JP2720864B2 - Resin-sealed electronic components - Google Patents

Resin-sealed electronic components

Info

Publication number
JP2720864B2
JP2720864B2 JP34962595A JP34962595A JP2720864B2 JP 2720864 B2 JP2720864 B2 JP 2720864B2 JP 34962595 A JP34962595 A JP 34962595A JP 34962595 A JP34962595 A JP 34962595A JP 2720864 B2 JP2720864 B2 JP 2720864B2
Authority
JP
Japan
Prior art keywords
resin layer
protective resin
thick film
circuit board
protective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP34962595A
Other languages
Japanese (ja)
Other versions
JPH09172109A (en
Inventor
茂雄 吉崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanken Electric Co Ltd
Original Assignee
Sanken Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanken Electric Co Ltd filed Critical Sanken Electric Co Ltd
Priority to JP34962595A priority Critical patent/JP2720864B2/en
Publication of JPH09172109A publication Critical patent/JPH09172109A/en
Application granted granted Critical
Publication of JP2720864B2 publication Critical patent/JP2720864B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は厚膜導体、厚膜抵抗等が
成形された回路基板を備えた樹脂封止形電子部品に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin-sealed electronic component having a circuit board on which a thick film conductor, a thick film resistor and the like are formed.

【0002】[0002]

【従来の技術】厚膜導体や厚膜抵抗が形成された回路基
板と、必要に応じてこれとは別に半導体素子を放熱板を
兼ねる金属支持板上に配し、これらを樹脂被覆体で封止
した電子部品(ハイブリッドIC)は公知である。一般
に、この種の電子部品では、回路基板上への不純物の侵
入による信頼性低下の防止等を図るため、厚膜導体、厚
膜抵抗及びその他回路部品の上面を保護樹脂(コート
材)で被覆し、その上方を更に樹脂被覆体(モールド樹
脂)で封止する。従来は、この保護樹脂として回路基板
への接着性に優れたポリイミド樹脂を使用し、これによ
って厚膜導体、厚膜抵抗及びその他回路部品を含めて一
様に被覆した。この様に形成しても保護樹脂と回路基板
との接着性が良好であれば、両者の界面からの不純物の
侵入が良好に防止できる。
2. Description of the Related Art A circuit board on which a thick-film conductor or a thick-film resistor is formed and, if necessary, a semiconductor element are separately disposed on a metal support plate also serving as a heat sink, and these are sealed with a resin coating. Stopped electronic components (hybrid ICs) are known. Generally, in this type of electronic component, the upper surface of the thick film conductor, the thick film resistor, and other circuit components is coated with a protective resin (coating material) in order to prevent a decrease in reliability due to intrusion of impurities into the circuit board. Then, the upper portion is further sealed with a resin coating (mold resin). Conventionally, a polyimide resin having excellent adhesion to a circuit board has been used as the protective resin, thereby uniformly covering the thick film conductor, the thick film resistor, and other circuit components. Even if it is formed in this way, if the adhesion between the protective resin and the circuit board is good, the intrusion of impurities from the interface between them can be prevented well.

【0003】[0003]

【発明が解決しようとする課題】しかし、回路基板への
接着性に優れた保護樹脂は、一般に厚膜抵抗への接着性
も優れており、樹脂被覆体(モールド樹脂)への接着性
も優れている。一方、厚膜抵抗と回路基板との接着性
は、厚膜抵抗と保護樹脂との接着性よりも劣っている。
このため、樹脂封止体に熱膨張等が生ずると、樹脂被覆
体から保護樹脂を介して厚膜抵抗に回路基板から引張る
力が加わり、厚膜抵抗に剥離や断線が生じることがあっ
た。なお、厚膜抵抗は厚膜導体に比べてその幅が広いの
で、このような問題が生じ易い。
However, a protective resin having excellent adhesion to a circuit board generally has excellent adhesion to a thick film resistor and also has excellent adhesion to a resin coating (mold resin). ing. On the other hand, the adhesion between the thick film resistor and the circuit board is inferior to the adhesion between the thick film resistor and the protective resin.
For this reason, when thermal expansion or the like occurs in the resin sealing body, a pulling force is applied to the thick film resistor from the resin substrate via the protective resin from the circuit board, and peeling or disconnection may occur in the thick film resistor. Since the thickness of the thick-film resistor is wider than that of the thick-film conductor, such a problem is likely to occur.

【0004】そこで、本発明は、厚膜抵抗の剥離又は断
線が生じ難い樹脂封止形電子部品を提供することを目的
とする。
Accordingly, an object of the present invention is to provide a resin-sealed electronic component in which peeling or disconnection of a thick-film resistor hardly occurs.

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
の本発明は、その上面の一部に厚膜抵抗が形成された回
路基板と、前記厚膜抵抗の上面を被覆している第1の保
護樹脂層と、前記厚膜抵抗以外の部分を被覆するもので
あって、平面的に見て前記第1の保護樹脂層を囲むよう
に配置されている第2の保護樹脂層と、前記第1の保護
樹脂層及び前記第2の保護樹脂層の上を被覆している樹
脂被覆体とを備え、第1の保護樹脂層の前記樹脂被覆体
に対する接着力が第2の保護樹脂層の前記樹脂被覆体に
対する接着力よりも低いことを特徴とする樹脂封止形電
子部品に係わるものである。なお、請求項2に示すよう
に樹脂被覆体の回路基板への接着力Aを基準にして、第
1の保護樹脂層の樹脂被覆体への接着力Bを低くし、第
2の保護樹脂層の樹脂被覆体への接着力Cを高くするこ
とが望ましい。
According to the present invention, there is provided a circuit board having a thick film resistor formed on a part of an upper surface thereof, and a first circuit board covering the upper surface of the thick film resistor. A second protective resin layer, which covers a portion other than the thick film resistor, and is arranged so as to surround the first protective resin layer in plan view; A resin coating covering the first protective resin layer and the second protective resin layer, wherein an adhesive force of the first protective resin layer to the resin coating is equal to that of the second protective resin layer. The present invention relates to a resin-sealed electronic component having a lower adhesive strength to the resin coating. As described in claim 2, the adhesive strength B of the first protective resin layer to the resin coating is reduced based on the adhesive strength A of the resin coating to the circuit board, and the second protective resin layer It is desirable to increase the adhesive force C to the resin coating.

【0006】[0006]

【発明の作用及び効果】各請求項の発明によれば、第1
の保護樹脂層の樹脂被覆体への接着力が第2の保護樹脂
層の樹脂被覆体への接着力よりも低くしたので、第1の
保護樹脂層が樹脂被覆体によって上方向に引張られ、こ
れにより厚膜抵抗も上方向に引張られた時に、厚膜抵抗
が第1の保護樹脂層によってさほど強く引張られない。
このため、厚膜抵抗の回路基板からの剥離や断線が生じ
難くなる。第1の保護樹脂層の樹脂被覆体に対する接着
力が弱くても、第1の保護樹脂層を平面的に見て囲むよ
うに配設した第2の保護樹脂層の樹脂被覆体に対する接
着力が高いので、厚膜抵抗の形成領域への水や不純物の
侵入を防ぐことができる。また、樹脂被覆体と保護樹脂
層との間の剥離は外周側から内周側に進行しやすいの
で、外周側に接着力の強い第2の保護樹脂層を設けるこ
とにより剥離の発生及び進行を抑制することができる。
請求項2の発明によれば、回路基板装置の保護を一層合
理的に達成することができる。
According to the invention of each claim, the first aspect is as follows.
Since the adhesive force of the protective resin layer to the resin coating is lower than the adhesive force of the second protective resin layer to the resin coating, the first protective resin layer is pulled upward by the resin coating, Thus, when the thick film resistor is also pulled upward, the thick film resistor is not pulled so strongly by the first protective resin layer.
For this reason, peeling or disconnection of the thick film resistor from the circuit board hardly occurs. Even if the adhesive strength of the first protective resin layer to the resin coating is weak, the adhesive strength of the second protective resin layer disposed so as to surround the first protective resin layer in a plan view is small. Since it is high, it is possible to prevent water and impurities from entering the region where the thick film resistor is formed. Further, since the separation between the resin coating and the protective resin layer easily proceeds from the outer peripheral side to the inner peripheral side, the occurrence and progress of the separation can be prevented by providing the second protective resin layer having a strong adhesive force on the outer peripheral side. Can be suppressed.
According to the invention of claim 2, protection of the circuit board device can be achieved more rationally.

【0007】[0007]

【実施例】次に、図1及び図2を参照して、本発明の一
実施例に係わる樹脂封止形電子部品としてのハイブリッ
ドICを説明する。このハイブリッドICは、放熱板を
兼ねる金属支持板1、アルミナ(Al2 3 )等から成
る絶縁性回路基板2、第1の保護樹脂層3、第2の保護
樹脂層4、樹脂被覆体5を備えている。この他に、回路
基板2上に形成された電極金属にリード細線6を介して
接続された外部引出しリード等も有するが、その図示は
省略している。また、金属支持板1には必要に応じて半
導体素子等が更に固着されている場合もある。また、樹
脂被覆体5は支持板1の裏面側を被覆することもある。
また、金属支持板1の上に電力用半導体素子が配置さ
れ、樹脂被覆体5がこの電力用半導体素子も被覆するこ
ともある。
1 and 2, a hybrid IC as a resin-sealed electronic component according to an embodiment of the present invention will be described. This hybrid IC includes a metal support plate 1 also serving as a heat sink, an insulating circuit board 2 made of alumina (Al 2 O 3 ) or the like, a first protective resin layer 3, a second protective resin layer 4, and a resin cover 5. It has. In addition, external lead leads and the like connected to the electrode metal formed on the circuit board 2 via the lead wires 6 are also provided, but are not shown. Further, a semiconductor element or the like may be further fixed to the metal support plate 1 as necessary. Further, the resin coating 5 may cover the back side of the support plate 1.
Further, a power semiconductor element may be arranged on the metal support plate 1, and the resin coating 5 may cover the power semiconductor element.

【0008】回路基板2は四角形の平面形状を有してお
り、この一方の主面には、厚膜抵抗7、厚膜導体8、厚
膜電極9等が形成されている。回路基板2の一方の主面
の外側には厚膜抵抗7等が形成されていない領域10が
設けられている。なお、回路基板2の一方の主面には、
この他にも別の回路部品が固着されているが、図示は省
略している。厚膜抵抗7は例えば抵抗材料としての酸化
ルテニウム系ガラス粉末と有機バインダとから成る厚膜
抵抗ペーストをスクリーン印刷して焼成して成る。ま
た、厚膜導体8及び厚膜電極9は例えばAg(銀)又は
AgとPd(パラジウム)から成る金属粉末と無機バイ
ンダとしてのガラスと有機バインダとから成る厚膜導体
ペーストをスクリーン印刷して焼成して成る。厚膜抵抗
7は図示のように、厚膜導体8の一部に重ねて橋わたし
状に形成されている。一方、厚膜電極(ボンディングパ
ッド)9は厚膜導体8と一体にこの延長幅広部分として
形成されたものである。図2に示すように厚膜導体8の
配線部分は厚膜抵抗7よりも幅狭に形成されている。厚
膜抵抗7は厚膜導体8及び厚膜電極9に比べて領域10
よりも内側に形成されている。回路基板2の他方の主面
は支持板1の一方の主面に接着剤によって固着されてい
る。
The circuit board 2 has a rectangular planar shape, and a thick film resistor 7, a thick film conductor 8, a thick film electrode 9 and the like are formed on one main surface thereof. A region 10 where the thick film resistor 7 and the like are not formed is provided outside one main surface of the circuit board 2. In addition, on one main surface of the circuit board 2,
In addition, other circuit components are fixed, but are not shown. The thick film resistor 7 is formed, for example, by screen printing and firing a thick film resistor paste composed of a ruthenium oxide-based glass powder as a resistance material and an organic binder. The thick-film conductor 8 and the thick-film electrode 9 are screen-printed and fired with a thick-film conductor paste made of, for example, metal powder of Ag (silver) or Ag and Pd (palladium), glass as an inorganic binder and an organic binder. Consisting of As shown, the thick film resistor 7 is formed in a bridge shape so as to overlap a part of the thick film conductor 8. On the other hand, the thick film electrode (bonding pad) 9 is formed integrally with the thick film conductor 8 as this extended wide portion. As shown in FIG. 2, the wiring portion of the thick film conductor 8 is formed narrower than the thick film resistor 7. The thick film resistor 7 has a larger area 10 than the thick film conductor 8 and the thick film electrode 9.
It is formed inside. The other main surface of the circuit board 2 is fixed to one main surface of the support plate 1 with an adhesive.

【0009】第1の保護樹脂層3は、実質的に厚膜抵抗
7の上面のみを選択的に被覆しており、厚膜抵抗7以外
の部分即ち厚膜導体8や厚膜電極9等の上面は厚膜抵抗
7が形成されない図2の破線よりも外側の環状領域10
の上面を含めて第1の保護樹脂層3とは異なる第2の保
護樹脂層4によって被覆されている。即ち、第2の保護
樹脂層4は平面的に見て第1の保護樹脂層3を囲むよう
に配置されている。第1の保護樹脂層3はワニス状のシ
リコーン樹脂を塗布して固化したものである。第2の保
護樹脂層4はワニス状のポリイミド系樹脂を塗布して固
化させたものである。また、樹脂被覆体5と回路基板2
とを直接に接着した場合における両者の接着力(両者を
引剥がすに要する力)をAkgf/cm2 としたとき、
第1の保護樹脂層3と樹脂被覆体5との接着力Bkgf
/cm2 と、第2の保護樹脂層4と樹脂被覆体5との接
着力Ckgf/cm2 との間にはB<A<Cの関係があ
る。この関係による利点は後述する。
The first protective resin layer 3 selectively covers substantially only the upper surface of the thick film resistor 7, and covers portions other than the thick film resistor 7, such as the thick film conductor 8 and the thick film electrode 9. The upper surface is an annular region 10 outside the broken line in FIG. 2 where the thick film resistor 7 is not formed.
Is covered with a second protective resin layer 4 different from the first protective resin layer 3 including the upper surface. That is, the second protective resin layer 4 is disposed so as to surround the first protective resin layer 3 when viewed in plan. The first protective resin layer 3 is formed by applying a varnish-like silicone resin and solidifying it. The second protective resin layer 4 is formed by applying and solidifying a varnish-like polyimide resin. In addition, the resin cover 5 and the circuit board 2
When the adhesive strength of the two when they are directly bonded (the force required to peel them off) is Akgf / cm 2 ,
Adhesion Bkgf between first protective resin layer 3 and resin coating 5
/ Cm 2 and the adhesion Ckgf / cm 2 between the second protective resin layer 4 and the resin coating 5 have a relationship of B <A <C. Advantages of this relationship will be described later.

【0010】厚膜電極(ボンディングパッド)9にはリ
ード細線6が接続されており、第2の保護樹脂層4はこ
の細線6の上面をも被覆している。第1の保護樹脂層3
及び第2の保護樹脂層4は樹脂被覆体5によって被覆さ
れている。樹脂被覆体5は、例えばエポキシ樹脂(充填
材を含む)から成り、リード細線6の保護樹脂層4によ
って被覆されなかった部分及び図示しない外部リードの
一部も被覆する。第1の保護樹脂層3と樹脂被覆体5と
の接着力(密着性)は、第2の保護樹脂層4と樹脂被覆
体5との接着力(密着性)よりも劣っている。
A thin lead wire 6 is connected to the thick film electrode (bonding pad) 9, and the second protective resin layer 4 also covers the upper surface of the thin wire 6. First protective resin layer 3
The second protective resin layer 4 is covered with a resin coating 5. The resin coating 5 is made of, for example, an epoxy resin (including a filler), and also covers a portion of the fine lead wire 6 that is not covered with the protective resin layer 4 and a portion of an external lead (not shown). The adhesion (adhesion) between the first protective resin layer 3 and the resin coating 5 is inferior to the adhesion (adhesion) between the second protection resin layer 4 and the resin coating 5.

【0011】上述のように、第1の保護樹脂層3と樹脂
被覆体5との接着力を第2の保護樹脂層4と樹脂被覆体
5との接着力よりも低くすることによって、厚膜抵抗7
の剥離や断線が生じなくなる。この理由を次に述べる。
従来例と同様に樹脂被覆体5が熱膨張等によって回路基
板2の主面から浮き上がっても、本実施例では樹脂被覆
体5と第1の保護樹脂層3との接着性が劣っているた
め、第1の保護樹脂層3が樹脂被覆体5に引張られて浮
き上がることがない。従って、厚膜抵抗7に剥離が生じ
ることがない。一方、厚膜抵抗7の上面以外は第1の保
護樹脂層3よりも樹脂被覆体5との接着性に優れた第2
の保護樹脂層4によって被覆されているので、リード細
線6の厚膜電極9からの剥離や回路基板2上面への不純
物侵入等も防止される。なお、厚膜電極9とリード細線
6の接続部分さらには環状領域10も一様に第1の保護
樹脂層3で被覆しても厚膜抵抗7の剥離や断線は同様に
防止できる。しかし、もしこのようにすると、リード細
線6の接続部分の近くにおいて第1の保護樹脂層3と樹
脂被覆体5との界面で剥離が生じ易くなり、万一剥離が
生ずると、これに伴う応力がリード細線6に加わって、
リード細線6を厚膜電極9から剥離させかねない。ま
た、保護樹脂層と樹脂被覆体5との剥離はその周囲側即
ち回路基板2の外周側から内側に向って進行するので、
回路基板2の外周側の保護樹脂層の樹脂被覆体5に対す
る接着性が悪いと、この剥離の進行が早期に生じ、リー
ド細線6の剥離を早期にまねき易い。また、回路基板2
の外周側を含めてそのほぼ全面を被覆する保護樹脂層を
回路基板2との接着性が良くないと、回路基板2と保護
樹脂層の剥離も生じ易く、保護樹脂層の本来の機能であ
る不純物侵入防止効果等が損なわれる。本実施例では、
リード細線6の接続部分や回路基板2の外周側を含む回
路基板のほぼ全面が第1の保護樹脂層3に比較して樹脂
被覆体5や回路基板2への密着性に優れた第2の保護樹
脂層4によって被覆されているので、このような問題は
生じない。
As described above, by making the adhesive strength between the first protective resin layer 3 and the resin coating 5 lower than the adhesive strength between the second protective resin layer 4 and the resin coating 5, a thick film is formed. Resistance 7
No peeling or disconnection occurs. The reason will be described below.
Even if the resin coating 5 rises from the main surface of the circuit board 2 due to thermal expansion or the like as in the conventional example, the adhesiveness between the resin coating 5 and the first protective resin layer 3 is poor in this embodiment. In addition, the first protective resin layer 3 is not lifted by being pulled by the resin coating 5. Therefore, the thick film resistor 7 does not peel off. On the other hand, other than the upper surface of the thick film resistor 7, the second protective resin layer 5 has better adhesion to the resin coating 5 than the first protective resin layer 3.
Is protected by the protective resin layer 4, peeling of the thin lead wire 6 from the thick film electrode 9 and intrusion of impurities into the upper surface of the circuit board 2 are also prevented. Even if the connection portion between the thick film electrode 9 and the thin lead wire 6 and the annular region 10 are uniformly covered with the first protective resin layer 3, peeling and disconnection of the thick film resistor 7 can be similarly prevented. However, if this is done, peeling is likely to occur at the interface between the first protective resin layer 3 and the resin coating body 5 near the connection portion of the lead thin wire 6, and if peeling occurs, the stress accompanying the peeling will occur. Is added to the lead wire 6,
The thin lead wire 6 may be peeled off from the thick film electrode 9. In addition, since the separation between the protective resin layer and the resin coating body 5 proceeds from the peripheral side thereof, that is, from the outer peripheral side of the circuit board 2 toward the inside,
If the adhesiveness of the protective resin layer on the outer peripheral side of the circuit board 2 to the resin coating body 5 is poor, the progress of the peeling occurs early, and the peeling of the thin lead wires 6 is likely to be caused early. Also, the circuit board 2
If the adhesion of the protective resin layer covering almost the entire surface including the outer peripheral side of the protective resin layer to the circuit board 2 is not good, peeling of the circuit board 2 and the protective resin layer easily occurs, which is an original function of the protective resin layer. The effect of preventing impurities from entering is impaired. In this embodiment,
Almost the entire surface of the circuit board including the connection portion of the lead thin wires 6 and the outer peripheral side of the circuit board 2 has a second adhesive layer which is more excellent in adhesion to the resin coating 5 and the circuit board 2 than the first protective resin layer 3. Such a problem does not occur because the resin is covered with the protective resin layer 4.

【0012】なお、厚膜抵抗7を被覆する第1の保護樹
脂層3が少なくとも第2の保護樹脂層4よりも樹脂被覆
体5に対する接着性が低ければ本発明の目的が達成され
ることも考えられるが、実際には、第1の保護樹脂層3
と樹脂被覆体5との接着性が樹脂被覆体5と回路基板2
との接着性よりも低くないと本発明の作用効果は十分に
発揮されない。即ち、第1の保護樹脂層3と樹脂被覆体
5との密着性が樹脂被覆体5と回路基板2との接着性と
同等のレベルであると、回路基板2を樹脂被覆体5で直
接被覆した場合に両者に剥離が生じる程度になるまで、
第1の保護樹脂層3と樹脂被覆体5とが接着性を良好に
保つため、その間、厚膜導体に引張り力が加わりかねな
いからである。従って、上述のようにB<A<Cとする
ことが望ましい。
The object of the present invention can be achieved if the first protective resin layer 3 covering the thick film resistor 7 has lower adhesiveness to the resin coating 5 than at least the second protective resin layer 4. Although it is conceivable, in practice, the first protective resin layer 3
Between the resin coating 5 and the circuit board 2
If the adhesiveness is not lower than the adhesiveness, the function and effect of the present invention cannot be sufficiently exhibited. That is, if the adhesion between the first protective resin layer 3 and the resin coating 5 is at the same level as the adhesion between the resin coating 5 and the circuit board 2, the circuit board 2 is directly covered with the resin coating 5. Until the peeling of both occurs
This is because the first protective resin layer 3 and the resin coating 5 maintain good adhesiveness, and during this time, a tensile force may be applied to the thick film conductor. Therefore, it is desirable that B <A <C as described above.

【0013】[0013]

【変形例】本発明は、上述の実施例に係わるものでな
く、例えば次の変形が可能なものである。 (1) 第1及び第2の保護樹脂層3、4を共に接着力
の互いに異なるポリイミド系ワニスで形成することがで
きる。 (2) 厚膜抵抗7をAg−Pd抵抗ペースト等で形成
することもできる。
[Modifications] The present invention does not relate to the above-described embodiment, and for example, the following modifications are possible. (1) Both the first and second protective resin layers 3 and 4 can be formed of polyimide varnishes having different adhesive strengths. (2) The thick film resistor 7 may be formed of an Ag-Pd resistor paste or the like.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例に係わるハイブリッドICの一
部を示す断面図である。
FIG. 1 is a sectional view showing a part of a hybrid IC according to an embodiment of the present invention.

【図2】図1の回路基板とこの上面の厚膜抵抗と厚膜導
体とを説明的に示す平面図である。
FIG. 2 is a plan view for explaining the circuit board of FIG. 1 and a thick film resistor and a thick film conductor on the upper surface thereof.

【符号の説明】[Explanation of symbols]

2 回路基板 3 第1の保護樹脂層 4 第2の保護樹脂層 5 樹脂被覆体 7 厚膜抵抗 8 厚膜導体 Reference Signs List 2 circuit board 3 first protective resin layer 4 second protective resin layer 5 resin coating 7 thick film resistor 8 thick film conductor

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 その上面の一部に厚膜抵抗が形成された
回路基板と、 前記厚膜抵抗の上面を被覆している第1の保護樹脂層
と、 前記厚膜抵抗以外の部分を被覆するものであって、平面
的に見て前記第1の保護樹脂層を囲むように配置されい
る第2の保護樹脂層と、 前記第1の保護樹脂層及び前記第2の保護樹脂層の上を
被覆している樹脂被覆体とを備え、第1の保護樹脂層の
前記樹脂被覆体に対する接着力が第2の保護樹脂層の前
記樹脂被覆体に対する接着力よりも低いことを特徴とす
る樹脂封止形電子部品。
1. A circuit board having a thick film resistor formed on a part of its upper surface, a first protective resin layer covering the upper surface of the thick film resistor, and covering a portion other than the thick film resistor. A second protective resin layer disposed so as to surround the first protective resin layer when viewed in a plan view, and on the first protective resin layer and the second protective resin layer. Wherein the adhesive strength of the first protective resin layer to the resin coated body is lower than the adhesive strength of the second protective resin layer to the resin coated body. Sealed electronic components.
【請求項2】 前記樹脂被覆体の前記回路基板に対する
接着力をA、前記第1の保護樹脂層の前記樹脂被覆体に
対する接着力をB、前記第2の保護樹脂層の前記樹脂被
覆体に対する接着力をCとした場合に、B<A<Cを満
足するように前記第1及び第2の保護樹脂層の接着力が
決定されていることを特徴とする請求項1記載の樹脂封
止形電子部品。
2. The adhesive strength of the resin coating to the circuit board is A, the adhesive strength of the first protective resin layer to the resin coating is B, and the adhesive strength of the second protective resin layer to the resin coating is 2. 2. The resin encapsulation according to claim 1, wherein when the adhesive strength is C, the adhesive strength of the first and second protective resin layers is determined so as to satisfy B <A <C. Shaped electronic components.
JP34962595A 1995-12-20 1995-12-20 Resin-sealed electronic components Expired - Fee Related JP2720864B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34962595A JP2720864B2 (en) 1995-12-20 1995-12-20 Resin-sealed electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34962595A JP2720864B2 (en) 1995-12-20 1995-12-20 Resin-sealed electronic components

Publications (2)

Publication Number Publication Date
JPH09172109A JPH09172109A (en) 1997-06-30
JP2720864B2 true JP2720864B2 (en) 1998-03-04

Family

ID=18405008

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34962595A Expired - Fee Related JP2720864B2 (en) 1995-12-20 1995-12-20 Resin-sealed electronic components

Country Status (1)

Country Link
JP (1) JP2720864B2 (en)

Also Published As

Publication number Publication date
JPH09172109A (en) 1997-06-30

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