JP2809713B2 - Copper alloy rolled foil for flexible printing - Google Patents
Copper alloy rolled foil for flexible printingInfo
- Publication number
- JP2809713B2 JP2809713B2 JP16022289A JP16022289A JP2809713B2 JP 2809713 B2 JP2809713 B2 JP 2809713B2 JP 16022289 A JP16022289 A JP 16022289A JP 16022289 A JP16022289 A JP 16022289A JP 2809713 B2 JP2809713 B2 JP 2809713B2
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- Prior art keywords
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- copper alloy
- flexible printing
- foil
- plating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Description
【発明の詳細な説明】 [産業上の利用分野] 本発明は、フレキシブルプリント用銅合金圧延箔に係
り、詳細には、たとえば、プリント回路、テープキャリ
ヤなどの配線回路に使用されるフレキシブルプリント用
銅合金圧延箔に関するものである。さらに詳しくは、極
微細加工性、Snめっき被覆時の耐ウイスカ性、耐熱性お
よび導電性に優れるフレキシブルプリント用銅合金圧延
箔に関するものである。Description: FIELD OF THE INVENTION The present invention relates to a rolled copper alloy foil for flexible printing, and more particularly, to a flexible printed copper foil used for wiring circuits such as printed circuits and tape carriers. The present invention relates to a rolled copper alloy foil. More specifically, the present invention relates to a rolled copper alloy foil for flexible printing which is excellent in ultrafine workability, whisker resistance when coated with Sn plating, heat resistance and conductivity.
[従来の技術] プリント回路などの電気回路には5〜40μmの厚さの
銅箔が多用されている。このような銅箔には電解銅箔と
圧延銅箔がある。[Prior Art] A copper foil having a thickness of 5 to 40 μm is frequently used in an electric circuit such as a printed circuit. Such copper foils include electrolytic copper foils and rolled copper foils.
プリント回路基板には、ガラスエポキシ、紙フェノー
ルなどの基板上に銅箔をクラッドした後、レジストエッ
チング法により所望の回路パターンに形成した基板のほ
かに、ポリイミドなどのフィルムに銅箔を張り合せでき
るフレキシブル回路基板もある。これらの一部はテープ
キャリヤ、TAB(Tape Automated Bonding)リードとし
て半導体チップの実装に使用されている。フレキシブル
回路基板にはフレキシビリティの点で優る圧延箔が使用
される。On printed circuit boards, after cladding copper foil on a board made of glass epoxy, paper phenol, etc., in addition to the board formed into the desired circuit pattern by the resist etching method, copper foil can be bonded to a film such as polyimide There are also flexible circuit boards. Some of these are used for mounting semiconductor chips as tape carriers and TAB (Tape Automated Bonding) leads. For the flexible circuit board, a rolled foil excellent in flexibility is used.
近年、電気機器の小型化と高密度化と多機能化にとも
なって、プリント回路基板の高密度化が強く求められて
おり、このため小型チップ部品を高密度実装ができる表
面実装方式が次第に採用され始めた。In recent years, with the miniaturization, high density, and multi-functionality of electrical equipment, high density of printed circuit boards has been strongly demanded. For this reason, the surface mounting method that enables high-density mounting of small chip components is gradually adopted. Began to be.
テープキャリヤやTABのリードは、最近では、ピッチ
間距離が80μm以下にも近接するようになってきてい
る。In recent years, tape carriers and TAB leads have been approaching pitch distances of 80 μm or less.
圧延箔としては通常タフピッチ銅および無酸素銅が使
用されているが、いずれもリードとして使用する場合、
電子デバイスと接合する部分にまず厚さ5μmのNi下地
めっきを形成し、さらに、その上に厚さ1μmのAuめっ
きを形成している。Normally, tough pitch copper and oxygen-free copper are used as rolled foils, but when both are used as leads,
First, a 5 μm-thick Ni base plating is formed on a portion to be joined to an electronic device, and a 1 μm-thick Au plating is further formed thereon.
配線のリード間ピッチが80μmと狭い接続部分には上
記のようなNi下地めっきとAuめっき被覆が常識とされて
いた。For the connection portions where the pitch between the wiring leads is as narrow as 80 μm, the above-described Ni base plating and Au plating coating were commonly used.
Ni下地めっき上にAuめっきを行ったものは信頼性の高
いものではあるが、高価なものであるため、それに代る
安価なSnめっきが試みられている。しかし、Snめっきの
場合は短時間でのウイスカ発生による配線間の短絡が生
ずるという課題がある。Au plating on Ni underlayer plating is highly reliable, but expensive, so inexpensive Sn plating has been attempted instead. However, in the case of Sn plating, there is a problem that a short circuit between wirings occurs due to generation of whiskers in a short time.
一方、ウイスカ対策のためSnめっきの替りに、はんだ
めっきが検討されている。しかし、はんだめっきでは脆
い金属間化合物ε相の形成によりはんだ密着性不良とい
う不具合いが生じるため、この考え方は実用化には至っ
ていない。On the other hand, solder plating is being studied instead of Sn plating for whisker countermeasures. However, this concept has not been put to practical use because the formation of a brittle intermetallic compound ε phase causes a problem of poor solder adhesion in solder plating.
[発明が解決しようとする課題] 本発明は銅合金圧延箔に係るもので、従来のCu圧延箔
の代りに、接合部およびその近傍のめっきを、Niめっき
とAuめっきの2層めっきからSnめっきないしはんだめっ
きに置き代えることが可能となり、しかも、そのSnめっ
き層がウイスカを全く生じず、はんだ接合時の230℃で
の加熱によっても母材が軟化せず、錫およびはんだの剥
離も150℃×1000Hr保持後にも起こらず、また、強度お
よび導電率も高い箔であって、しかも、5μmの厚さで
80μm程度のピッチでホト・エッチングしても目標通り
に非常にきれいにエッチングできるフレキシブルプリン
ト用銅合金圧延箔を提供することを目的とする。[Problem to be Solved by the Invention] The present invention relates to a copper alloy rolled foil, and instead of a conventional Cu rolled foil, plating at a joint and the vicinity thereof is performed by two-layer plating of Ni plating and Au plating to Sn. It can be replaced by plating or solder plating, and its Sn plating layer does not generate whiskers at all, the base material does not soften even by heating at 230 ° C during solder bonding, and tin and solder peel off It does not occur even after holding at ℃ x 1000Hr, and has high strength and electrical conductivity.
An object of the present invention is to provide a copper alloy rolled foil for flexible printing which can be etched very finely as intended even when photo-etched at a pitch of about 80 μm.
[課題を解決するための手段] 本発明の第1の要旨は、Cr:0.02〜0.3%、P:0.04%以
下、Zn:1.0〜5.0%(ただし、1.0%は除く)、10ppm以
下のSを含有し、残部Cuと不純物とからなることを特徴
とするフレキシブルプリント用銅合金圧延箔に存在す
る。[Means for Solving the Problems] The first gist of the present invention is that Cr: 0.02 to 0.3%, P: 0.04% or less, Zn: 1.0 to 5.0% (excluding 1.0%), and 10 ppm or less of S And the balance consists of Cu and impurities.
本発明の第2の要旨は、Cr:0.02〜0.3%、P:0.04%以
下、Zn:1.0〜5.0%(ただし、1.0%は除く)、10ppm以
下のSを含有し、不純物と酸素との合計が50ppm以下、
残部Cuからなることを特徴とするフレキシブルプリント
用銅合金圧延箔に存在する。The second gist of the present invention is that Cr: 0.02 to 0.3%, P: 0.04% or less, Zn: 1.0 to 5.0% (excluding 1.0%), contains 10 ppm or less of S, and contains impurities and oxygen. The total is 50 ppm or less,
The present invention resides in a rolled copper alloy foil for flexible printing characterized by the balance of Cu.
本発明の第3の要旨は、Zr:0.005〜0.1%、P:0.04%
以下、Zn:1.0〜5.0%(ただし、1.0%は除く)、10ppm
以下のSを含有し、残部Cuと不純物とからなることを特
徴とするフレキシブルプリント用銅合金圧延箔に存在す
る。The third gist of the present invention is that Zr: 0.005 to 0.1%, P: 0.04%
Below, Zn: 1.0 to 5.0% (excluding 1.0%), 10ppm
The present invention resides in a rolled copper alloy foil for flexible printing characterized in that it contains the following S and is composed of the balance of Cu and impurities.
本発明の第4の要旨は、Zr:0.005〜0.1%、P:0.04%
以下、Zn:1.0〜5.0%(ただし、1.0%は除く)、10ppm
以下のSを含有し、不純物と酸素との合計が50ppm以
下、残部Cuからなることを特徴とするフレキシブルプリ
ント用銅合金圧延箔に存在する。The fourth gist of the present invention is as follows: Zr: 0.005 to 0.1%, P: 0.04%
Below, Zn: 1.0 to 5.0% (excluding 1.0%), 10ppm
The rolled copper alloy foil for flexible printing is characterized in that it contains the following S, the total of impurities and oxygen is 50 ppm or less, and the balance is Cu.
本発明の第5の要旨は、Cr:0.02〜0.3%およびZr:0.0
05〜0.1%のうち少なくとも1種以上を0.005〜0.3含
み、P:0.04%以下、Zn:1.0〜5.0%(ただし、1.0%は除
く)、10ppm以下のSを含有し、残部Cuと不純物とから
なることを特徴とするフレキシブルプリント用銅合金圧
延箔に存在する。A fifth gist of the present invention is that Cr: 0.02 to 0.3% and Zr: 0.0
0.005 to 0.3 at least one of 05 to 0.1%, P: 0.04% or less, Zn: 1.0 to 5.0% (excluding 1.0%), contains 10ppm or less of S, the balance of Cu and impurities The present invention relates to a rolled copper alloy foil for flexible printing characterized by comprising:
本発明の第6の要旨は、Cr:0.02〜0.3%およびZr:0.0
05〜0.1%のうち少なくとも1種以上を0.005〜0.3含
み、P:0.04%以下、Zn:1.0〜5.0%(ただし、1.0%は除
く)、10ppm以下のSを含有し、不純物と酸素との合計
が50ppm以下、残部Cuからなることを特徴とするフレキ
シブルプリント用銅合金圧延箔に存在する。The sixth gist of the present invention is that Cr: 0.02 to 0.3% and Zr: 0.0
It contains 0.005 to 0.3 of at least one of 05 to 0.1%, P: 0.04% or less, Zn: 1.0 to 5.0% (except 1.0%), contains 10ppm or less of S, and contains impurities and oxygen. Present in a rolled copper alloy foil for flexible printing characterized in that the total is 50 ppm or less and the balance is Cu.
本発明の第7の要旨は、上記第1から第6の要旨にお
いて、箔の厚さを40μm以下としたことを特徴とするフ
レキシブルプリント用銅合金圧延箔に存在する。According to a seventh aspect of the present invention, there is provided a rolled copper alloy foil for flexible printing according to the first to sixth aspects, wherein the foil has a thickness of 40 μm or less.
[作 用] 本発明の含有元素の作用効果および限定理由を説明す
る。[Operation] The effects of the elements contained in the present invention and the reasons for limitation will be described.
(Zn) Znは、Sn被覆材のウイスカ発生を抑制し、Snめっきな
いしはんだめっきの密着性を向上させ、導電率を低め
る。そのためには、1%を超えてZnを含有させる必要が
ある。(Zn) Zn suppresses the generation of whiskers in the Sn coating material, improves the adhesion of Sn plating or solder plating, and lowers the conductivity. For that purpose, it is necessary to contain Zn exceeding 1%.
Znを1%を超えて含有させると、Snめっきないしはん
だめっきの密着性を悪くする金属間化合物(Cu3Sn)相
の生成を抑制できる。これは、ZnはCu3Sn相の母材側に
生ずるカーケンダールホイドの生成を抑制し、密着性を
向上させるものと考えられる。When Zn is contained in an amount exceeding 1%, generation of an intermetallic compound (Cu 3 Sn) phase which deteriorates the adhesion of Sn plating or solder plating can be suppressed. This is considered to be due to the fact that Zn suppresses the formation of Kirkendall wedge generated on the base material side of the Cu 3 Sn phase and improves the adhesion.
また、Snめっき中へ微量のZnが拡散し、Snの内部応力
を緩和するため、ウイスカ成長を抑制していると思われ
る。In addition, it is considered that a small amount of Zn diffuses into the Sn plating to reduce the internal stress of Sn, thereby suppressing whisker growth.
しかし、Znが5%を超えると耐ウイスカ性には問題は
ないが、導電率が60%IACS未満となったり、黄銅独特の
応力腐食割れを生じやすい性質を保有してくるという短
所が表れてくるので、Znは5%以下とする。However, when Zn exceeds 5%, there is no problem in whisker resistance, but the drawbacks are that the electrical conductivity is less than 60% IACS and it has the characteristic of easily causing stress corrosion cracking unique to brass. Therefore, Zn is set to 5% or less.
(S) 次にSの含有量の上限を定めた理由について記述す
る。従来の銅合金においては、銅合金中ではSは多くは
CuSとして存在し、MnあるいはMgが不純物として含有さ
れていると、MnSあるいはMgSとして存在する。いずれ
も、粒界中に局在し、そのためにエッチング時の不具合
が生じることを知見した。従来の銅合金においては、特
に、5〜40μm厚さの箔となると、レジストエッチング
する場合に、レジストの接着不良およびエッチング液を
はじいたりして、エッチングむらなどの不具合いを生じ
ていた。本発明者は、その原因の探究を行った。その結
果、その原因はSに存在することを知見した。したがっ
て、不具合の発生を防ぐためには、Sを完全に除去する
ことが望ましいが、原料・炉材、被覆木炭、燃料などか
らの混入は避け難く、10ppm以下と定めた。(S) Next, the reason for setting the upper limit of the content of S will be described. In conventional copper alloys, S is often
When it exists as CuS and contains Mn or Mg as an impurity, it exists as MnS or MgS. All of them have been found to be localized in the grain boundaries, which causes problems during etching. In the case of a conventional copper alloy, particularly in the case of a foil having a thickness of 5 to 40 [mu] m, in the case of resist etching, defects such as poor adhesion of the resist and repelling of an etching solution have occurred. The present inventors have investigated the cause. As a result, it was found that the cause exists in S. Therefore, in order to prevent the occurrence of defects, it is desirable to completely remove S, but it is difficult to avoid contamination from raw materials / furnace materials, coated charcoal, fuel, and the like, and the content is set to 10 ppm or less.
(酸素、不純物) また、酸素と不純物とについても、不純物が酸化物の
状態で存在すると、5〜40μmの厚さの箔では、上記の
Sと同様、エッチング時の微細加工を阻害することが分
かり、50ppm以下と定めた。(Oxygen and impurities) Also, when oxygen and impurities are present in the form of oxides, the foil having a thickness of 5 to 40 μm may impede the fine processing during etching as in the case of S described above. Understandable, it was determined to be 50ppm or less.
S、酸素および不純物は、厚さが0.1mm以上の板・条
では、表面に現れても、それらの化合物の大きさ・数・
量は僅かであり、通常混入する量を制限する必要はない
が、厚さ5〜40μmの箔になると、圧延時のピンホール
の発生、圧延切れ、さらには、前述のレジストの接着不
良、エッチング不良などが生じることを本発明者は知見
し、前述の上限に定める。S, oxygen, and impurities, even if they appear on the surface of plates and strips with a thickness of 0.1 mm or more, have the size, number,
The amount is small, and it is not necessary to limit the amount that is usually mixed. However, when a foil having a thickness of 5 to 40 μm is formed, pinholes occur during rolling, rolling breakage, and the above-described poor adhesion of the resist and etching. The inventor has found that a defect or the like occurs, and sets the above upper limit.
(Cr) CrはCu中に析出して強度と軟化温度を向上する効果を
有する。0.02%未満ではかかる効果は少ない。0.3%を
超えるCr析出物の直径が10μmを越えるもの 現われ微
細加工上に不具合が生ずる。また、造塊時の湯流性が低
下し、鋳塊の鋳肌も悪くなる等により0.3%を上限とす
る。(Cr) Cr has an effect of precipitating in Cu to improve strength and softening temperature. If it is less than 0.02%, such effect is small. A Cr precipitate having a diameter of more than 0.3% having a diameter of more than 10 μm appears and causes a problem in fine processing. Further, the upper limit is set to 0.3% because the flowability at the time of ingot making is reduced and the casting surface of the ingot becomes worse.
(Zr) ZrはCu中に固溶して強度と軟化温度を高め、耐熱性を
向上する効果を有する。0.005%未満では目標とする耐
熱性を保有することができない。0.1%を超えるとCrと
同様造塊時の湯流れ性が低下し、鋳塊の鋳肌も悪くな
り、歩留りが低下する。(Zr) Zr has the effect of forming a solid solution in Cu to increase the strength and softening temperature and to improve the heat resistance. If it is less than 0.005%, the target heat resistance cannot be maintained. If it exceeds 0.1%, the flow of molten metal at the time of ingot formation is reduced as in the case of Cr, the casting surface of the ingot is also deteriorated, and the yield is reduced.
したがってZr含有量は0.005〜0.1%とする。 Therefore, the Zr content is set to 0.005 to 0.1%.
(P) Pは大気中での造塊の際には脱酸のため0.02%以下の
添加が必要であるが、0.04%を越えるとCu中に固溶して
導電率を低下させる。(P) P is required to be added in an amount of 0.02% or less for deoxidation at the time of agglomeration in the air. However, if it exceeds 0.04%, P forms a solid solution in Cu and lowers the electrical conductivity.
還元性雰囲気中あるいは真空中での造塊の際には、溶
湯中あるいは鋳塊中の酸素は10ppm以下となり、脱酸剤
を必要としなくなるのでPでの脱酸は必要としない。し
たがってP含有量の上限を0.04%とする。During ingot making in a reducing atmosphere or in a vacuum, oxygen in the molten metal or ingot becomes 10 ppm or less, and a deoxidizing agent is not required, so deoxidation with P is not required. Therefore, the upper limit of the P content is set to 0.04%.
[実施例] 以下、本発明を実施例によって説明する。EXAMPLES Hereinafter, the present invention will be described with reference to examples.
第1表〜第2表に示す各種合金を黒鉛ツボで溶解し
て、金型鋳造した。Various alloys shown in Tables 1 and 2 were melted with a graphite pot and cast in a mold.
鋳塊を機械加工により表裏面を各2.5mm面削して50mmt
×70mmw×200mmlとし、900℃の温度で厚さ10mmまで熱間
圧延し、600℃以上の温度から水冷し、酸化スケール除
去後厚さ0.2mmまで冷間圧延し、ついで500℃×1Hrの中
間焼鈍を行った。The ingot is machined to cut the front and back sides 2.5mm each and 50mmt
X 70mmw x 200mml, hot-rolled to a thickness of 10mm at a temperature of 900 ° C, water-cooled from a temperature of 600 ° C or more, cold-rolled to a thickness of 0.2mm after removing oxide scale, and then 500 ° C x 1Hr intermediate Annealing was performed.
次に、入念に酸洗し、さらに冷間圧延を繰り返し、厚
さ35μmの箔を製作し、ピンホール、圧延切れを観察し
た。Next, pickling was carefully performed, and cold rolling was further repeated to produce a foil having a thickness of 35 μm, and pinholes and rolling cuts were observed.
また、同様の手順によって、厚さ5μmと65μmの箔
とを作製した。Further, a foil having a thickness of 5 μm and a thickness of 65 μm were produced by the same procedure.
(エッチング性) これらの箔について、幅100μm、間隔80μm、長さ2
0μmで50本のレジストを焼きつけ、塩化第2鉄溶液40
%でケミカルミーリングして、50本のリードを製作その
健全性を調査した。(Etching property) About these foils, width 100μm, interval 80μm, length 2
Bake 50 resists at 0μm, ferric chloride solution 40
Chemical milling at 50% produced 50 leads and investigated their soundness.
(ウイスカの発生程度) アルカリ中で電界脱脂後硫酸浴中で電流密度3A/dm2に
よって厚さ1.5μmのSnめっきを行い、エポキシ樹脂系
の接着材でSnめっきと反対側面を0.2mm銅合金板で貼り
つけ、曲げによって約4kg/mm2の圧縮応力を加え、室温
で1年間放置後、ウイスカの発生の有無を調査した。(About whisker) performs Sn plating thickness 1.5μm by the current density of 3A / dm 2 in electric field degreasing after sulfate bath in an alkaline, 0.2 mm copper alloys opposite side and Sn plating adhesive epoxy resin After applying a compressive stress of about 4 kg / mm 2 by bending and leaving it at room temperature for one year, the presence or absence of whisker formation was examined.
(軟化特性、導電率) 軟化特性については、木炭の被覆下で電気炉中で1Hr
保持し、引張強度の6割の値を維持する温度を求めた。
導電率は、JISH0505に基づいた。(Softening characteristics, conductivity) For softening characteristics, 1Hr in an electric furnace under charcoal coating
The temperature at which the temperature was maintained and maintained at 60% of the tensile strength was determined.
The conductivity was based on JISH0505.
以上の試験結果をまとめて第1表に示した。 Table 1 summarizes the above test results.
Znを1〜5%含む合金は、表面にSnめっきが行われて
も、ウイスカが生ずることもなく、また、Sおよび酸素
とその他の不純物とを規制することによって厚さ5〜40
μmの箔においてもホト・エッチング後の不良率が2%
以下と良好となった。An alloy containing 1 to 5% of Zn does not generate whiskers even if the surface is plated with Sn, and has a thickness of 5 to 40 by regulating S and oxygen and other impurities.
2% defect rate after photo-etching even for μm foil
The following was good.
特に、本発明合金箔以外の合金箔では、5〜40μmと
厚みが薄くなると、エッチング性の低下が著しいが、本
発明の合金ではほとんど低下しない。また、はんだ付け
などの加熱によっても、1Hrの加熱によっても、軟化温
度300℃以上を示し、はんだ付け時の温度230℃では軟化
しない。なお、表中には従来合金としてタフピッチ銅
(No.10)を併記した。In particular, in alloy foils other than the alloy foil of the present invention, when the thickness is reduced to 5 to 40 μm, the etching property is significantly reduced, but is hardly reduced in the alloy of the invention. In addition, it shows a softening temperature of 300 ° C. or more by heating such as soldering or heating for 1 hour, and does not soften at 230 ° C. during soldering. In the table, tough pitch copper (No. 10) is also described as a conventional alloy.
[発明の効果] 本発明によれば、従来のNiとAuとのめっきの代わり
に、Snめっきを行っても、ウイスカ性を全く生ずること
もない。[Effects of the Invention] According to the present invention, even if Sn plating is performed instead of the conventional plating of Ni and Au, no whisker property is generated.
また、極微細加工後の歩留も向上する。 In addition, the yield after ultrafine processing is improved.
さらに、従来材より格段に優れる引張強度を有してい
る。Furthermore, it has a much higher tensile strength than conventional materials.
このように、本発明は、フレキシブルプリント用銅合
金箔として優れた特性を有しており、電子機器の小型化
高密度実装化、多機能化のための材料として優れた特性
を有している。As described above, the present invention has excellent characteristics as a copper alloy foil for flexible printing, and has excellent characteristics as a material for miniaturization, high-density mounting, and multifunctionalization of electronic devices. .
フロントページの続き (56)参考文献 特開 昭62−146231(JP,A) 特開 昭63−310931(JP,A) (58)調査した分野(Int.Cl.6,DB名) C22C 9/00 - 9/10 H05K 1/09Continuation of front page (56) References JP-A-62-146231 (JP, A) JP-A-63-310931 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) C22C 9 / 00-9/10 H05K 1/09
Claims (7)
04%以下、Zn:1.0〜5.0%(ただし、1.0%は除く)、10
ppm以下のSを含有し、残部Cuと不純物とからなること
を特徴とするフレキシブルプリント用銅合金圧延箔。(1) Cr: 0.02 to 0.3% (the same applies to weight% or less);
04% or less, Zn: 1.0-5.0% (excluding 1.0%), 10
A rolled copper alloy foil for flexible printing, comprising: S or less in ppm, and the balance being Cu and impurities.
5.0%(ただし、1.0%は除く)、10ppm以下のSを含有
し、不純物と酸素との合計が50ppm以下、残部Cuからな
ることを特徴とするフレキシブルプリント用銅合金圧延
箔。(2) Cr: 0.02-0.3%, P: 0.04% or less, Zn: 1.0-
Rolled copper alloy foil for flexible printing characterized by containing 5.0% (but excluding 1.0%) and 10ppm or less of S, the total of impurities and oxygen being 50ppm or less, and the balance being Cu.
〜5.0%(ただし、1.0%は除く)、10ppm以下のSを含
有し、残部Cuと不純物とからなることを特徴とするフレ
キシブルプリント用銅合金圧延箔。3. Zr: 0.005 to 0.1%, P: 0.04% or less, Zn: 1.0
A rolled copper alloy foil for flexible printing characterized by containing up to 5.0% (excluding 1.0%), 10 ppm or less of S, and the balance of Cu and impurities.
〜5.0%(ただし、1.0%は除く)、10ppm以下のSを含
有し、不純物と酸素との合計が50ppm以下、残部Cuから
なることを特徴とするフレキシブルプリント用銅合金圧
延箔。4. Zr: 0.005 to 0.1%, P: 0.04% or less, Zn: 1.0
A rolled copper alloy foil for flexible printing, characterized in that it contains up to 5.0% (excluding 1.0%), 10 ppm or less of S, the total of impurities and oxygen is 50 ppm or less, and the balance is Cu.
うち少なくとも1種以上を0.005〜0.3含み、P:0.04%以
下、Zn:1.0〜5.0%(ただし、1.0%は除く)、10ppm以
下のSを含有し、残部Cuと不純物とからなることを特徴
とするフレキシブルプリント用銅合金圧延箔。5. An alloy containing 0.005 to 0.3 of at least one of Cr: 0.02 to 0.3% and Zr: 0.005 to 0.1%, P: 0.04% or less, Zn: 1.0 to 5.0% (excluding 1.0%). A rolled copper alloy foil for flexible printing, characterized by containing 10 ppm or less of S and the balance of Cu and impurities.
うち少なくとも1種以上を0.005〜0.3含み、P:0.04%以
下、Zn:1.0〜5.0%(ただし、1.0%は除く)、10ppm以
下のSを含有し、不純物と酸素との合計が50ppm以下、
残部Cuからなることを特徴とするフレキシブルプリント
用銅合金圧延箔。6. At least one of Cr: 0.02 to 0.3% and Zr: 0.005 to 0.1% is contained 0.005 to 0.3, P: 0.04% or less, Zn: 1.0 to 5.0% (excluding 1.0%). , Containing 10 ppm or less of S, the total of impurities and oxygen being 50 ppm or less,
Rolled copper alloy foil for flexible printing characterized by the balance of Cu.
する請求項1ないし請求項6のいずれか1項に記載のフ
レキシブルプリント用銅合金圧延箔。7. The rolled copper alloy foil for flexible printing according to claim 1, wherein the thickness of the foil is 40 μm or less.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16022289A JP2809713B2 (en) | 1989-06-22 | 1989-06-22 | Copper alloy rolled foil for flexible printing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16022289A JP2809713B2 (en) | 1989-06-22 | 1989-06-22 | Copper alloy rolled foil for flexible printing |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0324244A JPH0324244A (en) | 1991-02-01 |
JP2809713B2 true JP2809713B2 (en) | 1998-10-15 |
Family
ID=15710359
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16022289A Expired - Fee Related JP2809713B2 (en) | 1989-06-22 | 1989-06-22 | Copper alloy rolled foil for flexible printing |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2809713B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04290286A (en) * | 1991-03-19 | 1992-10-14 | Tatsuta Electric Wire & Cable Co Ltd | Flexible printed circuit board with electromagnetic wave shield |
CA2563094C (en) * | 2004-08-10 | 2012-03-27 | Sanbo Shindo Kogyo Kabushiki Kaisha | Copper-based alloy casting in which grains are refined |
CN104593638B (en) * | 2015-01-23 | 2017-05-10 | 武汉雄驰机电设备有限公司 | Motor conducting bar and preparation method thereof |
-
1989
- 1989-06-22 JP JP16022289A patent/JP2809713B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH0324244A (en) | 1991-02-01 |
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