JP2025505947A5 - - Google Patents

Info

Publication number
JP2025505947A5
JP2025505947A5 JP2024543888A JP2024543888A JP2025505947A5 JP 2025505947 A5 JP2025505947 A5 JP 2025505947A5 JP 2024543888 A JP2024543888 A JP 2024543888A JP 2024543888 A JP2024543888 A JP 2024543888A JP 2025505947 A5 JP2025505947 A5 JP 2025505947A5
Authority
JP
Japan
Prior art keywords
camera
reflection
illumination
optical sensors
reflection image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024543888A
Other languages
English (en)
Japanese (ja)
Other versions
JP2025505947A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2023/051517 external-priority patent/WO2023139254A1/en
Publication of JP2025505947A publication Critical patent/JP2025505947A/ja
Publication of JP2025505947A5 publication Critical patent/JP2025505947A5/ja
Pending legal-status Critical Current

Links

JP2024543888A 2022-01-24 2023-01-23 ステレオビームプロファイル分析による改善された材料検出 Pending JP2025505947A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP22153038.9 2022-01-24
EP22153038 2022-01-24
PCT/EP2023/051517 WO2023139254A1 (en) 2022-01-24 2023-01-23 Enhanced material detection by stereo beam profile analysis

Publications (2)

Publication Number Publication Date
JP2025505947A JP2025505947A (ja) 2025-03-05
JP2025505947A5 true JP2025505947A5 (https=) 2025-12-19

Family

ID=80035126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024543888A Pending JP2025505947A (ja) 2022-01-24 2023-01-23 ステレオビームプロファイル分析による改善された材料検出

Country Status (6)

Country Link
US (2) US12492982B2 (https=)
EP (1) EP4469783B1 (https=)
JP (1) JP2025505947A (https=)
KR (1) KR20240141168A (https=)
CN (1) CN118613712A (https=)
WO (1) WO2023139254A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240149897A (ko) * 2022-02-15 2024-10-15 트리나미엑스 게엠베하 대상체의 재료를 결정하기 위한 시스템 및 방법
WO2025036966A1 (en) * 2023-08-16 2025-02-20 Trinamix Gmbh Method for improved biometric authentication
CN120314906B (zh) * 2025-06-11 2025-09-02 吉林建筑科技学院 一种基于雷达遥感数据的滑坡区域检测方法及系统

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6377700B1 (en) * 1998-06-30 2002-04-23 Intel Corporation Method and apparatus for capturing stereoscopic images using image sensors
US20120242795A1 (en) * 2011-03-24 2012-09-27 Paul James Kane Digital 3d camera using periodic illumination
US9482529B2 (en) 2011-04-15 2016-11-01 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
US20140120319A1 (en) * 2012-11-01 2014-05-01 Benjamin E. Joseph 3d mapping using structured light and formation of custom surface contours
AU2014280332B2 (en) * 2013-06-13 2017-09-07 Basf Se Detector for optically detecting at least one object
JP2018510320A (ja) * 2014-12-09 2018-04-12 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se 光学検出器
AU2016222716B2 (en) * 2015-02-25 2018-11-29 Facebook Technologies, Llc Identifying an object in a volume based on characteristics of light reflected by the object
US10072815B2 (en) 2016-06-23 2018-09-11 Apple Inc. Top-emission VCSEL-array with integrated diffuser
US9947099B2 (en) * 2016-07-27 2018-04-17 Microsoft Technology Licensing, Llc Reflectivity map estimate from dot based structured light systems
US10055882B2 (en) * 2016-08-15 2018-08-21 Aquifi, Inc. System and method for three-dimensional scanning and for capturing a bidirectional reflectance distribution function
EP3542179B1 (en) 2016-11-17 2021-03-24 trinamiX GmbH Detector for optically detecting at least one object
US10516876B2 (en) * 2017-12-19 2019-12-24 Intel Corporation Dynamic vision sensor and projector for depth imaging
CN108363482A (zh) 2018-01-11 2018-08-03 江苏四点灵机器人有限公司 一种基于双目结构光的三维手势控制智能电视的方法
JP7253323B2 (ja) * 2018-02-14 2023-04-06 オムロン株式会社 3次元計測システム及び3次元計測方法
WO2020169727A1 (en) 2019-02-20 2020-08-27 Trinamix Gmbh Detector with a projector for illuminating at least one object
CN113574406B (zh) 2019-03-15 2025-05-27 特里纳米克斯股份有限公司 用于识别至少一种材料特性的检测器
CN115023735A (zh) 2020-01-31 2022-09-06 特里纳米克斯股份有限公司 用于对象识别的检测器
KR20220147604A (ko) 2020-02-28 2022-11-03 트리나미엑스 게엠베하 제스처 인식
CN118215820A (zh) 2021-11-09 2024-06-18 特里纳米克斯股份有限公司 基于结构光的3d检测器的重新校准

Similar Documents

Publication Publication Date Title
JP2025505947A5 (https=)
TW202117401A (zh) 使用雲紋元件及旋轉對稱配置以成像疊對目標
JP2019095799A5 (https=)
JP2021535408A5 (https=)
EP4224206A3 (en) Projector pattern
JP2016038565A5 (https=)
JPWO2020059426A5 (https=)
RU2389974C2 (ru) Устройство оптического обследования поверхностей предмета, обращенных в различные стороны
CN115809978B (zh) 光学检查方法、光学检查程序、处理装置以及光学检查装置
KR101211438B1 (ko) 결함 검사장치
JP2009002823A (ja) 3次元形状測定システム、及び、3次元形状測定方法
US20210310799A1 (en) Apparatus, measurement system and method for capturing an at least partially reflective surface using two reflection patterns
JP2019138893A (ja) 画像検査装置および照明装置
JP2021502589A5 (https=)
JP3322606B2 (ja) 板幅・蛇行検出方法及び装置
TWM527556U (zh) 一種物件外表面的取像裝置
JP2008535016A (ja) 信号光を検出器上にマッピングするための光学系
JP2021162562A5 (https=)
TWM532575U (zh) 取像裝置
CN208141124U (zh) 一种图像控制器和调焦调平装置
JP6187153B2 (ja) 検査装置
JP6699263B2 (ja) 検査装置
JPH09304287A (ja) 外観検査装置
TW202124938A (zh) 一種散射檢測裝置
JP7300152B2 (ja) 光検査装置