JP2541903Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JP2541903Y2 JP2541903Y2 JP10574290U JP10574290U JP2541903Y2 JP 2541903 Y2 JP2541903 Y2 JP 2541903Y2 JP 10574290 U JP10574290 U JP 10574290U JP 10574290 U JP10574290 U JP 10574290U JP 2541903 Y2 JP2541903 Y2 JP 2541903Y2
- Authority
- JP
- Japan
- Prior art keywords
- storage
- lane
- track rail
- guide shafts
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims description 44
- 238000005096 rolling process Methods 0.000 claims description 24
- 238000011144 upstream manufacturing Methods 0.000 claims description 9
- 230000008646 thermal stress Effects 0.000 claims description 2
- 239000011295 pitch Substances 0.000 description 5
- 230000000717 retained effect Effects 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008642 heat stress Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10574290U JP2541903Y2 (ja) | 1990-10-08 | 1990-10-08 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10574290U JP2541903Y2 (ja) | 1990-10-08 | 1990-10-08 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0463080U JPH0463080U (enExample) | 1992-05-29 |
| JP2541903Y2 true JP2541903Y2 (ja) | 1997-07-23 |
Family
ID=31851554
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10574290U Expired - Lifetime JP2541903Y2 (ja) | 1990-10-08 | 1990-10-08 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2541903Y2 (enExample) |
-
1990
- 1990-10-08 JP JP10574290U patent/JP2541903Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0463080U (enExample) | 1992-05-29 |
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