JP2023108546A5 - - Google Patents

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Publication number
JP2023108546A5
JP2023108546A5 JP2022009720A JP2022009720A JP2023108546A5 JP 2023108546 A5 JP2023108546 A5 JP 2023108546A5 JP 2022009720 A JP2022009720 A JP 2022009720A JP 2022009720 A JP2022009720 A JP 2022009720A JP 2023108546 A5 JP2023108546 A5 JP 2023108546A5
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Japan
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inspected
frequency
defect
elastic wave
laser light
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JP2022009720A
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English (en)
Japanese (ja)
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JP7746861B2 (ja
JP2023108546A (ja
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Priority to JP2022009720A priority Critical patent/JP7746861B2/ja
Priority claimed from JP2022009720A external-priority patent/JP7746861B2/ja
Priority to CN202211481788.3A priority patent/CN116500034B/zh
Priority to US18/077,213 priority patent/US12099000B2/en
Publication of JP2023108546A publication Critical patent/JP2023108546A/ja
Publication of JP2023108546A5 publication Critical patent/JP2023108546A5/ja
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JP2022009720A 2022-01-25 2022-01-25 欠陥検出装置及び欠陥検出方法 Active JP7746861B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2022009720A JP7746861B2 (ja) 2022-01-25 2022-01-25 欠陥検出装置及び欠陥検出方法
CN202211481788.3A CN116500034B (zh) 2022-01-25 2022-11-24 缺陷检测装置及缺陷检测方法
US18/077,213 US12099000B2 (en) 2022-01-25 2022-12-07 Defect detection device and defect detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022009720A JP7746861B2 (ja) 2022-01-25 2022-01-25 欠陥検出装置及び欠陥検出方法

Publications (3)

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JP2023108546A JP2023108546A (ja) 2023-08-04
JP2023108546A5 true JP2023108546A5 (https=) 2024-11-13
JP7746861B2 JP7746861B2 (ja) 2025-10-01

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US (1) US12099000B2 (https=)
JP (1) JP7746861B2 (https=)
CN (1) CN116500034B (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118190821A (zh) * 2022-12-12 2024-06-14 夏楼激光音响有限责任公司 用于测试材料接合部或材料化合物的方法和装置以及计算机程序、装置的用途

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004069301A (ja) 2002-08-01 2004-03-04 Kazuya Mori 音響式検査方法および音響式検査装置
CN102292627B (zh) * 2009-06-08 2014-04-30 奥林巴斯医疗株式会社 生物体观测装置
JP2012068209A (ja) 2010-09-27 2012-04-05 Choonpa Zairyo Shindan Kenkyusho:Kk 超音波材料診断方法及び装置
US9360418B2 (en) 2014-07-17 2016-06-07 The Boeing Company Nondestructive inspection using hypersound
JP6451695B2 (ja) 2016-06-02 2019-01-16 株式会社島津製作所 欠陥検査方法及び欠陥検査装置
EP3474009B1 (en) * 2016-06-21 2023-01-18 Shimadzu Corporation Sound-wave-propagation visualization device and method
JP6791029B2 (ja) * 2017-06-12 2020-11-25 株式会社島津製作所 欠陥検出方法及び欠陥検出装置
EP3819633A4 (en) * 2018-07-04 2021-08-11 Shimadzu Corporation Defect detection device
WO2020110197A1 (ja) * 2018-11-27 2020-06-04 株式会社島津製作所 欠陥検査装置および欠陥検査方法
US12188769B2 (en) 2020-01-17 2025-01-07 Shimadzu Corporation Defect inspection device and defect inspection method

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