JP2021086457A5 - - Google Patents

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JP2021086457A5
JP2021086457A5 JP2019215774A JP2019215774A JP2021086457A5 JP 2021086457 A5 JP2021086457 A5 JP 2021086457A5 JP 2019215774 A JP2019215774 A JP 2019215774A JP 2019215774 A JP2019215774 A JP 2019215774A JP 2021086457 A5 JP2021086457 A5 JP 2021086457A5
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Japan
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quality measurement
data
measurement method
prediction model
quality
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JP2019215774A
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JP7084907B2 (ja
JP2021086457A (ja
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Priority claimed from JP2019215774A external-priority patent/JP7084907B2/ja
Priority to CN202080082342.6A priority patent/CN114760969B/zh
Priority to PCT/JP2020/031469 priority patent/WO2021106288A1/ja
Publication of JP2021086457A publication Critical patent/JP2021086457A/ja
Publication of JP2021086457A5 publication Critical patent/JP2021086457A5/ja
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JP2019215774A 2019-11-28 2019-11-28 品質計測方法及び品質計測装置 Active JP7084907B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2019215774A JP7084907B2 (ja) 2019-11-28 2019-11-28 品質計測方法及び品質計測装置
CN202080082342.6A CN114760969B (zh) 2019-11-28 2020-08-20 质量测量方法和质量测量装置
PCT/JP2020/031469 WO2021106288A1 (ja) 2019-11-28 2020-08-20 品質計測方法及び品質計測装置

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Application Number Priority Date Filing Date Title
JP2019215774A JP7084907B2 (ja) 2019-11-28 2019-11-28 品質計測方法及び品質計測装置

Publications (3)

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JP2021086457A JP2021086457A (ja) 2021-06-03
JP2021086457A5 true JP2021086457A5 (https=) 2022-04-20
JP7084907B2 JP7084907B2 (ja) 2022-06-15

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JP (1) JP7084907B2 (https=)
CN (1) CN114760969B (https=)
WO (1) WO2021106288A1 (https=)

Families Citing this family (4)

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Publication number Priority date Publication date Assignee Title
JP7493128B2 (ja) * 2021-08-19 2024-05-31 Ｊｆｅスチール株式会社 操業条件提示方法および操業条件提示装置
CN114777714B (zh) * 2022-03-31 2024-03-01 广东康怡卫生用品有限公司 一种卫生用品厚度测量方法
CN115169745A (zh) * 2022-08-12 2022-10-11 芜湖云一新材料科技有限公司 生产质量预测方法、系统及计算机可读介质
KR20260026561A (ko) * 2023-07-05 2026-02-26 제이에프이 스틸 가부시키가이샤 프로세스 데이터의 편집 방법, 프로세스의 이상 검지 방법, 프로세스 데이터의 편집 장치 및 프로세스의 이상 검지 장치

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Publication number Priority date Publication date Assignee Title
JP2763495B2 (ja) * 1994-10-24 1998-06-11 三菱電機株式会社 圧延装置
JP2000252179A (ja) * 1999-03-04 2000-09-14 Hitachi Ltd 半導体製造プロセス安定化支援システム
TWI267012B (en) * 2004-06-03 2006-11-21 Univ Nat Cheng Kung Quality prognostics system and method for manufacturing processes
JP4296160B2 (ja) 2005-03-29 2009-07-15 株式会社東芝 回路基板の品質解析システム及び品質解析方法
JP2007258731A (ja) * 2007-04-23 2007-10-04 Canon System Solutions Inc プロセスと品質との関係についてのモデル作成装置及びモデル作成方法
JP2009099745A (ja) * 2007-10-16 2009-05-07 Toshiba Corp 半導体装置の生産管理装置及び生産管理方法
US8145338B2 (en) * 2009-06-02 2012-03-27 The Procter & Gamble Company Systems and methods for detecting and rejecting defective absorbent articles from a converting line
JP2011242923A (ja) 2010-05-17 2011-12-01 Fuji Electric Co Ltd モデルの入力変数調整装置
JP5014500B1 (ja) 2011-04-04 2012-08-29 シャープ株式会社 異常要因特定方法および装置、上記異常要因特定方法をコンピュータに実行させるためのプログラム、並びに上記プログラムを記録したコンピュータ読み取り可能な記録媒体
US9110452B2 (en) * 2011-09-19 2015-08-18 Fisher-Rosemount Systems, Inc. Inferential process modeling, quality prediction and fault detection using multi-stage data segregation
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JP6653307B2 (ja) 2016-11-25 2020-02-26 花王株式会社 製品の製造方法及び製品の製造装置
JP6953990B2 (ja) * 2017-10-17 2021-10-27 日本製鉄株式会社 品質予測装置及び品質予測方法
TWI663569B (zh) * 2017-11-20 2019-06-21 財團法人資訊工業策進會 多工作站系統的品質預測方法及其系統
CN109472057B (zh) * 2018-10-16 2023-05-23 浙江大学 基于跨工步隐式参数记忆的产品加工质量预测装置及方法
CN109659933B (zh) * 2018-12-20 2022-03-18 浙江工业大学 一种基于深度学习模型的含分布式电源配电网电能质量预测方法
CN109711714B (zh) * 2018-12-24 2023-01-10 浙江大学 基于并联长短期记忆网络的制造装配产品质量预测方法
CN109483816A (zh) * 2018-12-27 2019-03-19 东莞市誉铭新精密技术股份有限公司 一种手机塑料壳体注塑工艺及注塑装置

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