JP2022182314A5 - - Google Patents

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JP2022182314A5
JP2022182314A5 JP2021089812A JP2021089812A JP2022182314A5 JP 2022182314 A5 JP2022182314 A5 JP 2022182314A5 JP 2021089812 A JP2021089812 A JP 2021089812A JP 2021089812 A JP2021089812 A JP 2021089812A JP 2022182314 A5 JP2022182314 A5 JP 2022182314A5
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fluorescence
unit
target position
laser beam
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JP2021089812A
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JP2022182314A (ja
JP7582073B2 (ja
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JP2021089812A 2021-05-28 2021-05-28 マトリックス支援レーザ脱離イオン化質量分析装置及び方法 Active JP7582073B2 (ja)

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JP2021089812A JP7582073B2 (ja) 2021-05-28 2021-05-28 マトリックス支援レーザ脱離イオン化質量分析装置及び方法

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JP2021089812A JP7582073B2 (ja) 2021-05-28 2021-05-28 マトリックス支援レーザ脱離イオン化質量分析装置及び方法

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JP2022182314A JP2022182314A (ja) 2022-12-08
JP2022182314A5 true JP2022182314A5 (https=) 2023-09-08
JP7582073B2 JP7582073B2 (ja) 2024-11-13

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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6716629B2 (en) 2000-10-10 2004-04-06 Biotrove, Inc. Apparatus for assay, synthesis and storage, and methods of manufacture, use, and manipulation thereof
JP2004212206A (ja) 2002-12-27 2004-07-29 Institute Of Physical & Chemical Research 高分子分析用基板、高分子分析用アレイおよび高分子分析方法
US7423260B2 (en) 2005-11-04 2008-09-09 Agilent Technologies, Inc. Apparatus for combined laser focusing and spot imaging for MALDI
JP7167705B2 (ja) 2018-12-26 2022-11-09 株式会社島津製作所 質量分析方法
JP2020149853A (ja) 2019-03-13 2020-09-17 株式会社島津製作所 質量分析装置及び質量分析方法

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