JP2022002245A - 面発光型量子カスケードレーザ - Google Patents
面発光型量子カスケードレーザ Download PDFInfo
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- JP2022002245A JP2022002245A JP2020106268A JP2020106268A JP2022002245A JP 2022002245 A JP2022002245 A JP 2022002245A JP 2020106268 A JP2020106268 A JP 2020106268A JP 2020106268 A JP2020106268 A JP 2020106268A JP 2022002245 A JP2022002245 A JP 2022002245A
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- 239000004038 photonic crystal Substances 0.000 claims abstract description 23
- 239000000758 substrate Substances 0.000 claims abstract description 10
- 239000004065 semiconductor Substances 0.000 claims abstract description 7
- 230000007704 transition Effects 0.000 claims abstract description 7
- 239000000969 carrier Substances 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 230000010355 oscillation Effects 0.000 abstract description 22
- 239000010408 film Substances 0.000 description 43
- 238000010586 diagram Methods 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012788 optical film Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3401—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
- H01S5/04253—Electrodes, e.g. characterised by the structure characterised by the material having specific optical properties, e.g. transparent electrodes
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/11—Comprising a photonic bandgap structure
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- H—ELECTRICITY
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- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/12—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
- H01S5/1237—Lateral grating, i.e. grating only adjacent ridge or mesa
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/185—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL]
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- H—ELECTRICITY
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- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/176—Specific passivation layers on surfaces other than the emission facet
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0287—Facet reflectivity
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04256—Electrodes, e.g. characterised by the structure characterised by the configuration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2018—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers
- H01S5/2027—Reflecting region or layer, parallel to the active layer, e.g. to modify propagation of the mode in the laser or to influence transverse modes
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
Abstract
Description
Claims (8)
- 基板と、
前記基板上に設けられた半導体積層体のメサ部であって、キャリアのサブバンド間遷移により発光する発光層と、二次元回折格子を含むフォトニック結晶層とを有するメサ部と、
前記メサ部の側壁に設けられた反射膜と、
を備える面発光型量子カスケードレーザ。 - 前記メサ部は、4つの側壁を有する四角柱状に設けられ、
前記反射膜は、前記4つの側壁のうち少なくとも相対する2つの側壁に設けられた請求項1記載の面発光型量子カスケードレーザ。 - 前記メサ部は、円柱状に設けられた請求項1記載の面発光型量子カスケードレーザ。
- 前記発光層が発する光に対する前記反射膜の反射率は40%以上である請求項1〜3のいずれか1つに記載の面発光型量子カスケードレーザ。
- 前記反射膜は、金属膜である請求項1〜4のいずれか1つに記載の面発光型量子カスケードレーザ。
- 前記金属膜は、金を含む請求項5記載の面発光型量子カスケードレーザ。
- 前記反射膜と連続して前記メサ部に設けられた電極と、
前記メサ部の前記側壁と、前記反射膜との間に設けられた絶縁膜と、
をさらに備える請求項5または6に記載の面発光型量子カスケードレーザ。 - 前記反射膜は、誘電体多層膜である請求項1〜4のいずれか1つに記載の面発光型量子カスケードレーザ。
Priority Applications (2)
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JP2020106268A JP7542336B2 (ja) | 2020-06-19 | 2020-06-19 | 面発光型量子カスケードレーザ |
US17/302,237 US20210399526A1 (en) | 2020-06-19 | 2021-04-28 | Surface-emitting quantum cascade laser |
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JP2020106268A JP7542336B2 (ja) | 2020-06-19 | 2020-06-19 | 面発光型量子カスケードレーザ |
Publications (2)
Publication Number | Publication Date |
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JP2022002245A true JP2022002245A (ja) | 2022-01-06 |
JP7542336B2 JP7542336B2 (ja) | 2024-08-30 |
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JP (1) | JP7542336B2 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4246741A1 (en) * | 2022-03-15 | 2023-09-20 | Sensirion AG | Vertical emission cascade lasers |
GB2623511A (en) * | 2022-10-14 | 2024-04-24 | Univ Glasgow Court | Photonic device |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
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US6728282B2 (en) * | 2001-06-18 | 2004-04-27 | Lucent Technologies Inc. | Engineering the gain/loss profile of intersubband optical devices having heterogeneous cascades |
WO2003067724A1 (fr) | 2002-02-08 | 2003-08-14 | Matsushita Electric Industrial Co., Ltd. | Dispositif semi-conducteur electroluminescent et procede de fabrication de celui-ci |
JP5015641B2 (ja) * | 2007-03-26 | 2012-08-29 | 国立大学法人京都大学 | 2次元フォトニック結晶面発光レーザ |
JP2009231773A (ja) | 2008-03-25 | 2009-10-08 | Sumitomo Electric Ind Ltd | フォトニック結晶面発光レーザ素子およびその製造方法 |
JP5158878B2 (ja) | 2008-10-08 | 2013-03-06 | 古河電気工業株式会社 | 面発光レーザ及びその製造方法 |
JP2012129497A (ja) | 2010-11-26 | 2012-07-05 | Hamamatsu Photonics Kk | 量子カスケードレーザ |
JP6506663B2 (ja) * | 2015-08-31 | 2019-04-24 | 浜松ホトニクス株式会社 | 量子カスケードレーザ |
JP6513626B2 (ja) | 2016-12-01 | 2019-05-15 | 株式会社東芝 | フォトニック結晶内蔵基板およびその製造方法、並びに面発光量子カスケードレーザ |
JP2018098263A (ja) * | 2016-12-08 | 2018-06-21 | 住友電気工業株式会社 | 量子カスケード半導体レーザ |
JP6580097B2 (ja) * | 2017-09-05 | 2019-09-25 | 株式会社東芝 | 面発光量子カスケードレーザ |
US10490979B2 (en) * | 2017-12-27 | 2019-11-26 | Kabushiki Kaisha Toshiba | Substrate including photonic crystal and method for manufacturing the same, and surface emitting quantum cascade laser |
CN109861078B (zh) | 2019-04-02 | 2021-01-05 | 中国科学院长春光学精密机械与物理研究所 | 一种面发射激光器及一种面发射激光器阵列 |
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2020
- 2020-06-19 JP JP2020106268A patent/JP7542336B2/ja active Active
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2021
- 2021-04-28 US US17/302,237 patent/US20210399526A1/en active Pending
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JP7542336B2 (ja) | 2024-08-30 |
US20210399526A1 (en) | 2021-12-23 |
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