JP2023516151A5 - - Google Patents

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Publication number
JP2023516151A5
JP2023516151A5 JP2022551010A JP2022551010A JP2023516151A5 JP 2023516151 A5 JP2023516151 A5 JP 2023516151A5 JP 2022551010 A JP2022551010 A JP 2022551010A JP 2022551010 A JP2022551010 A JP 2022551010A JP 2023516151 A5 JP2023516151 A5 JP 2023516151A5
Authority
JP
Japan
Prior art keywords
temperature
circuit
correction circuit
mtj
comparators
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022551010A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023516151A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IB2021/051475 external-priority patent/WO2021176296A1/en
Publication of JP2023516151A publication Critical patent/JP2023516151A/ja
Publication of JP2023516151A5 publication Critical patent/JP2023516151A5/ja
Pending legal-status Critical Current

Links

JP2022551010A 2020-03-02 2021-02-22 温度を補償する磁気トンネル接合をベースとする、外部磁場を計測する検知回路 Pending JP2023516151A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202062983809P 2020-03-02 2020-03-02
US62/983,809 2020-03-02
PCT/IB2021/051475 WO2021176296A1 (en) 2020-03-02 2021-02-22 Temperature compensated mtj-based sensing circuit for measuring an external magnetic field

Publications (2)

Publication Number Publication Date
JP2023516151A JP2023516151A (ja) 2023-04-18
JP2023516151A5 true JP2023516151A5 (https=) 2025-06-13

Family

ID=74797980

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022551010A Pending JP2023516151A (ja) 2020-03-02 2021-02-22 温度を補償する磁気トンネル接合をベースとする、外部磁場を計測する検知回路

Country Status (5)

Country Link
US (1) US11971463B2 (https=)
EP (1) EP4115192A1 (https=)
JP (1) JP2023516151A (https=)
KR (1) KR102898859B1 (https=)
WO (1) WO2021176296A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4130772B1 (en) 2021-08-05 2025-07-23 Allegro MicroSystems, LLC Magnetoresistive element having compensated temperature coefficient of tmr
WO2025097093A1 (en) 2023-11-03 2025-05-08 Spindrift Innovations, LLC Differential dual sensor contactless magnetic-mode electrical current sensors with tamper detection
US12584947B2 (en) 2023-11-03 2026-03-24 Spindrift Innovations, LLC Differential dual sensor contactless magnetic-mode electrical current sensors with tamper detection

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5902925A (en) * 1996-07-01 1999-05-11 Integrated Sensor Solutions System and method for high accuracy calibration of a sensor for offset and sensitivity variation with temperature
EP1143536B1 (en) * 1998-12-15 2008-12-03 Asahi Kasei EMD Corporation Semiconductor device
KR100518565B1 (ko) * 2003-04-04 2005-10-04 삼성전자주식회사 반도체 온도 검출기, 이를 구비하여 셀프 리프레쉬 전류를감소시키는 반도체 메모리 장치, 및 그 셀프 리프레쉬 방법
US7809519B2 (en) * 2005-07-18 2010-10-05 Micron Technology, Inc. System and method for automatically calibrating a temperature sensor
US7923996B2 (en) * 2008-02-26 2011-04-12 Allegro Microsystems, Inc. Magnetic field sensor with automatic sensitivity adjustment
TWI384210B (zh) * 2009-08-14 2013-02-01 Sunplus Technology Co Ltd 溫度偵測裝置與溫度偵測方法
US9823092B2 (en) * 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor providing a movement detector
US10162017B2 (en) * 2016-07-12 2018-12-25 Allegro Microsystems, Llc Systems and methods for reducing high order hall plate sensitivity temperature coefficients
WO2018092336A1 (ja) * 2016-11-17 2018-05-24 株式会社村田製作所 電流センサ
EP3457154B1 (en) * 2017-09-13 2020-04-08 Melexis Technologies SA Stray field rejection in magnetic sensors
EP3467522B1 (en) * 2017-10-06 2023-02-22 STMicroelectronics S.r.l. A temperature compensation circuit, corresponding device and method
US10367518B2 (en) * 2018-02-07 2019-07-30 Intel Corporation Apparatus and method for single temperature subthreshold factor trimming for hybrid thermal sensor
US10955493B2 (en) * 2018-05-02 2021-03-23 Analog Devices Global Unlimited Company Magnetic sensor systems

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