JP2021189084A - Current test probe holder and current test probe device - Google Patents

Abstract

To provide a current test probe device and a current test probe holder that are able to cope with a large current with a compact structure.CONSTITUTION: A current test probe device 11 has: a current test probe holder 10 having a conductive case member 1 that has a plurality of current probe insertion holes 2 at one end and a contact fixing portion relative to a measuring terminal portion at the other end; a current probe 9 surrounded by a conductive cylindrical body 13, having, at an end of a contact piece exposed from one end of the cylindrical body, an end face that is brought into face-contact with a to-be-inspected object, and inserted into a current probe insertion hole of the current test probe holder 10 while surrounded by the conductive cylindrical body; and insertion stroke adjustment means for the current probe relative to the current probe insertion hole of the current test probe holder. The insertion stroke adjustment means has: a screw hole portion formed in a hole bottom portion of the current probe insertion hole; and a tip screw portion for the conductive cylindrical body that helically engages with the screw hole portion.SELECTED DRAWING: Figure 1

Description

The present invention relates to a current test probe holder and a current test probe device. The present invention relates to a current test probe device suitable for measuring a large current as seen in, for example, an inspection facility for an inverter of an electric vehicle (EV vehicle), and a current test probe holder used in the probe device.

When detecting electrical characteristics such as current and voltage in various electrical equipment or general electrical equipment, connect the probe to the measuring instrument according to the purpose, and bring the tip of the probe into contact with the electrode to be measured. The values of current, voltage, etc. are measured. Such detection probes come in various forms depending on the type of the object to be inspected and the purpose of the inspection. For example, from those for wiring inspection of wiring boards of electronic devices to power supply devices in power generation equipment. Various forms such as a large current probe for measuring the output voltage of the above or used in an inverter inspection facility of an electric vehicle in recent years are known.

The measurement probe unit shown in Patent Document 1 is disclosed as being used for measuring the output voltage of a power supply device of an automatic voltage regulator in a thermal power plant. This prevents a short circuit and a ground fault accident due to accidental contact between the probe probe and the opening of the power supply housing when the probe at the tip of the measuring probe is brought into contact with the electrode of the power supply device of the object to be measured. be. Further, as shown in Patent Document 2, a spring made of a superelastic alloy having a shape memory characteristic is housed in a sleeve holding the probe head, and the measured pressure of the probe head with respect to an object to be measured (wiring substrate, etc.) by this spring. By keeping the (pressing pressure) constant, the structure prevents damage to the contact area of the object to be measured.

Further, as applied to a probe for a large current, for example, an inverter inspection facility of an electric vehicle (EV vehicle), a conductive stud is inserted in a conductive barrel (cylinder body), and the inside of the barrel is inserted. There is also known a large current probe in which the tip of the stud is pressed against the electrode to be measured by a spring provided in the stud and the rear end of the stud is brought into contact with the detection electrode of the inspection facility.

JP-A-2017-207299 Japanese Unexamined Patent Publication No. 2000-147003

A conductive stud is inserted into the above-mentioned conductive cylinder, the end of the stud exposed from one end of the cylinder is pressed against the electrode to be measured, and the other end of the stud or the other end of the cylinder is inspected. A device that detects electrical characteristics such as an inverter by contacting the detection end of the device is more suitable for detecting a large current than a measurement probe that connects the rear end of the probe and the measuring device with a lead wire. However, it is a form in which only one terminal of the probe is connected to the detection end of the inspection device, and there is a limit to the detection of a higher current. In addition, in order to handle a large current, it is necessary to securely crimp the probe contacts to the electrodes of the inspection device, and there is a concern that heat will be generated if the connection is insufficient with a single contact. rice field.

On the other hand, the measurement probe unit of Patent Document 1 forms two through holes in the probe holding connector of the insulator, inserts a pair of probes into the through holes, and presses the probe at the tip of the probe against the electrode of the object to be detected. However, this probe unit is connected to the measuring instrument via a lead wire, and is not for detecting a large current as in Patent Document 2.

The present invention provides a current test probe device capable of efficiently detecting and processing a large current by accommodating a plurality of high current probes in a conductive case, and a current test probe holder used in the probe device. The purpose is to do.

Further, the present invention further provides a current test probe device capable of easily adjusting the insertion stroke of a plurality of high current probes inserted in a conductive case and tightly crimping a contactor at the probe end to an inspected object. It is an object of the present invention to provide a current test probe holder used in this probe device.

The present invention further relates to a current test probe device having good maintainability and a current test used in the probe device, in which a probe damaged during use can be easily replaced for a plurality of high current probes housed in a conductive case. It is intended to provide a probe holder.

It is an object of the present invention to further provide a current test probe device which is useful for use in an inverter inspection facility of an electric vehicle (EV vehicle) and which is compact as a whole and a current test probe holder used in the probe device. do.

The current test probe holder according to the present invention is characterized by having a conductive case member having a plurality of current probe insertion holes at one end and a contact fixing portion for a measurement terminal at the other end.

According to one embodiment of the present invention, a screw hole portion to be screwed with the tip screw portion of the current probe is formed at the hole bottom portion of the current probe insertion hole.

According to another embodiment of the present invention, a spring member for pressing the tip of the conductive cylinder of the current probe to be inserted into the insertion hole is arranged at the bottom portion of the current probe insertion hole.

According to still another embodiment of the present invention, a fixing screw screw-in hole for screwing and fixing the measurement terminal portion is formed in the contact fixing portion of the conductive case member with respect to the measurement terminal portion.

Further, according to the present invention, a current test probe holder having a conductive case member having a plurality of current probe insertion holes at one end and a contact fixing portion for a measurement terminal at the other end, and a conductive cylinder. The current test probe is surrounded by the body and has an end face that comes into surface contact with the object to be inspected at the end of the contact exposed from one end of the cylinder and is surrounded by the conductive cylinder. It has a current probe inserted into the current probe insertion hole of the holder and an insertion stroke adjusting means of the current probe for the current probe insertion hole of the current test probe holder, and the insertion stroke adjusting means is the current probe. Provided is a current test probe device including a screw hole portion formed at a hole bottom portion of an insertion hole and a tip thread portion of the conductive cylinder screwed with the screw hole portion.

In the current test probe device according to the present invention, a plurality of current probes are housed in a conductive case as a set, and one end of each probe is used as a contact end surface to an inspected object, so that a larger current can be obtained. Can be detected. As a probe device for dealing with a large current, an extremely compact device can be obtained while having a plurality of probes.

Further, according to the present invention, even if a certain current probe in the conductive case is damaged, the damaged probe can be easily replaced and good maintainability is ensured. Further, the insertion stroke of the current probe inserted in the conductive case can be easily adjusted, and a good crimp connection of the contactor at the probe end to the electrode of the object to be inspected becomes possible.

It is a perspective view which disassembled in the order of assembling the current test probe apparatus which concerns on embodiment of this invention. It is a side view in the assembled state of the current test probe apparatus which concerns on embodiment of this invention. It is external perspective view of the current test probe apparatus in the Example shown in FIGS. 1 and 2. It is a front view of the probe insertion end portion of the current test probe holder which concerns on various examples of this invention, and FIG. FIG. (B) is a front view of the current test probe holder of the embodiment having six current probe insertion holes.

Next, an embodiment of the present invention will be described with reference to the drawings.
This embodiment is an example configured as a large current test probe device for inverter inspection of an inverter inspection facility in an electric vehicle (EV vehicle) of an automobile production line. As shown in FIG. 1, the large current test probe holder 10 of the embodiment has a columnar case member 1 having good conductivity such as copper, and the case is at a predetermined depth from one end of the conductive case member 1. Four current probe insertion holes 2 extending in the longitudinal direction of the member are formed. As is clearly shown in FIG. 2, a female screw portion 3 is formed at the bottom portion of each current probe insertion hole 2 of the conductive case member 1. Further, a screw hole 5 into which the fixing screw 4 is screwed is formed in the center of the other end of the conductive case member 1 (the end opposite to the opening side of the insertion hole), and a measuring device (not shown). ), The fixing screw 4 is screwed into and fastened into the end screw hole 5 of the conductive case member 1 through the screw insertion hole 8 of the plate surface-shaped crimp terminal 7 formed in the energization cable 6. The flat end surface of the columnar conductive case member 1 is in close contact with the crimp terminal 7 and is fixed to the crimp terminal 7 in a conductive state by the fixing screw 4.

A current probe 9 is removably inserted into each probe insertion hole 2 of the conductive case member 1 of the current test probe holder 10. The current probe itself may be a commercially available one, and its configuration is such that the outer circumference of the conductive contactor 12 having a columnar appearance is surrounded by a conductive cylinder 13. The tip of the conductive cylinder 13 is closed, the opposite end is opened, and the contact 12 of the current probe 9 is exposed to a predetermined length. A threaded portion 15 is formed on the outer periphery of the closed tip portion of the conductive cylinder 13, and when the current probe 9 is inserted into the probe insertion hole 2 of the conductive case member 1 of the current test probe holder 10, the probe contacts. The threaded portion 15 at the tip of the conductive cylinder 13 surrounding the child 12 and the female threaded portion 3 at the bottom of the probe insertion hole 2 of the conductive case member 1 are screwed together. A spring member (not shown) is interposed between the bottom of the hole of the conductive cylinder 13 and the insertion end of the contactor 12 in advance. Further, the end surface of the exposed end portion of the contact 12 of the current probe 9 exposed from the conductive cylinder 13 is a flat surface so as to be in close contact with the electrode of the inverter inspection object (not shown) by surface contact.

In the current test probe device 11 of the present invention, it is necessary that the end face of the contact 12 of the current probe 9 is closely crimped to the electrode of the object to be inspected (inspected object), and this crimping is not sufficient. Generates heat and wears the contacts. In this regard, in the present invention, the screw is screwed between the threaded portion 15 at the tip peripheral portion of the conductive cylinder body 13 of the current probe and the female threaded portion 3 of the probe insertion hole of the conductive case member 1 by rotating the current probe 9. The insertion stroke of the current probe 9 can be adjusted by the feeding action, and even if there is some error such as flatness, straightness, or gap between the end face of the contact 12 and the object to be inspected (object to be inspected), these It is possible to absorb the error of the above and secure a reliable crimping state.

Further, in the present invention, since a plurality of current probes 9 are inserted into the conductive case member 1 of the probe holder 10, when a part of the current probes 9 is damaged due to heat generation of the current probes 9 due to a large current. However, the detection operation can be continued by replacing only the damaged current probe, and high maintainability can be ensured. In addition, a probe device with an extremely compact overall configuration can be obtained.

Since the current test probe device of the present invention has a configuration in which a plurality of current probes are assembled as a set in a current probe holder and housed in the current probe holder, a larger current can be dealt with. In the embodiment of FIGS. 1 to 3, since four 50 amp (50 A) current probes are incorporated, a current of 200 A can be supported by 50 A × 4 current probes. In the present invention, the current probe to be incorporated in the current test probe holder is not limited to four as in the above embodiment, and as shown in FIG. 4A, the conductive case member 17 of the probe holder 16 has 5 current probes. By forming the probe insertion holes 18 and incorporating the five current probes into the probe holder 16, it is possible to handle a current of 50 A × 5, and the conductivity is as shown in the example of FIG. 4 (b). By forming 6 probe insertion holes 20 in the sex case member 19 and incorporating 6 current probes into the probe insertion holes 20 accordingly, it is possible to cope with a large current of 50 A × 6. In addition, a probe holder with eight probe insertion holes is generally formed, and n probe insertion holes are generally formed to form a set of n current probes and inserted into the conductive case member to obtain a current of 50 A × n. It can be configured to have specifications corresponding to. In the present invention, a large current test probe device having an extremely compact structure can be obtained by adopting a configuration in which a plurality of current probes are set and incorporated in a probe holder in this way.

1 Conductive case member 2 Current probe insertion hole 3 Female thread 4 Fixed screw 5 Thread hole 6 Energizing cable 7 Crimping terminal 8 Thread insertion hole 9 Current probe 10 Current test probe holder 11 Current test probe device 12 Current probe contact 13 Conductive Sex tube

Claims (5)

A current test probe holder characterized by having a plurality of current probe insertion holes at one end and a conductive case member having a contact fixing portion for a measurement terminal at the other end. The current test probe holder according to claim 1, wherein a threaded hole portion to be screwed with the tip threaded portion of the current probe is formed at a hole bottom portion of the current probe insertion hole. The invention according to claim 1 or 2, wherein a spring member for pressing the tip of the conductive cylinder of the current probe to be inserted into the insertion hole is arranged at the bottom portion of the current probe insertion hole. Current test probe holder. Any of claims 1 to 3, wherein a fixing screw screw-in hole for screwing and fixing the measurement terminal portion is formed in the contact fixing portion of the conductive case member with respect to the measurement terminal portion. Current test probe holder described in. A current test probe holder having a conductive case member having a plurality of current probe insertion holes at one end and a contact fixing portion for a measurement terminal at the other end.
The said in a state of being surrounded by the conductive cylinder and having an end face in surface contact with the object to be inspected formed at the end of the contact exposed from one end of the cylinder and being surrounded by the conductive cylinder. The current probe inserted into the current probe insertion hole of the current test probe holder,
It has a means for adjusting the insertion stroke of the current probe with respect to the current probe insertion hole of the current test probe holder.
The insertion stroke adjusting means includes a screw hole portion formed at a hole bottom portion of the current probe insertion hole, and a tip screw portion of the conductive cylinder screwed with the screw hole portion. Current test probe device.

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