JP2540703Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JP2540703Y2 JP2540703Y2 JP10943090U JP10943090U JP2540703Y2 JP 2540703 Y2 JP2540703 Y2 JP 2540703Y2 JP 10943090 U JP10943090 U JP 10943090U JP 10943090 U JP10943090 U JP 10943090U JP 2540703 Y2 JP2540703 Y2 JP 2540703Y2
- Authority
- JP
- Japan
- Prior art keywords
- outrail
- shutter
- test
- heat
- thermostat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims description 33
- 239000000463 material Substances 0.000 claims description 11
- 230000005494 condensation Effects 0.000 description 8
- 238000009833 condensation Methods 0.000 description 8
- 239000004020 conductor Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 230000008014 freezing Effects 0.000 description 2
- 238000007710 freezing Methods 0.000 description 2
- 239000002470 thermal conductor Substances 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000008642 heat stress Effects 0.000 description 1
- 230000009545 invasion Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10943090U JP2540703Y2 (ja) | 1990-10-19 | 1990-10-19 | Ic試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10943090U JP2540703Y2 (ja) | 1990-10-19 | 1990-10-19 | Ic試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0466588U JPH0466588U (enrdf_load_stackoverflow) | 1992-06-11 |
JP2540703Y2 true JP2540703Y2 (ja) | 1997-07-09 |
Family
ID=31856632
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10943090U Expired - Lifetime JP2540703Y2 (ja) | 1990-10-19 | 1990-10-19 | Ic試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2540703Y2 (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11248787A (ja) * | 1998-03-02 | 1999-09-17 | Advantest Corp | Ic試験装置 |
-
1990
- 1990-10-19 JP JP10943090U patent/JP2540703Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0466588U (enrdf_load_stackoverflow) | 1992-06-11 |
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