JP2541903Y2 - Ic試験装置 - Google Patents

Ic試験装置

Info

Publication number
JP2541903Y2
JP2541903Y2 JP10574290U JP10574290U JP2541903Y2 JP 2541903 Y2 JP2541903 Y2 JP 2541903Y2 JP 10574290 U JP10574290 U JP 10574290U JP 10574290 U JP10574290 U JP 10574290U JP 2541903 Y2 JP2541903 Y2 JP 2541903Y2
Authority
JP
Japan
Prior art keywords
storage
lane
track rail
guide shafts
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP10574290U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0463080U (enExample
Inventor
信行 千葉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP10574290U priority Critical patent/JP2541903Y2/ja
Publication of JPH0463080U publication Critical patent/JPH0463080U/ja
Application granted granted Critical
Publication of JP2541903Y2 publication Critical patent/JP2541903Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP10574290U 1990-10-08 1990-10-08 Ic試験装置 Expired - Lifetime JP2541903Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10574290U JP2541903Y2 (ja) 1990-10-08 1990-10-08 Ic試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10574290U JP2541903Y2 (ja) 1990-10-08 1990-10-08 Ic試験装置

Publications (2)

Publication Number Publication Date
JPH0463080U JPH0463080U (enExample) 1992-05-29
JP2541903Y2 true JP2541903Y2 (ja) 1997-07-23

Family

ID=31851554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10574290U Expired - Lifetime JP2541903Y2 (ja) 1990-10-08 1990-10-08 Ic試験装置

Country Status (1)

Country Link
JP (1) JP2541903Y2 (enExample)

Also Published As

Publication number Publication date
JPH0463080U (enExample) 1992-05-29

Similar Documents

Publication Publication Date Title
US3245731A (en) Ball way package
DE68901862T2 (de) Koordinatenmessmaschine mit verbesserter schlittenfuehrung.
JPH03121311A (ja) スライド運動のためのころがり軸受
JP2541903Y2 (ja) Ic試験装置
US5244283A (en) Double rail linear motion guide assembly
US20190210385A1 (en) Head position adjustment mechanism and line head
JPH0586021U (ja) 直動転がり案内ユニット
JP4035370B2 (ja) 直動案内ユニット
US5217214A (en) Positioning table assembly
NO164644B (no) Innretning for haandtering av byggedeler.
US5273366A (en) Roller linear movement guiding device
JP2548488Y2 (ja) Ic試験装置
CN119508352A (zh) 具有运动单元的线性引导装置
JP2515163B2 (ja) 溝治具及び該溝治具を装着したピン状体整列装置
JPH0430151Y2 (enExample)
JPH0818209B2 (ja) テーブル移送装置
JP4110056B2 (ja) 免震装置
JPH05296240A (ja) 直動転がり案内ユニット
JP2541591Y2 (ja) Ic試験装置
JPS6339998Y2 (enExample)
US4093966A (en) Adjustable holder particularly useful for mounting magnetic heads
JP2564608Y2 (ja) 直動転がり案内ユニット
US10625945B2 (en) Bottle stopping apparatus
CN223037731U (zh) 干粉颗粒分析仪
JPH0224033A (ja) Xyテーブル