JP2024520598A5 - - Google Patents

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Publication number
JP2024520598A5
JP2024520598A5 JP2023574161A JP2023574161A JP2024520598A5 JP 2024520598 A5 JP2024520598 A5 JP 2024520598A5 JP 2023574161 A JP2023574161 A JP 2023574161A JP 2023574161 A JP2023574161 A JP 2023574161A JP 2024520598 A5 JP2024520598 A5 JP 2024520598A5
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JP
Japan
Prior art keywords
detector
features
reflection
evaluation device
applications
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JP2023574161A
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English (en)
Japanese (ja)
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JP7855017B2 (ja
JP2024520598A (ja
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Priority claimed from PCT/EP2022/064655 external-priority patent/WO2022253777A1/en
Publication of JP2024520598A publication Critical patent/JP2024520598A/ja
Publication of JP2024520598A5 publication Critical patent/JP2024520598A5/ja
Application granted granted Critical
Publication of JP7855017B2 publication Critical patent/JP7855017B2/ja
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JP2023574161A 2021-05-31 2022-05-30 投影パターン内のエピポーラ線距離からの自動較正 Active JP7855017B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP21176939.3 2021-05-31
EP21176939 2021-05-31
PCT/EP2022/064655 WO2022253777A1 (en) 2021-05-31 2022-05-30 Auto calibration from epipolar line distance in projection pattern

Publications (3)

Publication Number Publication Date
JP2024520598A JP2024520598A (ja) 2024-05-24
JP2024520598A5 true JP2024520598A5 (https=) 2025-06-03
JP7855017B2 JP7855017B2 (ja) 2026-05-07

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