JP2532081Y2 - Ic試験装置 - Google Patents

Ic試験装置

Info

Publication number
JP2532081Y2
JP2532081Y2 JP8896489U JP8896489U JP2532081Y2 JP 2532081 Y2 JP2532081 Y2 JP 2532081Y2 JP 8896489 U JP8896489 U JP 8896489U JP 8896489 U JP8896489 U JP 8896489U JP 2532081 Y2 JP2532081 Y2 JP 2532081Y2
Authority
JP
Japan
Prior art keywords
signal
voltage source
circuit
relay
bias voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8896489U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0328480U (enrdf_load_stackoverflow
Inventor
利明 淡路
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP8896489U priority Critical patent/JP2532081Y2/ja
Publication of JPH0328480U publication Critical patent/JPH0328480U/ja
Application granted granted Critical
Publication of JP2532081Y2 publication Critical patent/JP2532081Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP8896489U 1989-07-28 1989-07-28 Ic試験装置 Expired - Lifetime JP2532081Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8896489U JP2532081Y2 (ja) 1989-07-28 1989-07-28 Ic試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8896489U JP2532081Y2 (ja) 1989-07-28 1989-07-28 Ic試験装置

Publications (2)

Publication Number Publication Date
JPH0328480U JPH0328480U (enrdf_load_stackoverflow) 1991-03-20
JP2532081Y2 true JP2532081Y2 (ja) 1997-04-09

Family

ID=31638559

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8896489U Expired - Lifetime JP2532081Y2 (ja) 1989-07-28 1989-07-28 Ic試験装置

Country Status (1)

Country Link
JP (1) JP2532081Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0328480U (enrdf_load_stackoverflow) 1991-03-20

Similar Documents

Publication Publication Date Title
US6335616B2 (en) Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device
US4857861A (en) Amplifier arrangement with improved quiescent current control
JP4478033B2 (ja) 電圧印加電流測定装置及びそれに使用されるスイッチ付き電流バッファ
JP2669435B2 (ja) 単一チップ型レシーバ回路
JPH0750526A (ja) 平衡型カスコード電流ミラー
US6166569A (en) Test interface circuits with waveform synthesizers having reduced spurious signals
JPWO2003044550A1 (ja) 半導体試験装置
JP2532081Y2 (ja) Ic試験装置
US5384532A (en) Bipolar test probe
US4791325A (en) Class B clamp circuit
JPS6047787B2 (ja) 集積回路化同期再生回路
EP0393996A1 (en) Charge coupled devices
US6172551B1 (en) Wide dynamic-range current switches and switching methods
JP3734877B2 (ja) Ic試験装置のi/o切換スイッチ回路
KR840006585A (ko) 신호 샘플링 회로
IL144436A (en) Driver output swing control using a mirror driver
JP2577938Y2 (ja) 信号伝送装置
JP3922737B2 (ja) サンプルアンドホールド回路
JPH0139014Y2 (enrdf_load_stackoverflow)
JP2956911B2 (ja) Ic試験装置
JPH08222968A (ja) 増幅器
JPH0346589Y2 (enrdf_load_stackoverflow)
SU746913A1 (ru) Многофункциональный генератор
JP2801944B2 (ja) 増幅器
KR100253333B1 (ko) 전압분배를 위한 저항배열의 저항 부정합 보정회로

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term