、3、4でも
同じで、かつ先端側でも後端側でも必要最小限にでき
る。但し、このように垂直探触子2と斜角探触子3、4
を同一断面内に配置した状態で各探触子2、3、4を同
時に送受信すると、垂直探触子2から送信された超音波
が斜角探触子3、4に受信されたり、逆に斜角探触子
3、4で送信された超音波が垂直探触子2に受信された
りして欠陥8、9を未誤って検出する等の弊害をまねく
ため、上記誤検出を防止するため送受信制御部19が設
けられている。
In the automatic ultrasonic flaw detector constructed as described above, the vertical probe 2 is mounted on the upper surface of the probe holder 5 in the same manner as the conventional apparatus, but the first angle beam probe is used. Since the probe 3 and the second oblique probe 4 are mounted on both sides of the probe holder 5 and in the same cross section as the vertical probe 2, the probe holder 5 is attached to the test piece 1. In the position where the probe has contacted, the end undetected area a of the end of the test material 1 generated on each of the probes 2, 3, and 4 is the same for any of the probes 2, 3, and 4, and on the tip side. However, it can be minimized at the rear end. However, as described above, the vertical probe 2 and the oblique probes 3, 4
When the probes 2, 3, and 4 are simultaneously transmitted and received in a state in which they are arranged in the same cross section, the ultrasonic waves transmitted from the vertical probe 2 are received by the oblique probes 3, 4 or conversely. In order to prevent the ultrasonic waves transmitted by the angled probes 3 and 4 from being received by the vertical probe 2 and to detect the defects 8 and 9 erroneously, the above-described erroneous detection is prevented. A transmission / reception control unit 19 is provided.

【0014】すなわち、表1と図2(a)に示すよう
に、第1のタイミング21では第1の斜角探触子3に接
続される第1斜角送信部15と第1斜角受信部16と第
2の斜角探触子4に接続される第2斜角送信部17と第
2斜角受信部18を動作状態とし、上記斜角探触子3、
4が送受信している時間は垂直探触子2は停止状態と
し、斜角探触子3、4から送信された超音波が被検材1
の側面に到達して再び斜角探触子3、4に戻って受信さ
れるのに要する時間を経過してから斜角探触子3、4の
送受信を停止するように送受信制御部19が信号を出力
する。次に、第2のタイミング22で垂直探触子2に接
続される垂直送信部13と垂直受信部14を動作状態と
して第1の斜角探触子3に接続される第1斜角送信部1
5と第2の斜角探触子4に接続される第2斜角送信部1
7を停止状態とするように送受信制御部19が信号を出
力する。
That is, as shown in Table 1 and FIG. 2A, at the first timing 21, the first oblique transmission unit 15 and the first oblique reception unit connected to the first oblique probe 3 are used. The second oblique angle transmitting section 17 and the second oblique angle receiving section 18 connected to the section 16 and the second oblique angle probe 4 are put into an operating state,
The vertical probe 2 is in a stopped state during the transmission and reception by the probe 4, and the ultrasonic waves transmitted from the oblique probes 3 and 4 transmit
The transmission and reception control unit 19 stops transmission and reception of the oblique probes 3 and 4 after a lapse of time required to reach the side surface of the oblique probes 3 and 4 and to receive the signals again. Output a signal. Next, at the second timing 22, the vertical transmission unit 13 and the vertical reception unit 14 connected to the vertical probe 2 are put into the operating state, and the first angle transmission unit connected to the first angle probe 3 is set. 1
5 and the second bevel transmitter 1 connected to the second bevel probe 4
The transmission / reception control unit 19 outputs a signal so that 7 is in a stopped state.

【0015】また、上記垂直探触子2は被検材1の直径
寸法の約四分の一以上の距離を設けて探触子ホルダー5
の上面に取付けられ、上記垂直探触子2と被検材1との
スペースには水等の接触媒質7が満たされる。上記水等
の接触媒質7を伝搬する超音波の速度は被検材1(材
質:鋼)の約四分の一であるため、垂直探触子2と被検
材1との表面間距離は被検材1直径寸法の約四分の一以
上の距離を設けることにより底面エコーBIが発生する
時間より後方に被検材1表面からの第2回目の表面エコ
ーSI2が発生し、第2回目の表面エコーSI2がゲー
トGIの中に発生することはない。上記垂直探触子2が
送受信状態の時に第1の斜角探触子3に接される第1斜
角受信部16と第2の斜角探触子4に接続される第2斜
角受信部18を受信状態にする信号を送受信制御部から
出力すると、垂直探触子2と第1の斜角探触子3、及び
垂直探触子2と第2の斜角探触子4との間でそれぞれ二
探触子法の動作条件が成立する。二探触子法の特徴は表
面エコーSIA1、SIA2のレベルと持続時間を大幅
に縮小できる事にあり、その結果、被検材1の表面下4
mm程度の距離からの欠陥9検出が可能となる。また、
第1の斜角探触子と第2の斜角探触子は被検材1表面と
の間に数mmのギャップしか設けていないため、欠陥9
からの反射波が大幅に拡散しない位置で受信でき、上記
二探触子法で受信可能な条件は垂直探触子2の真下から
それぞれの斜角探触子3、4の入射点までのわずかな範
囲に限定でき、表面付近に存在する欠陥9の深さはもち
ろんであるが、被検材1の円周位置も正確に検出でき
る。
Further, the vertical probe 2 is provided with a distance of at least about one-fourth of the diameter of the test material 1 and the probe holder 5.
The space between the vertical probe 2 and the test material 1 is filled with a couplant 7 such as water. Since the velocity of the ultrasonic wave propagating through the couplant 7 such as water is about a quarter of that of the test material 1 (material: steel), the distance between the surfaces of the vertical probe 2 and the test material 1 is By providing a distance of about one-quarter or more of the diameter of the test material 1, a second surface echo SI2 from the surface of the test material 1 is generated behind the time when the bottom echo BI is generated, and the second test is performed. Does not occur in the gate GI. When the vertical probe 2 is in the transmission / reception state, the first bevel receiver 16 is in contact with the first bevel probe 3 and the second bevel receiver is connected to the second bevel probe 4. When a signal for bringing the unit 18 into the receiving state is output from the transmission / reception control unit, the vertical probe 2 and the first oblique probe 3 and the vertical probe 2 and the second oblique probe 4 The operating conditions of the two-probe method are respectively satisfied between them. The feature of the two-probe method is that the level and the duration of the surface echoes SIA1 and SIA2 can be greatly reduced.
The defect 9 can be detected from a distance of about mm. Also,
Since the first angle beam probe and the second angle beam probe have a gap of only a few mm between the surface of the test piece 1 and the defect 9
Can be received at a position where the reflected wave from the probe does not greatly diffuse, and the conditions that can be received by the above-described two-probe method are a little from the point directly below the vertical probe 2 to the incident point of each of the oblique probes 3 and 4. It is possible to accurately detect not only the depth of the defect 9 near the surface but also the circumferential position of the test material 1.

【0016】実施の形態2.図3はこの発明による実施
の形態2を示す自動探傷装置の探触子と探触子ホルダー
の断面図である。図において1〜7は従来と同じであ
る。25は垂直探触子2から放射されるサイドローブ、
26はゴム状の吸音材である。
Embodiment 2 FIG. 3 is a sectional view of a probe and a probe holder of an automatic flaw detector according to a second embodiment of the present invention. In the figure, reference numerals 1 to 7 are the same as those in the related art. 25 is a side lobe emitted from the vertical probe 2,
26 is a rubber-like sound absorbing material.

【0017】この発明による探触子ホルダー5への斜角
探触子3、4の取付け位置は垂直探触子2の超音波ビー
ムが通過する接触媒質7内となり、垂直探触子2の主ビ
ーム20の外側に配置してもサイドローブ25等の低い
レベルの超音波成分が垂直探触子2の両側に配置された
斜角探触子3、4の面に到達するのを防ぐことはできな
い。上記斜角探触子3、4からの反射波は垂直探触子2
の送受信条件に対して固定的なノイズ源となるため、斜
角探触子3、4の面には超音波が反射するのを防止する
ためのゴム状の弾性体からなる吸音材26をそれぞれ設
けてある。従ってこの条件のもとで垂直探触子を動作さ
せても斜角探触子3、4はノイズ源とはならず、S/N
比の高い探傷条件が確保できる。
The position where the oblique probes 3 and 4 are attached to the probe holder 5 according to the present invention is in the couplant 7 through which the ultrasonic beam of the vertical probe 2 passes, and the main position of the vertical probe 2 is Even if it is arranged outside the beam 20, it is possible to prevent a low level ultrasonic component such as the side lobe 25 from reaching the surfaces of the oblique probes 3, 4 arranged on both sides of the vertical probe 2. Can not. The reflected waves from the oblique probes 3 and 4 are reflected by the vertical probe 2
A sound absorbing material 26 made of a rubber-like elastic body for preventing ultrasonic waves from being reflected is provided on the surfaces of the oblique probes 3 and 4 because the noise sources are fixed to the transmission / reception conditions. It is provided. Therefore, even if the vertical probe is operated under this condition, the oblique probes 3 and 4 do not become a noise source and the S / N
High flaw detection conditions can be secured.

【0018】実施の形態3.図4はこの発明による実施
の形態3を示す自動探傷装置の探触子と探触子ホルダー
の断面図である。図において1〜7は従来と同じであ
る。27はアクリルで構成される斜め板、28は斜め板
に設けられた吸音材である。
Embodiment 3 FIG. 4 is a sectional view of a probe and a probe holder of an automatic flaw detector according to a third embodiment of the present invention. In the figure, reference numerals 1 to 7 are the same as those in the related art. 27 is a diagonal plate made of acrylic, and 28 is a sound absorbing material provided on the diagonal plate.

【0019】この発明による垂直探触子2と斜角探触子
3、4の配列では上記に述べたようにそれぞれの探触子
2、3、4を同時に送受信できないため、送信繰返し周
波数を高くできないという制約が生じる。中でも垂直探
触子2では超音波の減衰が少ない接触媒質7中を何回も
往復して現れる表面エコーSIの多重反射波が最大の制
約条件となるため、上記表面エコーSIの多重反射波の
レベルを強制的に低下させるためのアクリル樹脂から成
る斜め板27を垂直探触子2の主ビーム20の通過範囲
内に備えている。上記斜め板27を通過する超音波は縦
波を通過させずに横波だけを通過させる条件として超音
波が被検材1に放射される軸に対して約45゜位の角度
を有して探触子ホルダー5に固定され、垂直探触子2の
主ビーム20が通過する幅以外の部分にはゴム状の弾性
体から成る吸音材28が設けられている。従って、垂直
探触子2から放射される超音波のサイドローブ25や、
主ビーム20が被検材1表面から反射して上記斜め板2
4の周辺部に到達して再び垂直探触子2に戻り、妨害エ
コーとなるのを防止できる。
In the arrangement of the vertical probe 2 and the oblique probes 3 and 4 according to the present invention, since the respective probes 2, 3 and 4 cannot be transmitted and received simultaneously as described above, the transmission repetition frequency is increased. There is a restriction that it cannot be done. Above all, in the vertical probe 2, the multiple reflection wave of the surface echo SI that appears to be reciprocated many times in the couplant 7 where the ultrasonic wave is less attenuated is the maximum constraint condition. An oblique plate 27 made of an acrylic resin for forcibly lowering the level is provided in a range where the main beam 20 of the vertical probe 2 passes. The ultrasonic wave passing through the diagonal plate 27 has an angle of about 45 ° with respect to the axis from which the ultrasonic wave is radiated to the test piece 1 under the condition that only the transverse wave passes without passing the longitudinal wave. A sound absorbing material 28 made of a rubber-like elastic body is provided at a portion other than the width of the vertical probe 2 other than the main beam 20 and fixed to the probe holder 5. Therefore, the side lobe 25 of the ultrasonic wave radiated from the vertical probe 2,
The main beam 20 is reflected from the surface of the test material 1 and
4 and returns to the vertical probe 2 again, thereby preventing interference echo.

【0020】[0020]

【発明の効果】この発明は、上記説明したように構成さ
れているので、以下に記載されるような効果を有する。
Since the present invention is configured as described above, it has the following effects.

【0021】探触子ヘッド内の垂直探触子と第1の斜角
探触子と第2の斜角探触子とを被検材の同一断面内に配
置して、各探触子に接続される送受信部の動作状況をコ
ントロールする送受信制御部を備えることにより、被検
材の先端と後端における端部未探傷領域を小さくでき、
さらに垂直探触子と斜角探触子間による二探触子法を実
現させることにより、表面直下に存在する欠陥の深さと
円周方向の位置を精度良く検出でき、その結果、後工程
における表面欠陥、及び表面直下に存在する欠陥を除去
するグラインダー手入れを効率良く作業できる。
The vertical probe, the first oblique probe, and the second oblique probe in the probe head are arranged in the same cross section of the test piece, and each probe is By including a transmission and reception control unit that controls the operation status of the connected transmission and reception unit, it is possible to reduce the end undetected areas at the front and rear ends of the test material,
Furthermore, by realizing the two-probe method between the vertical probe and the oblique probe, it is possible to accurately detect the depth and circumferential position of a defect existing immediately below the surface, and as a result, It is possible to efficiently perform grinder care for removing surface defects and defects existing immediately below the surface.

【0022】また、垂直探触子の主ビームが通過する領
域に面した第1の斜角探触子と第2の斜角探触子のそれ
ぞれの面に吸音材を設けているため、垂直探触子から放
射されるサイドローブの反射波等が妨害エコーとなら
ず、S/N比の高い探傷試験が可能となる。
Further, since the sound absorbing material is provided on each surface of the first angle beam probe and the second angle beam probe facing the region where the main beam of the vertical probe passes, Reflected waves and the like of side lobes emitted from the probe do not become disturbing echoes, thereby enabling a flaw detection test with a high S / N ratio.

【0023】また、垂直探触子の超音波ビームが通過す
る領域に斜め板を設け、上記斜め板の垂直探触子の主ビ
ームが通過する範囲の外側部分に吸音材を設けているた
め、垂直探触子で得られる被検材表面の表面エコーの多
重反射回数を大幅に低減させて送信繰返し周波数を高く
できることにより、高速での探傷試験が可能となると同
時に、主ビーム以外のサイドローブを斜め板に設けられ
た吸音材で吸収できるため、S/N比を大幅に向上でき
る。
In addition, since an oblique plate is provided in a region where the ultrasonic beam of the vertical probe passes, and a sound absorbing material is provided outside a range where the main beam of the vertical probe of the oblique plate passes, By greatly reducing the number of multiple reflections of the surface echo on the surface of the test material obtained by the vertical probe and increasing the transmission repetition frequency, high-speed flaw detection can be performed and at the same time, side lobes other than the main beam are reduced. Since it can be absorbed by the sound absorbing material provided on the oblique plate, the S / N ratio can be greatly improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 この発明の実施の形態1の自動超音波探傷装
置の探触子の配置と送受信制御部を示す図である。
FIG. 1 is a diagram showing an arrangement of a probe and a transmission / reception control unit of an automatic ultrasonic flaw detector according to Embodiment 1 of the present invention.

【図2】 この発明の実施の形態1の自動超音波探傷装
置における各探触子の送受信タイミングと探傷図形を示
す図である。
FIG. 2 is a diagram showing transmission / reception timings of each probe and a flaw detection pattern in the automatic ultrasonic flaw detector according to Embodiment 1 of the present invention;

【図3】 この発明の実施の形態2の自動超音波探傷装
置を示す断面図である。
FIG. 3 is a sectional view showing an automatic ultrasonic flaw detector according to Embodiment 2 of the present invention;

【図4】 この発明の実施の形態3の自動超音波探傷装
置を示す断面図である。
FIG. 4 is a sectional view showing an automatic ultrasonic flaw detector according to Embodiment 3 of the present invention.

【図5】 従来の自動超音波探傷装置を示す断面図であ
る。
FIG. 5 is a cross-sectional view showing a conventional automatic ultrasonic flaw detector.

【表1】 [Table 1]

【符号の説明】[Explanation of symbols]

1 被検材、2 垂直探触子、3 第1の斜角探触子、
4 第2の斜角探触子、13 垂直送信部、14 垂直
受信部、15 第1斜角送信部、16 第1斜角受信
部、17 第2斜角送信部、18 第2斜角受信部、1
9 送受信制御部、26 斜角探触子吸音材、27 斜
め板、28 斜め板吸音材。
1 test material, 2 vertical probe, 1st angle beam probe,
4 second oblique probe, 13 vertical transmitting section, 14 vertical receiving section, 15 first oblique transmitting section, 16 first oblique receiving section, 17 second oblique transmitting section, 18 second oblique receiving section Part 1
9 Transmission / reception control unit, 26 bevel probe sound absorbing material, 27 diagonal plate, 28 diagonal plate sound absorbing material.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 福高 善己 岡山県倉敷市水島川崎通1丁目(番地な し) 川崎製鉄株式会社 水島製鉄所内 (56)参考文献 特開 平2−44246(JP,A) 特開 平1−195359(JP,A) 特開 昭61−44349(JP,A) 実開 昭61−54266(JP,U) (58)調査した分野(Int.Cl.6,DB名) G01N 29/00 - 29/28 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Yoshimi Fukutaka 1-chome, Mizushima-Kawasaki-dori, Kurashiki-shi, Okayama Pref. Kawasaki Steel Corporation Mizushima Works (56) A) JP-A-1-195359 (JP, A) JP-A-61-44349 (JP, A) JP-A-61-54266 (JP, U) (58) Fields investigated (Int. Cl. 6 , DB name) ) G01N 29/00-29/28

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 円柱状の被検材中心に対して垂直に超音
波を送受信する垂直探触子と、上記被検材に斜めに超音
波を送受信する斜角探触子を備えて被検材の内部に存在
するきずをオンラインで検査する自動超音波探傷装置に
おいて、1個の探触子ホルダーと上記探触子ホルダーの
被検材中心の延長線上で被検材表面から被検材直径の四
分の一以上の距離を設けた位置の探触子ホルダー上面に
配置される垂直探触子と、上記垂直探触子の主ビームの
両外側で、かつ被検材の軸長方向位置は上記垂直探触子
と同一位置として被検材表面との隙間が数mmのギャッ
プを設けた位置で探触子ホルダーの両側面に配置される
1対の斜角探触子と、上記垂直探触子を駆動する垂直送
信部と、垂直探触子の受信信号を増幅処理する垂直受信
部と、上記1対の斜角探触子をそれぞれ駆動する第1斜
角送信部と、第2斜角送信部と、1対のそれぞれの斜角
探触子の受信信号を増幅処理する第1斜角受信部と、第
2斜角受信部と、上記垂直送信部と垂直受信部と第1斜
角送信部と第2斜角送信部と第1斜角受信部と第2斜角
受信部のそれぞれを制御する送受信制御部とを備えたこ
とを特徴とする自動超音波探傷装置。
1. A test device comprising: a vertical probe for transmitting and receiving ultrasonic waves perpendicular to a center of a columnar test material; and an oblique probe for transmitting and receiving ultrasonic waves to the test material obliquely. In an automatic ultrasonic flaw detector that inspects the flaws existing inside the material online, one probe holder and the diameter of the material to be inspected from the surface of the material to be inspected on the extension line of the center of the material to be inspected. A vertical probe arranged on the upper surface of the probe holder at a position provided with a distance of not less than one-fourth of the length of the main beam of the vertical probe, and an axial position of the test material Is a pair of oblique probes arranged on both sides of the probe holder at the same position as the vertical probe and a gap of several mm from the surface of the test material; A vertical transmitting unit that drives the probe, a vertical receiving unit that amplifies and processes the received signal of the vertical probe, A first oblique transmission unit that drives each of the angle probes, a second oblique angle transmission unit, a first oblique angle reception unit that amplifies a reception signal of each of the pair of oblique angle probes, Transmission / reception control for controlling each of the two oblique reception units, the vertical transmission unit, the vertical reception unit, the first oblique transmission unit, the second oblique transmission unit, the first oblique reception unit, and the second oblique reception unit And an automatic ultrasonic flaw detector.
【請求項2】 上記斜角探触子の探触子ホルダーの内面
側で、垂直探触子の主ビームに面した露出面部に吸音効
果の高いゴム等の吸音材を備えたことを特徴とする請求
項1記載の自動超音波探傷装置。
2. A sound absorbing material such as rubber having a high sound absorbing effect is provided on the exposed surface of the vertical probe facing the main beam on the inner surface side of the probe holder of the angle beam probe. The automatic ultrasonic flaw detector according to claim 1.
【請求項3】 上記垂直探触子と被検材表面間にアクリ
ル材から成る斜め板と、上記斜め板の垂直探触子の主ビ
ーム通過範囲の両外側部にゴム等の吸音材を設けたこと
を特徴とする請求項1記載の自動超音波探傷装置。
3. An oblique plate made of an acrylic material is provided between the vertical probe and the surface of the test material, and a sound absorbing material such as rubber is provided on both outer sides of the main beam passing range of the vertical probe of the oblique plate. The automatic ultrasonic flaw detector according to claim 1, wherein:
JP10216933A 1998-07-31 1998-07-31 Automatic ultrasonic flaw detector Expired - Fee Related JP2922508B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10216933A JP2922508B1 (en) 1998-07-31 1998-07-31 Automatic ultrasonic flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10216933A JP2922508B1 (en) 1998-07-31 1998-07-31 Automatic ultrasonic flaw detector

Publications (2)

Publication Number Publication Date
JP2922508B1 true JP2922508B1 (en) 1999-07-26
JP2000046813A JP2000046813A (en) 2000-02-18

Family

ID=16696210

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10216933A Expired - Fee Related JP2922508B1 (en) 1998-07-31 1998-07-31 Automatic ultrasonic flaw detector

Country Status (1)

Country Link
JP (1) JP2922508B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009084508A1 (en) * 2007-12-27 2009-07-09 Showa Denko K.K. Ultrasonic flaw detection method for cast stick and ultrasonic flaw detection device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4735163B2 (en) * 2005-09-28 2011-07-27 Jfeスチール株式会社 Ultrasonic flaw detection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009084508A1 (en) * 2007-12-27 2009-07-09 Showa Denko K.K. Ultrasonic flaw detection method for cast stick and ultrasonic flaw detection device
JP2009156755A (en) * 2007-12-27 2009-07-16 Showa Denko Kk Method and device for ultrasonically detecting flaw in cast rod

Also Published As

Publication number Publication date
JP2000046813A (en) 2000-02-18

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