JP2517580Y2 - レーザ回折／散乱式粒度分布測定用乾燥粉体検出アダプタ - Google Patents

レーザ回折／散乱式粒度分布測定用乾燥粉体検出アダプタ

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Publication number
JP2517580Y2
JP2517580Y2 JP1991002529U JP252991U JP2517580Y2 JP 2517580 Y2 JP2517580 Y2 JP 2517580Y2 JP 1991002529 U JP1991002529 U JP 1991002529U JP 252991 U JP252991 U JP 252991U JP 2517580 Y2 JP2517580 Y2 JP 2517580Y2
Authority
JP
Japan
Prior art keywords
tube
particle size
size distribution
aerosol
diameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1991002529U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0499059U (enrdf_load_stackoverflow
Inventor
和 竹内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1991002529U priority Critical patent/JP2517580Y2/ja
Publication of JPH0499059U publication Critical patent/JPH0499059U/ja
Application granted granted Critical
Publication of JP2517580Y2 publication Critical patent/JP2517580Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1991002529U 1991-01-30 1991-01-30 レーザ回折／散乱式粒度分布測定用乾燥粉体検出アダプタ Expired - Lifetime JP2517580Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1991002529U JP2517580Y2 (ja) 1991-01-30 1991-01-30 レーザ回折／散乱式粒度分布測定用乾燥粉体検出アダプタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1991002529U JP2517580Y2 (ja) 1991-01-30 1991-01-30 レーザ回折／散乱式粒度分布測定用乾燥粉体検出アダプタ

Publications (2)

Publication Number Publication Date
JPH0499059U JPH0499059U (enrdf_load_stackoverflow) 1992-08-27
JP2517580Y2 true JP2517580Y2 (ja) 1996-11-20

Family

ID=31730722

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1991002529U Expired - Lifetime JP2517580Y2 (ja) 1991-01-30 1991-01-30 レーザ回折／散乱式粒度分布測定用乾燥粉体検出アダプタ

Country Status (1)

Country Link
JP (1) JP2517580Y2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2642872B2 (ja) * 1994-06-29 1997-08-20 工業技術院長 粒子物性測定装置
JP5967525B2 (ja) * 2012-06-13 2016-08-10 パナソニックＩｐマネジメント株式会社 粉塵検出装置
JP5837107B2 (ja) * 2014-01-17 2015-12-24 シャープ株式会社 粒子測定器

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60243571A (ja) * 1984-05-18 1985-12-03 Nippon Furnace Kogyo Kaisha Ltd 流れ観察段面と直交する方向の速度測定方法
JPS6114542A (ja) * 1984-06-30 1986-01-22 Toshiba Corp 粒径測定装置
JPH01314531A (ja) * 1988-06-15 1989-12-19 Matsushita Electric Ind Co Ltd 電気掃除機の塵検知装置

Also Published As

Publication number Publication date
JPH0499059U (enrdf_load_stackoverflow) 1992-08-27

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