JP2548488Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JP2548488Y2 JP2548488Y2 JP10574190U JP10574190U JP2548488Y2 JP 2548488 Y2 JP2548488 Y2 JP 2548488Y2 JP 10574190 U JP10574190 U JP 10574190U JP 10574190 U JP10574190 U JP 10574190U JP 2548488 Y2 JP2548488 Y2 JP 2548488Y2
- Authority
- JP
- Japan
- Prior art keywords
- storage track
- track rail
- guide
- lane
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 60
- 239000000463 material Substances 0.000 claims description 5
- 230000008646 thermal stress Effects 0.000 claims description 3
- 239000011295 pitch Substances 0.000 description 7
- 230000007246 mechanism Effects 0.000 description 3
- 229910001374 Invar Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000000717 retained effect Effects 0.000 description 2
- 230000008602 contraction Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008642 heat stress Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10574190U JP2548488Y2 (ja) | 1990-10-08 | 1990-10-08 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10574190U JP2548488Y2 (ja) | 1990-10-08 | 1990-10-08 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0463079U JPH0463079U (enExample) | 1992-05-29 |
| JP2548488Y2 true JP2548488Y2 (ja) | 1997-09-24 |
Family
ID=31851553
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10574190U Expired - Fee Related JP2548488Y2 (ja) | 1990-10-08 | 1990-10-08 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2548488Y2 (enExample) |
-
1990
- 1990-10-08 JP JP10574190U patent/JP2548488Y2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0463079U (enExample) | 1992-05-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |