JP2021507531A - パワー・シリコン・カーバイドmosfetデバイス及び関連する方法 - Google Patents
パワー・シリコン・カーバイドmosfetデバイス及び関連する方法 Download PDFInfo
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- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims abstract description 97
- 229910010271 silicon carbide Inorganic materials 0.000 title claims abstract description 97
- 238000000034 method Methods 0.000 title claims description 23
- 239000002019 doping agent Substances 0.000 claims abstract description 52
- 238000005468 ion implantation Methods 0.000 claims description 47
- 230000005465 channeling Effects 0.000 claims description 32
- 239000013078 crystal Substances 0.000 claims description 8
- 239000012535 impurity Substances 0.000 claims description 5
- 239000007943 implant Substances 0.000 claims 2
- 239000010410 layer Substances 0.000 description 91
- 239000004065 semiconductor Substances 0.000 description 66
- 108091006146 Channels Proteins 0.000 description 48
- 239000000758 substrate Substances 0.000 description 31
- 238000002513 implantation Methods 0.000 description 9
- 238000002347 injection Methods 0.000 description 9
- 239000007924 injection Substances 0.000 description 9
- 150000002500 ions Chemical class 0.000 description 9
- 239000000463 material Substances 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000008186 active pharmaceutical agent Substances 0.000 description 7
- 230000000903 blocking effect Effects 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 230000003321 amplification Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000000969 carrier Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 238000004806 packaging method and process Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 108010075750 P-Type Calcium Channels Proteins 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- -1 aluminum ions Chemical class 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- 239000004783 Serene Substances 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- MTCFGRXMJLQNBG-UHFFFAOYSA-N serine Chemical compound OCC(N)C(O)=O MTCFGRXMJLQNBG-UHFFFAOYSA-N 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
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Abstract
Description
本出願は、内容の全てが本明細書での参照により組み込まれている、2017年12月21日に提出された米国特許出願第15/849,975号の優先権を主張するものである。
本発明は、契約番号W911NF−12−2−0064の下で陸軍研究所から資金提供された政府の助成を受けてなされたものである。政府は、本発明について一定の権利を有する。
Claims (28)
- 第1の導電型を有するシリコン・カーバイド・ドリフト領域と、
前記シリコン・カーバイド・ドリフト領域の上部内に配置され、前記シリコン・カーバイド・ドリフト領域の上面へと延在する、第1のウェル領域であって、前記第1のウェル領域は第2の導電性のドーパントでドーピングされ、前記第1のウェル領域の少なくとも下部は第2の導電型を有し、前記第2の導電型は前記第1の導電型と異なる、第1のウェル領域と、
前記シリコン・カーバイド・ドリフト領域の前記上部内に配置され、前記シリコン・カーバイド・ドリフト領域の前記上面へと延在する、第2のウェル領域であって、前記第2のウェル領域は前記シリコン・カーバイド・ドリフト層のJFET領域を確定するように前記第1のウェル領域から間隔を空けられ、前記第2のウェル領域は第2の導電性のドーパントでドーピングされ、前記第2のウェル領域の少なくとも下部は前記第2の導電型を有する、第2のウェル領域と、
前記第1のウェル領域の側面部内のチャネル領域であって、前記チャネル領域の上部が前記第1の導電型を有する、チャネル領域とを、備える、
パワーMOSFETであって、
前記第1のウェル領域の深さが少なくとも1.5マイクロメートルであり、
前記第1のウェル領域の前記深さは、前記第1及び第2のウェル領域間の距離を超える、
パワーMOSFET。 - 前記シリコン・カーバイド・ドリフト領域の下面上の第1のソース/ドレイン・コンタクトと、
前記第1のウェル領域の上部内にあり、前記第1のウェル領域の上面へと延在する、第1の導電型領域と、
前記第1の導電型領域の上面上の第2のソース/ドレイン・コンタクトと、
前記第1のウェル領域の直上のゲート絶縁層と、
前記ゲート絶縁層上のゲート電極とを、さらに備える、
請求項1に記載のパワーMOSFET。 - 前記第1及び第2のウェル領域が、第2の導電型ドーパントで注入された、注入された領域を含む、請求項1又は2に記載のパワーMOSFET。
- 前記JFET領域のドーピング濃度が、1×1016cm3〜5×1017/cm3である、請求項1から3までのいずれか一項に記載のパワーMOSFET。
- 前記第1のウェル領域の少なくとも上側0.2マイクロメートルが、前記第1の導電型を有する、請求項1から4までのいずれか一項に記載のパワーMOSFET。
- 前記第1のウェル領域の少なくとも上側0.4マイクロメートルが、前記第1の導電型を有する、請求項1から5までのいずれか一項に記載のパワーMOSFET。
- 前記第1及び第2のウェル領域が各々、少なくとも2.5マイクロメートルの深さを有する、請求項1から6までのいずれか一項に記載のパワーMOSFET。
- 前記チャネル領域及び前記第1のウェル領域の中央部分が、前記シリコン・カーバイド・ドリフト領域の前記上面からの深さに応じた、第2の導電型ドーパントの実質的に同一のドーピング・プロファイルを有する、請求項1から7までのいずれか一項に記載のパワーMOSFET。
- 前記第1のウェル領域内の第2の導電型ドーパント濃度が、前記シリコン・カーバイド・ドリフト領域の前記上面から1.0〜2.0マイクロメートルの深さで、3倍未満で変化する、請求項1から8までのいずれか一項に記載のパワーMOSFET。
- 前記チャネル領域の下部が、前記第2の導電型を有する、請求項1から9までのいずれか一項に記載のパワーMOSFET。
- 前記第1及び第2のウェル領域間の距離が少なくとも2.0マイクロメートルであり、前記第1のウェル領域の深さが少なくとも2.5マイクロメートルである、請求項1から10までのいずれか一項に記載のパワーMOSFET。
- 40アンペア未満のドレイン−ソース電流で少なくとも25〜150℃の範囲の温度での前記ドレイン電流に負の温度係数を示す、請求項1から11までのいずれか一項に記載のパワーMOSFET。
- 第1の導電型を有するシリコン・カーバイド・ドリフト領域と、
前記シリコン・カーバイド・ドリフト領域の上部内に配置され、前記シリコン・カーバイド・ドリフト領域の上面へと延在する、第1のウェル領域であって、前記第1のウェル領域は第2の導電性のドーパントでドーピングされ、前記第1のウェル領域の少なくとも下部は第2の導電型を有し、前記第2の導電型は前記第1の導電型と異なる、第1のウェル領域と、
前記シリコン・カーバイド・ドリフト領域の前記上部内に配置され、前記シリコン・カーバイド・ドリフト領域の上面へと延在する、第2のウェルであって、前記第2のウェル領域は第2の導電性のドーパントでドーピングされ、前記第2のウェル領域の少なくとも下部は第2の導電型を有し、前記第1及び第2のウェル領域がそれらの間のJFET領域を画定する、第2のウェルと、
前記第1のウェル領域の前記上面上のゲート絶縁層と、
前記第1のウェル領域の側面部内の前記ゲート絶縁層下のチャネル領域であって、前記チャネル領域の上部が前記第1の導電型を有する、チャネル領域とを、備える、
パワーMOSFETであって、
前記シリコン・カーバイド・ドリフト領域のドーピング濃度、前記JFET領域の幅、前記チャネル領域のドーピング濃度、及び/又は前記第1のウェル領域の深さが、40アンペア未満のドレイン−ソース電流で少なくとも25〜150℃の範囲の温度での前記ドレイン電流に負の温度係数をもたらすように選択される、
パワーMOSFET。 - 前記第1のウェル領域の深さが、少なくとも1.5マイクロメートルであり、前記第1のウェル領域の前記深さが、前記第1ウェル領域と、前記第1のウェル領域に隣接する第2のウェル領域との間の距離を超える、請求項13に記載のパワーMOSFET。
- 前記第1及び第2のウェル領域が、第2の導電型ドーパントで注入された、注入された領域を含む、請求項13又は14に記載のパワーMOSFET。
- 前記第1のウェル領域の少なくとも上側0.3マイクロメートルが、前記第1の導電型を有する、請求項13から15までのいずれか一項に記載のパワーMOSFET。
- 前記第1及び第2のウェル領域が各々、少なくとも2.5マイクロメートルの深さを有する、請求項13から16までのいずれか一項に記載のパワーMOSFET。
- 前記チャネル領域及び前記第1のウェル領域の中央部分が、前記シリコン・カーバイド・ドリフト領域の前記上面からの深さに応じた、第2の導電型ドーパントの実質的に同一のドーピング・プロファイルを有する、請求項13から17までのいずれか一項に記載のパワーMOSFET。
- 前記第1のウェル領域内の第2の導電型ドーパント濃度が、前記シリコン・カーバイド・ドリフト領域の前記上面から1.0〜2.0マイクロメートルの深さで、3倍未満で変化する、請求項13から18までのいずれか一項に記載のパワーMOSFET。
- 第1の導電型を有するシリコン・カーバイド・ドリフト領域を提供するステップと、
前記シリコン・カーバイド・ドリフト領域の上部内に第1及び第2のウェル領域を形成するために、チャネリング・イオン注入を用いて、第2の導電型ドーパントを前記シリコン・カーバイド・ドリフト領域の前記上部内に注入するステップとを、含む、
パワーMOSFETを形成する方法であって、
前記第1及び第2のウェル領域の各々の上部が、前記第1の導電型を有し、一方、前記第1及び第2のウェル領域の各々の下部は、前記第2の導電型を有し、前記第2の導電型は、前記第1の導電型と異なる、
パワーMOSFETを形成する方法。 - 前記第1及び第2のウェル領域が各々、少なくとも1.5マイクロメートルの深さを有する、請求項20に記載の方法。
- 前記第1及び第2のウェル領域が各々、少なくとも2.0マイクロメートルの深さを有する、請求項20又は21に記載の方法。
- 前記第1のウェル領域の前記深さが、前記第1及び第2のウェル領域間の距離を超える、請求項20から22までのいずれか一項に記載の方法。
- 前記MOSFETのゲート電極の下層にある前記第1のウェル領域の側面部が、チャネル領域を含み、前記チャネル領域の少なくとも一部分は、前記第1の導電型を有する、請求項20から23までのいずれか一項に記載の方法。
- 前記チャネル領域及び前記第1のウェル領域の中央部分が、前記シリコン・カーバイド・ドリフト領域の上面からの深さに応じた、第2の導電型ドーパントの実質的に同一のドーピング・プロファイルを有する、請求項20から24までのいずれか一項に記載の方法。
- 前記チャネリング・イオン注入が、ドーパント不純物を、前記シリコン・カーバイド・ドリフト領域の<0001>、<11−23>、<−1−123>、<1−213>、<−12−13>、<2−1−13>、又は<−2113>結晶軸のうちの1つの±1.5°以内の角度で注入する、請求項20から25までのいずれか一項に記載の方法。
- 前記第1のウェル領域の少なくとも上側0.2マイクロメートルが、前記第1の導電型を有する、請求項20から26までのいずれか一項に記載の方法。
- 前記チャネル領域が、チャネリング・イオン注入を用いて形成される、請求項20から27までのいずれか一項に記載の方法。
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