JP2588854B2 - Developing device - Google Patents

Developing device

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Publication number
JP2588854B2
JP2588854B2 JP7011403A JP1140395A JP2588854B2 JP 2588854 B2 JP2588854 B2 JP 2588854B2 JP 7011403 A JP7011403 A JP 7011403A JP 1140395 A JP1140395 A JP 1140395A JP 2588854 B2 JP2588854 B2 JP 2588854B2
Authority
JP
Japan
Prior art keywords
substrate
developing
processed
developing solution
developer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP7011403A
Other languages
Japanese (ja)
Other versions
JPH07263338A (en
Inventor
圭蔵 長谷部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP7011403A priority Critical patent/JP2588854B2/en
Publication of JPH07263338A publication Critical patent/JPH07263338A/en
Application granted granted Critical
Publication of JP2588854B2 publication Critical patent/JP2588854B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、半導体ウエハ等の被処
理基板の現像処理を行なう現像装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a developing apparatus for developing a substrate to be processed such as a semiconductor wafer.

【0002】[0002]

【従来の技術】一般に、半導体ウエハ等の被処理基板の
現像処理を行なう現像装置では、表面にフォトレジスト
等の感光性膜が形成された被処理基板が配置される処理
室と、この処理室内から排気する手段と、被処理基板と
現像液とを所定の現像時間の間接触させ、感光性膜に所
定の化学変化を生じさせて現像を行なう手段とを備えて
いる。
2. Description of the Related Art In general, in a developing apparatus for developing a substrate to be processed such as a semiconductor wafer, a processing chamber in which a substrate on which a photosensitive film such as a photoresist is formed is disposed, and a processing chamber is provided in the processing chamber. And a means for bringing the substrate to be processed and the developing solution into contact with each other for a predetermined developing time to cause a predetermined chemical change in the photosensitive film to perform development.

【0003】そして、処理室内に配置された載置台上に
半導体ウエハ等の被処理基板を配置して、現像液、純水
等のリンス液を順次スプレ―ノズル等から被処理基板に
供給して、現像を行なう。
A substrate to be processed such as a semiconductor wafer is placed on a mounting table disposed in a processing chamber, and a rinsing liquid such as a developer and pure water is sequentially supplied to the substrate from a spray nozzle or the like. And develop.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上述の
従来の現像装置では、多量の現像液を必要とするため、
現像コストが高くなるという問題がある。
However, in the above-mentioned conventional developing device, a large amount of developing solution is required.
There is a problem that the development cost is increased.

【0005】本発明者等は、このような問題を解決する
ため、被処理基板を現像液中に浸漬するようにして現像
を行なうディップ型の現像装置の開発を行なってきた。
そしてディップ型の現像装置では、例えば現像時間短縮
のための現像液の改良による現像の高速化、被処理基板
の大型化等を行なう場合、被処理基板面内で、現像状態
が不均一となり、例えば精密写真技術を用いて、半導体
ウエハ上に微細パタ―ンを形成する場合等では、半導体
ウエハ面に形成される線幅等が不均一になるという問題
が発生することが判明した。
In order to solve such a problem, the present inventors have developed a dip-type developing apparatus that performs development by immersing a substrate to be processed in a developing solution.
In a dip type developing device, for example, when speeding up the development by improving the developing solution to shorten the developing time, or when increasing the size of the substrate to be processed, the development state becomes uneven within the surface of the substrate to be processed, For example, when a fine pattern is formed on a semiconductor wafer using a precision photographic technique, it has been found that a problem arises in that the line width and the like formed on the semiconductor wafer surface become non-uniform.

【0006】本発明は、上記問題に対処してなされたも
ので、少量の現像液で現像処理を行なうことができ、現
像コストの低減および効率の向上を図ることができ、か
つ、例えば高速な現像液を用いて、大型の被処理基板の
現像を行なう場合でも面内の現像状態が均一となるよう
に現像処理を行なうことができ、半導体ウエハ面に形成
される線幅等を均一化することのできる現像方法を提供
しようとするものである。
SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and can perform a developing process using a small amount of a developing solution. Thus, the developing cost can be reduced and the efficiency can be improved. Even when a large substrate to be processed is developed using a developer, development processing can be performed so that the in-plane development state is uniform, and the line width and the like formed on the semiconductor wafer surface are made uniform. It is intended to provide a developing method which can be performed.

【0007】[0007]

【課題を解決するための手段】請求項1記載の発明は、
表面に感光性膜が形成された被処理基板を、前記被処理
基板の周囲を囲む容器内に配置し、前記容器内に現像液
を供給して、前記被処理基板を前記現像液に接触させる
現像装置であって、前記被処理基板の周囲を囲む壁面を
形成する如く形成され、当該壁面の下端と前記被処理基
板の載置面との間に間隙を形成する如く上方から延在す
るリング状部材と、 前記リング状部材の外側面に向けて
現像液を供給し、前記リング状部材の外側面に当たった
現像液が下方へ向かい、前記間隙から前記載置面に沿っ
て前記被処理基板方向へ供給されるよう構成された現像
液供給口とを具備した現像液供給機構により、前記現像
液を供給することを特徴とする。
According to the first aspect of the present invention,
A substrate having a photosensitive film formed on its surface is disposed in a container surrounding the substrate to be processed, and a developer is supplied into the container to bring the substrate into contact with the developer. A developing device, wherein a wall surrounding the periphery of the substrate to be processed is
The lower end of the wall and the substrate to be treated.
Extends from above so as to form a gap between the plate and the mounting surface
Ring-shaped member and an outer surface of the ring-shaped member.
The developer was supplied and hit the outer surface of the ring-shaped member.
The developer flows downward, and from the gap, along the mounting surface described above.
And a developing device configured to be supplied toward the substrate to be processed.
The developer is supplied by a developer supply mechanism having a liquid supply port .

【0008】また、請求項2記載の発明は、表面に感光
性膜が形成された被処理基板を、前記被処理基板の周囲
を囲む容器内に配置し、前記容器内に現像液を供給し
て、前記被処理基板を前記現像液に接触させる現像装置
であって、前記被処理基板の周囲を囲む壁面を形成する
如く形成され、当該壁面の下端と前記被処理基板の載置
面との間に間隙を形成する如く上方から延在するリング
状部材と、 前記リング状部材の外側面に向けて現像液を
供給し、前記リング状部材の外側面に当たった現像液が
下方へ向かい、前記間隙から前記載置面に沿って前記被
処理基板方向へ供給されるよう構成された現像液供給口
を具備した現像液供給機構により、処理室内の排気を
停止した状態で前記現像液を供給することを特徴とす
る。
According to a second aspect of the present invention, a substrate having a photosensitive film formed on its surface is disposed in a container surrounding the substrate to be processed, and a developer is supplied into the container. A developing device for contacting the substrate to be processed with the developing solution, wherein a wall surrounding the periphery of the substrate is formed.
The lower end of the wall surface and the placement of the substrate to be processed are formed as described above.
Ring extending from above so as to form a gap with the surface
And a developing solution toward the outer surface of the ring-shaped member.
The developer supplied and applied to the outer surface of the ring-shaped member is
Going downward, the cover extends along the mounting surface from the gap.
Developer supply port configured to be supplied toward the processing substrate
And supplying the developer in a state in which the exhaust of the processing chamber is stopped.

【0009】[0009]

【作用】本発明の現像装置では、被処理基板をその周囲
を囲む容器内に配置し、当該被処理基板の周囲を囲む如
く形成された現像液供給口と、この現像液供給口と被処
理基板との間に設けられ、現像液供給口から水平方向に
向かう現像液流を下方へ向け、下部に設けられた間隙か
ら被処理基板方向へ供給するリング状部材とを具備した
現像液供給機構により、現像液を供給する。
In the developing device of the present invention, the substrate to be processed is disposed in a container surrounding the substrate, and a developer supply port formed so as to surround the substrate to be processed; A ring-shaped member provided between the substrate and the substrate, the developer flowing in the horizontal direction from the developer supply port being directed downward, and a ring-shaped member being supplied from the gap provided below toward the substrate to be processed. Supplies a developer.

【0010】したがって、被処理基板の周囲から被処理
基板とほぼ平行に供給される現像液流によって、被処理
基板表面全面に渡って、高速かつ均一に現像液を供給す
ることができ、また現像液に無駄がなく必要な現像液の
量も少量となる。さらに、感光性膜に現像液圧が加わる
ことも防止できる。
Therefore, the developer can be supplied at high speed and uniformly over the entire surface of the substrate by the flow of the developer supplied from the periphery of the substrate substantially parallel to the substrate. There is no waste of the liquid, and the amount of the developer required is small. Further, it is possible to prevent the developer pressure from being applied to the photosensitive film.

【0011】また、本発明では、処理室内の排気を停止
した状態で現像液を供給するので、気体流による現像液
の温度低下及び温度不均一が発生することを防止するこ
とができる。
[0011] In the present invention, since the supplying a developing solution in a state of stopping the exhaust processing chamber, it is possible to prevent the temperature decrease and the temperature unevenness of the developer by the gas flow is generated.

【0012】これによって、少量の現像液で効率よく現
像処理を行なうことができ、現像コストの低減を図るこ
とができ、かつ、例えば高速な現像液を用いて、大型の
被処理基板の現像を行なう場合でも、面内の現像状態が
均一となるように現像処理を行なうことができ、半導体
ウエハ面に形成される線幅等を均一化することができ
る。
Thus, the developing process can be efficiently performed with a small amount of developing solution, the developing cost can be reduced, and the development of a large substrate to be processed can be performed by using, for example, a high-speed developing solution. Even in the case of performing, the development processing can be performed so that the in-plane development state becomes uniform, and the line width and the like formed on the semiconductor wafer surface can be made uniform.

【0013】[0013]

【実施例】以下本発明の現像装置を図面を参照して実施
例について説明する。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of a developing device according to an embodiment of the present invention.

【0014】図1は、本発明の一実施例の現像装置1の
構成を示している。この実施例における現像装置1で
は、処理室2内には、半導体ウエハ等の被処理基板3を
吸着保持する真空チャックおよび回転機構4aを備えた
載置台4が配置されている。
FIG. 1 shows the structure of a developing device 1 according to one embodiment of the present invention. In the developing apparatus 1 of this embodiment, a mounting table 4 provided with a vacuum chuck for holding a substrate 3 to be processed such as a semiconductor wafer by suction and a rotating mechanism 4a is disposed in the processing chamber 2.

【0015】また処理室2内には、図2にも示すよう
に、上下動可能とされ、被処理基板3を真空チャック等
により吸着保持するとともに、被処理基板3の周囲を囲
む環状の堰を形成する環状部材5aが配置されている。
この環状部材5aには載置台4の周囲を囲むように配置
され、被処理基板3方向へ被処理基板3とほぼ平行する
現像液流を形成する複数の現像液供給口5bが配置され
ている。そして、環状部材5a上には、現像液供給口5
bと間隔をもって対向する対向部5cを形成し、現像液
流を下方へ向けるリング状部材5dが載置されており、
現像液供給部が形成されている。
As shown in FIG. 2, the processing chamber 2 is vertically movable, holds the substrate 3 to be processed by a vacuum chuck or the like, and has an annular weir surrounding the substrate 3. Is formed.
A plurality of developer supply ports 5b are arranged on the annular member 5a so as to surround the mounting table 4 and form a developer flow substantially parallel to the substrate 3 in the direction of the substrate 3 to be processed. . The developer supply port 5 is provided on the annular member 5a.
A ring-shaped member 5d is formed to form an opposing portion 5c opposing at an interval b, and to direct the flow of the developer downward.
A developer supply section is formed.

【0016】そして、載置台4上方には、被処理基板3
に純水等のリンス液を供給するリンスノズル6が配置さ
れている。
The substrate 3 to be processed is located above the mounting table 4.
A rinsing nozzle 6 for supplying a rinsing liquid, such as pure water, is provided.

【0017】また、処理室2の下部には、廃液排出用開
口7と、排気装置8に接続された排気用開口9が配置さ
れており、排気装置8と排気用開口9との間には、排気
路の開閉を行なうシャッタ10が介挿されている。
In the lower part of the processing chamber 2, a waste liquid discharge opening 7 and an exhaust opening 9 connected to an exhaust device 8 are arranged. A shutter 10 for opening and closing the exhaust path is interposed.

【0018】上記構成のこの実施例の現像装置では、例
えば図示しないマイクロコンピュ―タ等からなる制御部
によって例えば以下のように制御され、現像処理を行な
う。すなわち、まず、図示しない搬送装置等により被処
理基板3が載置台4上に載置され、載置台4の真空チャ
ックが作動され、被処理基板3が載置台4上に吸着保持
される。
In the developing apparatus of this embodiment having the above-described configuration, the developing unit performs a developing process under the control of, for example, a microcomputer (not shown) as follows. That is, first, the substrate to be processed 3 is placed on the mounting table 4 by a transfer device or the like (not shown), the vacuum chuck of the mounting table 4 is operated, and the substrate to be processed 3 is suction-held on the mounting table 4.

【0019】次に、環状部材5aを上昇させ、被処理基
板3を載置台4から環状部材5aに移動させ、現像液供
給口5bから、被処理基板3方向へ被処理基板3とほぼ
平行する現像液流を形成し、対向部5cによってこの現
像液流を下方へ向けて現像液を供給し、環状部材5a内
に現像液を貯留して、あらかじめ設定された例えば30秒
等の所定の現像時間、現像液を被処理基板3に接触させ
て、被処理基板3表面に形成されたフォトレジスト等の
感光性膜の現像を行なう。この現像時間中は、シャッタ
11は閉塞され、処理室2内からの排気は停止されてい
る。このように処理室2内からの排気を停止することに
より、気体流による現像液の温度低下及び温度不均一が
発生することを防止することができる。
Next, the annular member 5a is raised, and the substrate 3 to be processed is moved from the mounting table 4 to the annular member 5a, and is substantially parallel to the substrate 3 in the direction of the substrate 3 from the developer supply port 5b. A developing solution flow is formed, the developing solution is supplied downward by the facing portion 5c, the developing solution is supplied, and the developing solution is stored in the annular member 5a. The developer is brought into contact with the substrate 3 for a certain period of time to develop a photosensitive film such as a photoresist formed on the surface of the substrate 3. During this development time, the shutter 11 is closed and the exhaust from the processing chamber 2 is stopped. By stopping the exhaust from the inside of the processing chamber 2 in this manner, it is possible to prevent the temperature of the developing solution from being lowered and the temperature from being uneven due to the gas flow.

【0020】この後、環状部材5aを下降させ、被処理
基板3を環状部材5aから載置台4に移動させると共
に、現像液を排出し、回転機構4aによって被処理基板
3を例えば 500rpm 〜2000rpm 程度の第1の回転数で回
転させ、リンスノズル6から純水等のリンス液を被処理
基板3表面に供給する。この時は、シャッタ10は開と
され、10〜20mmH2 O程度の排気量で処理室2からの排
気が行なわれる。
Thereafter, the annular member 5a is lowered, the substrate 3 is moved from the annular member 5a to the mounting table 4, the developing solution is discharged, and the substrate 3 is rotated by, for example, about 500 to 2000 rpm by the rotating mechanism 4a. Then, a rinse liquid such as pure water is supplied from the rinse nozzle 6 to the surface of the substrate 3 to be processed. At this time, the shutter 10 is opened, and the exhaust from the processing chamber 2 is performed with an exhaust amount of about 10 to 20 mmH2O.

【0021】上記リンス操作が、例えば10秒〜20秒程度
の所定時間行なわれた後、リンスノズル6からのリンス
液の供給を停止して、被処理基板3の回転を例えば3000
rpm〜5000rpm 程度の第2の回転数に上昇させて被処理
基板3表面に付着した液体を遠心力により除去し、被処
理基板3を乾燥させる。この間も、シャッタ11は開と
され、10〜20mmH2 O程度の排気量で処理室2からの排
気が行なわれる。
After the rinsing operation has been performed for a predetermined time of, for example, about 10 to 20 seconds, the supply of the rinsing liquid from the rinsing nozzle 6 is stopped, and the rotation of the substrate 3 to be processed is for example 3000
The liquid that has adhered to the surface of the substrate 3 is removed by centrifugal force by increasing the rotation speed to a second rotation speed of about rpm to 5000 rpm, and the substrate 3 is dried. Also during this time, the shutter 11 is opened, and the exhaust from the processing chamber 2 is performed with an exhaust amount of about 10 to 20 mmH2O.

【0022】被処理基板3の乾燥が終了すると、回転機
構4aが停止され、図示しない搬送装置によって、被処
理基板3が処理室2内から搬出される。
When the drying of the substrate 3 is completed, the rotation mechanism 4a is stopped, and the substrate 3 is carried out of the processing chamber 2 by a transport device (not shown).

【0023】すなわち、この実施例の現像方法では、被
処理基板3を、環状部材5aと被処理基板3とで形成し
た容器内に供給した現像液と接触させて現像した後、載
置台4の回転速度を切替えてリンス液の供給と乾燥とを
行っているため、少量の現像液で効率よく、かつ均一に
現像処理を行なうことができる。
That is, in the developing method of this embodiment, after the substrate 3 to be processed is brought into contact with the developing solution supplied into the container formed by the annular member 5a and the substrate 3 to be developed, Since the supply of the rinsing liquid and the drying are performed by switching the rotation speed, the developing process can be efficiently and uniformly performed with a small amount of the developing liquid.

【0024】また、現像液供給口5bから被処理基板3
方向へ被処理基板3とほぼ平行する現像液流を形成し、
リング状部材5dの対向部5cによってこの現像液流を
下方へ向けて現像液を供給し、環状部材5a内に現像液
を貯留して、所定の現像時間、現像液を被処理基板3に
接触させて、被処理基板表面に形成されたフォトレジス
ト等の感光性膜の現像を行なう。したがって、被処理基
板表面全面に渡って、高速かつ均一に現像液を供給する
ことができ、被処理基板3面内の現像状態が均一となる
ように現像処理を行なうことができる。また、例えば現
像液をシャワー状に供給する場合等に比べてフォトレジ
スト等に現像液圧が加わることを防止できるので、この
点においても被処理基板3面内の現像状態が均一となる
ように現像処理を行なうことができる。
Further, the substrate 3 to be processed is supplied from the developer supply port 5b.
Forming a developer flow substantially parallel to the substrate 3 in the direction,
The developing solution is supplied downward by the facing portion 5c of the ring-shaped member 5d, and the developing solution is stored in the annular member 5a. The developing solution contacts the substrate 3 for a predetermined developing time. Then, a photosensitive film such as a photoresist formed on the surface of the substrate to be processed is developed. Accordingly, the developing solution can be supplied at high speed and uniformly over the entire surface of the substrate to be processed, and the developing process can be performed so that the developing state on the surface of the substrate 3 becomes uniform. In addition, since it is possible to prevent the developer pressure from being applied to the photoresist or the like as compared with a case where the developer is supplied in the form of a shower, for example, the development state on the surface of the substrate 3 to be processed is also uniform. Development processing can be performed.

【0025】[0025]

【発明の効果】上述のように、本発明の現像装置では、
少量の現像液で効率よく現像処理を行なうことができ、
現像コストの低減を図ることができ、かつ、例えば高速
な現像液を用いて、大型の被処理基板の現像を行なう場
合でも面内の現像状態が均一となるように現像処理を行
なうことができ、半導体ウエハ面に形成される線幅等を
均一化することができる。
As described above, in the developing device of the present invention,
Development processing can be performed efficiently with a small amount of developer,
The development cost can be reduced, and the development process can be performed so that the in-plane development state becomes uniform even when developing a large-sized substrate using, for example, a high-speed developer. In addition, the line width and the like formed on the semiconductor wafer surface can be made uniform.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例の現像装置の構成を示す図。FIG. 1 is a diagram illustrating a configuration of a developing device according to an embodiment of the present invention.

【図2】図1に示す現像装置の要部を拡大して示す縦断
面図。
FIG. 2 is an enlarged longitudinal sectional view showing a main part of the developing device shown in FIG. 1;

【符号の説明】[Explanation of symbols]

1……現像装置、3……被処理基板、5a……環状部
材、5b……現像液供給口、5c……対向部、5d……
リング状部材。
Reference numeral 1 denotes a developing device, 3 denotes a substrate to be processed, 5a denotes an annular member, 5b denotes a developing solution supply port, 5c denotes an opposing portion, and 5d denotes a developing solution supply port.
Ring-shaped member.

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 表面に感光性膜が形成された被処理基板
を、前記被処理基板の周囲を囲む容器内に配置し、前記
容器内に現像液を供給して、前記被処理基板を前記現像
液に接触させる現像装置であって、前記被処理基板の周囲を囲む壁面を形成する如く形成さ
れ、当該壁面の下端と前記被処理基板の載置面との間に
間隙を形成する如く上方から延在するリング状部材と、 前記リング状部材の外側面に向けて現像液を供給し、前
記リング状部材の外側面に当たった現像液が下方へ向か
い、前記間隙から前記載置面に沿って前記被処理基板方
向へ供給されるよう構成された現像液供給口と を具備し
た現像液供給機構により、 前記現像液を供給することを特徴とする現像装置。
A substrate having a photosensitive film formed on a surface thereof is disposed in a container surrounding a periphery of the substrate to be processed, and a developing solution is supplied into the container; A developing device to be brought into contact with a developing solution, the developing device being formed so as to form a wall surrounding a periphery of the substrate to be processed.
Between the lower end of the wall surface and the mounting surface of the substrate to be processed.
A ring-shaped member extending from above so as to form a gap; and supplying a developer toward an outer surface of the ring-shaped member.
The developer that has hit the outer surface of the ring-shaped member moves downward.
From the gap along the mounting surface,
And a developing solution supply mechanism having a developing solution supply port configured to supply the developing solution to the developing device.
【請求項2】 表面に感光性膜が形成された被処理基板
を、前記被処理基板の周囲を囲む容器内に配置し、前記
容器内に現像液を供給して、前記被処理基板を前記現像
液に接触させる現像装置であって、前記被処理基板の周囲を囲む壁面を形成する如く形成さ
れ、当該壁面の下端と前記被処理基板の載置面との間に
間隙を形成する如く上方から延在するリング状部材と、 前記リング状部材の外側面に向けて現像液を供給し、前
記リング状部材の外側面に当たった現像液が下方へ向か
い、前記間隙から前記載置面に沿って前記被処理基板方
向へ供給されるよう構成された現像液供給口と を具備し
た現像液供給機構により、 処理室内の排気を停止した状態で前記現像液を供給する
ことを特徴とする現像装置。
2. A processing target substrate having a photosensitive film formed on a surface thereof is disposed in a container surrounding a periphery of the processing target substrate, and a developing solution is supplied into the container so that the processing target substrate is formed. A developing device to be brought into contact with a developing solution, the developing device being formed so as to form a wall surrounding a periphery of the substrate to be processed.
Between the lower end of the wall surface and the mounting surface of the substrate to be processed.
A ring-shaped member extending from above so as to form a gap; and supplying a developer toward an outer surface of the ring-shaped member.
The developer that has hit the outer surface of the ring-shaped member moves downward.
From the gap along the mounting surface,
A developing solution supply mechanism having a developing solution supply port configured to supply the developing solution to the developing chamber in a state where the exhaust in the processing chamber is stopped.
JP7011403A 1995-01-27 1995-01-27 Developing device Expired - Fee Related JP2588854B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7011403A JP2588854B2 (en) 1995-01-27 1995-01-27 Developing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7011403A JP2588854B2 (en) 1995-01-27 1995-01-27 Developing device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP61311167A Division JPH0611024B2 (en) 1986-12-29 1986-12-29 Development method

Publications (2)

Publication Number Publication Date
JPH07263338A JPH07263338A (en) 1995-10-13
JP2588854B2 true JP2588854B2 (en) 1997-03-12

Family

ID=11777061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7011403A Expired - Fee Related JP2588854B2 (en) 1995-01-27 1995-01-27 Developing device

Country Status (1)

Country Link
JP (1) JP2588854B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7138493B2 (en) * 2018-06-28 2022-09-16 東京エレクトロン株式会社 Substrate liquid processing method, storage medium and substrate liquid processing apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5666044A (en) * 1979-11-05 1981-06-04 Toshiba Corp Semiconductor device
JPS5745232A (en) * 1980-08-29 1982-03-15 Matsushita Electric Ind Co Ltd Device and method for developing

Also Published As

Publication number Publication date
JPH07263338A (en) 1995-10-13

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