JP2022516950A - 信号のパルス幅改ざんの検出 - Google Patents
信号のパルス幅改ざんの検出 Download PDFInfo
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- JP2022516950A JP2022516950A JP2021539595A JP2021539595A JP2022516950A JP 2022516950 A JP2022516950 A JP 2022516950A JP 2021539595 A JP2021539595 A JP 2021539595A JP 2021539595 A JP2021539595 A JP 2021539595A JP 2022516950 A JP2022516950 A JP 2022516950A
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- 238000001514 detection method Methods 0.000 title description 10
- 238000012360 testing method Methods 0.000 claims abstract description 62
- 230000000052 comparative effect Effects 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 claims description 12
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- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 abstract description 12
- 238000012544 monitoring process Methods 0.000 description 13
- 230000007246 mechanism Effects 0.000 description 5
- 230000006399 behavior Effects 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 230000000737 periodic effect Effects 0.000 description 4
- 101000881247 Homo sapiens Spectrin beta chain, erythrocytic Proteins 0.000 description 3
- 102100037613 Spectrin beta chain, erythrocytic Human genes 0.000 description 3
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- 101100328957 Caenorhabditis elegans clk-1 gene Proteins 0.000 description 1
- 101100113692 Caenorhabditis elegans clk-2 gene Proteins 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
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- 238000010079 rubber tapping Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/023—Measuring pulse width
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318583—Design for test
- G01R31/318588—Security aspects
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- General Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Storage Device Security (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (15)
- センサシステムであって、
被試験信号の制御下で電圧源に制御可能に接続された電荷蓄積装置を備えるセンサと、
前記電荷蓄積装置に結合され、前記電荷蓄積装置の電圧に従って前記被試験信号のパルス幅が閾値量より大きく変化したか否かを判定する読み出し回路と、を備え、
前記電荷蓄積装置の前記電圧は、前記被試験信号のパルス幅に関連する、センサシステム。 - 前記電荷蓄積装置は、少なくとも1つのスイッチによって前記電圧源に制御可能に接続される、請求項1に記載のセンサシステム。
- 前記電荷蓄積装置は、前記少なくとも1つのスイッチが前記被試験信号によって閉じられたときに充電する、請求項2に記載のセンサシステム。
- 前記センサは、前記電荷蓄積装置と並列に結合された放電スイッチを更に備える、請求項1~3のいずれか一項に記載のセンサシステム。
- 前記放電スイッチは、前記被試験信号の反転信号によって制御される、請求項4に記載のセンサシステム。
- 前記少なくとも1つのスイッチに結合された調整回路を更に備え、前記調整回路は、コマンド信号及び前記被試験信号を受信し、過渡的に除去された被試験信号を前記少なくとも1つのスイッチに出力するように結合される、請求項2~5のいずれか一項に記載のセンサシステム。
- 前記読み出し回路は、前記電圧が比較電圧に関する条件を満たすか否かを判定することによって、前記被試験信号の前記パルス幅が前記閾値量よりも大きく変化したか否かを判定する、請求項1~6のいずれか一項に記載のセンサシステム。
- 前記比較電圧は基準電圧である、請求項7に記載のセンサシステム。
- 前記比較電圧は、別のセンサの別の電荷蓄積装置からの電圧である、請求項7に記載のセンサシステム。
- 前記比較電圧は、同じセンサからのものであるが、別の時間からのものである、請求項7に記載のセンサシステム。
- 前記読み出し回路は、遅延チェーンを含み、前記読み出し回路は、前記遅延チェーンを介した伝搬遅延に基づいて、前記被試験信号の前記パルス幅が前記閾値量よりも大きく変化したか否かを判定し、前記伝搬遅延は前記電圧に依存する、請求項1~6のいずれか一項に記載のセンサシステム。
- 前記読み出し回路は比較器を含む、請求項1~11のいずれか一項に記載のセンサシステム。
- 前記被試験信号は、クロック信号、リセット信号、制御信号、ステータス信号、コマンドバス信号、又はデータバス信号である、請求項1~12のいずれか一項に記載のセンサシステム。
- 信号のパルス幅改ざんを検出するための方法であって、
被試験信号のパルスのエッジを受信することであって、前記エッジが正のエッジ又は負のエッジである、受信することと、
前記被試験信号のパルスの持続時間中に電荷蓄積装置を電圧源に結合することと、
前記電荷蓄積装置から電圧値を読み出すことと、
前記被試験信号の前記パルスの逆極性のエッジを受信した後に、前記電荷蓄積装置を前記電圧源から切断することと、
前記電圧値が比較電圧に関する条件を満たすか否かを判定することによってパルス幅改ざんの発生を判定することと、を含む、方法。 - 前記被試験信号はクロック信号である、請求項14に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16/244,364 | 2019-01-10 | ||
US16/244,364 US11022637B2 (en) | 2019-01-10 | 2019-01-10 | Detection of pulse width tampering of signals |
PCT/GB2020/050037 WO2020144478A1 (en) | 2019-01-10 | 2020-01-08 | Detection of pulse width tampering of signals |
Publications (1)
Publication Number | Publication Date |
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JP2022516950A true JP2022516950A (ja) | 2022-03-03 |
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JP2021539595A Pending JP2022516950A (ja) | 2019-01-10 | 2020-01-08 | 信号のパルス幅改ざんの検出 |
Country Status (5)
Country | Link |
---|---|
US (1) | US11022637B2 (ja) |
JP (1) | JP2022516950A (ja) |
CN (1) | CN113260870A (ja) |
GB (1) | GB2595112B (ja) |
WO (1) | WO2020144478A1 (ja) |
Families Citing this family (1)
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TWI775479B (zh) * | 2021-06-08 | 2022-08-21 | 黑澤科技股份有限公司 | 電路感測裝置 |
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Publication number | Priority date | Publication date | Assignee | Title |
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JP2003296680A (ja) * | 2002-03-29 | 2003-10-17 | Hitachi Ltd | データ処理装置 |
JP4016034B2 (ja) * | 2003-04-10 | 2007-12-05 | 富士通株式会社 | オートレンジ設定機能つきパルス幅測定装置 |
JP4134845B2 (ja) * | 2003-08-19 | 2008-08-20 | 株式会社デンソー | 信号生成回路,フェールセーフ回路 |
US7603602B2 (en) * | 2006-11-27 | 2009-10-13 | Faraday Technology Corp. | Built-in self test circuit for analog-to-digital converter and phase lock loop and the testing methods thereof |
KR100847148B1 (ko) | 2006-12-01 | 2008-07-18 | 한국전자통신연구원 | 주파수 센싱 장치 |
KR100911379B1 (ko) | 2007-06-14 | 2009-08-10 | 삼성전자주식회사 | 반도체 집적 회로의 해킹 검출기 및 그것의 검출 방법 |
FR2929780A1 (fr) | 2008-04-08 | 2009-10-09 | St Microelectronics Rousset | Detection de donnees recues par un dispositif maitre dans un protocole de communication unifilaire |
US8065102B2 (en) * | 2008-08-28 | 2011-11-22 | Advantest Corporation | Pulse width measurement circuit |
US8547433B2 (en) * | 2008-11-09 | 2013-10-01 | Haim Amir | Extended life video camera system and method |
US8232824B2 (en) * | 2009-04-08 | 2012-07-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Clock circuit and method for pulsed latch circuits |
CN101696996B (zh) * | 2009-10-16 | 2012-02-15 | 西安英洛华微电子有限公司 | 脉宽信号占空比检测器 |
CN101964647B (zh) * | 2010-09-14 | 2012-10-24 | 日银Imp微电子有限公司 | 一种脉宽信号占空比检测电路 |
KR101725505B1 (ko) | 2010-12-07 | 2017-04-11 | 삼성전자주식회사 | 해킹 검출 장치, 집적 회로 및 해킹 검출 방법 |
US8378710B1 (en) | 2011-09-20 | 2013-02-19 | Nxp B.V. | Secure device anti-tampering circuit |
KR20170003041A (ko) * | 2015-06-30 | 2017-01-09 | 삼성전자주식회사 | 유효한 유저 입력을 판단하는 전자 장치 |
US10418981B2 (en) * | 2017-04-12 | 2019-09-17 | Samsung Electronics Co., Ltd. | System and method for calibrating pulse width and delay |
US10753966B2 (en) * | 2018-11-30 | 2020-08-25 | Sequans Communications S.A. | Duty cycle estimation |
-
2019
- 2019-01-10 US US16/244,364 patent/US11022637B2/en active Active
-
2020
- 2020-01-08 GB GB2111116.6A patent/GB2595112B/en active Active
- 2020-01-08 WO PCT/GB2020/050037 patent/WO2020144478A1/en active Application Filing
- 2020-01-08 CN CN202080007709.8A patent/CN113260870A/zh active Pending
- 2020-01-08 JP JP2021539595A patent/JP2022516950A/ja active Pending
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Publication number | Publication date |
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WO2020144478A1 (en) | 2020-07-16 |
CN113260870A (zh) | 2021-08-13 |
GB2595112B (en) | 2023-01-04 |
GB2595112A (en) | 2021-11-17 |
GB202111116D0 (en) | 2021-09-15 |
US20200225270A1 (en) | 2020-07-16 |
US11022637B2 (en) | 2021-06-01 |
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