JP2021097541A - 半導体集積回路装置 - Google Patents
半導体集積回路装置 Download PDFInfo
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- JP2021097541A JP2021097541A JP2019228673A JP2019228673A JP2021097541A JP 2021097541 A JP2021097541 A JP 2021097541A JP 2019228673 A JP2019228673 A JP 2019228673A JP 2019228673 A JP2019228673 A JP 2019228673A JP 2021097541 A JP2021097541 A JP 2021097541A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 64
- 238000012360 testing method Methods 0.000 claims abstract description 60
- 238000012544 monitoring process Methods 0.000 claims abstract description 5
- 239000003990 capacitor Substances 0.000 claims description 20
- 238000007599 discharging Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 8
- 102000012677 DET1 Human genes 0.000 description 6
- 101150113651 DET1 gene Proteins 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
- H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/18—Modifications for indicating state of switch
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/22—Modifications for ensuring a predetermined initial state when the supply voltage has been applied
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0081—Power supply means, e.g. to the switch driver
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dc-Dc Converters (AREA)
Abstract
Description
図1Aは、実施形態に係る半導体集積回路装置100(以下、「半導体集積回路装置100」と略す)の構成を示す図である。
図10は、変形例に係る半導体集積回路装置101(以下、「半導体集積回路装置101」と略す)の構成を示す図である。
次に、先に説明した半導体集積回路装置100及び101の用途例について説明する。図11は、車両の外観図である。車両Y1は、半導体集積回路装置100及び101のいずれかである半導体集積回路装置X1と、半導体集積回路装置X1の外付け部品群X2と、バッテリX3と、を搭載している。
なお、本発明の構成は、上記実施形態のほか、発明の主旨を逸脱しない範囲で種々の変更を加えることが可能である。
2 PチャネルMOSFET
3 NチャネルMOSFET
5 テスト部
6 判定部
7 放電部
100、101、102、X1 半導体集積回路装置
OUTS モニター端子
Y1 車両
Claims (7)
- 電源装置のスイッチング素子又は出力トランジスタを制御する制御部と、
前記電源装置の出力電圧をモニターするためのモニター端子と、
前記電源装置の起動前にテスト信号を前記モニター端子に出力するテスト部と、
前記テスト部が前記テスト信号を前記モニター端子に出力しているときの前記モニター端子の電圧に基づき、前記モニター端子がオープン状態であるか否かを判定する判定部と、
を備える、半導体集積回路装置。 - 前記モニター端子がオープン状態である場合に、前記テスト部から前記モニター端子への前記テスト信号の出力が前記モニター端子の電圧を上昇させる、請求項1に記載の半導体集積回路装置。
- 前記モニター端子がオープン状態でない場合に、前記テスト部から前記モニター端子への前記テスト信号の出力が前記モニター端子の電圧を上昇させることを前記電源装置の出力コンデンサが抑制する、請求項2に記載の半導体集積回路装置。
- 前記出力コンデンサを放電させる放電部を備える、請求項3に記載の半導体集積回路装置。
- 前記判定部は、前記出力コンデンサの放電状態が所定範囲内であるか否かも判定する、請求項4に記載の半導体集積回路装置。
- 前記テスト部は、前記電源装置の起動後に前記テスト信号を出力しない、請求項1〜5のいずれか一項に記載の半導体集積回路装置。
- 請求項1〜6のいずれか一項に記載の半導体集積回路装置を備える、車両。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019228673A JP7360317B2 (ja) | 2019-12-18 | 2019-12-18 | 半導体集積回路装置 |
US17/121,967 US11555847B2 (en) | 2019-12-18 | 2020-12-15 | Semiconductor integrated circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019228673A JP7360317B2 (ja) | 2019-12-18 | 2019-12-18 | 半導体集積回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2021097541A true JP2021097541A (ja) | 2021-06-24 |
JP7360317B2 JP7360317B2 (ja) | 2023-10-12 |
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JP2019228673A Active JP7360317B2 (ja) | 2019-12-18 | 2019-12-18 | 半導体集積回路装置 |
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US (1) | US11555847B2 (ja) |
JP (1) | JP7360317B2 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109917307B (zh) * | 2019-04-15 | 2021-02-02 | 苏州浪潮智能科技有限公司 | 一种避免uvlo测试中信号异常振荡的方法和装置 |
US11243264B2 (en) * | 2020-04-22 | 2022-02-08 | Renesas Electronics Corporation | Abnormal power supply voltage detection device and method for detecting abnormal power supply voltage |
US11874340B2 (en) * | 2022-05-31 | 2024-01-16 | Nxp Usa, Inc. | Open-circuit detector |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4385717B2 (ja) | 2003-10-10 | 2009-12-16 | 日本電気株式会社 | 昇圧dc−dcコンバータを用いた電源装置および故障検出制御方法 |
JP2014121103A (ja) | 2012-12-13 | 2014-06-30 | Renesas Electronics Corp | 半導体装置及びスイッチング電源装置 |
US9641070B2 (en) | 2014-06-11 | 2017-05-02 | Allegro Microsystems, Llc | Circuits and techniques for detecting an open pin condition of an integrated circuit |
US9640982B2 (en) * | 2014-11-05 | 2017-05-02 | General Electric Company | Over-voltage protection system and method |
JP2016181071A (ja) | 2015-03-24 | 2016-10-13 | 日立オートモティブシステムズ株式会社 | 電源装置 |
US10366987B2 (en) * | 2015-07-31 | 2019-07-30 | Texas Instruments Incorporated | Methods and apparatus for compensation and current spreading correction in shared drain multi-channel load switch |
JP6791722B2 (ja) | 2015-11-30 | 2020-11-25 | ローム株式会社 | 電源レギュレータ |
US11349470B2 (en) * | 2019-11-07 | 2022-05-31 | GM Global Technology Operations LLC | Gate driver and protection system for a solid-state switch |
-
2019
- 2019-12-18 JP JP2019228673A patent/JP7360317B2/ja active Active
-
2020
- 2020-12-15 US US17/121,967 patent/US11555847B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US11555847B2 (en) | 2023-01-17 |
JP7360317B2 (ja) | 2023-10-12 |
US20210190858A1 (en) | 2021-06-24 |
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