JP2021052122A5 - - Google Patents
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- JP2021052122A5 JP2021052122A5 JP2019175001A JP2019175001A JP2021052122A5 JP 2021052122 A5 JP2021052122 A5 JP 2021052122A5 JP 2019175001 A JP2019175001 A JP 2019175001A JP 2019175001 A JP2019175001 A JP 2019175001A JP 2021052122 A5 JP2021052122 A5 JP 2021052122A5
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- JP
- Japan
- Prior art keywords
- circuit
- abnormality
- internal step
- down power
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000005856 abnormality Effects 0.000 claims description 23
- 238000006243 chemical reaction Methods 0.000 claims description 14
- 239000004065 semiconductor Substances 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 9
- 230000002159 abnormal effect Effects 0.000 claims 5
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019175001A JP7312073B2 (ja) | 2019-09-26 | 2019-09-26 | 半導体集積回路装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019175001A JP7312073B2 (ja) | 2019-09-26 | 2019-09-26 | 半導体集積回路装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2021052122A JP2021052122A (ja) | 2021-04-01 |
JP2021052122A5 true JP2021052122A5 (ko) | 2022-02-22 |
JP7312073B2 JP7312073B2 (ja) | 2023-07-20 |
Family
ID=75158066
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019175001A Active JP7312073B2 (ja) | 2019-09-26 | 2019-09-26 | 半導体集積回路装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP7312073B2 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2023240503A1 (zh) * | 2022-06-15 | 2023-12-21 | 北京小米移动软件有限公司 | 显示驱动模块、显示设备、异常处理方法、装置及介质 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2945508B2 (ja) * | 1991-06-20 | 1999-09-06 | 三菱電機株式会社 | 半導体装置 |
JP4146930B2 (ja) * | 1998-04-28 | 2008-09-10 | 株式会社 沖マイクロデザイン | 半導体集積回路 |
JP2001035193A (ja) | 1999-07-16 | 2001-02-09 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP3367519B2 (ja) | 1999-12-03 | 2003-01-14 | 日本電気株式会社 | 半導体記憶装置及びそのテスト方法 |
JP3863508B2 (ja) | 2003-07-03 | 2006-12-27 | Necエレクトロニクス株式会社 | 電源電圧検出回路及び半導体集積回路装置 |
-
2019
- 2019-09-26 JP JP2019175001A patent/JP7312073B2/ja active Active
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