JP2024510657A - 基板を処理するための方法及び装置 - Google Patents

基板を処理するための方法及び装置 Download PDF

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JP2024510657A
JP2024510657A JP2023557439A JP2023557439A JP2024510657A JP 2024510657 A JP2024510657 A JP 2024510657A JP 2023557439 A JP2023557439 A JP 2023557439A JP 2023557439 A JP2023557439 A JP 2023557439A JP 2024510657 A JP2024510657 A JP 2024510657A
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duty cycle
substrate
providing
supplying
processing
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JP2024510657A5 (https=
Inventor
ジェスロ タノス,
バルガフ シュリダール シトラ,
シュリニヴァス ディ. ネマニ,
エリー イェー,
ジョシュア アラン ルブニッツ,
エリカ チェン,
ソハム サンジェイ アスラニ,
ニコラオス ベキアリス,
ダグラス アーサー, ジュニア ブッフバーガー,
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Applied Materials Inc
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Applied Materials Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32357Generation remote from the workpiece, e.g. down-stream
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    • H10P14/65Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
    • H10P14/6516Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials
    • H10P14/6518Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer
    • H10P14/6519Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer the substance being oxygen
    • H10P14/6522Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer the substance being oxygen introduced into a nitride material, e.g. changing SiN to SiON
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    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
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    • H10P14/6326Deposition processes
    • H10P14/6328Deposition from the gas or vapour phase
    • H10P14/6334Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H10P14/6336Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
JP2023557439A 2021-03-22 2022-02-04 基板を処理するための方法及び装置 Pending JP2024510657A (ja)

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Application Number Priority Date Filing Date Title
US17/208,719 US11955333B2 (en) 2021-03-22 2021-03-22 Methods and apparatus for processing a substrate
US17/208,719 2021-03-22
PCT/US2022/015222 WO2022203767A1 (en) 2021-03-22 2022-02-04 Methods and apparatus for processing a substrate

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JP2024510657A true JP2024510657A (ja) 2024-03-08
JP2024510657A5 JP2024510657A5 (https=) 2025-02-12

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230173016A (ko) * 2022-06-16 2023-12-26 에이에스엠 아이피 홀딩 비.브이. 실리콘 산화물을 포함한 층을 형성하기 위한 방법 및 시스템
US12467144B2 (en) * 2022-10-27 2025-11-11 Applied Materials, Inc. Methods of correlating zones of processing chambers, and related systems and methods
US20240312770A1 (en) * 2023-03-16 2024-09-19 Applied Materials, Inc. Apparatus and methods for controlling substrate temperature during processing

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100330299A1 (en) * 2009-06-24 2010-12-30 Lg Electronics Inc. Plasma deposition of a thin film
JP2011504651A (ja) * 2007-10-22 2011-02-10 アプライド マテリアルズ インコーポレイテッド 基板上に酸化ケイ素層を形成する方法
US20200090946A1 (en) * 2018-09-17 2020-03-19 Applied Materials, Inc. Methods for depositing dielectric material
WO2020247548A1 (en) * 2019-06-07 2020-12-10 Lam Research Corporation In-situ control of film properties during atomic layer deposition

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6055927A (en) * 1997-01-14 2000-05-02 Applied Komatsu Technology, Inc. Apparatus and method for white powder reduction in silicon nitride deposition using remote plasma source cleaning technology
US7084832B2 (en) 2001-10-09 2006-08-01 Plasma Control Systems, Llc Plasma production device and method and RF driver circuit with adjustable duty cycle
US6854479B2 (en) 2002-08-26 2005-02-15 Alden Harwood Sump liner
US20080268154A1 (en) * 2007-04-30 2008-10-30 Shreyas Kher Methods for depositing a high-k dielectric material using chemical vapor deposition process
US20110065276A1 (en) 2009-09-11 2011-03-17 Applied Materials, Inc. Apparatus and Methods for Cyclical Oxidation and Etching
US9309594B2 (en) 2010-04-26 2016-04-12 Advanced Energy Industries, Inc. System, method and apparatus for controlling ion energy distribution of a projected plasma
TWI496932B (zh) 2012-03-09 2015-08-21 氣體產品及化學品股份公司 用於顯示裝置的阻絕物材料
US9484191B2 (en) 2013-03-08 2016-11-01 Asm Ip Holding B.V. Pulsed remote plasma method and system
CN105321869A (zh) 2014-07-18 2016-02-10 联华电子股份有限公司 填沟介电层及其制作方法与应用
US10566187B2 (en) * 2015-03-20 2020-02-18 Lam Research Corporation Ultrathin atomic layer deposition film accuracy thickness control
US20170051405A1 (en) * 2015-08-18 2017-02-23 Asm Ip Holding B.V. Method for forming sin or sicn film in trenches by peald
WO2020223737A2 (en) 2019-05-02 2020-11-05 Lotus Applied Technology, Llc High voltage, low pressure plasma enhanced atomic layer deposition

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011504651A (ja) * 2007-10-22 2011-02-10 アプライド マテリアルズ インコーポレイテッド 基板上に酸化ケイ素層を形成する方法
US20100330299A1 (en) * 2009-06-24 2010-12-30 Lg Electronics Inc. Plasma deposition of a thin film
US20200090946A1 (en) * 2018-09-17 2020-03-19 Applied Materials, Inc. Methods for depositing dielectric material
WO2020247548A1 (en) * 2019-06-07 2020-12-10 Lam Research Corporation In-situ control of film properties during atomic layer deposition

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