JPH01124534U - - Google Patents
Info
- Publication number
- JPH01124534U JPH01124534U JP1820688U JP1820688U JPH01124534U JP H01124534 U JPH01124534 U JP H01124534U JP 1820688 U JP1820688 U JP 1820688U JP 1820688 U JP1820688 U JP 1820688U JP H01124534 U JPH01124534 U JP H01124534U
- Authority
- JP
- Japan
- Prior art keywords
- crack
- gauge
- crack opening
- diagram showing
- showing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 2
- 238000006073 displacement reaction Methods 0.000 claims 1
- 238000010292 electrical insulation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 9
- 239000000853 adhesive Substances 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
第1図〜第4図は本考案の基本例を示す図で、
第1図は本案のゲージの使用状態を示す平面図、
第2図は第1図の一部を拡大して示した第1基本
例を示す図、第3図は第2図に示す第1基本例に
ついての実際の使用例を示す図、第4図は第2基
本例を示す平面図である。第5図は本考案の具体
的な実施例を示す平面図である。第6図は基本例
についてのスリツト開口量の測定例を示す図、第
7図は同じく亀裂開口量の測定例を示す図、第8
図は同じく応力拡大係数の推定精度を示す図であ
る。第9図および第10図は従来例による応力拡
大係数を求める手段を示す図で、第9図は簡易モ
デルを用いて求める手段を示す図、第10図は有
限要素法を用いて求める手段を示す図である。
11……亀裂入り部材、12……亀裂、13,
33,43……測定ゲージ、13a,33a,4
3a……薄板状ベース、13b,33b,43b
……導電線、14a,14b……測定用リード線
、15……非接着範囲。
Figures 1 to 4 are diagrams showing basic examples of the present invention.
Figure 1 is a plan view showing how the proposed gauge is used;
Figure 2 is an enlarged view of a part of Figure 1 showing the first basic example, Figure 3 is a diagram showing an actual usage example of the first basic example shown in Figure 2, and Figure 4 is a diagram showing an actual usage example of the first basic example shown in Figure 2. FIG. 2 is a plan view showing a second basic example. FIG. 5 is a plan view showing a specific embodiment of the present invention. Fig. 6 is a diagram showing an example of measuring the slit opening amount for the basic example, Fig. 7 is a diagram showing an example of measuring the crack opening amount, and Fig. 8 is a diagram showing an example of measuring the crack opening amount.
The figure also shows the estimation accuracy of the stress intensity factor. Figures 9 and 10 are diagrams showing means for determining the stress intensity factor according to the conventional example. Figure 9 is a diagram showing a means for determining it using a simple model, and Figure 10 is a diagram showing a means for determining it using the finite element method. FIG. 11...Cracked member, 12...Crack, 13,
33, 43...Measuring gauge, 13a, 33a, 4
3a... Thin plate base, 13b, 33b, 43b
... Conductive wire, 14a, 14b ... Lead wire for measurement, 15 ... Non-adhesive range.
Claims (1)
数本の導電線を各々独立した回路を形成するよう
に既知の間隔で配列し、各導電線の長さを、測定
すべき亀裂の亀裂先端部に対応するものより亀裂
開口部に対応するものの方が長くなるように漸次
変化させたことを特徴とする亀裂開口変位測定ゲ
ージ。 A plurality of conductive wires are arranged at known intervals on a thin plate base having electrical insulation properties so as to form independent circuits, and the length of each conductive wire is determined from the crack tip of the crack to be measured. A crack opening displacement measurement gauge characterized in that the gauge is gradually changed so that the gauge corresponding to the crack opening is longer than the gauge corresponding to the crack opening.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1820688U JPH01124534U (en) | 1988-02-15 | 1988-02-15 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1820688U JPH01124534U (en) | 1988-02-15 | 1988-02-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01124534U true JPH01124534U (en) | 1989-08-24 |
Family
ID=31232642
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1820688U Pending JPH01124534U (en) | 1988-02-15 | 1988-02-15 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01124534U (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03146900A (en) * | 1989-11-01 | 1991-06-21 | Hitachi Ltd | Sensor for water quality control of atomic reactor and its control method |
JP2007263674A (en) * | 2006-03-28 | 2007-10-11 | Nippon Steel Corp | Crack detection sensor |
JP2020139898A (en) * | 2019-03-01 | 2020-09-03 | トッパン・フォームズ株式会社 | Crack detection label |
JP2022549845A (en) * | 2019-09-24 | 2022-11-29 | エル テク カンパニー リミテッド | Crack sensor and low-power driven crack detection system using the same |
-
1988
- 1988-02-15 JP JP1820688U patent/JPH01124534U/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03146900A (en) * | 1989-11-01 | 1991-06-21 | Hitachi Ltd | Sensor for water quality control of atomic reactor and its control method |
JP2007263674A (en) * | 2006-03-28 | 2007-10-11 | Nippon Steel Corp | Crack detection sensor |
JP2020139898A (en) * | 2019-03-01 | 2020-09-03 | トッパン・フォームズ株式会社 | Crack detection label |
JP2022549845A (en) * | 2019-09-24 | 2022-11-29 | エル テク カンパニー リミテッド | Crack sensor and low-power driven crack detection system using the same |
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