JP2024152037A - 波形解析方法、波形解析装置、及び分析装置 - Google Patents

波形解析方法、波形解析装置、及び分析装置 Download PDF

Info

Publication number
JP2024152037A
JP2024152037A JP2023065939A JP2023065939A JP2024152037A JP 2024152037 A JP2024152037 A JP 2024152037A JP 2023065939 A JP2023065939 A JP 2023065939A JP 2023065939 A JP2023065939 A JP 2023065939A JP 2024152037 A JP2024152037 A JP 2024152037A
Authority
JP
Japan
Prior art keywords
peak
multimodal
waveform
peaks
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023065939A
Other languages
English (en)
Japanese (ja)
Other versions
JP2024152037A5 (https=
Inventor
仁望 北嶋（吉山）
Kitajima, (Yoshiyama) Hitomi
慎司 金澤
Shinji Kanazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2023065939A priority Critical patent/JP2024152037A/ja
Priority to US18/631,581 priority patent/US20240345046A1/en
Priority to CN202410432044.5A priority patent/CN118795074A/zh
Publication of JP2024152037A publication Critical patent/JP2024152037A/ja
Publication of JP2024152037A5 publication Critical patent/JP2024152037A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8624—Detection of slopes or peaks; baseline correction
    • G01N30/8631—Peaks
    • G01N30/8637—Peak shape
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8624—Detection of slopes or peaks; baseline correction
    • G01N30/8631—Peaks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/213—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8603—Signal analysis with integration or differentiation
    • G01N30/8606—Integration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/74—Optical detectors
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2123/00—Data types
    • G06F2123/02—Data types in the time domain, e.g. time-series data
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/08—Feature extraction
    • G06F2218/10—Feature extraction by analysing the shape of a waveform, e.g. extracting parameters relating to peaks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/12—Classification; Matching
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/12—Classification; Matching
    • G06F2218/16—Classification; Matching by matching signal segments

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Artificial Intelligence (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Algebra (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2023065939A 2023-04-13 2023-04-13 波形解析方法、波形解析装置、及び分析装置 Pending JP2024152037A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2023065939A JP2024152037A (ja) 2023-04-13 2023-04-13 波形解析方法、波形解析装置、及び分析装置
US18/631,581 US20240345046A1 (en) 2023-04-13 2024-04-10 Waveform-analyzing method, waveform-analyzing device, and analyzing system
CN202410432044.5A CN118795074A (zh) 2023-04-13 2024-04-11 波形分析方法、波形分析装置以及分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023065939A JP2024152037A (ja) 2023-04-13 2023-04-13 波形解析方法、波形解析装置、及び分析装置

Publications (2)

Publication Number Publication Date
JP2024152037A true JP2024152037A (ja) 2024-10-25
JP2024152037A5 JP2024152037A5 (https=) 2026-02-06

Family

ID=93017481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023065939A Pending JP2024152037A (ja) 2023-04-13 2023-04-13 波形解析方法、波形解析装置、及び分析装置

Country Status (3)

Country Link
US (1) US20240345046A1 (https=)
JP (1) JP2024152037A (https=)
CN (1) CN118795074A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12297378B2 (en) 2019-06-12 2025-05-13 Resonac Corporation Adhesive agent and adhesion method

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120067870B (zh) * 2025-04-25 2025-07-29 杭州中谱科技有限公司 基于分段迭代的模态分析方法及系统
CN120874213B (zh) * 2025-09-29 2025-12-26 温州大学 一种基于分区建模的爆破淤泥压力预测方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12297378B2 (en) 2019-06-12 2025-05-13 Resonac Corporation Adhesive agent and adhesion method

Also Published As

Publication number Publication date
CN118795074A (zh) 2024-10-18
US20240345046A1 (en) 2024-10-17

Similar Documents

Publication Publication Date Title
JP2024152037A (ja) 波形解析方法、波形解析装置、及び分析装置
JP7108136B2 (ja) 分析装置
JP6872034B2 (ja) 波形解析装置
JP6245387B2 (ja) ３次元スペクトルデータ処理装置及び処理方法
JP6873317B2 (ja) クロマトグラフィー質量分析方法およびクロマトグラフ質量分析装置
JP7643494B2 (ja) 波形解析方法及び波形解析装置
JP6132073B2 (ja) 包括的２次元クロマトグラフ用データ処理装置
JP5757264B2 (ja) クロマトグラフ質量分析データ処理装置
JP2013068444A (ja) 包括的２次元クロマトグラフ質量分析用データ処理装置
US20150198569A1 (en) Mass analysis method and mass analysis system
JP6060793B2 (ja) ピーク検出装置
JP6929645B2 (ja) マルチトレース定量化
JP6256162B2 (ja) 信号波形データ処理装置
JP2024152291A (ja) 波形解析方法、波形解析装置、及び分析装置
WO2018158801A1 (ja) スペクトルデータの特徴抽出装置および方法
WO2024236865A1 (ja) 波形解析方法、波形解析装置、及び分析装置
US12578317B2 (en) Learning data producing method, waveform analysis device, waveform analysis method, and recording medium
US20240175850A1 (en) Data processing system
US20220198177A1 (en) Waveform processing assistance device and waveform processing assistance method
JP4839248B2 (ja) 質量分析システム

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20260129

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20260129