JP2582256Y2 - Composite semiconductor device - Google Patents

Composite semiconductor device

Info

Publication number
JP2582256Y2
JP2582256Y2 JP1992055484U JP5548492U JP2582256Y2 JP 2582256 Y2 JP2582256 Y2 JP 2582256Y2 JP 1992055484 U JP1992055484 U JP 1992055484U JP 5548492 U JP5548492 U JP 5548492U JP 2582256 Y2 JP2582256 Y2 JP 2582256Y2
Authority
JP
Japan
Prior art keywords
gel
coating agent
hole
lid
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1992055484U
Other languages
Japanese (ja)
Other versions
JPH0611356U (en
Inventor
昭夫 鈴木
美枝 宮原
Original Assignee
日本インター株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by 日本インター株式会社 filed Critical 日本インター株式会社
Priority to JP1992055484U priority Critical patent/JP2582256Y2/en
Publication of JPH0611356U publication Critical patent/JPH0611356U/en
Application granted granted Critical
Publication of JP2582256Y2 publication Critical patent/JP2582256Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】[Detailed description of the invention]

【0001】[0001]

【産業上の利用分野】本考案は、絶縁ケース内部に樹脂
が充填されて電子部品等を樹脂封止する形式の複合半導
体装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a composite semiconductor device of the type in which an insulating case is filled with a resin and electronic components and the like are sealed with a resin.

【0002】[0002]

【従来の技術】この種の複合半導体装置の構造の概略を
図5の斜視図及び図6の断面模式図に示す。これらの図
において、複合半導体装置1は金属製の放熱板2を有
し、該放熱板2上に回路基板3が半田固着されている。
この回路基板3は絶縁物、主としてセラミック板からな
り、その下面には全面に亘って金属層が形成され、放熱
板2への半田付けが可能なようにしてある。回路基板3
の上面は、金属からなる図示を省略した導体パターン層
が形成され、この導体パターン層上には半導体チップ等
の電子部品が搭載・固着され、さらに回路基板3の所定
の位置には、外部へ導出するための主端子4及び信号端
子5が半田固着されている。
2. Description of the Related Art The structure of a composite semiconductor device of this type is schematically shown in a perspective view of FIG. 5 and a schematic sectional view of FIG. In these figures, the composite semiconductor device 1 has a metal radiator plate 2, and a circuit board 3 is fixed on the radiator plate 2 by soldering.
The circuit board 3 is made of an insulator, mainly a ceramic plate, and a metal layer is formed on the entire lower surface thereof so that it can be soldered to the heat sink 2. Circuit board 3
A conductive pattern layer (not shown) made of metal is formed on the upper surface of the circuit board. Electronic components such as semiconductor chips are mounted and fixed on the conductive pattern layer. A main terminal 4 and a signal terminal 5 for leading out are fixed by soldering.

【0003】放熱板2の外周縁には、両端開口の絶縁ケ
ース6が固着されている。この絶縁ケース6の内側に
は、半導体チップ、その他の電子部品が埋没する程度に
シリコーンゴム系のゲル状コート剤7が充填されてい
る。このゲル状コート剤7上にエポキシ樹脂8等の熱硬
化性樹脂が充填された後、主端子4及び信号端子5を挿
通させた蓋体9が絶縁ケース6の開口端を塞ぐように配
置され、エポキシ樹脂8により固着される。なお、絶縁
ケース6の上端開口部の内側には必要に応じて凹部10
が設けられ、この凹部10内にエポキシ樹脂8が入り込
むことにより、当該樹脂8の上方への抜け止めの役割を
果たさせている。蓋体9から外部に導出された主端子4
は、該蓋体9の上面上に略直角に折曲げられ、図6に示
すような複合半導体装置1が完成する。
An insulating case 6 having openings at both ends is fixed to the outer peripheral edge of the heat sink 2. The inside of the insulating case 6 is filled with a silicone rubber-based gel coating agent 7 to such an extent that a semiconductor chip and other electronic components are buried. After the thermosetting resin such as the epoxy resin 8 is filled on the gel coating agent 7, the lid 9 through which the main terminal 4 and the signal terminal 5 are inserted is arranged so as to close the opening end of the insulating case 6. Is fixed by an epoxy resin 8. The inside of the upper end opening of the insulating case 6 is provided with a concave
Is provided, and the epoxy resin 8 enters the concave portion 10 so as to function to prevent the resin 8 from coming off. Main terminal 4 led out from lid 9
Is bent at a substantially right angle on the upper surface of the lid 9 to complete the composite semiconductor device 1 as shown in FIG.

【0004】[0004]

【考案が解決しようとする課題】ところで、図5及び図
6に示す構造の複合半導体装置を実際に電流を流して運
転すると、回路基板3上に搭載・固着された半導体チッ
プ及び他の電子部品から発生した熱は、放熱板2を介し
て外部へ放出される。しかし、定格以上の過負荷運転を
した場合には、それに応じて発熱量も多くなる。かかる
場合には、ゲル状コート剤7の膨張量が大きくなり、約
10%増加し体積が許容量を越えてしまう。これにより
ゲル状コート剤7中に埋没している電子部品に応力が加
わり、最悪の場合には半導体チップ等の電子部品を破壊
させてしまう。さらに、放熱板2と絶縁ケース6との固
着箇所がゲル状コート剤7の膨張によって剥がれてしま
うことがある。また、エポキシ樹脂8を上方に押し上げ
て当該エポキシ樹脂8が絶縁ケース6の上端からはみ出
し、製品外観を損ねることがあるなどの解決すべき課題
があった。
By the way, when the composite semiconductor device having the structure shown in FIGS. 5 and 6 is actually operated by passing a current, the semiconductor chip and other electronic components mounted and fixed on the circuit board 3 are operated. Is released to the outside through the radiator plate 2. However, when an overload operation exceeding the rating is performed, the calorific value increases accordingly. In such a case, the swelling amount of the gel-like coating agent 7 increases, and increases by about 10%, and the volume exceeds the allowable amount. As a result, stress is applied to the electronic components buried in the gel coating agent 7, and in the worst case, the electronic components such as semiconductor chips are destroyed. Further, the fixing portion between the heat radiating plate 2 and the insulating case 6 may come off due to the expansion of the gel coating agent 7. Further, there is a problem to be solved such that the epoxy resin 8 is pushed upward and the epoxy resin 8 protrudes from the upper end of the insulating case 6 and may impair the product appearance.

【0005】[0005]

【考案の目的】本考案は、上記のような課題を解決する
ためになされたもので、回路基板上に搭載・固着された
半導体チップ等の電子部品からの発熱によってゲル状コ
ート剤7が膨張しても上記電子部品を破壊させることが
なく、また、エポキシ樹脂のはみ出しによって製品外観
を損ねることがない複合半導体装置を提供することを目
的とする。
The purpose of the present invention is to solve the above-mentioned problem, and the gel-like coating agent 7 expands due to heat generated from electronic components such as semiconductor chips mounted and fixed on a circuit board. It is an object of the present invention to provide a composite semiconductor device which does not destroy the electronic component and does not impair the appearance of the product due to the protrusion of the epoxy resin.

【0006】[0006]

【問題点を解決するための手段】本考案の複合半導体装
置は、放熱板の上面に回路基板が固着され、該回路基板
上に電子部品、外部導出用の主端子及び信号端子が搭載
され、上記放熱板の外周に両端開口の絶縁ケースの一端
が固着され、他端開口部に、主端子及び信号端子を貫通
させた蓋体が被せられ、絶縁ケースの内側の底部に電子
部品を覆うようにゲル状コート剤が充填された複合半導
体装置において、前記蓋体の−部に設けられ、かつ、前
記主端子を蓋体上に折曲げたときに上部開口部を塞ぐ位
置にゲル状コート剤逃げ用の貫通孔が設けられ、該貫通
孔の下部までゲル状コート剤が充填され、該貫通孔部分
を除き、前記ゲル状コート剤の上部に、熱硬化性樹脂が
充填・硬化されてなることを特徴とするものである。
In the composite semiconductor device of the present invention, a circuit board is fixed on an upper surface of a heat sink, and electronic components, main terminals for external derivation and signal terminals are mounted on the circuit board. One end of an insulating case having both ends opened is fixed to the outer periphery of the heat sink, the other end opening is covered with a lid through which the main terminal and the signal terminal penetrate, and the bottom part inside the insulating case covers the electronic component. In the composite semiconductor device in which the gel-like coating agent is filled ,
Position that closes the upper opening when the main terminal is bent over the lid
A through-hole for escaping the gel-like coating agent is provided at the position, the gel-like coating agent is filled up to the lower portion of the through-hole, and a thermosetting resin is provided on the upper portion of the gel-like coating agent except for the through-hole portion. It is characterized by being filled and cured.

【0007】[0007]

【作用】本考案の複合半導体装置は、蓋体の一部に貫通
孔を設け、その下端がゲル状コート剤の上面に開口する
ようにしたので、電子部品からの発熱によりゲル状コー
ト剤が膨張した場合でも、その増加体積は貫通孔により
吸収することができる。このため、電子部品には膨張に
よる応力を加えることがなく、破壊等のおそれもなくな
り、信頼性が向上する。また、ゲル状コート剤上に充填
されたエポキシ樹脂を押し上げることもなくなるので、
製品外観を損ねることもない。
In the composite semiconductor device of the present invention, a through-hole is provided in a part of the lid, and the lower end thereof is opened to the upper surface of the gel-like coating agent. Even when expanded, the increased volume can be absorbed by the through holes. For this reason, stress due to expansion is not applied to the electronic component, and there is no risk of destruction or the like, and reliability is improved. Also, since it will not push up the epoxy resin filled on the gel coating agent,
It does not impair the product appearance.

【0008】[0008]

【実施例】以下に、本考案の実施例を図1ないし図4を
参照して詳細に説明する。図において、複合半導体装置
1は、蓋体9の構成の構成を除いて、他の構成は従来と
同様の構成を有するため、同一部分には同一符号を付し
てその詳しい説明は省略する。そこで、以下に、蓋体9
の構成を中心にその特徴を述べる。蓋体9は、複数の、
図では3つの端子台座部91が所定の間隔を置いて配置
され、隣接する端子台座部91間は、枠部92により互
いに連結されている。これにより蓋体9には、端子台座
部91と枠部92とにより囲まれた開口部93が形成さ
れる。上記端子台座部91には、主端子導出孔94、有
底ナット収納孔95がそれぞれ設けられている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below in detail with reference to FIGS. In the figure, since the composite semiconductor device 1 has the same configuration as the conventional one except for the configuration of the lid 9, the same portions are denoted by the same reference numerals and the detailed description thereof will be omitted. Therefore, in the following, the lid 9
Its features will be described focusing on the configuration. The lid 9 has a plurality of
In the figure, three terminal pedestals 91 are arranged at predetermined intervals, and adjacent terminal pedestals 91 are connected to each other by a frame 92. Thus, an opening 93 surrounded by the terminal pedestal 91 and the frame 92 is formed in the lid 9. The terminal base 91 is provided with a main terminal lead-out hole 94 and a bottomed nut storage hole 95, respectively.

【0009】上記主端子導出孔94と有底ナット収納孔
95との間には、端子台座部91を貫通するゲル状コー
ト剤逃げ用の貫通孔96が設けられている。この位置関
係により貫通孔96の上部開口部は主端子4の折曲げに
よって塞がれることになる。
Between the main terminal lead-out hole 94 and the bottomed nut storage hole 95, there is provided a through-hole 96 for escaping the gel-like coating agent, which penetrates the terminal base 91. This location
The upper opening of the through-hole 96 is formed by bending the main terminal 4.
Therefore, it will be closed.

【0010】上記のように構成の蓋体9を絶縁ケース6
の開口端に被せた後、該蓋体9の空所部93からゲル状
コート剤7を注入する。このコート剤7の注入量は、図
1に示すように、蓋体9の下面に形成された筒体部99
の下端部までとする。次いで、ゲル状コート剤7の上に
エポキシ樹脂8を注入する。このエポキシ樹脂8の注入
量は、上記筒体部99の下端部から絶縁ケース6の上端
開口部と同一平面になるまでとする。ここで、注意すべ
きは、ゲル状コート剤逃げ用の貫通孔96内にはエポキ
シ樹脂8が入らないようにすることである。上記のエポ
キシ樹脂8を加熱硬化させた後、有底ナット収納孔95
にナット(図示せず)を収納し、主端子4を略直角に折
曲げてナットの逸脱を防止する。なお、主端子4を折曲
げることにより上記貫通孔96は塞がれるので、完成品
では上記貫通孔96の露出により外観を損ねることもな
い。また、他の実施例として有底ナット収納孔95を貫
通孔96として利用することも可能である。この場合に
はナット収納孔95の底の部分に蓋体9を貫通する孔を
設け、必要により筒体部99と同様な筒体部(図示省
略)を設けても良い。
[0010] The lid 9 having the above-described structure is attached to the insulating case 6.
After that, the gel-like coating agent 7 is injected from the space 93 of the lid 9. As shown in FIG. 1, the injection amount of the coating agent 7 is determined by the cylindrical portion 99 formed on the lower surface of the lid 9.
Up to the lower end. Next, the epoxy resin 8 is injected onto the gel coating agent 7. The injection amount of the epoxy resin 8 is from the lower end of the cylindrical body 99 to the same plane as the upper end opening of the insulating case 6. Here, it should be noted that the epoxy resin 8 does not enter the through-hole 96 for escape of the gel-like coating agent. After the epoxy resin 8 is cured by heating, the bottomed nut storage hole 95 is formed.
The main terminal 4 is bent substantially at right angles to prevent deviation of the nut. Since the through-hole 96 is closed by bending the main terminal 4, the appearance of the finished product is not impaired by the exposure of the through-hole 96. Further, as another embodiment, the bottomed nut storage hole 95 can be used as the through hole 96. In this case, a hole that penetrates the lid 9 may be provided at the bottom of the nut storage hole 95, and a cylinder (not shown) similar to the cylinder 99 may be provided as necessary.

【0011】[0011]

【考案の効果】以上のように、本考案の複合半導体装置
は、絶縁ケース内に充填したゲル状コート剤の上面がゲ
ル状コート剤逃げ用の貫通孔を介して外部に通じている
ので、回路基板上の搭載部品の発熱によりゲル状コート
剤が膨張しても半導体チップ等電子部品に応力を加える
ことなく、該貫通孔によって逃げることができる。従っ
て、放熱板の剥離、エポキシ樹脂の抜け等が無くなり信
頼性が向上し、かつ、製品外観を損ねることもなくな
る。
As described above, in the composite semiconductor device of the present invention, the upper surface of the gel-like coating agent filled in the insulating case communicates with the outside through the through-hole for escape of the gel-like coating agent. Even if the gel-like coating agent expands due to heat generated by the mounted components on the circuit board, the gel-type coating agent can escape through the through-holes without applying stress to electronic components such as semiconductor chips. Therefore, peeling of the heat radiating plate, detachment of the epoxy resin, and the like are eliminated, so that the reliability is improved and the appearance of the product is not spoiled.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本考案の一実施例を示す複合半導体装置の図2
におけるA−A線に沿う断面図である。
FIG. 1 is a composite semiconductor device showing an embodiment of the present invention; FIG.
FIG. 2 is a sectional view taken along line AA in FIG.

【図2】上記複合半導体装置の平面図である。FIG. 2 is a plan view of the composite semiconductor device.

【図3】上記複合半導体装置に用いる蓋体の平面図であ
る。
FIG. 3 is a plan view of a lid used for the composite semiconductor device.

【図4】図3のA−A線に沿う断面図である。FIG. 4 is a sectional view taken along line AA of FIG. 3;

【図5】従来の複合半導体装置の断面模式図である。FIG. 5 is a schematic cross-sectional view of a conventional composite semiconductor device.

【図6】上記従来の複合半導体装置の斜視図である。FIG. 6 is a perspective view of the conventional composite semiconductor device.

【符号の説明】[Explanation of symbols]

1 複合半導体装置 2 放熱板 3 回路基板 4 主端子 5 信号端子 6 絶縁ケース 7 ゲル状コート剤 8 エポキシ樹脂 9 蓋体 91 端子台座部 92 枠部 93 空所部 94 主端子導出孔 95 有底ナット収納孔 96 ゲル状コート剤逃げ用の貫通孔 97,98 突起部 99 筒体部 100 信号端子導出用の透孔 DESCRIPTION OF SYMBOLS 1 Composite semiconductor device 2 Heat sink 3 Circuit board 4 Main terminal 5 Signal terminal 6 Insulating case 7 Gel coating agent 8 Epoxy resin 9 Lid 91 Terminal pedestal part 92 Frame part 93 Empty part 94 Main terminal lead-out hole 95 Bottom nut Housing hole 96 Through hole for escape of gel-like coating agent 97, 98 Projection portion 99 Cylindrical portion 100 Through hole for signal terminal lead-out

Claims (1)

(57)【実用新案登録請求の範囲】(57) [Scope of request for utility model registration] 【請求項1】 放熱板の上面に回路基板が固着され、該
回路基板上に電子部品、外部導出用の主端子及び信号端
子が搭載され、上記放熱板の外周に両端開口の絶縁ケー
スの一端が固着され、他端開口部に、主端子及び信号端
子を貫通させた蓋体が被せられ、絶縁ケースの内側の底
部に電子部品を覆うようにゲル状コート剤が充填された
複合半導体装置において、前記蓋体の一部に設けられ、かつ、前記主端子を蓋体上
に折曲げたときに上部開口部を塞ぐ位置にゲル状コート
剤逃げ用の貫通孔が設けられ、 該貫通孔の下部までゲル
状コート剤が充填され、該貫通孔部分を除き、前記ゲル
状コート剤の上部に、熱硬化性樹脂が充填・硬化されて
なる複合半導体装置。
1. A circuit board is fixed to an upper surface of a heat radiating plate, and electronic components, a main terminal for external lead-out and a signal terminal are mounted on the circuit board, and one end of an insulating case having both ends opened around the heat radiating plate. Is fixed, the other end opening is covered with a lid penetrating the main terminal and the signal terminal, and the bottom inside the insulating case is filled with a gel-like coating agent to cover the electronic component. , Provided on a part of the lid, and the main terminal is disposed on the lid.
Gel coat at the position to close the upper opening when folded
A through hole for releasing the agent is provided, a gel-like coating agent is filled up to a lower portion of the through-hole, and an upper portion of the gel-like coating agent is filled and cured with the thermosetting resin except for the through-hole portion. Composite semiconductor device.
JP1992055484U 1992-07-16 1992-07-16 Composite semiconductor device Expired - Lifetime JP2582256Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1992055484U JP2582256Y2 (en) 1992-07-16 1992-07-16 Composite semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1992055484U JP2582256Y2 (en) 1992-07-16 1992-07-16 Composite semiconductor device

Publications (2)

Publication Number Publication Date
JPH0611356U JPH0611356U (en) 1994-02-10
JP2582256Y2 true JP2582256Y2 (en) 1998-09-30

Family

ID=12999901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1992055484U Expired - Lifetime JP2582256Y2 (en) 1992-07-16 1992-07-16 Composite semiconductor device

Country Status (1)

Country Link
JP (1) JP2582256Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2017891A1 (en) * 2007-07-20 2009-01-21 ABB Technology AG Semiconductor module

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0334355A (en) * 1989-06-29 1991-02-14 Sansha Electric Mfg Co Ltd Semiconductor module for power

Also Published As

Publication number Publication date
JPH0611356U (en) 1994-02-10

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