JPH02130475A

JPH02130475A - Probe

Info

Publication number: JPH02130475A
Application number: JP28502088A
Authority: JP
Inventors: Daisuke Miyajima; 宮島　大亮
Original assignee: NEC Corp
Current assignee: NEC Corp
Priority date: 1988-11-10
Filing date: 1988-11-10
Publication date: 1990-05-18

Abstract

PURPOSE:To maintain uniform contact pressure and contact area by a construction wherein three or more contactors each having a spherical fore end are provided for each probe and each contactor has a spring. CONSTITUTION:A probe 1 has three or more contactors 3 each having a spherical fore end 4, and when a resistance value of a substance to be measured, for instance, is measured by a measuring unit 2, the probe 1 is pressed on a spot to be measured. Then, uniform contact pressure and contact area are obtained between the contactors 3 and the substance by springs 6 of the separate contactors irrespective of the undulation of the surface of the substance to be measured, the condition of pressing by a measurer, etc. For a grip 5 of the probe 1, an insulator is used for preventing the electric contact of the contactors 3 with one another. The contactors are connected to the measuring unit 2 by lead wires 7.

Description

【発明の詳細な説明】〔産業上の利用分野〕本発明は、抵抗計等が有する探針くプローブ）に関し、
特に被測定物と直接、接する接触子の形状及び構成に関
する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a probe included in a resistance meter, etc.
In particular, it relates to the shape and configuration of a contact that comes into direct contact with an object to be measured.

[Conventional technology]

従来、この種の探針は、先端の形状が鋭い接触子が一本
だけ直接探針の柄に取り付けられている構成となってい
た。Conventionally, this type of probe has a structure in which only one contact element with a sharp tip is attached directly to the handle of the probe.

[Problem to be solved by the invention]

上述した従来の探針は、−本の削成金属の接触子が直接
探針の柄に取り付けられていたため、被測定物との接触
圧、接触の角度によって測定値にバラツキが生じるとい
う欠点がある。The conventional probe mentioned above has a disadvantage in that the ground metal contacts are attached directly to the probe handle, which causes variations in measured values depending on the contact pressure with the object to be measured and the angle of contact. be.

[Means to solve the problem]

本発明の探針は、柄と、先端が球状で前記柄により一定
範囲内において互いがほぼ平行に案内される３本以上の
接触子と、この接触子それぞれを前記柄から押し出す方
向の力を与える３本以上のばねと、前記接触子の測定器
とを電気的に接続するリード線とを含んで構成される。The probe of the present invention includes a handle, three or more contacts each having a spherical tip and guided approximately parallel to each other within a certain range by the handle, and a force in the direction of pushing each of the contacts out of the handle. It is configured to include three or more springs that provide the contact, and a lead wire that electrically connects the contactor to the measuring device.

〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第１図および第２図はそれぞれ本発明の一実施例を示す
斜視図およびＡＡ断面図である。探針１は先端４が球状
の３本以上の複数の接触子３を有し、測定器２で、例え
ば被測定物の抵抗値を測定しようとする場合、探針１を
各々測定しようとする箇所に押し当ると個々の接触子３
のばね６により被測定物表面の凹凸、測定者の押圧の具
合等にかかわらず、接触子３と被測定物間に均一な接触
圧、接触面積が得られる。探針１の柄５は各々の接触子
３が電気的に接触しないよう絶縁体を用いる。接触子は
リード線７により測定器２に接続されている。FIG. 1 and FIG. 2 are a perspective view and an AA sectional view, respectively, showing an embodiment of the present invention. The probe 1 has a plurality of three or more contacts 3 each having a spherical tip 4, and when measuring the resistance value of an object to be measured with the measuring instrument 2, for example, the probe 1 is used to measure each probe 1. When pressed against a point, the individual contacts 3
The spring 6 provides uniform contact pressure and contact area between the contact 3 and the object to be measured, regardless of the unevenness of the surface of the object to be measured, the degree of pressure applied by the person measuring the object, etc. The handle 5 of the probe 1 is made of an insulator so that the contacts 3 do not come into electrical contact. The contactor is connected to the measuring device 2 by a lead wire 7.

〔Effect of the invention〕

以上説明したように本発明は、−本の探針当りに各々の
先端が球状になっている３本以上の複数の接触子と個々
の接触子にばねを有する構成にすることにより、被測定
物の凹凸や、剛性又は弾性及び測定者の押圧の具合、又
は測定環境等の制約による接触の角度にかかわらず、均
一の接触圧及び接触面積を保つことが出来、測定誤差の
要因がらこれらを除去する効果がある。As explained above, the present invention has a structure in which each probe has three or more contacts each having a spherical tip and each contact has a spring, thereby making it possible to Uniform contact pressure and contact area can be maintained regardless of the angle of contact due to the unevenness of the object, the rigidity or elasticity, the degree of pressure applied by the measurer, or the constraints of the measurement environment, etc., and these can be prevented from causing measurement errors. It has the effect of removing

[Brief explanation of drawings]

第１図および第２図はそれぞれ本発明の一実施例の斜視
図およびＡ−Ａ断面図である。１・・・探針、２・・・測定器、３・・・接触子、４・
・・先端、５・・・柄、６・・・ばね、７・・・リード
線。FIGS. 1 and 2 are a perspective view and a sectional view taken along line A-A of an embodiment of the present invention, respectively. 1... Probe, 2... Measuring device, 3... Contact, 4...
...Tip, 5...Handle, 6...Spring, 7...Lead wire.

Claims

[Claims]

A handle, three or more contacts each having a spherical tip and guided approximately parallel to each other within a certain range by the handle, and 3 applying a force in a direction to push each of the contacts out of the handle.
A probe characterized in that it includes a spring or more and a lead wire that electrically connects the contactor to a measuring device.